Claims
- 1. A superconductive material with a superconducting critical temperature of at least 77.degree. K., having a composition of 20 atomic % niobium (Nb), 10 atomic % silicon (Si), 10 atomic % aluminum (Al) and 60 atomic % oxygen (O), which comprises crystalline grains of intermetallic compound comprising Nb, Si, and Al and having an Nb/Si atomic ratio of 2/1, said superconductive material containing oxides of Nb, Si and Al in the boundaries of said crystalline grains.
- 2. A process for manufacturing a superconductive material having a superconducting critical temperature of at least 77.degree. K., which comprises: maintaining a sapphire substrate at a temperature of 500 to 800.degree. C. under an inert gas atmosphere at a pressure of from 1.times.10.sup.-2 to 0.7 Torr; depositing Nb, Si and Al simultaneously onto said substrate by means of vapor-phase physical deposition or sputtering with a plate voltage of from 200 to 600 V, and introducing oxygen at a pressure of from 0.1.times.10.sup.-5 to 1 Torr in such an amount to form a film composed of 20 atomic % Nb, 10 atomic % Si, 10 atomic % Al and 60 atomic % O, and forming (1) crystalline grains of intermetallic compound comprising Nb, Si and Al and having an Nb/Si atomic ratio of 2/1 and (2) oxides of Nb, Si and Al in the boundaries of the crystalline grains; and then quenching the formed film.
- 3. A process as claimed in claim 2, which further comprises post-oxidizing the quenched film in an atmosphere containing oxygen in an amount of at least the oxygen content of air.
- 4. A process as claimed in claim 3, wherein the post-oxidizing is effected until the film is oxidized substantially into a passive state in which the film cannot be further oxidized.
- 5. A process as claimed in claim 2, wherein the quenching is carried out at a cooling rate of about 100.degree.-4,000.degree. C./min. down to the temperature of liquid nitrogen.
- 6. A process as claimed in claim 5, wherein the cooling rate is about 1,100.degree.-2,000.degree. C./min.
- 7. A process for manufacturing the superconductive material having a superconducting critical temperature of at least 77.degree. K., which comprises: maintaining a sapphire substrate at a temperature of 500 to 800.degree. C.; depositing Nb, Si and Al each in a selected amount simultaneously onto said substrate in an oxygen-free inert gas atmosphere having a pressure of from 1.times.10.sup.-2 to 0.7 Torr by means of vapor-phase physical deposition or sputtering with a plate voltage of from 200 to 600 V, to form an Nb-Si-Al ternary system film; then quenching the formed film; and then post-oxidizing the quenched film in an atmosphere containing oxygen in an amount of at least the oxygen content of air to obtain a film having a composition of 20 atomic % Nb, 10 atomic % Si, 10 atomic % Al and 60 atomic % O, forming (1) crystalline grains of intermetallic compound comprising Nb, Si and Al having an Nb/Si atomic ratio of 2/1 and (2) oxides of Nb, Si and Al in the boundaries of said crystalline grains.
- 8. A process as claimed in claim 7, wherein the post-oxidizing is effected until the film is oxidized substantially into a passive state in which the film cannot be further oxidized.
- 9. The superconductive material prepared by the process of claim 2.
- 10. The superconductive material prepared by the process of claim 7.
- 11. The superconductive material as claimed in claim 1 which has the shape of a thin film which has been quenched to form metastable compounds, said film containing an amount of oxygen effective to passivate the film so that further oxidation of said film is suppressed.
Priority Claims (1)
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61-11728 |
Jan 1986 |
JPX |
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GROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation-in-part of copending U.S. patent application, Ser. No. 07/262,181, filed Oct. 20, 1988, now abandoned which in turn is a continuation of Ser. No. 06/943,518, filed Dec. 17, 1986, now abandoned.
Foreign Referenced Citations (2)
Number |
Date |
Country |
62-170108 |
Jul 1987 |
JPX |
62-171924 |
Jul 1987 |
JPX |
Non-Patent Literature Citations (4)
Entry |
Wang et al., "High Rate Sputter-Deposited Nb.sub.3 X Containing Oxygen", AIME 1976, Fall Meeting, 9/1986. |
Gavaler et al., "The Effect of Oxygen on the Low Temperature Growth of the High-Tc A15 Superconductors", Conference on Superconductivity in d- and f-Band Metals, Karlsnehe, F. R. Germany, Jun. 1982. |
Ihara et al., "Oxidation Mechanism of the Surface of A15 Superconductors", International Cryogenic Materials Conf., 5th Plenum Press 1984. |
Ogushi, Appl. Phys. Lett. 48 (17), Apr. 1986, pp. 1167-1168. |
Continuations (1)
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943518 |
Dec 1986 |
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Continuation in Parts (1)
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262181 |
Oct 1988 |
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