BRIEF DESCRIPTION OF THE DRAWINGS
The present invention will become readily apparent to those of ordinary skill in the art when descriptions of exemplary embodiments thereof are read with reference to the accompanying drawings.
FIG. 1 is a flowchart illustrating an offset frequency estimation method according to an exemplary embodiment of the present invention.
FIG. 2 is a block diagram of an offset frequency estimation apparatus according to an exemplary embodiment of the present invention.
FIGS. 3A and 3B are flowcharts illustrating detection of received samples performed in the method of FIG. 1.
FIG. 4 is a diagram showing a result obtained by detecting phases of received samples as illustrated in FIGS. 1 and 2.
FIG. 5 is a diagram showing a result obtained by estimating a temporary offset frequency and an initial phase as illustrated in FIGS. 1 and 2.
FIG. 6 is a diagram showing differences between estimated phases and detected phases in the method and apparatus illustrated in FIGS. 1 and 2, respectively.
FIG. 7 is a detailed flowchart illustrating an estimation of a final offset frequency as performed in the method of FIG. 1.
FIG, 8 is a diagram showing error values of received samples of the apparatus or method illustrated in FIGS. 2 or 7, respectively.
FIG. 9 is a diagram showing error values obtained using the apparatus or method illustrated in FIGS. 2 or 7, respectively, arranged in magnitude order.
FIG. 10 is a diagram showing a final offset frequency obtained using the method or apparatus illustrated in FIGS. 1 or 2, respectively.
FIG. 11 is a diagram showing a final offset frequency obtained using the method or apparatus illustrated in FIGS. 1 or 2, respectively.
FIG. 12 is a diagram showing a mean value of the final offset frequency obtained using the method or apparatus illustrated in FIGS. 1 or 2, respectively.
FIG. 13 is a diagram showing a standard deviation of the final offset frequency obtained using the method or apparatus illustrated in FIGS. 1 or 2, respectively.
DESCRIPTION OF EXEMPLARY EMBODIMENTS
Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. Like reference numerals refer to similar or identical elements throughout the description of the figures.
FIG. 1 is a flowchart illustrating an offset frequency estimation method 100 according to an exemplary embodiment of the present invention.
Referring to FIG. 1, the offset frequency estimation method 100 includes receiving complex samples in step S110, detecting phases of the received samples in step S120, estimating a temporary offset frequency and an initial phase from the detected phases of the received samples using a linear regression analysis method in step S130, and estimating a final offset frequency by skipping error samples detected by the temporary offset frequency and the initial phase in step S140.
The linear regression analysis method may be, for example, a least squares method.
FIG. 2 is a block diagram of an offset frequency estimation apparatus 200 according to an exemplary embodiment of the present invention.
Referring to FIG. 2, the offset frequency estimation apparatus 200 includes a receiver 210, a phase detector 220, a first estimator 230, and a second estimator 240.
Hereinafter, offset frequency estimation operations will be described in detail with reference to FIGS. 1 and 2. Referring to FIGS. 1 and 2, in step S110, the receiver 210 receives complex samples SAM. The received samples SAM are given by Equation 1.
In step S120, the phase detector 220 detects the phases phasei of the received samples SAM, where phasei denotes a detected phase of a received sample i. To detect the phases phasei of the received samples SAM, the phase detector 220 includes a conjugate unit 222, a multiplier 224, and a detector 226.
FIGS. 3A and 38 are flowcharts illustrating step S120 of FIG. 1.
Referring to FIGS. 2 and 3A, in step S121, the conjugate unit 222 generates a first value by conjugating a reference sample REF. In step S122, the multiplier 224 generates a second value by multiplying the first value by the received samples SAM. In step S123, the detector 226 obtains the phase phasei of the received samples SAM using the second value.
A method of detecting the phase phasei of the received samples SAM is given by Equations 2 and 3. The phase phasei of the received samples SAM may have the value ωt+φ+ε according to Equation 3. The phase phasei of the received samples SAM is called a detected phase phasei.
The reference sample REF is a signal that does not contain a noise component generated in a transmission/reception process of the received samples SAM. The reference sample REF can be obtained by equalizing and filtering the received sample SAM. A signal pre-set in transmission and reception systems can also be used as the reference sample REF.
Referring to FIGS. 2 and 38, in step S126, the conjugate unit 222 generates a third value by conjugating the received samples SAM. In step S127, the multiplier 224 generates a fourth value by multiplying the first value by the reference sample REF. In step S128, the detector 226 obtains the phase phasei of the received samples SAM using the fourth value.
The phase phasei of the received samples SAM is obtained by Equation 3 even if the reference sample REF or the received samples SAM are conjugated. However, for the convenience of description, FIG. 2 illustrates that the reference sample REF is conjugated.
FIG. 4 is a diagram showing a result obtained by detecting the phases phasei of the received samples SAM using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively. Referring to FIG. 4, the phases phasei of the received samples SAM are shown as dots. As shown in FIG. 4, the received samples SAM having the detected phases phasei are within a predetermined range. In addition, FIG. 4 shows received samples SAM having detected phases that are significantly different from the detected phases phasei within the predetermined range.
Referring back to FIGS. 1 and 2, in step S130, the first estimator 230 estimates a temporary offset frequency {circumflex over (ω)} and an initial phase {circumflex over (φ)} from the phases phasei of the received samples SAM using the linear regression analysis method, such as for example, a least squares method. The initial phase {circumflex over (φ)} is a phase difference between transmission and reception systems, which is generated as a result of synchronization mismatching between the transmission and reception of the received samples SAM.
The temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)} may be estimated using Equations 5 through 7.
phasei=ω·i+φ (5)
Here, ω and φ denote an actual offset frequency and an actual initial phase, respectively, existing in the transmission and reception systems, and phasei denotes a detected phase of a received sample i. Values of the detected phases phasei are obtained as illustrated in FIG. 4, and thus a process of estimating ω and φ is needed.
A process of estimating ω and φ using the least squares method will now be described. In particular, 142 received samples SAM are used to describe the estimation of ω and φ.
The X and Y matrices of Equation 6 are used in the least squares method.
The temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)} of Equation 7 are estimated using the least squares method from the X and Y matrices of Equation 6, Since the least squares method is understood by those of ordinary skill in the art, detailed description of the least squares method is omitted in the interests of simplicity. Unlike conventional offset frequency estimation, the offset frequency estimation method and apparatus according to exemplary embodiments of the present invention can prevent incorrect offset frequency estimation by estimating an offset frequency and an initial phase.
For example, when the received samples SAM illustrated in FIG. 4 are received the temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)} are estimated as 0.0017 and −0.0952, respectively, using the least squares method,
Inverting the estimated temporary offset frequency {circumflex over (ω)} and initial phase {circumflex over (φ)}, an estimated phase of each received sample SAM can be obtained. The estimated phase of each received sample SAM can be obtained using Equation 8.
phasei={circumflex over (ω)}·i+{circumflex over (φ)} (8)
Each estimated phase is obtained using the linear regression analysis method in which the temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)} are used as parameters. Hereinafter, the estimated phase is denoted as phaseest to differentiate it from the detected phase phasei of the received sample i of Equation 5.
FIG. 5 is a diagram showing a result obtained by estimating the temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)} using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively. Referring to FIG. 5, the estimated phase phaseest of each received sample SAM is located on a line A having a slope which is the temporary offset frequency {circumflex over (ω)} and an initial y-axis value of the initial phase {circumflex over (φ)}.
FIG. 6 is a diagram showing differences between estimated phases and detected phases obtained using the method or apparatus described in connection with FIG. 1 or FIG. 2 respectively, FIG. 6 shows differences d1, d2, and d3 between detected phases phasei and estimated phases phaseest located on the line A having a slope which is the temporary offset frequency {circumflex over (ω)} and an initial y-axis value of the initial phase {circumflex over (φ)}. A received sample SAM, which has a difference between an estimated phase phaseest and a detected phase phasei greater than a predetermined value, is called an error sample.
Referring to FIGS. 1 and 2, in step S140, the second estimator 240 estimates a final offset frequency {circumflex over (ω)}tmp by skipping error samples detected by the temporary offset frequency {circumflex over (ω)} and the initial phase {circumflex over (φ)}.
That is, according to an exemplary embodiment of the present inventions in step S140, the final offset frequency {circumflex over (ω)}tmp is estimated from detected phases phasei of received samples SAM excluding error samples among the received samples SAM using the least squares method. The second estimator 240 may include an error value calculator 242, a setting unit 246,, and an estimator 248 to estimate the final offset frequency {circumflex over (ω)}tmp.
FIG. 7 is a flowchart illustrating the step S140 of FIG. 1.
Referring to FIGS. 2 and 7, in step S141, the error value calculator 242 calculates error values indicating differences between the detected phases phasei and the estimated phases phaseest. The error values may be the absolute values of these differences.
FIG. 8 is a diagram showing the error values of the received samples SAM of the apparatus or method illustrated in FIG. 2 or 7. FIG. 8 shows the error values {circle around (1)} through {circle around (5)} of the received samples SAM numbered in order of magnitude.
Referring again to FIGS. 2 and 7, the second estimator 240 may include a reordering unit 244. In step S142, the reordering unit 244 arranges the received samples SAM by the order of magnitude of the error values. FIG. 9 is a diagram showing the error values obtained using the apparatus or method described in connection with FIG. 2 or FIG. 7, respectively, arranged by the order of magnitude.
In step S143, the setting unit 246 sets received samples SAM having an error value greater than a predetermined value among the received samples SAM as the error samples. The predetermined value can be set according to the number of error samples to be skipped. In an exemplary embodiment of the present invention, incorrect offset frequency estimation can be prevented by setting an appropriate number of error samples to be skipped.
In step S144, the estimator 248 estimates the final offset frequency {circumflex over (ω)}tmp using the detected phases phasei of the received samples SAM excluding the error samples. The final offset frequency {circumflex over (ω)}tmp may be estimated using the least squares method as described above.
A method of obtaining the final offset frequency {circumflex over (ω)}tmp using the detected phases phasei of the received samples SAM excluding the error samples may include using the Equations 5 through 7 used to obtain the temporary offset frequency {circumflex over (ω)} of the received samples SAM. However, in accordance with an exemplary embodiment of the present invention, the final off set frequency {circumflex over (ω)}tmp that is closer to an actual offset frequency can be obtained by skipping the error samples.
The final offset frequency {circumflex over (ω)}tmp may be obtained using Equation 9.
Here, n denotes the number of error samples to be skipped, and {.} denotes an index of the error samples to be skipped.
FIG. 10 is a diagram showing the final offset frequency {circumflex over (ω)}tmp obtained using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively.
Referring to FIG. 10, the offset frequency estimation method and S apparatus according to the embodiments of the present invention estimates the final offset frequency {circumflex over (ω)}tmp by skipping received samples {circle around (1)} through {circle around (5)} by the order of magnitude of the error samples. A line B has a slope of the final offset frequency {circumflex over (ω)}tmp.
FIG. 11 is a diagram showing a final offset frequency {circumflex over (ω)}tmp obtained using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively. As shown in FIG. 11, the final offset frequency {circumflex over (ω)}tmp obtained according to exemplary embodiments of the present invention has a value closer to the actual offset frequency as compared to the temporary offset frequency {circumflex over (ω)}. Here, it is assumed for the convenience of description that a reference character of a line whose slope is an offset frequency indicates the offset frequency.
Referring to FIG. 11, while the conventional offset frequency A is approximately 0.0017, the final offset frequency B estimated according to an exemplary embodiment of the present invention is approximately 0.0019. The actual offset frequency I is approximately 0.0020. Thus, the final offset frequency B, which is an offset frequency according to an exemplary embodiment of the present invention, is closer to the actual offset frequency I than the temporary offset frequency A, which is a conventional offset frequency.
FIG. 12 is a diagram showing a mean value of the final offset frequency obtained using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively. As shown in FIG. 12, a mean value of the final offset frequency obtained according to exemplary embodiments of the present invention is closer to a mean value of the actual offset frequency as compared to the temporary offset frequency.
FIG. 13 is a diagram showing a standard deviation of the final offset frequency obtained using the method or apparatus described in connection with FIG. 1 or FIG. 2, respectively. As shown in FIG. 1, the standard deviation of the final offset frequency obtained according to exemplary embodiments of the present invention is less than that of the temporary offset frequency.
Referring to FIGS. 12 and 13, the offset frequency estimated according to exemplary embodiments of the present invention has a closer mean value to a mean value of the actual offset frequency and has a standard deviation which is less than the offset frequency conventionally estimated. As described above, in an offset frequency estimation method and apparatus according to an exemplary embodiment of the present invention, by adaptively skipping error samples, a more correct offset frequency can be estimated.
Although the exemplary embodiments of the present invention have been described in detail with reference to the accompanying drawings for the purpose of illustration, it is to be understood that the inventive processes and apparatus should not be construed as limited thereby. It will be apparent to those of ordinary skill in the art that various modifications to the foregoing exemplary embodiments may be made without departing from the scope of the invention as defined by the appended claims, with equivalents of the claims to be included therein.