Various exemplary embodiments disclosed herein relate generally to an all NMOS low swing voltage mode TX driver.
A summary of various exemplary embodiments is presented below. Some simplifications and omissions may be made in the following summary, which is intended to highlight and introduce some aspects of the various exemplary embodiments, but not to limit the scope of the invention. Detailed descriptions of an exemplary embodiment adequate to allow those of ordinary skill in the art to make and use the inventive concepts will follow in later sections.
Various embodiments relate to a transmit driver circuit, including: a first node connected to a first differential output; a first transistor connected in series with a first resistor, wherein the series connected first transistor and first resistor are connected between a source voltage and the first node; a second transistor connected in series with a second resistor, wherein the series connected second transistor and second resistor are connected between the first node and a ground; a second node connected to a second differential output; a third transistor connected in series with a third resistor, wherein the series connected third transistor and third resistor are connected between the source voltage and the second node; a fourth transistor connected in series with a fourth resistor, wherein the series connected fourth transistor and fourth resistor are connected between the second node and the ground; a first differential input connected to the gate of the first transistor and the gate of the fourth transistor; and a second differential input connected to the gate of the second transistor and the gate of the third transistor, wherein the first transistor, second transistor, third transistor, and fourth transistor are NMOS transistors.
Various embodiments are described, transmit driver circuit of claim 1, wherein the first resistor is connected between the voltage source and the first transistor, the second resistor is connected between the first node and the second transistor, the third resistor is connected between the voltage source and the third transistor, and the fourth resistor is connected between the second node and the fourth transistor.
Various embodiments are described, transmit driver circuit of claim 1, wherein the first resistor is connected between the first transistor and the first node, the second resistor is connected between the first node and the second transistor, the third resistor is connected between the third transistor and the second node, and the fourth resistor is connected between the second node and the fourth transistor.
Various embodiments are described, transmit driver circuit of claim 1, wherein the first resistor is connected between the voltage source and the first transistor, the second resistor is connected between the second transistor and the ground, the third resistor is connected between the voltage source and the third transistor, and the fourth resistor is connected between the fourth transistor and the ground.
Various embodiments are described, wherein when the first differential input is logic 1 and the second differential input is logic 0, the first transistor and fourth transistor are switched on and the second transistor and the third transistor are turned off and the first output is pulled up to the source voltage and the second output is pulled down to the ground.
Various embodiments are described, wherein when the first differential input is logic 0 and the second differential input is logic 1, the first transistor and fourth transistor are switched off and the second transistor and the third transistor are turned on and the first output is pulled down to the ground and the second output is pulled up to the source voltage.
Further various embodiments relate to a transmit driver circuit, including: a first node connected to a first differential output; a first transistor connected in series with a first resistor, wherein the series connected first transistor and first resistor are connected between a source voltage and the first node; a second transistor connected in series with a second resistor, wherein the series connected second transistor and second resistor are connected between the first node and a ground; a second node connected to a second differential output; a third transistor connected in series with the first resistor, wherein the series connected third transistor and first resistor are connected between the source voltage and the second node; a fourth transistor connected in series with the second resistor, wherein the series connected fourth transistor and second resistor are connected between the second node and the ground; a first differential input connected to the gate of the first transistor and the gate of the fourth transistor; and a second differential input connected to the gate of the second transistor and the gate of the third transistor, wherein the first transistor, second transistor, third transistor, and fourth transistor are NMOS transistors.
Various embodiments are described, wherein when the first differential input is logic 1 and the second differential input is logic 0, the first transistor and fourth transistor are switched on and the second transistor and the third transistor are turned off and the first output is pulled up to the source voltage and the second output is pulled down to the ground.
Various embodiments are described, wherein when the first differential input is logic 0 and the second differential input is logic 1, the first transistor and fourth transistor are switched off and the second transistor and the third transistor are turned on and the first output is pulled down to the ground and the second output is pulled up to the source voltage.
Further various embodiments relate to a differential high-speed data path circuit, including: a differential gain circuit; a differential transmit driver circuit including a first differential input and a second differential input including: a first node connected to the first differential output; a first transistor connected in series with a first resistor, wherein the series connected first transistor and first resistor are connected between a source voltage and the first node; a second transistor connected in series with a second resistor, wherein the series connected second transistor and second resistor are connected between the first node and a ground; a second node connected to the second differential output; a third transistor connected in series with a third resistor, wherein the series connected third transistor and third resistor are connected between the source voltage and the second node; a fourth transistor connected in series with a fourth resistor, wherein the series connected fourth transistor and fourth resistor are connected between the second node and the ground; a first differential input connected to the gate of the first transistor and the gate of the fourth transistor; and a second differential input connected to the gate of the second transistor and the gate of the third transistor, wherein the first transistor, second transistor, third transistor, and fourth transistor are NMOS transistors.
Various embodiments are described, wherein the first resistor is connected between the voltage source and the first transistor, the second resistor is connected between the first node and the second transistor, the third resistor is connected between the voltage source and the third transistor, and the fourth resistor is connected between the second node and the fourth transistor.
Various embodiments are described, wherein the first resistor is connected between the first transistor and the first node, the second resistor is connected between the first node and the second transistor, the third resistor is connected between the third transistor and the second node, and the fourth resistor is connected between the second node and the fourth transistor.
Various embodiments are described, wherein the first resistor is connected between the voltage source and the first transistor, the second resistor is connected between the second transistor and the ground, the third resistor is connected between the voltage source and the third transistor, and the fourth resistor is connected between the fourth transistor and the ground.
Various embodiments are described, wherein when the first differential input is logic 1 and the second differential input is logic 0, the first transistor and fourth transistor are switched on and the second transistor and the third transistor are turned off and the first output is pulled up to the source voltage and the second output is pulled down to the ground.
Various embodiments are described, wherein when the first differential input is logic 0 and the second differential input is logic 1, the first transistor and fourth transistor are switched off and the second transistor and the third transistor are turned on and the first output is pulled down to the ground and the second output is pulled up to the source voltage.
Further various embodiments relate to a differential high-speed data path circuit, including: a differential gain circuit; a differential transmit driver circuit including a first differential input and a second differential input including: a first node connected to the first differential output; a first transistor connected in series with a first resistor, wherein the series connected first transistor and first resistor are connected between a source voltage and the first node; a second transistor connected in series with a second resistor, wherein the series connected second transistor and second resistor are connected between the first node and a ground; a second node connected to the second differential output; a third transistor connected in series with the first resistor, wherein the series connected third transistor and first resistor are connected between the source voltage and the second node; a fourth transistor connected in series with the second resistor, wherein the series connected fourth transistor and second resistor are connected between the second node and the ground; a first differential input connected to the gate of the first transistor and the gate of the fourth transistor; and a second differential input connected to the gate of the second transistor and the gate of the third transistor, wherein the first transistor, second transistor, third transistor, and fourth transistor are NMOS transistors.
Various embodiments are described, wherein when the first differential input is logic 1 and the second differential input is logic 0, the first transistor and fourth transistor are switched on and the second transistor and the third transistor are turned off and the first output is pulled up to the source voltage and the second output is pulled down to the ground.
Various embodiments are described, wherein when the first differential input is logic 0 and the second differential input is logic 1, the first transistor and fourth transistor are switched off and the second transistor and the third transistor are turned on and the first output is pulled down to the ground and the second output is pulled up to the source voltage.
In order to better understand various exemplary embodiments, reference is made to the accompanying drawings, wherein:
To facilitate understanding, identical reference numerals have been used to designate elements having substantially the same or similar structure and/or substantially the same or similar function.
The description and drawings illustrate the principles of the invention. It will thus be appreciated that those skilled in the art will be able to devise various arrangements that, although not explicitly described or shown herein, embody the principles of the invention and are included within its scope. Furthermore, all examples recited herein are principally intended expressly to be for pedagogical purposes to aid the reader in understanding the principles of the invention and the concepts contributed by the inventor(s) to furthering the art and are to be construed as being without limitation to such specifically recited examples and conditions. Additionally, the term, “or,” as used herein, refers to a non-exclusive or (i.e., and/or), unless otherwise indicated (e.g., “or else” or “or in the alternative”). Also, the various embodiments described herein are not necessarily mutually exclusive, as some embodiments can be combined with one or more other embodiments to form new embodiments.
The embedded USB2 (eUSB2) specification is a supplement to the USB2.0 specification that addresses issues related to interface controller integration with advanced system-on-chip (SoC) process nodes by enabling USB2.0 interfaces to operate at I/O voltages of 1V or 1.2V instead of 3.3V. eUSB2 can enable smaller, more power-efficient SoCs, in turn enabling process nodes to continue to scale while increasing performance in applications such as smartphones, tablets and notebooks.
As applications like smartphones and tablets continue to pack more and more components into smaller form factors, it is essential that interfaces shrink as well. However, the continued shrinking of SoC node size has led to a thinner gate oxide that can only support lower voltages. For devices relying on USB2.0 interfaces, this trend can lead to complicated design challenges for advanced process nodes.
When process nodes reach 7 nm, quantum effects begin impacting high-signaling-voltage inputs/outputs (IOs) such as 3.3V and can no longer be easily supported. Many device-to-device interfaces already support low signaling voltages, but USB2.0 still requires a 3.3V I/O voltage to operate.
USB2.0 has been the most successful wired interface in the past 20 years, and almost all SoCs today are equipped with the USB2.0 interface. USB standards evolution kept the original 3.3V I/O USB 1.0 interface intact for backward compatibility, helping enable wider adoption and a larger ecosystem while also preserving device interoperability.
As process nodes approach smaller features (e.g. 5 nm), the manufacturing cost to maintain USB2.0 3.3V I/O signaling has grown exponentially. eUSB2 addresses the I/O voltage gap as a physical layer supplement to the USB2.0 specification so that designers can integrate the eUSB2 interface at the device level while leveraging and reusing the USB2.0 interface at the system level.
eUSB2 can support onboard inter-device connectivity through direct connections as well as exposed connector interfaces through an eUSB2-to-USB2.0/USB2-to-eUSB2 repeater, to perform level shifting
While USB2.0 can continue to be integrated into SoCs with process features of 7 nm and above, eUSB2 is a good fit for SoCs when process features are 5 nm and below. eUSB2 can also be integrated into other devices to easily interconnect with SoCs as a device-to-device interface. USB2.0 will continue serving as the standard connector interface.
eUSB2 allows significant I/O power reduction and improves power efficiency, while enabling process features to continue to scale.
A USB2 to eUSB2 repeater includes a USB2 port and an eUSB2 port. Bidirectional traffic may be carried by the repeater include low speed (LS), full speed (FS), and high speed (HS) traffic. The repeater may have different voltage domains that serve the different ports. For example, a 1.8V source may be used to power the circuits related to the eUSB2 port, and a 3.3V source may be used to power the circuits related to the USB2 port. Each of the USB2 pins faces ˜3.6V voltage in LS/FS mode and<1.1V signal in HS mode (0.44V in functional mode and<1.1V in chirp mode), so it is assumed that the maximum signal in each of the USB2 pins during the HS-RX mode will be 1.1V).
The equalizer 122 removes most of the inter-symbol interference (ISI) that is introduced by the transmission channel at its input. The gain stages 124 make a (non-linear) hard decision and makes the equalized signal high or low. That avoids propagation of amplitude noise and allows regeneration of pre-emphasis but turns residual ISI into non-equalizable timing jitter.
The high-speed path 100 may practically be considered for a USB2/eUSB high-speed repeater. The high-speed path 100 illustrates a TX driver 126, but de-emphasis may be added to TX driver 126 as well.
The standard eUSB voltage swing according to the high-speed transmitter DC specification is 400 mV (±10%) that is relatively low swing compared to existing supply voltage (VDD=1.8 V).
Embodiments of a low-swing high-speed voltage mode TX driver featuring an all NMOS design together with resistors for impedance control will be described. The transmitter works in a voltage-mode, which pulls-up or pulls-down signal nets towards a local supply net or a local ground net. NMOS switch devices are used for either pull-up or pull-down operations, controlled by the input signal. Output impedances of the pull-up or pull-down paths are controlled by explicit resistor instances that are in serial to the NMOS switches. Such a configuration simplifies the transmitter design by avoiding additional control loops to regulate switch resistances.
The TX driver embodiments described herein are proposed for an eUSB application, but they may be generalized for any low swing voltage mode transmitter. The TX driver embodiments described herein have the following benefits: use only NMOS transistors for voltage mode TX driver; good for high-speed applications because only NMOS transistors are used (i.e., smaller size compared to a NMOS+PMOS transistor version, less parasitic capacitors, etc.); less area consumed due to avoiding PMOS switches; good for implementing the eUSB standard (and any other voltage mode standard); better matching and equally less variation for the output impedance; less swing variation over process/voltage/temperature (PVT) due to improved matching;
The TX driver embodiments described herein reduce the need for PMOS transistors in a voltage-mode driver (with or without de-emphasis). The TX driver embodiments described herein also is suitable for high-speed applications.
The differences between voltage mode and current mode TX drivers will now be described. Signal integrity considerations (e.g., minimum reflections) require 40Ω driver output impedance (for eUSB but this may vary for different standard as was mentioned above).
Differential termination current mode current levels will first be described.
V
d,+=(I/4)(2R);
V
d,−=−(I/4)(2R);
Vd,pp=IR; and
Differential termination voltage mode current levels will next be described.
V
d,+=(Vs/2);
V
d,−=−(Vs/2);
Vd,pp=Vs; and
Table 1 shows relative current consumption of single ended and fully differential current mode and voltage mode TX driver.
An ideal voltage-mode driver with differential RX termination enables a potential 4×reduction in TX driver current. Actual TX driver power levels also depend on output impedance control, pre-driver power, and equalization implementation.
Low swing and high swing voltage mode TX drivers will now be described.
The voltage-mode driver implementation depends on output swing requirements. For low-swing (<400-500 mVpp), an all NMOS driver is suitable, while for high-swing, a driver with both PMOS and NMOS transistors is used.
For the low swing embodiment with differential termination:
For the high swing embodiment with differential termination:
V
S
>|V
t1
|+V
OD1.
VS is the supply voltage which is twice of the final swing of the differential voltage mode driver. Vt1 is the threshold voltage of the transistors, and VOD1 is the overdrive voltage of the transistors (VOD1=VG−Vt1).
To get an equal Ron for a PMOS switch, its size should be approximately 2.5-3 times of size of a NMOS switch (depending on the technology/process node). This means that the resulting parasitic capacitances will also be greater which will greatly reduce the speed of the driver.
In the voltage mode TX driver, because Ron of the switch will be added to the Rout, its variation will be added to range of Rout. Considering different variations for PMOS and NMOS transistors, a wider Rout range will be expected which will be reduced by using an NMOS only solution. Due to limited swing of the output, using NMOS switches in the top and bottom sides of the TX driver seems to be a better solution which is a key point of the embodiments described herein.
Various embodiments of all NMOS voltage mode TX drivers will now be described.
A transmitter in real applications usually includes multiple unit cells as shown in
In the TX driver 1000 of
The all NMOS TX drivers described herein may be used for a low-swing high speed voltage mode TX driver using an all NMOS design together with resistors for impedance control. The use of the resistors control the output impedances of the pull-up or pull-down path, so that additional control loops are not needed to regulate switch resistances. The TX drivers described herein may be used in various low swing voltage mode applications.
It should be appreciated by those skilled in the art that any block diagrams herein represent conceptual views of illustrative circuitry embodying the principles of the invention.
Although the various exemplary embodiments have been described in detail with particular reference to certain exemplary aspects thereof, it should be understood that the invention is capable of other embodiments and its details are capable of modifications in various obvious respects. As is readily apparent to those skilled in the art, variations and modifications can be affected while remaining within the spirit and scope of the invention. Accordingly, the foregoing disclosure, description, and figures are for illustrative purposes only and do not in any way limit the invention, which is defined only by the claims.