Claims
- 1. An apparatus for testing a non-cut type core comprising:
- a primary winding and a secondary winding to be mounted for a test operation on a core, said primary and secondary windings having only one connector-type contact per one turn, said connector-type contact being located within said core when said connector-type contact is connected;
- means, connected to said primary winding, for supplying an input current to said primary winding;
- means, connected to said secondary winding, for detecting an output voltage of said secondary winding;
- negative feedback means, connected to said input current supplying means and said output voltage detecting means, for supplying an input current of the negative feedback in accordance with said output voltage to said primary winding.
- 2. An apparatus as set forth in claim 1, wherein said negative feedback means comprises:
- means for generating a basic sine-wave voltage; and
- means, connected to said basic sine-wave voltage generating means and said output voltage detecting means, for detecting a voltage difference between said basic sine-wave voltage and said output voltage,
- thereby supplying said input current to said primary winding.
- 3. An apparatus as set forth in claim 2, wherein said negative feedback means further comprises a phase adjusting circuit connected between said output voltage detecting means and said voltage difference detecting means.
- 4. An apparatus as set forth in claim 1 further comprising:
- means for generating a basic sine-wave voltage;
- means, connected to said basic sine-wave voltage generating means and an output of said secondary winding, for detecting a voltage error therebetween;
- means, connected to said voltage error detecting means, for delaying said voltage error by one cycle of said basic sine-wave voltage; and
- means, connected to said basic sine-wave voltage generating means, said delaying means, and said input current supplying means, for adding said delayed voltage error to said basic sine-wave voltage,
- said input current supplying means supplying an input current to said primary winding in accordance with the result of addition by said adding means.
- 5. An apparatus as set forth in claim 4, further comprising means, connected to said voltage error detecting means and said delaying means, for adding said delayed voltage error to said voltage, thereby increasing the degree of feedback which takes place in the apparatus.
Priority Claims (1)
Number |
Date |
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62-18625 |
Jan 1987 |
JPX |
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Parent Case Info
This is a continuation of application Ser. No. 07/343,414, filed Apr. 25, 1989, which was abandoned upon the filing hereof, which is a division of application Ser. No. 07/149,146, filed Jan. 27, 1988, now U.S. Pat. No. 4,866,366 .
US Referenced Citations (6)
Foreign Referenced Citations (4)
Number |
Date |
Country |
2812303 |
Oct 1979 |
DEX |
4429688 |
Feb 1969 |
JPX |
0128805 |
Oct 1980 |
JPX |
0287209 |
Dec 1986 |
JPX |
Non-Patent Literature Citations (3)
Entry |
Proc. IEE, vol. 121, No. 11, Nov. 1974, pp. 1419-1420. |
Patent Abstracts of Japan, vol. 8, No. 133 (P 281) [1570], 20th Jun. 1984; and JP-A-59 34166 (Mitsubishi Denki K.K.) Feb. 24, 1984. |
Orengo et al., "DC Flux Compensating Circuit . . .", IBM Technical Disclosure, vol. 21, No. 1, Jun. 1978. |
Divisions (1)
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Number |
Date |
Country |
Parent |
149746 |
Jan 1988 |
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Continuations (1)
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Number |
Date |
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Parent |
343414 |
Apr 1989 |
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