Multiposition micro electromechanical switch

Information

  • Patent Grant
  • 6489857
  • Patent Number
    6,489,857
  • Date Filed
    Thursday, November 30, 2000
    23 years ago
  • Date Issued
    Tuesday, December 3, 2002
    21 years ago
Abstract
A micro electromechanical switch has a guidepost formed upon a substrate. A signal transmission line is formed on the substrate, with the signal transmission line having a gap and forming an open circuit. The switch further includes a switch body having a via opening formed therein, with the switch body being movably disposed along an length defined by the guide post. The guidepost is partially surrounded by the via opening.
Description




BACKGROUND




The present disclosure relates generally to micro electromechanical (MEM) switches and, more particularly, to a multiposition MEM switch.




Advances in integrated circuit technology in recent years have led to the development of micro electromechanical systems (MEMS), featuring devices of micrometer dimensions which can be actuated and controlled using mechanical, electrostatic, electromagnetic, fluidic and thermal methods. MEMS manufacturing technologies are a combination of the more established semiconductor microfabrication techniques with the newer developments in micromachining.




One example of a MEM device is a cantilevered beam switch having one end anchored to a substrate material, such as silicon. The free end of the beam serves as a deflection electrode which, when a voltage source is applied thereto, deflects as a result of the electrostatic forces on the beam and a field plate, thereby making contact with a stationary electrode. When the voltage source is removed, the beam returns to its “rigid” state due to the restoring forces therein and the switch contacts are opened.




Although advances in MEM technology have been considerable in recent years, the technology is not without its drawbacks. For example, one of the most insidious problems facing manufacturers of MEMS devices is stiction, which occurs when a surface of a micromachined part (such as a cantilever beam) becomes fused or bonded to an adjacent surface of the structure. Stiction can often result from conditions such as surface roughness, humidity, applied voltage and capillary forces during the manufacturing process. The greater the number of stiction problems occurring in a device, the greater the overall effect on the yield of the device becomes. In addition, the physical geometry of a component itself may also have an effect on its susceptibility to stiction; switches of the cantilevered type may undergo warpage due to repeated mechanical stresses on the beam. As such, it is desirable to provide a switch design which minimizes the susceptibility to stiction.




Other difficulties associated with beam switches may include: material fatigue, space constraints (from the requirement for anchoring points), the creation of parasitic inductances and resonant frequency problems. It is also desirable, therefore, to provide a MEM switch which addresses the aforementioned concerns.




SUMMARY




In an exemplary embodiment, a micro electromechanical switch has a guidepost formed upon a substrate. A signal transmission line is formed on the substrate, with the signal transmission line having a gap and forming an open circuit. The switch further includes a switch body having a via opening formed therein, with the switch body being movably disposed along a length defined by the guidepost. The guidepost is partially surrounded by the via opening. In a preferred embodiment, a field plate is formed on the substrate and aligned electrostatically attractably apart from the switch body. An electrostatic attraction between the field plate and the switch body causes the switch body to close the gap in the signal transmission line.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a side elevational view of a prior art, cantilever beam microswitch;





FIG. 2

is a top plan view of an embodiment of a micro electromechanical switch of the invention, with the upper and lower substrate levels exploded laterally to illustrate the main switch body;





FIG. 3

is a cross sectional view of the switch of

FIG. 2

, taken along the section line


3





3


;





FIG. 4

is an alternative embodiment of the switch shown in

FIG. 3

;





FIG. 5

is a top plan view of another embodiment of the micro electromechanical switch of the invention;





FIG. 6

is a top cross sectional view of another embodiment of the switch body; and





FIGS. 7-9

are cross sectional views of the steps in fabricating a section of the switch shown in FIGS.


3


and


4


.











DETAILED DESCRIPTION





FIG. 1

is illustrative of a known micro electromechanical switch (MEMS). As shown, the MEMS, generally identified by reference numeral


20


, is formed on a substrate


22


with a fixed post


24


formed at one end. A flexible cantilever beam


26


is connected on one end of post


24


. The cantilever beam


26


is adapted to carry an electrical contact


28


on one end that is aligned and adapted to mate with a corresponding contact


30


on substrate


22


. The switch


20


is adapted to be activated electrostatically. A grounding plate


32


is formed on the substrate


22


while a filed plate


34


is formed on the cantilever beam


26


. The grounding plate


32


is adapted to be connected to ground while the field plate


34


is adapted to be selectively coupled to a DC voltage source (not shown). With no voltage applied to the field plate


34


, the contact


28


is separated from contact


30


, defining an open circuit state. When an appropriate DC voltage is applied to field plate


34


, the cantilever beam


26


is deflected by the electrostatic forces between plate


34


and ground plate


32


, causing electrical contact


28


to mate with contact


30


, defining a closed circuit state. When the applied voltage is subsequently removed from the field plate


34


, the cantilever beam


26


returns to its static position due to the restoring forces in the beam.




Referring now to

FIGS. 2 through 4

, a switch


50


of an embodiment of the invention is fabricated upon a substrate


52


, such as silicon dioxide (SiO


2


), onto which a plurality of guideposts


54


are formed and located thereupon. Guideposts


54


are surrounded by via openings


56


formed within a moveable body


58


of switch


50


. Body


58


is comprised of a generally rectangular block


60


of conducting material, such as copper. In order to prevent oxidation, the block


60


is encapsulated within an insulating layer and capped, as is described in greater detail hereinafter. As is best seen in

FIGS. 3 and 4

, body


58


is movably disposed along the length of the guideposts


54


, which serve to keep the body


58


of switch


50


in proper lateral alignment as it travels vertically along the guideposts


54


. Configured in this manner, switch


50


does not require an anchor or fixed point about which to pivot or flex.




Body


58


is disposed in a generally horizontal alignment between an upper layer


62


of the substrate


52


and a lower layer


64


of the substrate


52


, as seen in

FIGS. 3 and 4

. Formed within the lower layer


64


of substrate


52


is a first field plate


66


to which a control voltage is applied. A second field plate


68


is similarly located within the upper layer


62


of substrate


52


, and is also connected to a control voltage supply (not shown). The first field plate


66


is electrostatically spaced apart from and attractable to the bottom surface


70


of the switch body


58


, whereas the second field plate


68


is electrostatically spaced apart from and attractable to the top surface


72


of switch body


58


.




A first signal transmission line


74


is established through the lower layer


64


of substrate


52


through contacts


76


separated by a gap


78


therebetween, and defining a open circuit in the first signal transmission line


74


. A second signal transmission line


80


is similarly established through the upper layer


66


of substrate


52


through contacts


82


separated by a gap


84


, and defining an open circuit in the second signal transmission line


80


.




The configuration of the switch


50


in the illustrated embodiments represents a double pole, double throw switch; however, the principals of the invention are applicable to other switch configurations as well. In the present embodiments, switch


50


can be implemented as either a two position switch or a three position switch. In order to maintain a third switch position, the body


58


of switch is maintained in position which is electrically disconnected from signal transmission lines


74


,


80


, and between the upper and lower substrate layers


62


,


64


. The embodiment shown in

FIG. 3

, for example, features a pair of hinges


90


, which are used to bias switch


50


in a neutral or “off” position. The hinges


90


may be integrated with the conducting material.




Alternatively, a “free floating” switch design, shown in

FIG. 4

, may be utilized in the absence of hinges


90


. However, in order to maintain switch


50


in a neutral third position, the first and second field plates


66


,


68


are biased with an appropriate balancing charge such that the resulting opposing electrostatic forces exerted on the switch body


58


cancel one another out, thereby keeping switch body


58


suspended in a free floating position. In the absence of biasing electrostatic forces, switch


50


may also be used in a two position configuration, or a binary mode of operation. As an example of such a configuration, the first transmission line gap


78


is closed and the second transmission line gap


84


is open in the default or “off” position. In the energized or “on” position, the first set transmission line gap


78


is opened and the second transmission line gap


84


is closed.




Switch


50


is actuated by a control voltage selectively applied to one of the desired field plates. The resulting electrostatic force between the selected field plate and the switch body


58


either raises or lowers the body, depending upon which field plate is energized. If, for example, the first field plate


66


is energized, and further assuming that switch


50


is initially in a neutral position, switch body


58


will then be caused to move downward, until conducting surfaces


91


on opposite sides of the switch body


58


mate with corresponding contacts


76


on lower substrate layer


64


, thereby closing the first transmission line gap


78


and defining a closed circuit. When the first field plate


66


is subsequently de-energized, switch body


58


may be returned to a neutral position by biasing hinges


90


or by the application of balancing charges on both first and second field plates


66


,


68


. In either case, the first signal transmission gap is reopened upon the separation of contacts


76


with the conducting surfaces on switch body


58


.




The gap in the second signal transmission line


80


is closed in the same manner by energizing the second field plate


68


. This time, the electrostatic forces generated cause switch body


58


to move in an upward direction until conducting surfaces


91


mate with contacts


82


on upper substrate layer


62


. The second signal transmission line


80


is in a closed circuit condition until the second field plate


68


is deenergized and the switch body


58


is returned to a neutral position. It should also be noted that the polarity of the charge applied to either field plates may be reversed, thereby creating a repulsive force on switch body


58


. The repulsive force provided by one field plate may also be used in conjunction with an attractive force provided by the other field plate, thereby creating a push-pull actuation mechanism.




Again, as an alternative to a three position embodiment, switch


50


can be configured in a two position mode such that one field plate is energized when the other is de-energized and vice versa. In this manner, either the first or the second signal transmission line gap is continuously opened at any given time, but not both gaps simultaneously. In other words, switch body


58


is not statically maintained in a neutral position.





FIG. 5

illustrates yet another embodiment of the switch configuration, adaptable for use with a cantilever beam. In this embodiment, the main switch body


58


is integrally formed upon the end of a lever arm


92


which, in turn, is affixed to a stationary post


94


formed within the substrate. Lever arm


92


does not entirely support the weight of switch body, as hinges


90


are also used in this configuration.





FIG. 6

illustrates another embodiment of main switch body


58


. As is shown, switch body


58


may be fabricated in a generally circular shape


100


. Thus configured, switch body


58


travels vertically upward and downward within a cavity


96


formed within the substrate


52


, while only frictionally engaging the substrate walls at four tangential surfaces


102


on switch body


58


. Although guideposts (not shown) keep switch body


58


in a relatively horizontal orientation within cavity


96


, via openings (not shown) do allow for slight lateral shifting of switch body


58


while in operation. Accordingly, with a circular design, there would be a minimal amount of surface contact between the outer edges of switch body


58


and the substrate walls defining cavity


96


.




Referring now to

FIG. 7

, the details for fabrication of the switch are illustrated. The guideposts


54


are formed from the silicon dioxide (SiO


2


) substrate


52


by known masking, deposition and etching techniques. A sacrificial layer


200


, such as diamond-like carbon (DLC) or other conformal organic polymer, is deposited upon the substrate


52


, including the side and top surfaces of the guideposts


54


. A liner


202


is thereafter deposited upon the sacrificial layer


200


, in order to prevent the diffusion of the electroplated copper


204


which is subsequently deposited upon the liner


202


. Liner


202


is preferably comprised of a refractory metal such as titanium, titanium nitride, tantalum nitride or tungsten. Due to the poor corrosion resistance of copper


204


, a cap


206


of cobalt-tungsten-phosphide (CoWP) is electrolessly formed upon the top surface of the copper layer, as shown in FIG.


8


. It should be noted, however, that other materials may be used for cap


206


, including tantalum nitride or nickel. The top of the cap


206


is planarized with the top surface of the guideposts


54


, following chemical-mechanical polishing. A second sacrificial layer


208


of DLC is then deposited upon the caps


206


and the guideposts


54


. Next, a top cap


210


of insulating material, preferably silicon nitride, is deposited upon the second layer


208


of DLC.




Finally,

FIG. 9

illustrates the switch following the removal of the sacrificial layers


200


,


208


of DLC. Upon forming a number of perforations in the top cap


210


, the switch


50


is then heated in an oxygenated environment, thereby resulting in the removal of the sacrificial layers


200


,


208


and producing carbon dioxide and carbon monoxide as waste gases. The removal of the DLC thus creates the via openings


56


in the switch body


58


through which guideposts


54


guide the vertical movement of switch body


58


.




While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed as the best mode contemplated for carrying out this invention, but that the invention will include all embodiments falling within the scope of the appended claims.



Claims
  • 1. A multi-position, micro electromechanical switch, comprising:a plurality of guideposts formed upon a substrate; a first signal transmission line, formed on a lower layer of said substrate, said first signal transmission line having a first gap defining an open circuit associated therewith; a second signal transmission line, formed on an upper layer of said substrate, said second transmission line having a second gap defining an open circuit associated therewith; and a switch body having a plurality of via openings formed therein, said switch body movably disposed along said guide posts through said via openings.
  • 2. The micro electromechanical switch of claim 1, further comprising a pair of supporting hinges, disposed on opposing sides of said switch body, said supporting hinges biasing said switch in a neutral position, wherein said gaps in both of said first and second transmission lines remain open.
  • 3. The micro electromechanical switch of claim 1, wherein said switch body is generally rectangular shaped.
  • 4. The micro electromechanical switch of claim 1, wherein said switch body is generally circular shaped.
  • 5. The micro electromechanical switch of claim 1, wherein said switch body comprises electroplated copper.
  • 6. The micro electromechanical switch of claim 5, wherein said switch body further comprises a cobalt-tungsten-phosphide (CoWP) insulating cap.
  • 7. The micro electromechanical switch of claim 1, further comprising:a first field plate formed on said lower layer of said substrate, said first field plate aligned electrostatically attractably apart from a bottom surface of said switch body; and a second field plate formed on said upper layer of said substrate, said second field plate aligned electrostatically attractably apart from a top surface located on said switch body.
  • 8. The micro electromechanical switch of claim 7, further comprising a balancing charge applied to said first and second field plates, said balancing charge causing an electrostatic attraction between said first field plate and said bottom surface of said switch body to be cancelled by an electrostatic attraction between said second field plate and said top surface of said switch body.
  • 9. The micro electromechanical switch of claim 7, wherein an electrostatic attraction between said first field plate and said bottom surface of said switch body causes said switch body to close said first gap in said first signal transmission line.
  • 10. The micro electromechanical switch of claim 7, wherein an electrostatic attraction between said second fieldplate said and top surface of said switch body causes said switch body to close said second gap in said second signal transmission line.
US Referenced Citations (9)
Number Name Date Kind
5578976 Yao Nov 1996 A
5619061 Goldsmith et al. Apr 1997 A
5695810 Dubin et al. Dec 1997 A
5946176 Ghoshal Aug 1999 A
6065424 Shacham-Diamand et al. May 2000 A
6069540 Berenz et al. May 2000 A
6128961 Haronian Oct 2000 A
6132586 Adams et al. Oct 2000 A
6143997 Feng et al. Nov 2000 A
Non-Patent Literature Citations (4)
Entry
Dimitrios Peroulis, Sergio Pacheco, Kamal Sarabandi, and Linda P.B. Kathehi, “Mems Devices for High Isolation Switching and Tunable Filtering”, IEEE, 2000.
K.E. Petersen, “Micromechanical Membrane Switches on Silicon” IBM J. Res. Develop. vol. 23 No. 4, Jul. 1979.
Steven T. Walsh, Robert Boylan, and Stephen F. Bart “Overcoming Stiction in MEMS Manufacturing” Mar. 1995.
K. Komvopoulos and W. Yan “A Fractal Analysis of Stiction in Microelectromechanical Systems” Journal of Tribology, vol. 119 Jul. 1997.