BRIEF DESCRIPTION OF THE DRAWINGS
In the attached drawings:
FIG. 1 is a perspective view of an impedance conversion device embodying the present invention;
FIG. 2 is a top plan view of the impedance conversion device in FIG. 1;
FIG. 3 is a bottom plan view of the impedance conversion device in FIG. 1;
FIG. 4 is a side elevation view of the impedance conversion device in FIG. 1;
FIG. 5 is a sectional view through line V-V in FIGS. 2-4;
FIG. 6 is a sectional view through line VI-VI in FIGS. 2-4;
FIG. 7 is a sectional view through line VII-VII in FIGS. 2-4;
FIG. 8 is a top plan view of a structure used in time-domain reflectometry;
FIG. 9 is a bottom plan view of the structure in FIG. 8;
FIG. 10 depicts a time-domain reflectometer, and a coaxial cable and probes connected thereto;
FIG. 11 shows exemplary waveforms obtained by time-domain reflectometry using the structure in FIGS. 8 and 9;
FIG. 12 schematically depicts the impedance conversion device in FIG. 1 with a direct current source connected on its input side and a load resistor connected on its output side;
FIG. 13 schematically depicts the impedance conversion device in FIG. 1 with a pulse generator connected on its input side, a load resistor connected on its output side, and an oscilloscope connected to measure the voltage on the output side;
FIG. 14 is a top plan view of an impedance conversion device used in time-domain reflectometry;
FIG. 15 is a bottom plan view of an impedance conversion device used in time-domain reflectometry;
FIG. 16 shows exemplary waveforms obtained with the measurement setup shown in FIG. 13;
FIG. 17 shows exemplary waveforms obtained with the measurement setup shown in FIG. 13 with the output side left electrically open;
FIG. 18 shows exemplary waveforms obtained with the measurement setup shown in FIG. 13 with the central part of the conductor lengthened;
FIG. 19 is a top plan view of another structure used in time-domain reflectometry;
FIG. 20 is a bottom plan view of the structure in FIG. 19;
FIG. 21 shows an exemplary waveform obtained by time-domain reflectometry using the structure in FIGS. 19 and 20;
FIG. 22 is a perspective view illustrating crosstalk between mutually adjacent conductors;
FIG. 23 is a sectional view illustrating crosstalk between mutually adjacent conductors;
FIG. 24 is a sectional view illustrating another embodiment of the invention.