Claims
- 1. An optic modulator comprising:
- a quantum well heterostructure formed from a plurality of alternating layers of varying semiconductor materials, the heterostructure having a predetermined length and width and being formed so that a residual stress which is normal to the length of the heterostructure is released such that a uniaxial stress is displaced along the length of the heterostructure, whereby the uniaxial stress causes heavy and light holes of a valence band of the semiconductor materials to decouple at zero electric field, and the heterostructure further being defined as having a top and bottom surface;
- first and second polarizing means disposed at the top and bottom surfaces of the heterostructure;
- means to couple an optical signal to at least one of the polarizing means; and
- means to apply an electric field to the quantum well heterostructure.
- 2. The optic modulator of claim 1 wherein the first and second polarizing means are aligned perpendicularly to one another.
- 3. The optic modulator of claim 2 wherein the heterostructure is aligned at approximately a 45.degree. angle to both the first and second polarizing means.
- 4. The optic modulator of claim 1 wherein the width of the quantum well of the heterostructure is predetermined such that any quantum decoupling of heavy and light holes in the heterostructure caused by the application of an electric field to the heterostructure is not greater than any decoupling of heavy and light holes in the heterostructure which is a result of the uniaxial stress.
- 5. The optic modulator of claim 1 wherein the heterostructure is further defined as having a principle quantum axis which is parallel to the displacement of the uniaxial stress.
- 6. The optic modulator of claim 1 wherein the heterostructure comprises alternating layers of indium gallium arsenide and indium phosphide.
GOVERNMENT INTEREST
The invention described herein may be manufactured, used, and licensed by or for the Government of the United States for governmental purposes without the payment to us of any royalties thereon.
US Referenced Citations (3)
Foreign Referenced Citations (3)
Number |
Date |
Country |
1-11227 |
Jan 1989 |
JPX |
2-238432 |
Sep 1990 |
JPX |
4-30115 |
Feb 1992 |
JPX |
Non-Patent Literature Citations (2)
Entry |
H. Shen et al., "Biaxial and uniaxial stress in gallium aresenide on sili: A linear polarized photoluminescence study", J. Appl. Phys. 68(1), Jul. 1, 1990, 1990 American Institute of Physics, pp. 369-371. |
D. H. Rich et al., "Polarized-cathodoluminescence study of uniaxial and biaxial stress in GaAs/Si", Physical Review B, vol. 43, No. 8, Mar. 15, 1991-I, pp. 6836-6839. |