Claims
- 1. A neural network processor comprising:
- input means for receiving a plurality of input signals;
- output means for providing at least one output signal;
- neural network means coupled to the input means and the output means, the neural network means comprising a physical body, the physical body having physical properties allowing for propagation of an electrical WAVE in an unchanneled fashion therethrough from the input means to the output means, the body comprises:
- at least one region, which is suitable for affecting electrical conduction through the physical body;
- training means for altering a state of the region during a learning mode of the neural network means; and wherein:
- the physical body comprises a semiconductor body; and
- the semiconductor body comprises:
- a semiconductor substrate;
- an insulating layer on a major surface of the substrate;
- at least one charge storage region within the insulating layer for inducing the at least one region in the substrate.
- 2. The processor of claim 1 wherein the training means comprises at least one conductor situated on the opposite side of the insulating material from the semiconductor substrate.
- 3. The processor of claim 2 further comprising an additional doped region within the semiconductor substrate, which doped region is in electrical contact with the conductor, via an aperture in the insulating material.
- 4. The processor of claim 3 wherein the semiconductor substrate has a doping of opposite conducting type to that of additional doped region.
- 5. The processor of claim 2 wherein the conductor is situated directly over the charge storage region and interacts capacitively or galvanically therewith.
- 6. The processor of claim 2 wherein the conductor is situated over a thin portion of the insulating material and interacts capacitively or galvanically with the semiconductor substrate.
- 7. The processor of claim 1 wherein the training means comprises
- a piezo-electric layer on the insulating layer for receiving mechanical stress waves which alter the electrical properties of the piezo-electric layer;
- a second insulating layer on the piezo-electric layer; and
- a conductive layer on the second insulating layer, so that the piezo-electric layer alters an effect of the conductive layer on the at least one region.
- 8. The system of claim 1, wherein the training means comprises an upper surface containing photoelectric elements for receiving photons for altering electrical properties of the upper surface.
- 9. The system of claim 1 wherein the training means comprises a ferroelectric layer on the insulating layer.
Priority Claims (1)
Number |
Date |
Country |
Kind |
93200603 |
Mar 1993 |
EPX |
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Parent Case Info
This is a division of application Ser. No. 08/201,609, filed on Feb. 25, 1994.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
5165010 |
Masuda et al. |
Nov 1992 |
|
5426720 |
Bozich et al. |
Jun 1995 |
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5428711 |
Akiyama et al. |
Jun 1995 |
|
Non-Patent Literature Citations (1)
Entry |
Ohta et al, "Variable sensitivity photodetector for optical neural networks"; Journal of Lightwave Technology, vol. 9, iss. 12, pp. 1747-1754, Dec. 1991. |
Divisions (1)
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Number |
Date |
Country |
Parent |
201609 |
Feb 1994 |
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