BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
A general architecture that implements the various feature of the invention will now be described with reference to the drawings. The drawings and the associated descriptions are provided to illustrate embodiments of the invention and not to limit the scope of the invention.
FIG. 1 is a sectional view showing an example of a size of a guide groove of a two-layered optical disk according to an embodiment of the present invention;
FIG. 2 is an illustrative view showing an example (first test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 3 is an illustrative view showing an example (second test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 4 is an illustrative view showing an example (third test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 5 is an illustrative view showing an example (fourth test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 6 is an illustrative view showing an example (fifth test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 7 is an illustrative view showing an example (sixth test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 8 is an illustrative view showing an example (seventh test data) of effects each parameter of a substrate in a,two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 9 is an illustrative view showing an example (eighth test data) of effects each parameter of a substrate in a two-layered optical disk according to an embodiment of the present invention has on ΔCNR1, ΔCNR2, and ΔL;
FIG. 10 is a sectional view showing an example of another configuration of a two-layered optical disk according to an embodiment of the present invention;
FIG. 11 is a sectional view showing an example of another configuration of a two-layered optical disk according to an embodiment of the present invention;
FIG. 12 is a sectional view showing an example of another configuration of a two-layered optical disk according to an embodiment of the present invention;
FIG. 13 is a sectional view showing an example of another configuration of a two-layered optical disk according to an embodiment of the present invention;
FIG. 14 is a block diagram depicting an example of an optical disk device handling a two-layered optical disk according to an embodiment of the present invention;
FIG. 15 is an illustrative view showing an example of general parameter setting of a two-layered optical disk according to an embodiment of the present invention;
FIG. 16 is an illustrative view showing a relationship between a wobble shape and an address bit in an address bit region of a two-layered optical disk according to an embodiment of the present invention;
FIG. 17 is an illustrative layout view showing an inside of a wobble data unit relating to a primary layout position and a secondary layout position of a two-layered optical disk according to an embodiment of the present invention;
FIG. 18 is an illustrative view showing an embodiment relating to a data structure in wobble address information of a two-layered optical disk according to an embodiment of the present invention;
FIG. 19 is an illustrative view showing a layout position of a modulation region on a two-layered optical disk according to an embodiment of the present invention;
FIG. 20 is an illustrative view showing a method for measuring Wppmax and Wppmin of a two-layered optical disk according to an embodiment of the present invention;
FIG. 21 is a specific illustrative view showing a wobble signal and a track shift signal of a two-layered optical disk according to an embodiment of the present invention;
FIG. 22 is an illustrative view showing a method for measuring a (I1-I2) pp signal of a two-layered optical disk according to an embodiment of the present invention;
FIG. 23 is a block diagram depicting an NBSNR measuring circuit relevant to a square wavelength of a wobble signal of a two-layered optical disk according to an embodiment of the present invention;
FIG. 24 is an illustrative view showing a method for measuring NBSNR of a two-layered optical disk according to an embodiment of the present invention;
FIG. 25 is a graph depicting an example of a spectrum analyzer detection signal characteristic of a wobble signal based on phase modulation of a two-layered optical disk according to an embodiment of the present invention; and
FIG. 26 is a graph depicting an example of a spectrum analyzer waveform of a wobble signal based on phase modulation of a two-layered optical disk according to an embodiment of the present invention.