Claims
- 1. A device for measuring particulate matter comprising:
a light source that emits light; a receiver positioned to receive light emitted from said light source; and a detection unit in communication with said receiver wherein said detection unit detects an amount of particulate matter based upon said light received by said receiver.
- 2. The device as recited in claim 1 wherein said light source emits light at wavelengths in the visible spectrum.
- 3. The device as recited in claim 1 wherein said light source emits light at a wavelength of 500 nanometers.
- 4. The device as recited in claim 1 wherein said detection unit determines the concentration of particulate matter using the relationship:
- 5. The device as recited in claim 1 wherein said detection unit determines the concentration of particulate matter by determining a concentration of particulate matter and scaling said concentration.
- 6. The device as recited in claim 1 further comprising a reflector positioned to receive said light emitted from said light source and to reflect said light to said receiver.
- 7. The device as recited in claim 1 further comprising:
a beam splitter/combiner positioned to receive light emitted from said light source; and additional light sources positioned to emit light to said beam splitter/combiner so that the path of light emitted from said additional light sources follows the same optical path as said light emitted from said light source.
- 8. A method for determining a concentration of particulate matter comprising the steps of:
emitting light from a light source; receiving said light emitted from said light source in a receiver; and determining an amount of particulate matter using said light received in said receiver.
- 9. The method as recited in claim 8 wherein said step of emitting light from said light source comprises the step of emitting light at wavelengths in the visible spectrum.
- 10. The method as recited in claim 8 wherein said step of emitting light from said light source comprises the step of emitting light at a wavelength of 500 nanometers.
- 11. The method as recited in claim 8 wherein the step of determining an amount of particulate matter further comprises the step of using the relationship:
- 12. The method as recited in claim 8 wherein said step of determining an amount of particulate matter further comprises the steps of determining a concentration of particulate matter and scaling said concentration.
- 13. The method as recited in claim 8 further comprising the step of reflecting said light emitted from said light source to said receiver.
- 14. A system for measuring particulate matter comprising:
a light source means for emitting light; a receiver means for receiving said light emitted from said light source means, said receiver means positioned to receive said light emitted from said light source means; and a detection unit means for determining an amount of particulate matter based upon the light received by said receiver, said detection unit means in communication with said receiver means.
- 15. The system as recited in claim 14 wherein said light source means emits light at wavelengths in the visible spectrum.
- 16. The system as recited in claim 14 wherein said light source means emits light at a wavelength of 500 nanometers.
- 17. The system as recited in claim 14 wherein said detection unit means determines the concentration of particulate matter using the relationship:
- 18. The system as recited in claim 14 wherein said detection unit means determines the concentration of particulate matter by determining a concentration of particulate matter and scaling said concentration.
- 19. The system as recited in claim 14 further comprising a reflector means for reflecting said light emitted from said light source means to said receiver means.
- 20. The system as recited in claim 14 further comprising:
a beam splitter/combiner means for receiving light emitted from said light source means; and an additional light source means for emitting light to said beam splitter/combiner means so that the path of light emitted from said additional light source means follows the same optical path as said light emitted from said light source means.
PRIORITY
[0001] The present application is a continuation-in-part of pending U.S. patent application Ser. No. 09/934,272, filed Aug. 21, 2001, entitled Optical Path Structure for Open Emissions Sensing, the disclosure of which is incorporated herein by reference in its entirety.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
09934272 |
Aug 2001 |
US |
Child |
10142061 |
May 2002 |
US |