The present invention relates to optical elements having antireflection films, particularly, to an optical element having an antireflection film with high transmittance in a wide wavelength range.
Up to now, antireflection films have been extensively used in optical or opto-electrical applications where it is desired or necessary to decrease reflection at an optical boundary between, for example, air and glass. Examples of such applications include a camera lens, a platen for a copying machine, a glass cover for equipment, a panel for a cathode ray tube, and display devices.
However, existing antireflection coating has quite a few drawbacks, such as transmittance reduction in ultraviolet and infrared bands near the visible light band, when applied to an optical element for use in the visible light band. For example, when antireflection coating is used on an optical device such as a camera, color may be changed in images.
What is needed, therefore, is an optical element having an antireflection film with high transmittance in a wide wavelength range.
In accordance with one present embodiment, an optical element includes a substrate and an antireflection film coated on a surface of the substrate. The antireflection film includes a bottom layer, a first layer, a second layer, a third layer, a fourth layer, a fifth layer, and a top layer in that order from the substrate side. The bottom layer with a thickness in a range from 0.95 d to 1.05 d is formed using a middle refractive index material. The first layer with a thickness in a range from 0.311 d to 0.343 d is formed using a high refractive index material. The second layer with a thickness in a range from 0.147 d to 0.163 d is formed using a low refractive index material. The third layer with a thickness in a range from 1.561 d to 1.725 d is formed using a high refractive index material. The fourth layer with a thickness in a range from 0.210 d to 0.232 d is formed using a low refractive index material. The fifth layer with a thickness in a range from 0.321 d to 0.355 d is formed using a high refractive index material. The top layer with a thickness in a range from 0.95 d to 1.05 d is formed using a low refractive index material. Wherein, d=λ/(4×n), λ is a wavelength of incident light, n is a refractive index of the corresponding layer.
Many aspects of the present optical element having antireflection film can be better understood with reference to the following drawings. The components in the drawing are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present optical element. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
Embodiments will now be described in detail below, with reference to the drawings.
Referring to
The material of the substrate 20 can be selected from glass or plastic. All of the light emitting surfaces and light incident surfaces of the substrate 20 can be coated with the antireflection film 10.
The antireflection film 10 includes a bottom layer 11, a range broadening layer 12, and a top layer 13. The bottom layer 11, the range broadening layer 12, and the top layer 13 are sequentially formed on a surface of the substrate 20.
The bottom layer 11 is formed using a middle refractive index material. In the present embodiment, a material with refractive index in a range from 1.6 to 1.7 is used as the middle refractive index material. The middle refractive index material can be Al2O3. In order to describe the physical thickness of films, a physical film thickness unit d is established, wherein d=λ/(4×n), λ is a wavelength of incident light, and n is a refractive index of a film material. The value of λ is in a range from 500 nm to 700 nm. In the present embodiment, the value of λ is 600 nm. The thickness of the bottom layer 11 is in a range from 0.95 d to 1.05 d. Preferably, the thickness of the bottom layer 11 is approximately 1 d.
The top layer 13 is formed using a low refractive index material. In the present embodiment, a material with refractive index in a range from 1.35 to 1.46 is used as the low refractive index material. The low refractive index material can be selected from a group consisting of MgF2 and SiO2. The thickness of the top layer 13 is in a range from 0.95 d to 1.05 d. Preferably, the thickness of the top layer 13 is approximately 1 d.
The range broadening layer 12 includes a first layer 121, a second layer 122, a third layer 123, a fourth layer 124, and a fifth layer 125 forming sequentially on a surface of the substrate 20. The first layer 121 with a thickness in a range from 0.311 d to 0.343 d is formed using a high refractive index material. The second layer 122 with a thickness in a range from 0.147 d to 0.163 d is formed using a low refractive index material. The third layer 123 with a thickness in a range from 1.561 d to 1.725 d is formed using a high refractive index material. The fourth layer 124 with a thickness in a range from 0.210 d to 0.232 d is formed using a low refractive index material. The fifth layer 125 with a thickness in a range from 0.321 d to 0.355 d is formed using a high refractive index material. In present embodiment, a material with refractive index in a range from 2.0 to 2.3 is used as the high refractive index material. The high refractive index material can be selected from a group consisting of TiO2, Ta2O5, and Nb2O5. The low refractive index material can be selected from a group consisting of MgF2 and SiO2.
An example of the antireflection film 10 will be described below with reference to
Referring to
While certain embodiments have been described and exemplified above, various other embodiments will be apparent to those skilled in the art from the foregoing disclosure. The present invention is not limited to the particular embodiments described and exemplified but is capable of considerable variation and modification without departure from the scope of the appended claims.
| Number | Date | Country | Kind |
|---|---|---|---|
| 200710201804.8 | Sep 2007 | CN | national |