Claims
- 1. A printed circuit board inspection system, comprising:
a three-dimensional optical inspection system operable to capture two or more two-dimensional images of an at least partially specular object resident on a printed circuit board under different illumination configurations and to reconstruct a three-dimensional image of the shape of the surface of the object from the two or more two-dimensional images.
- 2. The printed circuit board inspection system of claim 1, wherein said optical inspection system is further operable to estimate a feature of the three-dimensional image without reconstructing the complete three-dimensional image, and to automatically identify the quality of the object using the feature.
- 3. The printed circuit board inspection system of claim 1, wherein said optical inspection system is further operable to utilize the three-dimensional image as program data for use in inspecting additional objects.
- 4. The printed circuit board inspection system of claim 1, wherein said optical inspection system is operable to use a photometric stereo method to reconstruct the three-dimensional image.
- 5. An illumination system for use in an optical inspection system, comprising:
an illumination source operable to illuminate an object under inspection, said illumination source including light-emitting elements arranged in concentric circular arrays around an axis extending from a plane in which the object is located, each of the circular arrays being divided into sections of the light-emitting elements, each of the sections being capable of independently illuminating the object; and an illumination control circuit connected to said illumination source to selectively activate the sections to illuminate the object in a pre-established illumination pattern.
- 6. The illumination system of claim 5, wherein said illumination source comprises a programmable light ring comprising a support structure including an inside surface on which said light-emitting elements are mounted to position said light-emitting elements at different elevations and azimuths with respect to the object.
- 7. An optical inspection system, comprising:
an illumination source operable to illuminate an object resident on an electronic device; a sensing apparatus disposed in relation to the object to receive illumination reflected from the surface of the object, the reflected illumination including at least a diffuse component, said sensing apparatus being operable to produce image data from the received reflected illumination for two or more images captured under different illumination configurations of said illumination source; and a processor connected to said sensing apparatus to receive the image data, said processor being operable to reconstruct a three-dimensional image of the shape of the surface of the object using the image data.
- 8. The optical inspection system of claim 7, wherein said illumination source comprises a programmable light ring comprising light-emitting elements arranged in concentric circular arrays around an axis extending from a plane in which the object is located, each of the circular arrays being divided into sections of the light-emitting elements, each of the sections being capable of independently illuminating the object.
- 9. The optical inspection system of claim 8, wherein said sensing apparatus is additionally operable to obtain four or more images of the object under independent illumination from four or more of the sections; and said processor is operable to reconstruct the three-dimensional image using a photometric stereo method.
- 10. The optical inspection system of claim 9, wherein the object is maintained in a constant spatial relationship with respect to said sensing apparatus for the four or more images.
- 11. The optical inspection system of claim 8, further comprising:
an illumination control circuit connected to said illumination source to selectively activate the sections to illuminate the object in a pre-established illumination pattern.
- 12. The optical inspection system of claim 11, wherein the pre-established illumination pattern alters the azimuth of the activated section for each of the two or more images.
- 13. A method for reconstructing a three-dimensional image of an object resident on an electronic device during an optical inspection process, comprising:
receiving image data representing reflected illumination for two or more images captured under different illumination configurations, the reflected illumination including at least a diffuse component; and reconstructing a three-dimensional image of the shape of the surface of the object using the image data.
- 14. The method of claim 13, further comprising:
illuminating the object under different illumination configurations having different azimuths.
- 15. The method of claim 14, further comprising:
capturing four or more images of the object under four or more illumination configurations; and reconstructing the three-dimensional image using a photometric stereo method.
- 16. The method of claim 14, further comprising:
controlling the illumination of the object in pre-established illumination patterns.
- 17. The method of claim 16, wherein said controlling further comprises:
altering the azimuth of the illumination for each of the two or more images.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This U.S. Nonprovisional Application for patent is related by subject matter to copending and commonly assigned U.S. Nonprovisional Applications for patent Ser. No. ______ (Attorney Docket No. 10021084), Ser. No. ______ (Attorney Docket No. 10030330) and Ser. No. ______ (Attorney Docket No. 10030331). U.S. Nonprovisional Applications for patent Serial No. ______ (Attorney Docket No. 10021084), Ser. No. ______ (Attorney Docket No. 10030330) and Ser. No. ______ (Attorney Docket No. 10030331) are hereby incorporated by reference in their entirety.