Claims
- 1. Apparatus for detection of wall-thinning defects of metals comprising:
a first test coil adjacent to a good metal section; a second test coil adjacent to a metal to be tested; and a bridge circuit for comparing inductance in the first test coil and inductance in the second test coil.
- 2. An apparatus according to claim 1, further comprising:
a first measuring transformer connected to said first test coil; a second measuring transformer connected to said second test coil; and wherein said first and second transformers each have primaries which comprise legs of said bridge circuit.
- 3. An apparatus in accordance with claim 1, wherein said bridge circuit comprises a transformer having a primary connected to a source of alternating voltage and having a center tapped secondary wherein each secondary winding is connected to one of said first and second test coils, said center tap is connected to an apparatus for measuring voltage and a connection between said first and second test coils is connected to the apparatus for measuring voltage.
- 4. An apparatus according to claim 3, wherein said source of alternating voltage has substantially no voltages under no load conditions which are higher in frequency than a fundamental voltage frequency.
- 5. An apparatus according to claim 1, wherein a connection between said first test coil and said second test coil is connected to ground.
- 6. The apparatus according to claim 3, wherein said apparatus for measuring voltage comprises an oscilloscope.
- 7. An apparatus for detection of defects of metals comprising:
a transformer having a secondary, said secondary having a center tap, and having a primary connected to a source of alternating current power; a first test coil placed adjacent to good metal section; a second test coil placed adjacent to a length of metal to be tested; and a voltage detection apparatus connected between said center tap and a connection between the first test coil and the second test coil; wherein one side of the transformer secondary coil is connected to said first test coil and another side of the transformer secondary coil is connected to the second test coil.
- 8. The apparatus according to claim 7, wherein said voltage measuring device is an oscilloscope.
- 9. The apparatus (said apparatus for measuring voltage (3) in accordance with claim 1, wherein a voltage measured by a measuring device is proportional to a difference in inductance of the first test coil and the second test coil.
- 10. The apparatus (said apparatus for measuring voltage (3) in accordance with claim 2, wherein a voltage measured by a measuring device is proportional to a difference in inductance of the first test coil and the second test coil.
- 11. The apparatus in accordance with claim 7, wherein the connection between the first test coil, second test coil and voltage detection apparatus is connected to ground.
- 12. An apparatus for detection of wall-thinning defects of metals comprising:
a power transformer having a primary connected to a source of alternating power and a secondary having a center tap; a first measuring transformer having a primary winding connected to a first end of said first transformer secondary winding and to ground, said first measuring transformer having a secondary winding connected to a first test coil; a second measuring transformer having a primary winding connected to a second end of said first transformer secondary winding and to ground, said second measuring transformer having a secondary winding connected to a second test coil; a voltage measuring apparatus for measuring voltage between the center tap of said first transformer and ground; a good metal section placed adjacent to one of said test coils and a length of metal to be tested placed adjacent to the other test coil; wherein a voltage measured by said voltage measuring apparatus indicates a difference in the impedance between the second transformer primary winding and that of the third transformer primary winding.
- 13. The apparatus in accordance with claim 11, wherein a difference in impedance between said first measuring transformer primary winding and said second measuring transformer primary winding is determined by a difference between a good metal section and a length of metal to be tested the good metal section and the metal section are to be tested are placed adjacent to in said first and second test coils.
- 14. An apparatus in accordance with claim 1, further comprising a circuit for increasing a signal to noise ratio of said apparatus for detection wherein a metal to be tested is a good metal section and wherein a voltage across said bridge is reduced to a minimum.
- 15. An apparatus in accordance with claim 13, wherein said circuit for increasing a signal to noise ratio comprises as a circuit for compensating for imbalance of impedance between said first and second test coils.
- 16. An apparatus in accordance with claim 14, wherein said circuit for increasing a signal to noise ratio comprises a circuit for compensating for imbalance of resistance between said first and second test coils.
- 17. An apparatus in accordance with claim 14, wherein said circuit for increasing a signal to noise ratio further comprises a circuit for compensating for imbalance of an inductance between said first and second test coils.
- 18. An apparatus in accordance with claim 16,
wherein said circuit for increasing a signal to noise ratio comprises a potentiometer connected across a power transformer secondary winding, having a wiper connected to a voltage detection apparatus first terminal, wherein said voltage detection apparatus has a second terminal connected to ground, and wherein a connection between the first test coil and the second test coil is connected to ground.
- 19. An apparatus in accordance with claim 13, wherein said circuit for increasing a signal to noise ratio comprises a potentiometer connected across a power transformer secondary winding,
wherein a wiper is connected from said potentiometer to an input of a voltage measuring device, wherein the voltage measuring device has a second connection to ground; a second potentiometer connected across the power transformer secondary winding having a wiper connected to ground; and wherein said first and second test coils are connected to each other and to ground.
- 20. An apparatus in accordance with claim 2, further comprising a circuit for increasing a signal to noise ratio which comprises:
a first potentiometer connected across a power transformer secondary winding, said potentiometer having a wiper connected to ground; a second potentiometer connected across said power transformer secondary winding, having a wiper connected to a voltage measuring apparatus; wherein said first and second measuring transformers each have a primary winding connected to said power transformer secondary winding; wherein said first and second measuring transformers each have a primary winding connected to ground; and wherein said voltage measuring apparatus has another terminal connected to ground.
- 21. A method for detection of wall-thinning defects of metals comprising the steps of:
placing a first test coil adjacent to a good metal section placing a second test coil adjacent to a good metal section connecting said first and second test coils in a bridge circuit for comparing inductance between the first coil and inductance in the second coil; increasing a signal to noise ratio of said bridge circuit; removing one of said good metal sections and replacing it with a section to be tested; observing bridge voltage imbalance when a metal to be tested is placed adjacent to one of said test coils.
- 22. A method for detection of wall-thinning defects of metals comprising the steps of:
placing a first test coil adjacent to a good metal section placing a second test coil adjacent to a metal section to be tested connecting said first and second test coils in a bridge circuit comparing inductance between the first coil and inductance in the second coil by reducing voltage across said bridge circuit to a minimum.
- 23. A method for detection of wall-thinning defects of metals in accordance with claim 21, further comprising the steps of:
connecting a first transformer to a source of alternating current power; connecting said first test coil to a first measuring transformer; connecting said second test coil to a second measuring transformer; and connecting primary windings of said first and second measuring transformers to a secondary winding of said first transformer.
- 24. A method for detection of wall-thinning defects of metals in accordance with claim 21, further comprising the steps of:
connecting a potentiometer across a secondary winding of said first transformer; connecting a wiper of said potentiometer to a voltage measuring apparatus first terminal; and connecting a voltage measuring apparatus second terminal to a connection between said first and second measuring transformers.
- 25. A method for detection of wall-thinning defects of metals in accordance with claim 23, further comprising the steps of:
replacing the metal to be tested with a metal which is substantially identical to the good metal section; adjusting a position of the wiper to a position where a voltage measured by said voltage measuring apparatus is a minimum.
- 26. A method for detection of wall-thinning defects of metals in accordance with claim 24, further comprising the steps of:
compensating the bridge for differences in impedance at said measuring transformers.
- 27. A method for detection of wall-thinning defects of metals in accordance with claim 25, wherein said impedance at said measuring transformers includes impudence of said measuring transformers and said test coils.
- 28. A method for detection of wall-thinning defects of metals in accordance with claim 22, further comprising using a source of alternating voltage which has substantially no voltages under no load conditions which are higher in frequency than a fundamental voltage frequency.
- 29. A method for detection of wall-thinning defects of metals in accordance with claim 23, further comprising the step of:
connecting the connection between said first and second measuring transformers to ground.
Parent Case Info
[0001] This application claims the priority of U.S. Provisional Application No. 60/310,828 filed on Aug. 9, 2001, which is incorporated herein by reference.
Provisional Applications (1)
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Number |
Date |
Country |
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60310828 |
Aug 2001 |
US |