The present invention relates to an optical member having an optical function, for example, antireflection on the surface, such as an optical film, a lens, and a display, and an optical apparatus.
Conventionally, a widely used optical member has a surface microstructure that is sized for a wavelength.
For example, an optical member 1 shown in
Such a relief structure is typically formed by using nanoimprinting. Specifically, ultraviolet curing or thermosetting resin is applied onto the planar substrate 2 and then is pressed with a molding die having shapes inverted from desired asperities. Subsequently, the resin is cured by ultraviolet irradiation or heat, and then the molding die is removed.
The moth-eye structure used for such optical members belongs to a well-known technique. The fine asperities vary in shape and layout among manufacturers. For example, in Patent Literature 1, the protrusions 32 are circularly arranged and are conically protruded with an oval shape having a major axis in the circumferential direction. In Patent Literature 2, the tops of the projecting portions of the protrusions 32 are connected to the adjacent projecting portions with a certain ratio or less. In this way, some structures relate to features obtained by methods of forming relief structures.
For example, in Patent Literature 3, a mark region is provided only at a specific position in a member and only a relief structure in the mark region is formed with a different layout and a different height from other regions, thereby preventing replication of an original form for forming the relief structure.
Patent Literature 2: WO2010143503 A1
Patent Literature 3: Japanese Patent Laid-Open No. 2007-79005
In the conventional configurations of Patent Literatures 1 and 2, however, it is unfortunately difficult to determine the cause of a defect that is confirmed on a member such as a formed film by any means. Specifically, when performance variations caused by deformation of a relief structure on a film are confirmed, it is difficult to decide whether the cause is intrusion of foreign matters during molding or a defect of the above-described molding die. Even if the cause can be limited to a defect of the mold rather than foreign matters during molding, the film of a molding size is divided into analysis samples that are sized for various analysis sample stages used for microscopes and so on and the relief structure on the film is composed of an infinite number of repeated identical relief structures. Thus, it is quite time-consuming and expensive to accurately locate a defect on the overall film and the original die.
In Patent Literature 3 and so on, mark regions are provided at any positions of a mold and a member and the layout and height of the relief structure are changed only in the regions, allowing analysis relative to the positions. However, a film is temporarily cut at any position according to the size of a device to be bonded to a large film and thus the cut film may not have any marks. Moreover, also on a film divided into samples for an analysis sample stage, a position may not be determined.
The present invention has been devised to solve the conventional problems. An object of the present invention is to provide an optical member so as to facilitate determination of the cause of a defect and feedback to a molding die in the optical member having a plurality of surface relief structures.
In order to attain the object, an optical member according to the present invention includes a plurality of protrusions sized for a wavelength with antireflection on the surface of the optical member, the protrusions including first protrusions and second protrusions with a different protrusion height or a different protrusion pitch from the first protrusions, the first protrusions being surrounded by the second protrusions having a different periodic position on the surface of the optical member from the first protrusions.
The optical member according to the present invention includes a plurality of protrusions sized for a wavelength with antireflection on the surface of the optical member, the protrusions being surrounded by one of a grid and a circle formed in any pattern or a convex shape formed with respect to a polygonal line.
An optical member according to the present invention includes a plurality of first protrusions and second protrusions sized for a wavelength with antireflection on the surface of the optical member, the first protrusions being formed on the surface of a first residual film in a first region, the second protrusions being formed on the surface of a second residual film in a second region, the first residual film having a different thickness from the second residual film, the first residual film being surrounded by the second residual film.
An optical member according to the present invention includes first protrusions that are a plurality of protrusions sized for a wavelength with antireflection on the surface of the optical member, the first protrusions being surrounded by a flat part having no surface relief structures formed.
According to the present invention, position coordinates to the second region closest to a defective point are precisely stored with a high magnification on an analyzer. Thus, in the optical member, only the grid region of the defective point in the second region is mapped. This can precisely specify the defective point in the overall optical member and a position in a mold used for molding the optical member. Thus, the optical member and the apparatus can be provided so as to facilitate determination of the cause of a defect and feedback to the molding die, achieving higher member quality and yields.
Embodiments of the present invention will be described below with reference to the accompanying drawings.
An optical member 1 includes an antireflective layer 3 formed on a planar substrate 2. The antireflective layer 3 includes a residual film 31 having a thickness T and fine protrusions 32 formed on the residual film 31.
The protrusions 32 of different shapes are provided in first regions D1 and second regions D2. In the first region D1, the protrusions have a height of H1 formed with an interval of protrusion repetition, that is, a pitch of P1. In the second region D2, the protrusions have a height of H2 formed with an interval of protrusion repetition, that is, a pitch of P2. The protrusions formed in the first region D1 will be called first protrusions 321 while the protrusions formed in the second region D2 will be called second protrusions 322. The first protrusions 321 are surrounded by the second protrusions 322. The second protrusions 322 are formed on grid lines having principal axes along a first direction optionally set in the surface of the optical member and a second direction set at a certain angle with respect to the first direction. Specifically, as shown in
With this configuration, the second protrusions 322 are periodically formed over the grid-like second regions D2 with a different protrusion height and a different center distance between the adjacent protrusions from the first protrusions 321 of the first regions D1 formed substantially over the optical member 1. This configuration can easily determine the cause of a defect of the optical member 1 and a defect of a molding die unlike in the conventional example. The reason will be specifically described below.
If a defect such as a deposited foreign matter and an abnormal surface appears on the optical member 1, the relative position of the defect needs to be highly accurately determined with respect to the visible outline of the member in order to specify the cause of the defect on the molding die. In various analyzers such as a microscope for defect analysis, however, the size of a sample which can be set is limited and thus varies the cutting of the member. Moreover, the screen size of an analysis monitor is also limited and thus varies feeding to a stage, leading to difficulty in precise feedback of position information.
In the optical member 1 of the first embodiment, the fine protrusions of about 300 nm, which is a visible wavelength or less, are formed. The regions of the first protrusions 321 and the second protrusions 322 having different shapes cannot be discriminated from each other, which does not deteriorate the visible quality of the optical member. However, a fine shape of 300 nm or less is directly measured by a device such as an atomic force microscope or a scanning electron microscope. A difference in fluorescence intensity according to a protrusion height is used by an evaluating device such as a confocal laser microscope. A small difference in reflectivity between the first protrusion 321 and the second protrusion 322 having different shapes is used by a spectroreflectometer. A laser microscope or the like can discriminate between the first region D1 and the second region D2, thereby locating the second region D2 having different shapes from the first protrusions 321.
For example, if a defect appears at a predetermined point of the optical member 1, position coordinates to a grid region closest to the defective point are precisely stored with a high magnification on various analyzers by using the second region D2. Thus, in the optical member 1, only the grid region of the defective point in the second region D2 is mapped with a laser microscope having a relatively low magnification. This can precisely specify the defective point in the overall optical member 1 and a position in the mold used for molding the optical member 1.
Moreover, in the formation of the optical member 1, a molding die sufficiently smaller than the area of the optical member 1 may be prepared to be regularly and repeatedly transferred at any pitch, molding the optical member 1. In this case, it is decided whether or not a defect of the optical member appears with the same period as the transfer pitch of the die, thereby quickly deciding whether the mold is the cause of the defect or not.
A small difference of reflectivity that changes depending on the shapes of the first protrusions 321 and the second protrusions 322 is not recognized by a visual check and a stereoscopic microscope or the like. Thus, the quality of an optical function such as antireflection is not deteriorated in appearance and practical use unlike in the optical member of the conventional example.
The dimensions of the protrusions 32 on the optical member 1 formed thus will be specifically described below.
The pitches P1 and P2 need to be equal to a visible wavelength or less, about 300 nm or less, as distances required for providing antireflection for the member, whereas the heights H1 and H2 are desirably 150 nm or more because an aspect ratio of at least 0.5 is necessary for the width of the protrusion.
Furthermore, the first region D1 and the second region D2 need to be clearly discriminated from each other on an analyzer used for analyzing a film. Thus, regarding variations of tolerance of the pitch P1 and the height H1 of the first protrusions 321 in the first region D1 and the pitch P2 and the height H2 of the second protrusions 322 in the second region D2, for example, P1 is desirably about a half of P2 while H1 is desirably at least about a half of H2.
The pitch W for the layout of the second regions D2 is desirably equal to a maximum size of the optical member 1 to be cut on various analyzers in use, for example, about 10 mm. This is because respective pieces obtained by cutting the optical member 1 in the use of the various analyzers surely need to contain the second region D2.
Referring to
As has been discussed, the first protrusions 321 and the second protrusions 322 are formed as follows: ultraviolet curing or thermosetting resin is coated onto the planar substrate 2 and then is pressed with the molding die having a shape inverted from a desired asperity, transferring the shape to the resin. Subsequently, the resin is cured by ultraviolet irradiation or heat. More specifically, the optical member 1 can be manufactured by any processes shown in
As shown in
As shown in FIG. 2B(a), a mold 42 is first used for collective transfer to the resin 30. Only the recesses d1 inverted from the first protrusions 321 are formed over the mold 42. In FIG. 2B(b), the second protrusions 322 are formed by another transferring to the predetermined second region D2 by means of a small mold 41 on which the recesses d2 inverted from the second protrusions 322 are formed.
As shown in FIG. 2C(a), partial transfer is performed to the resin 30 on the planar substrate 2 by means of the mold 42 as wide as the first region D1. Only the recesses d1 inverted from the first protrusions 321 are formed over the mold 42. In FIG. 2C(b), another transfer is performed with the mold 42 used in FIG. 2C(a) such that the mold 42 only overlaps the part of the second region D2 while being shifted by about a half pitch so as not to completely align the positions of the recesses of the mold with the transferred first protrusions 321.
In the present embodiment, the pitches P1 and P2 and the heights H1 and H2 are varied. The first region D1 and the second region D2 can be discriminated from each other only by varying the pitches or the heights.
In
In
In
In
In the first and second embodiments, the first protrusions 321 formed in the first regions D1 are all identical in shape and the second protrusions 322 formed in the second regions D2 are all identical in shape. The first protrusions 321 formed in the first regions D1 and the second protrusions 322 formed in the second regions D2 may have different shapes from each other.
In the example of
In the example of
Furthermore, in the example of
As shown in
In the foregoing embodiments, the second protrusions 322 are formed in the second region D2. In the example of
The detailed layout of the flat second region D2 having no protrusions formed in the surface of an optical member 1 in
The foregoing embodiments described differences in protrusion shape and thickness between the first protrusions 321 in the first region D1 and the second protrusions 322 in the second region D2. The present invention is not limited to this configuration.
For example, in an optical member 1, the same effect can be obtained by gradually changing a protrusion height H with any period as shown in
In
In the case where the optical member in
In an actual product, an optical member may be bonded to a display in a predetermined direction. In this case, the member is bonded with vertical and horizontal orientations confirmed beforehand according to optical properties varying between the first viewing direction A and the second viewing direction B. This can prevent failures caused by a bonding mistake.
In the embodiments of the specification, a microstructure of the protrusions appearing from the top surface of the residual film 31 on the surface of the planar substrate 2 is described as antireflective protrusions. A relief structure having an optical function is not limited to this structure. For example, as shown in
The present invention has been devised to solve the problems of optical quality of general display products or lens products, thereby improving member quality and yields in an optical member or apparatus having a plurality of relief structures on the surface of the optical member or apparatus.
Number | Date | Country | Kind |
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2013-076664 | Apr 2013 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2013/007241 | 12/10/2013 | WO | 00 |