Multiple testing system and testing method

Abstract

A multiple testing system has plural testing units which are disposed independently, and a single information processing device. The testing unit has a frame, a loading mechanism supported at the frame and applying a desired load quantity on a test body, and a detector detecting a load quantity applied on the test body. By multitasking control and with respect to the testing units, the information processing device carries out: feedback control processing for, on the basis of a detected load quantity, controlling the loading mechanism such that the detected load quantity becomes a predetermined target value; control processing at an abnormal situation when at least one of an abnormality of the test body, an abnormality of the testing unit, or an abnormality of a power source of the loading mechanism, is detected; and interface processing with an operator.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

Preferred embodiments of the present invention will be described in detail based on the following figures, wherein:

FIG. 1 is a function block diagram showing the structure of a multiple fatigue testing system relating to a first embodiment of the present invention;

FIG. 2 is a schematic diagram showing the structure of a fatigue testing unit relating to the first embodiment of the present invention;

FIG. 3 is a flowchart showing the contents of a processing routine of a computer relating to the first embodiment of the present invention;

FIG. 4 is a flowchart showing the contents of a fatigue testing processing routine of the computer relating to the first embodiment of the present invention;

FIG. 5 is a flowchart showing the contents of a test body removing processing routine of the computer relating to the first embodiment of the present invention;

FIG. 6 is a flowchart showing the contents of a processing routine of a computer relating to a second embodiment of the present invention;

FIG. 7 is a flowchart showing the contents of a test body removing processing routine of the computer relating to the second embodiment of the present invention; and

FIG. 8 is a function block diagram showing the structure of a conventional fatigue testing unit.

Claims

1. A multiple testing system comprising: a plurality of testing units which are disposed independently and each have a frame, a loading mechanism supported at the frame and applying a desired load quantity on a test body, and a detector detecting a load quantity applied on the test body; anda single information processing device which, by multitasking control and with respect to the plurality of testing units, carries out: feedback control processing for, on the basis of the load quantity detected by the detector, controlling the loading mechanism such that the detected load quantity becomes a predetermined target value; control processing at an abnormal situation when at least one of an abnormality of the test body, an abnormality of the testing unit, or an abnormality of a power source of the loading mechanism, is detected; and interface processing with an operator.

2. The multiple testing system of claim 1, wherein the respective loading mechanisms of the plurality of testing units are connected in parallel to the single power source.

3. The multiple testing system of claim 1, wherein the control processing of the information processing device at an abnormal situation effects constant value control by changing the target value to a fixed value which is determined in advance for each cause of abnormality, when at least one of the abnormality of the test body, the abnormality of the testing unit, or the an abnormality of the power source of the loading mechanism is detected.

4. The multiple testing system of claim 1, wherein the loading mechanism applies one or more of a desired load, displacement, strain, or temperature on the test body,the feedback control has one or more control modes among a displacement controlling mode which controls displacement of the test body, a load controlling mode which controls a load applied on the test body, a load—displacement combination controlling mode simultaneously controlling the load and the displacement, a strain controlling mode controlling strain caused in the test body, a temperature controlling mode controlling the temperature, or a temperature—mechanical quantity combination controlling mode simultaneously controlling temperature and any of load, displacement or strain, andsince mounting the test body on any one of the testing units until removal of the test bodies from all of the testing units, control is carried out in accordance with a same controlling mode without switching the controlling mode.

5. The multiple testing system of claim 1, wherein the information processing device further carries out replacement processing which effects control by changing the target value, at a time of removing the test body and at a time of mounting the test body.

6. The multiple testing system of claim 1, wherein the information processing device further has a multichannel D/A (Digital-Analog converter) board which outputs control command signals for controlling the loading mechanisms to the respective plurality of testing units,the D/A board has a plurality of buffer regions storing output data expressing the control command signals, and has a function of continuously outputting of the control command signals by repeating a series of operations of, when the D/A board outputs a predetermined amount of the control command signals, the D/A board sends an event signal requesting next output data, and, before output of output data stored in an active buffer region previously is completed, the D/A board stores the next output data in a next buffer region, andthe D/A board further has a function of outputting a constant control command signal and maintaining it, in a case in which the next output data is not stored in the next buffer region when output of the control command signals has been completed.

7. The multiple testing system of claim 6, wherein the information processing device continuously outputs the control command signals by controlling such that a sum of a time period t2, which is required for storage of the next output data, and a time period t3, which is required for a processing whose required time is longest among processings which are carried out continuously and cannot sense the event signal, is shorter than a time period t1, which is since the event signal is sent from the D/A board until completion of the output of the control command signals expressed by the output data which was stored previously, so that the next output data is stored in the next buffer region of the D/A board before output of the control command signals is completed.

8. The multiple testing system of claim 7, wherein the information processing device further carries out automatic restarting control processing which automatically restarts output of the control command signals, when output of the control command signals by the D/A board is stopped.

9. The multiple testing system of claim 1, wherein the information processing device is provided with interface identifying variables, which are for identifying the testing unit which is an object of instruction in a case in which an operator gives instructions with respect to any of the plurality of testing units by the interface processing, and control identifying variables, which are different from the interface identifying variables and which are for identifying the plurality of testing units that is a target of the feedback control processing.

10. The multiple testing system of claim 9, wherein the control identifying variables are local variables which are effective only in processings in which the control identifying variables are used.

11. The multiple testing system of claim 9, wherein the interface identifying variables are global variables which are effective in all processings which the operator instructs.

12. The multiple testing system of claim 1, wherein, in addition to usual feedback control based on an error between the target value and the load quantity detected by the detector, the feedback control processing of the information processing device also controls by correcting the target value each predetermined time period.

13. The multiple testing system of claim 1, wherein the load quantity is temperature, or at least one mechanical quantity among load, displacement or strain.

14. The multiple testing system of claim 1, wherein the interface processing is at least one of inputting test conditions, instructing start of testing, confirming intermediate progress of testing, confirming an operating status of the system, instructing ending of testing, processing relating to mounting of the test body, processing relating to removal of the test body, or storing test data.

15. The multiple testing system of claim 1, wherein the abnormality of the test body is a break of the test body, generation of cracks in the test body or degradation of rigidity of the test body.

16. The multiple testing system of claim 1, wherein the abnormality of the testing unit is an abnormality of the load quantity applied by the loading mechanism.

17. The multiple testing system of claim 1, wherein the power source of the loading mechanism is a hydraulic power source, and the abnormality of the power source is an abnormality in hydraulic pressure or oil temperature.

18. A testing method by a multiple testing system comprising: a plurality of testing units which are disposed independently and each have a frame, a loading mechanism supported at the frame and applying a desired load quantity on a test body, and a detector detecting a load quantity loaded on the test body; and a single information processing device carrying out processings with respect to the plurality of test bodies, the method comprising:carrying out, by multitasking control by the information processing device and with respect to the plurality of testing units: feedback control processing for, on the basis of the load quantity detected by the detector, controlling the loading mechanism such that the detected load quantity becomes a predetermined target value; control processing at an abnormal situation when at least one of an abnormality of the test body, an abnormality of the testing unit, or an abnormality of a power source of the loading mechanism, is detected; and interface processing with an operator.