“Non-uniform Bipolar conduction in Single Finger NMOS Transistors and Implications for Deep Submicron ESD Design”, IRPS-International Reliability Physics Symposium Proceedings for the Year 2000, Kwang-Hoon Oh, Charvaka Duvvury, Craig Salling, Kaustav Banerjee and Robert W. Dutton, Published in 2000, 9 pgs. |
“Process-related Effects on ESD Performance in Deep Submicron Technologies”, Ajith Amerasekera and Vikas Gupta, Published date not available, 10 pgs. |
“Development of Substrate-Pumped nMOS Protection for a 0.13um Technology”, Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline and Rith Pok, Published date not available, 13 pgs. |
“ESD-related Process Effects in Mixed-voltage Sub-0.5um Technologies”, Vikas Gupta, Ajith Amerasekera, Sridhar Ramaswamy and Alwin Tsao, Published date not available, 9 pgs. |
“Substrate Triggering and Salicide Effects on ESD Performance and Protection Circuit Design in Deep Submicron CMOS Processes”, IEEE Electron Device Meeting Technical Digest, Ajith Amerasekera, Charvaka Duvvury, Vijay Reddy and Mark Rodder, 1995, pp. 547-550. |
“A Novel NMOS Transistor for High Performance ESD Protection Devices in 0.18 um CMOS Technology Utilizing Salicide Process”, EOS/ESD Symposium 00, Chang-Su Kim, Hong-Bae Park, Young-Gwan Kim, Dae-Gwan, Kang, Myoung-Goo Lee, Si-Woo Lee, Chan-Hee Jeon, Han-Gu Kim, Young-Jae Yoo and Han-Sub Yoon, pp. 407-412. |