Cutting elements, as for example cutting elements used in rock bits or other cutting tools, typically have a body (i.e., a substrate), which has an interface end or surface. An ultra hard material layer is bonded to the interface surface of the substrate by a sintering process to form a cutting layer, i.e., the layer of the cutting element that is used for cutting. The substrate is generally made from a tungsten carbide-cobalt alloy (sometimes referred to simply as “cemented tungsten carbide,” “tungsten carbide” “or carbide”). The ultra hard material layer is a polycrystalline ultra hard material, such as polycrystalline diamond (“PCD”), polycrystalline cubic boron nitride (“PCBN”) or a thermally stable product (“TSP”) material such as thermally stable polycrystalline diamond.
Cemented tungsten carbide is formed by carbide particles being dispensed in a cobalt matrix, i.e., tungsten carbide particles are cemented together with cobalt. To form the substrate, tungsten carbide particles and cobalt are mixed together and then heated to solidify. To form a cutting element having an ultra hard material layer such as a PCD or PCBN ultra hard material layer, diamond or cubic boron nitride (“CBN”) crystals are placed adjacent the cemented tungsten carbide body in a refractory metal enclosure (e.g., a niobium enclosure) and subjected to high temperature and high pressure so that inter-crystalline bonding between the diamond or CBN crystals occurs, forming a polycrystalline ultra hard diamond or CBN layer. Cobalt from the tungsten carbide substrate infiltrates the diamond or CBN crystals and acts as a catalyst in forming the PCD or PCBN. A catalyst material may also be added to the diamond or CBN particles to assist in inter-crystalline bonding. The process of high temperature heating under high pressure is known as high temperature high pressure sintering process (“HTHP” sintering process). Metals such as cobalt, iron, nickel, manganese and alike and alloys of these metals have been used as a catalyst matrix material for the diamond or CBN.
In some instances, the substrate may be fully cured. In other instances, the substrate may be not fully cured, i.e., it may be green. In such case, the substrate may fully cure during the HTHP sintering process. In other embodiments, the substrate may be in powder form and may solidify during the sintering process used to sinter the ultra hard material layer.
TSP is typically formed by “leaching” the catalyst (such as the cobalt) from the polycrystalline diamond. This type of TSP material is sometimes referred to as a “thermally enhanced” material. When formed, polycrystalline diamond comprises individual diamond crystals that are interconnected defining a network structure. A cobalt binder phase (i.e., the catalyst) is found within interstitial spaces in the diamond network, between the bonded diamond crystals. Cobalt has a significantly different coefficient of thermal expansion as compared to diamond, and as such, upon heating and/or cooling of the polycrystalline diamond during use, the cobalt expands, causing cracks to form in the diamond network, resulting in the deterioration of the polycrystalline diamond layer. In addition, during use, the catalyzing effect of the cobalt can cause graphitization in the interstices of the diamond network, which deteriorates the diamond. By removing, i.e., by leaching, the cobalt from the diamond network structure, the polycrystalline diamond layer becomes more heat resistant. In another exemplary embodiment, TSP material is formed by forming polycrystalline diamond with a thermally compatible silicon carbide binder instead of cobalt. “TSP” as used herein refers to either of the aforementioned types of TSP materials.
To reduce the residual stresses created at the interface between the substrate and the ultra-hard layer, prior art interface surfaces on substrates have been formed having a plurality of projecting spaced apart concentric annular rings, such as annular ring 5 shown in
Common problems that plague cutting elements are chipping, spalling, partial fracturing, cracking and/or exfoliation of the ultra hard material layer. Another frequent problem is cracking on the interface between the ultra hard material layer and the substrate and the propagation of the crack across the interface surface. These problems result in the early failure of the ultra hard material layer and thus in a shorter operating life for the cutting element. Accordingly, there is a need for a cutting element having an ultra hard material layer with improved cracking, chipping, fracturing and exfoliating characteristics, and thereby having an enhanced operating life.
In an embodiment, a cutting element is provided, including a substrate and an ultra-hard material layer formed over the substrate. At one end of the substrate is an interface surface that interfaces with the ultra-hard material layer. The ultra-hard layer is bonded to the substrate at this interface surface. The interface surface includes a first or outer annular section that extends to the peripheral edge of the substrate, and a second or inner section that is radially inside the first section. The interface surface includes several spaced-apart projections arranged in an annular row. In one embodiment, the projections extend from the first section to the second section, spanning across the intersection of these two sections. In another embodiment, a majority of the projections are wholly located within the second section. In yet another embodiment, each of the projections are located wholly within the second section. The annular row is disposed in a circular path around the central longitudinal axis of the substrate. The projection has an upper surface that defines a groove bisecting the projection. The groove extends from one end of the projection to the other. The groove may be curved to follow the circumference of the interface surface, or it may be straight. The groove extends all the way across the projection and thus has open ends at opposite ends of the projection. In another embodiment, the groove extends in a radial direction across the projection. The interface surface may include a bridge coupling adjacent projections. The groove and the bridge interrupt stress fields that form in the substrate and ultra-hard material and reduce the magnitude of the residual stresses. The interface surface may include both the bridge and the groove, or one without the other.
In an exemplary embodiment, a cutting element includes a substrate having a periphery and an interface surface having a radial direction and a circumferential direction, and an ultra hard material layer formed over the substrate and having an interface surface having a radial direction and a circumferential direction. One of the interface surface of the substrate or the interface surface of the ultra hard material layer includes a first annular section comprising an outer band, a second section located radially inwardly of the first annular section, and a plurality of spaced-apart projections arranged in an annular row and located radially inward of the outer band. A groove bisects an upper surface of each projection, and/or a bridge couples adjacent projections.
In another exemplary embodiment, a cutting element includes a substrate having a periphery and an interface surface having a radial direction and a circumferential direction, and an ultra hard material layer formed over the substrate and interfacing with the interface surface. The interface surface includes a first annular section extending to the periphery of the substrate and having a non-planar outer band having repeating hills and valleys (wave-like surface), and a second section located radially inward of the first annular section. A plurality of spaced-apart projections are arranged in an annular row and located radially inwardly of the outer band. Each projection has a groove bisecting the projection, and each projection is tapered such that it narrows radially inwardly. The groove extends in a circumferential direction, and the center of curvature of the groove is the same as the center of curvature of a circumference of the substrate at the radial position of the groove.
In a further embodiment, a bit is provided incorporating any of the aforementioned cutting elements.
In order to improve the resistance to cracking, chipping, fracturing, and exfoliating of cutting elements, Applicants have invented cutting elements having an interface between the ultra hard material layer and the substrate, the interface having unique geometries that improve such resistance.
In the exemplary embodiments described herein, the interface surface is described as being formed on the substrate which interfaces with the ultra hard material layer. It should be understood that a negative or reversal of this interface surface is formed on the ultra hard material layer interfacing with the substrate. Additionally, when projections or depressions are described as being formed on the substrate surface, it should be understood that in other exemplary embodiments they could be formed instead on the surface of the ultra-hard material layer that interfaces with the substrate interface surface, with the inverse features formed on the substrate.
The term “substrate” as used herein means any substrate over which the ultra hard material layer is formed. For example, a “substrate” as used herein may be a transition layer formed over another substrate. The terms “upper,” “lower,” and other similar terms are relative terms used to denote the relative position between two objects, and not the exact position of such objects. Like reference numbers are used to identify like features. Additionally, as used herein, the terms “radial” and “circumferential” and like terms are not meant to limit the feature being described to a perfect circle.
In an embodiment as shown in
A perspective view of the substrate 12 is shown in
The interface surface 20 includes several spaced-apart projections 30 arranged in an annular row 32. The projections 30 straddle the first section 26 and the second section 28, spanning across the intersection of these two sections. The projections 30 are located radially inside an outer band 34, which is at the radially outer portion of the first section 26. That is, the outer band 34 extends from the projections 30 to the peripheral edge 24. In the embodiment shown, the annular row 32 is disposed in a circular path around a central longitudinal axis 36 of the substrate 12. However, the invention is not limited to this geometry, as, for example, the annular row 32 may be elliptical or asymmetrical, or may be offset from the axis 36. The annular row 32 in
An end view of one of the projections 30 taken along a diameter plane is shown in
The groove 40 may be curved to follow the circumference at its radial position, so that, together, the grooves 40 in each of the spaced-apart projections 30 outline a dashed circle. That is, the groove may have the same center of curvature as the circumference at the radial position of the groove. Alternatively, the groove 40 may have a curvature that is different than the curvature of the circumference at the radial position of the groove 40; that is, the groove 40 may curve more or less than the circumference of the surface 20 where the groove is located or may have a different center of curvature. Alternatively, the groove 40 may be straight, with the center of the groove extending at an angle (such as a 90° angle) to a radius of the substrate. The groove extends all the way across the projection and thus has open ends 40a, 40b at opposite ends of the projection. The open ends of the groove open into the space 42 between projections 30 (
As shown in
In an exemplary embodiment, the width of the groove Wg (see
Referring again to
The groove 40 affects the stress distributions in the cutting element 10 and improves the cutting element's resistance to crack growth, in particular, crack growth along the interface surface 20. As discussed above, the substrate 12 and ultra-hard material layer 14 have different coefficients of thermal expansion, which can cause stresses to generate along the interface surface 20 when the cutting element is cooled after HTHP sintering and when the cutting element is in use. Tensile, compressive, shear, and other stresses cause cracks to form and grow within the stress fields in the substrate as well as in the ultra-hard material and on the interface.
As shown in
Also, the pocket of compressive stress above the groove 40 arrests crack growth across the tensile stress zones above projections 30a, 30b. If a crack forms along the interface surface and grows radially under either the tensile or compressive stresses, the crack growth will slow or stop when it reaches an adjacent section with the opposite type of stress. For example, if a crack grows radially along one of the tensile regions above projection 30a, crack growth will be arrested when it reaches the area of compressive stress 49 above the groove 40.
The groove 40 with its open ends 40a, 40b, provides a gradual interruption of the stress field above the projection 30. As the groove 40 opens up into the space 42 between projections 30, at the open ends 40a, 40b of the groove (
A depression 46 within the space 42 is formed in the outer band 34 radially outside of the projections 30. The depression 46 interrupts the hoop stresses that may form around the annular outer band 34 and thus acts to arrest crack growth circumferentially around this band 34. In
The interface surface 20 may include a central projection 48 inside the annular row 32, located in the second section 28. The central projection 48 can take many shapes, such as elliptical, circular, or polygonal. In
In
Another exemplary embodiment of a substrate and interface surface is shown in
Another exemplary embodiment of a substrate and interface surface is shown in
In this embodiment, each projection 330 of the outer-most or first annular row 332 has a curving top surface 338 that forms a groove 360 in the top of the projection. The groove 360 is straight and extends in a radial direction. As shown in the side view of
In one embodiment, the projections 330 in the radial outermost row have a sloping top surface, as shown in
The projections 330 of the first annular row in
The projections 356 in the second or intermediate row 352 are positioned to radially align with the spaces 342 between the first projections 330 in the first row 332. Each projection 356 is equidistant from the two adjacent projections 330 in the first row. The second row 352 includes the same number of projections as the first row 332. In the shown exemplary embodiment, the projections 356 in the second row 352 are smaller than the projections 330 in the first row and are inverted or reversed; that is, they are tapered in the reverse direction as the first projections 330, tapering radially outwardly to a more narrow (lesser) width than the radially inward width. As such, the second projections 356 project toward the spaces 342 between the tapered first projections 330 to provide an even distribution of spaces and projections. In an exemplary embodiment, the projections 356 are generally flat on top, without sloping as the projections 330 in the outer row slope. In the shown exemplary embodiment, the projections 352 are triangular in plan view. The projections and spaces are staggered, with projections in one row overlapping spaces in the next row, and vice versa. This staggered or mis-aligned distribution of three-dimensional features at the interface helps to distribute the compressive and tensile stresses and reduce the magnitude of the stress fields and arrest crack growth by preventing an uninterrupted path for crack growth.
The projections 358 in the third or inner annular row 354 are tapered in the reverse direction as the second projections 356. The third projections 358 narrow (decrease in width) radially inwardly. In this embodiment, the third row 354 contains fewer projections than does the second row 352. However, in other embodiments, the size of these third projections 358 may be reduced further in order to provide the same number of projections in this row, with each projection aligned with the spaces between the projections in the second row. The size (including length, width, and height) of the projections in an inner row may be at most 60% of the size of the projections in the adjacent outer row.
In an exemplary embodiment, the height of the projections in each subsequent row decreases moving radially inwardly. That is, the maximum height of the radially-outermost first projections 330 is greater than the height of the second projections 356, which is greater than the height of the radially-innermost third projections 358. The central projection 348 inside the third row 354 has a height that is less than the height of the third projections 358. This arrangement can be used on a domed interface surface, where the surface 320, without any projections on it, has a domed shape. The projections vary in height as just described so that the top of the projections in the various rows are in approximately the same plane. The central projection 348 is the shortest, as it is at the top of the dome. The projections 330 at the outermost row are the tallest, although they may be sloped down toward their outer end 331, as described above. The domed interface surface further reduces the residual stresses between the diamond and substrate layers.
Another exemplary embodiment of a substrate and interface surface is shown in
Two annular rows of spaced-apart projections are located within the inner section 428. The first or outer row 432 includes projections 430 having grooves 440, and the second inner row 464 includes projections 466 having grooves 440. Projections 430 and 466 include circumferentially extending grooves 440 extending from one end of the projection to the other.
The projections 466 in the second row 464 have inverted or reversed radial and circumferential dimensions compared to the projections 430 in the first row 432. That is, the first projections 430 have a length in the circumferential direction that is longer (greater) than their length in the radial direction, and the second projections 466 have a length in the circumferential direction that is shorter (lesser) than their radial length. The projections in the second row do not necessarily have the same proportions as those in the first row. As in
In this embodiment, the interface surface 420 includes an annular band 470 radially inside the second row 464 of projections 466. This annular band 470 has a wavy outer edge 472. The wavy edge 472 interrupts stress fields in that region by creating small, alternating compressive and tensile stress regions. A central projection 448 is located radially inside the annular band 470, and is divided from the annular band by an annular groove 474. This central projection creates an area of tensile stress above the projection, interrupting the stress fields at the center of the interface surface, inside the annular rows of projections.
The number and arrangement of projections in each row can vary, as shown in
Another exemplary embodiment of a substrate and interface surface is shown in
The wave is formed in the outer band 834 radially outside of the projections 830. The projections 830 have a height that is higher (greater) than the hills 876 in the wave. Additionally, the projections are located in an inner section 828 that is raised above the band 834. A step 862, which may be curved, connects the outer band 834 and the inner section 828.
Another embodiment of a substrate and interface surface is shown in
The bridge 980 reduces stresses between the projections 930, reducing the difference in magnitude between the adjacent compressive and tensile stress fields. That is, as shown in
An interface surface with these saddle-shaped bridges is particularly suited for high pressure/high-density diamond in the ultra-hard material layer. Stresses can be more pronounced in ultra-hard material layers that have a high diamond volume content, because this material has a low thermal expansion, and the difference in expansion between the ultra-hard layer and the substrate is higher in magnitude, as compared to lower-diamond-density layers. Accordingly, the residual stresses in these layers can be higher, and thus the bridge 980 is provided to balance the stresses and provide smoother transitions between stress regions. Initial testing of high diamond volume fraction cutting elements having the interface surface shown in
Referring again to
The interface surface 920 includes a second or intermediate annular row 952 of spaced-apart projections 956, located radially inside the first row 932, and a third or inner annular row 954 of projections 958 located radially inside the second row 952. The projections in the second and third rows may also be connected by bridges 980, as in the first row 932. The bridges in these rows also take on a saddle-shape, extending concave circumferentially and convex radially. The bridges in these inner rows are optional.
A central projection 948 may be located radially inside the third row 954, and it may include an outer rim 982 with a wavy outer surface. As discussed previously, the central projection 948 interrupts the stresses inside the inner row of projections.
The bridge described above with respect to
Although the present invention has been described and illustrated in respect to exemplary embodiments, it is to be understood that it is not to be so limited, since changes and modifications may be made therein which are within the full intended scope of the this invention. For example, the substrate described herein has been identified by way of example. It should be understood that the ultra-hard material may be attached to other carbide substrates besides tungsten carbide substrates, such as substrates made of carbides of W, Ti, Mo, Nb, V, Hf, Ta, and Cr.
This application claims priority to U.S. Provisional Application No. 61/234,535, filed on Aug. 17, 2009, which is hereby incorporated by reference in its entirety.
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