Number | Date | Country | Kind |
---|---|---|---|
9681034 | May 1996 | EPX |
Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/EP97/02745 | 5/27/1997 | 11/25/1998 | 11/25/1998 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO97/45718 | 12/4/1997 |
Number | Name | Date | Kind |
---|---|---|---|
4254084 | Blum | Mar 1981 | |
5039490 | Marsoner et al. | Aug 1991 |
Number | Date | Country |
---|---|---|
0 571 661 A1 | Dec 1993 | EPX |
44 29 846 A1 | Mar 1995 | DEX |
Entry |
---|
Czolk, R., "Bewaehrungsprobe fuer Mikrosysteme", F&M Feinwerktechnik & Messtechnik 103, Sep., No. 9, 1995, pp. 492-494. |