Claims
- 1. A semiconductor memory lookup table comprising:J memory locations, each said memory location corresponding to an input data word in a range of M consecutive input words; output words stored in each of said J memory locations, said output words each comprised of N binary bits representing the sum of: a first component representing a function of said range of input words, wherein contiguous sub-ranges of said range of input words translate to an identical N-bit binary output word; and a second component representing an error between said first component and a desired value.
- 2. The semiconductor memory lookup table of claim 1, wherein said second component represents an accumulated error signal.
- 3. The semiconductor memory lookup table of claim 1, wherein said second component represents an accumulated error signal determined by summing said N-bit binary output words over a range from word K to word L, determining a difference between said sum with a sum of the desired output function over the range K to L+1, and assigning said difference to output word L+1.
- 4. The semiconductor memory lookup table of claim 1, wherein said second component is determined by an accumulated error signal for each output word in a contiguous sub-range of common output words, said accumulated error signal equal to:ACCI=ACCI−1+(I−1)/RPC whereRPC is said number of consecutive input words that translate to a common output word in each of said regions; and I is a location of said output word in said region; and when said accumulated error signal is greater than one, said second component is equal to one and one is subtracted from said accumulated error signal, if said accumulated error signal is not greater than one, said second component is equal to zero.
- 5. The semiconductor memory lookup table of claim 1, wherein said function is a degamma curve.
- 6. The semiconductor memory lookup table of claim 1, wherein said function is monotonic.
- 7. The semiconductor memory lookup table of claim 1, wherein said error is due to truncation of said output word.
- 8. A semiconductor memory lookup table comprising:J memory locations, each said memory location corresponding to an input data word in a range of M input words; outputs words stored in each of said J memory locations, said output words having a value representative of a function of said range of input words, wherein contiguous sub-ranges of said range of M input words translate to a common output word, at least a first of said sub-ranges abutting a second of said sub-ranges at a transition point, wherein said value of at least one said output word in said first of said sub-ranges is exchanged with said value of at least one said output word in said second of said sub-ranges.
- 9. The semiconductor memory lookup table of claim 8, wherein said value of said output word immediately prior to said transition point is exchanged with said value of said output word immediately following said transition point.
- 10. The semiconductor memory lookup table of claim 8, wherein said value of said output word two output words prior to said transition point is exchanged with said value of said output word two output words following said transition point.
- 11. The semiconductor memory lookup table of claim 8, wherein said function is monotonic.
Parent Case Info
This application is a Divisional of application Ser. No. 08/788,141 filed Jan. 24, 1997, now U.S. Pat. No. 6,052,491 issued Apr. 18, 2000, which claims priority under 35 U.S.C. §119(e)(1) of Provisional application No. 60/010,645 filed Jan. 26, 1996, now abandoned.
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Provisional Applications (1)
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