Claims
- 1. An optical member inspection apparatus, comprising:an inspection optical system consisting of a light source, a diffuser to diffuse light emitted from said light source, where said diffuser is a plane plate member extending substantially perpendicular to an optical axis of an image receiver of said inspection apparatus with said diffuser further comprising a central portion and a peripheral portion where said central portion has a shape similar to a plane shape of an optical member to be inspected, with a diffusion transmittance of said peripheral portion being higher than that of said central portion, and where said image receiver of said inspection apparatus picks up an image of the optical member, said image receiver being positioned to receive light emitted from said light source and transmitted through said diffuser and said optical member; a processor which judges whether or not said optical member has a defect, in accordance with image signals output from said image receiver; and a selector which selects a wavelength of that light incident on said optical member.
- 2. The optical member inspection apparatus in accordance with claim 1, wherein said selector varies a spectral transmittance of each of said central portion and said peripheral portion.
- 3. The optical member inspection apparatus in accordance with claim 2, wherein said diffuser is a plane plate member extending substantially perpendicular to an optical axis of said image pick-up means.
- 4. The optical member inspection apparatus in accordance with claim 3, wherein light emitted perpendicularly from said central portion substantially corresponds to a size and shape of said optical member.
- 5. The optical member inspection apparatus in accordance with claim 3, wherein said peripheral portion and said central portion each have a shape similar to a plan shape of said optical member.
- 6. An optical member inspection apparatus, comprising:an inspection optical system consisting of a light source, a diffuser to diffuse light emitted from said light source, where said diffuser is a plane plate member extending substantially perpendicular to an optical axis of an image receiver with said diffuser further comprising a central portion and a peripheral portion where said central portion has a shape similar to a plane shape of an optical member to be inspected, with a diffusion transmittance of said peripheral portion being higher than that of said central portion, and where said image receiver of said inspection apparatus picks up an image of the optical member, said image receiver being positioned to receive light emitted from said light source and transmitted through said diffuser and said optical member; a processor which judges whether or not said optical member has a defect, in accordance with image signals output from said image receiver; and a selector which selects a wavelength of that light incident on said optical member by which said selector varies a spectral transmittance of each of said central portion and peripheral portion.
- 7. An optical member inspection apparatus comprising:an inspection optical system, said inspection optical system including a light source; a diffuser position to diffuse the light emitted from said light source, said diffuser comprising a central portion and a peripheral portion, a diffusion transmittance of said peripheral portion being higher than a diffusion transmittance of said central portion; and an image pick-up device positioned to receive light emitted from said light source and transmitted through said diffuser and an optical member to be inspected, whereby said image pick-up device obtains an image of said optical member; a processor, wherein said processor receives image signals output from said image pick-up device and determines whether said optical member is defective based on said image signals; and a selector for selecting a wavelength of the light emitted from said light source and incident on said optical member; wherein an image of an object to be inspected formed on said image pick-up device is formed by light rays emitted mainly from said central portion of said diffuser and; wherein light emitted perpendicularly from said central portion substantially corresponds to a size and shape of said optical member.
- 8. The optical member inspection apparatus according to claim 7, wherein said diffuser is a plane plate member extending substantially perpendicular to an optical axis of said image pick-up device.
- 9. The optical member inspection apparatus according to claim 7, wherein said peripheral portion has a shape similar to a plane shape of said optical member.
Priority Claims (14)
Number |
Date |
Country |
Kind |
7-164825 |
Jun 1995 |
JP |
|
7-164826 |
Jun 1995 |
JP |
|
7-164827 |
Jun 1995 |
JP |
|
7-172911 |
Jun 1995 |
JP |
|
7-175518 |
Jun 1995 |
JP |
|
7-175519 |
Jun 1995 |
JP |
|
7-184795 |
Jun 1995 |
JP |
|
7-189844 |
Jul 1995 |
JP |
|
7-189853 |
Jul 1995 |
JP |
|
7-208398 |
Jul 1995 |
JP |
|
7-208399 |
Jul 1995 |
JP |
|
7-208400 |
Jul 1995 |
JP |
|
7-221120 |
Aug 1995 |
JP |
|
8-101834 |
Apr 1996 |
JP |
|
Parent Case Info
This application is a division of application Ser. No. 08/658,549, now U.S. Pat. No. 6,148,097, filed Jun. 5, 1996.
US Referenced Citations (5)
Non-Patent Literature Citations (4)
Entry |
Japanese Unexamined Patent Publication No. 5-342356. |
Japanese Unexamined Patent Publication No. 6-139341. |
Japanese Unexamined Patent Publication No. 6-348824. |
Japanese Unexamined Patent Publication No. 5-85168. |