Patent Grant
8035936
This invention is directed generally to electrical circuit breakers, and, more particularly, to a multiple pole arc-fault circuit breaker having a single position test button.
Multiple pole (also referred to as “multi-pole”) arc-fault circuit breakers are typically used in residential applications. Some current circuit breakers require periodic user-initiated testing, which is performed via a test button (also know as a push-to-test button or “PTT”).
Current multi-pole circuit breakers require either a plurality of test buttons (e.g., one test button for each pole) or a single test button having multiple button positions (e.g., a single button having a first position for a first pole and a second position for a second pole). One problem associated with these types of circuit breakers is that they are unnecessarily complex, requiring additional parts and board space. Each test button requires additional hardware components for mounting the test button to the breaker housing and for coupling the test button to the breaker microcontroller. Thus, manufacturing costs and design considerations are unnecessarily increased. Similarly, a single test button having multiple positions requires additional hardware components and design considerations.
Some design considerations include selecting an appropriate size and position for components such as the circuit breaker microcontroller. One design consideration of the microcontroller is related to the required number of I/O inputs, which are selected based on the number of test buttons or test button positions. For example, the higher the number of test buttons or test button positions, the higher the pin count and cost of the microcontroller. As such, using a plurality of test buttons or a plurality of test button positions increases the cost and size of microcontroller. Furthermore, a larger-sized microcontroller generates additional heat and, accordingly, provides additional design problems related to removal of excess heat from the circuit breaker.
What is needed, therefore, is a multi-pole circuit breaker having a single position—single test button that addresses the above-stated and other problems.
In an implementation of the present invention, a multiple pole arc-fault circuit breaker includes a first pole assembly, a second pole assembly, a microprocessor, and a single test button. At least one of the first pole assembly and the second pole assembly has a trip mechanism. The microprocessor is electrically coupled to the first pole assembly and to the second pole assembly, and, in response to receiving a single test signal, is operative to perform electrical tests for both the first pole assembly and the second pole assembly. In response to successful completion of the electrical tests, the microprocessor is further operative to actuate the trip mechanism. The single test button is mounted to the housing and includes a single test position which causes the sending of the single test signal for initiating the electrical tests.
In an alternative implementation of the present invention, a multiple pole arc-fault circuit breaker includes a first pole assembly having a first trip mechanism. A second pole assembly is coupled to the first pole assembly and has a second trip mechanism. At least one housing encloses the first pole assembly and the second pole assembly. The circuit breaker further includes a microprocessor communicatively coupled to the first trip mechanism and the second trip mechanism. The microprocessor is operative to perform a plurality of tests for determining failure conditions associated with the first pole assembly and the second pole assembly. The microprocessor is further operative to actuate, i.e., trip, at least one of the first trip mechanism and the second trip mechanism, in response to successful completion of the tests. A single test button is mounted to the housing and has a protruding (actuator) part extending outwards from a surface of the housing. The single test button is movable between an off position and a test position by pressing the protruding part. A pair of contacts is mounted in the housing near the single test button, wherein the contacts are forced in electrical contact with each other when the single test button is moved to the test position. In the test position, the contacts cause a test signal to be sent to the microprocessor to initiate the plurality of tests.
Additional aspects of the invention will be apparent to those of ordinary skill in the art in view of the detailed description of various embodiments, which is made with reference to the drawings, a brief description of which is provided below.
The invention may best be understood by reference to the following description taken in conjunction with the accompanying drawings.
Although the invention will be described in connection with certain preferred embodiments, it will be understood that the invention is not limited to those particular embodiments. On the contrary, the invention is intended to include all alternatives, modifications and equivalent arrangements as may be included within the spirit and scope of the invention as defined by the appended claims.
Referring to
The handle 108 protrudes through the first pole housing 102 and is generally used for resetting the circuit breaker 100. The handle 108 can also serve as a visual indication of the status of the circuit breaker 100 (e.g., tripped, on, off).
The test button 110 has a protruding portion 112 that extends from the first pole housing 102. The test button 110 is illustrated in one of its only two positions, which include an off position and a test position. To move the test button 110 between the off position and the test position, a user depresses the test button 110 towards the first pole housing 102.
The housing cover 106 is mounted directly to the second pole assembly 104. In alternative embodiments, the circuit breaker 100 can have a single housing for enclosing all the breaker poles. In other alternative embodiments, the second pole housing 104 can include an integrated housing cover.
Referring to
The test connector 114 includes a connector open end 114a below the test button 110 and a line end 114b electrically connected to a first line connector 115 (which is in contact with a first line for receiving current from a first contact of the circuit breaker 100). The test spring 116 includes a connected end 116a that mates to a circuit board 132.
Other mechanical components include a handle assembly 108 that is coupled to a movable blade 120 at the end of which is attached a movable contact 122. The movable contact is in direct contact with a fixed contact 124 when the circuit breaker 100 is in an “on” position of the circuit breaker 100 (i.e., when current is allowed to flow through the circuit breaker 100).
A trip mechanism 126 includes a magnetic trip armature 128 and an armature frame 130. In general, the trip mechanism 126 is the mechanism that drives a tripping action such as forcing the movable blade 120, and therefore the movable contact 122, away from the fixed contact 124. For example, the tripping action is caused by the presence of a higher current than the assigned current for the circuit breaker 100 over a specified period of time.
The electrical circuitry includes a circuit board 132 onto which numerous electrical components are mounted, including a microprocessor 134. The microprocessor 134 is operative to perform numerous tasks, including performing a plurality of electrical tests.
Referring to
When a user presses the test button 110 downward (towards the test connector 114), the bottom portion 113 forces the spring open end 116b in contact with the connector open end 114a. This mechanical movement of the test button 110 moves the test button 110 between the off position of the test button 110 (in which the test spring 116 and the test connector 114 are not in contact with each other) and the test position of the test button 110 (in which the test spring 116 and the test connector 114 are in contact with each other).
When the test button 110 is pressed in the test position, a single test signal is conveyed to a single pin of the microprocessor 134, which then initiates a circuitry test on critical system blocks across the plurality of poles in the breaker. According to one example, the circuitry test can be a microprocessor diagnostics test in which the microprocessor 134 generates a self-test signal that is compared to a response signal (e.g., a frequency response) to determine the general internal condition of the circuit breaker 100, including the condition of one or more of the microprocessor 134 and/or other circuit components.
Some exemplary critical system blocks include a voltage monitoring circuit, a ground fault circuit, a temperature sensing circuit, and a line current response circuit, as will be understood by the person of ordinary skill in the art. A voltage monitoring circuit test is performed on the circuit generally used to provide a scaled down reference voltage that is indicative of an AC line voltage, which can be interpreted by an electronic module. The line current response test, in general, verifies that a line current sensor and associated circuitry as found in the subject breaker are functioning within prescribed operational parameters, such as described in U.S. Pat. No. 7,253,637, of common ownership herewith.
Some examples of microprocessor diagnostics tests include testing of Random Access Memory (RAM), testing of Read Only Memory (ROM), verification of clocks, and execution of basic math operations. In another example, the microprocessor diagnostics test includes verification of a microprocessor's source code protection. Alternative to or in addition to the microprocessor diagnostics test, the microprocessor 134 can perform other circuitry tests (e.g., an arc fault test).
The microprocessor 134 further indicates the success or failure of the test in a manner perceptible to the user. One exemplary manner for indicating successful completion of all tests is to trip the circuit breaker 100. If all tests are not successful, the microprocessor 134 does not send a trip signal or the circuit breaker 100 does not trip.
Referring to
The second pole housing 104 further includes a trip mechanism 126′, a magnetic trip armature 128′, and an armature frame 130′. A second line connector 115′ is positioned near the armature frame 130′. The second line connector 115′ is in contact with a first line for receiving current from a first contact of the circuit breaker 100.
In addition to sharing the same handle 108, the second pole assembly also shares the circuit board 132 (including the microprocessor 134) with the first pole assembly. Furthermore, the second pole assembly does not include counterparts to the test button 110 or the test spring 116. The test signal generated in response to pressing the test button 110 initiates tests for all the pole assemblies (e.g., the first pole assembly and the second pole assembly).
Referring to
Optionally, the primary current path for the test circuit can be connected between any one of the first line and the second line of the circuit breaker 100 and a neutral line of the circuit breaker 100. For example, an alternative line-neutral connection 158 illustrates the PTT input line being connected to the neutral line, instead of the being connected to the first line. One advantage associated with this alternative embodiment is that resistors in the current path of the test circuit will only receive 120V voltage, which can potentially allow using smaller resistors with lower pulse limit power ratings.
Referring to
If any of the tests fail, the circuit breaker 100 will exit the test sequence and return to its normal arc-fault detection mode (210) (e.g., the circuit breaker 100 will tend to trip if an arc-fault is detected). If the microprocessor 134 successfully concludes (or “passes”) the tests, the circuit breaker 100 is tripped to indicate the successful conclusion of the tests. Thus, the customer becomes aware that the tests were successful if the circuit breaker is tripped after pushing the test button 110. Conversely, a failure of the tests is indicated by no response from the circuit breaker 100. For example, a customer becomes aware that the tests have failed if the circuit breaker 100 does not trip after pushing the test button 110. Throughout the testing, the circuit breaker 100 will continue to attempt to detect faults (210) and to protect any downstream electrical distribution systems.
In an alternative embodiment, a circuit breaker includes a daisy chain configuration in which the contact pair (e.g., the test spring 116 and the test connector 114) initiates the tests such that the poles are tested in succession, one at a time. Upon test completion, the pole under test sends a signal to a next pole in the daisy chain to begin testing, until the last pole is tested. The trip signal can be sent upon successful testing of all poles. Thus, according to this embodiment, the next pole in the daisy chain does not get tested if the tests fail for the initial pole. According to another embodiment, the next pole in the daisy chain is tested regardless of the outcome in the initial pole. However, the user is notified that at least one test has failed in one of the tested poles by, for example, failing to trip the circuit breaker.
In some current two-button and/or two-position systems, for example, each pole requires receiving its own test signal before initiating any pole related tests (e.g., first pole requires a first test signal, second pole requires a second test signal, etc.). The test signal is caused by a respective test button or test position. For example, a first button or a first test position (of a test button) causes the first test signal, a second button or a second test position (of the test button) causes the second test signal, etc. In contrast, the daisy chain approach replaces the need for the second button or the second test position by generating the second test signal in response to the successful completion of the tests associated with the first pole. When the tests associated with the first pole are successfully completed, the second test signal is generated and the tests associated with the second pole are initiated.
Furthermore, in some current two-button and/or two-position systems a separate button and/or position is required for testing separate functions (e.g., a first button is pressed to test an arc fault condition and a second button is pressed to test a ground fault condition). In another example, a user may have to press button A for testing the circuit breaker circuitry (i.e., perform a microprocessor diagnostics test) and button B for testing the ground fault. In contrast, the circuit breaker 100 of the current application can perform both kinds of tests with a single press of a single button.
While particular embodiments, aspects, and applications of the present invention have been illustrated and described, it is to be understood that the invention is not limited to the precise construction and compositions disclosed herein and that various modifications, changes, and variations may be apparent from the foregoing descriptions without departing from the spirit and scope of the invention as defined in the appended claims.
| Number | Name | Date | Kind |
|---|---|---|---|
| 6215378 | Gibson et al. | Apr 2001 | B1 |
| 6259340 | Fuhr et al. | Jul 2001 | B1 |
| 6285534 | Gibson et al. | Sep 2001 | B1 |
| 6392513 | Whipple et al. | May 2002 | B1 |
| 6426634 | Clunn et al. | Jul 2002 | B1 |
| 6433977 | Macbeth | Aug 2002 | B1 |
| 6538862 | Mason et al. | Mar 2003 | B1 |
| 6731483 | Mason et al. | May 2004 | B2 |
| Number | Date | Country | |
|---|---|---|---|
| 20100123981 A1 | May 2010 | US |
