Claims
- 1. An apparatus for optical analysis, the apparatus comprising:
a detector system; a microfluidic system on the detector system; wherein the apparatus is free from any lens system between the microfluidic system and the detector system.
- 2. The apparatus of claim 1, wherein the microfluidic system are made of at least one selected from a group consisting of elastomer, quartz, glass, and semiconductor.
- 3. The apparatus of claim 1, wherein the microfluidic system comprises one or a plurality of flow channels.
- 4. The apparatus of claim 3, wherein the microfluidic system further comprises at least a sealing membrane, the sealing membrane forming a bottom surface of the microfluidic system.
- 5. The apparatus of claim 4, wherein the microfluidic system are made of elastomer.
- 6. The apparatus of claim 5, wherein the microfluidic system are made of PDMS.
- 7. The apparatus of claim 1 further comprising a light source system coupled to the microfluidic system.
- 8. The apparatus of claim 7 wherein the light source system comprises at least one selected from a group consisting of a tungsten filament lamp, a tungsten-iodine filament lamp, a light emitting diode, a laser light source, a white light source, and the Sun.
- 9. The apparatus of claim 7 further comprising a bottom filter system placed between the microfluidic system and the detector system.
- 10. The apparatus of claim 9, wherein the bottom filter system reflects a portion of illumination transmitting through the microfluidic system back to the microfluidic system.
- 11. The apparatus of claim 10 wherein the bottom filter system reflects the portion of illumination of a first wavelength at a first location and of a second wavelength at a second location, the first location different from the second location, the first wavelength different from the second wavelength.
- 12. The apparatus of claim 9, wherein the bottom filter system blocks at least a portion of illumination from the light source system from reaching the detector system.
- 13. The apparatus of claim 12 wherein the bottom filter system blocks the portion of illumination of a first wavelength at a first location and of a second wavelength at a second location, the first location different from the second location, the first wavelength different from the second wavelength.
- 14. The apparatus of claim 9, wherein the bottom filter system comprises at least two layers having different indexes of refraction.
- 15. The apparatus of claim 14, wherein the bottom filter systems comprises at least one layer of silicon oxide and one layer of silicon nitride
- 16. The apparatus of claim 7 further comprising a top filter system coupled between the light source system and the microfluidic system.
- 17. The apparatus of claim 16, wherein the top filter system reflects a portion of illumination transmitting through the microfluidic system back to the microfluidic system.
- 18. The apparatus of claim 17, wherein the top filter system reflects the portion of illumination of a first wavelength at a first location and of a second wavelength at a second location, the first location different from the second location, the first wavelength different from the second wavelength.
- 19. The apparatus of claim 16, wherein the top filter system blocks at least a portion of illumination from the light source system from reaching the microfluidic system.
- 20. The apparatus of claim 19 wherein the top filter system blocks the at least a portion of illumination of a first wavelength at a first location and of a second wavelength at a second location, the first location different from the second location, the first wavelength different from the second wavelength.
- 21. The apparatus of claim 16, wherein the top filter system comprises at least two layers having different indexes of refraction.
- 22. The apparatus of claim 21, wherein the top filter system comprises at least one layer of silicon oxide and one layer of silicon nitride.
- 23. The apparatus of claim 1, wherein the detector system receives illumination transmitting through the microfluidic system in at least a portion of visible spectral range.
- 24. The apparatus of claim 23, wherein the detector system receives illumination transmitting through the microfluidic system in at least a portion of ultraviolet range.
- 25. The apparatus of claim 24, wherein the microfluidic system comprises at least one fluid channel, the fluid channel having a characteristic depth of about 10 microns.
- 26. The apparatus of claim 25, wherein the detector system comprises an imaging surface, the imaging surface having a characteristic area of about one square centimeter.
- 27. A method of making a system for optical analysis, the method comprising:
providing a detector system on a substrate system with connection to an electrical contact system; providing a microfluidic system on the detector system by replication molding; providing a light source system coupled to the microfluidic system; wherein the method is free from providing any lens system between the microfluidic system and the detector system.
- 28. The method of claim 25, wherein providing a microfluidic system on the detector system comprises:
providing at least one sealing membrane; providing at least one flow channel on the at least one sealing membrane by curing; providing the at least one sealing membrane on the detector system.
- 29. The method of claim 28, wherein the curing comprises baking the at least sealing membrane and the at least one flow channel at 90° C. for at least one hour.
- 30. The method of claim 27 further comprising providing a bottom filter system between the microfluidic system and the detector system using RF plasma sputtering deposition at room temperature.
- 31. The method of claim 27 further comprising providing a top filter system between the light source system and the microfluidic system using RF plasma sputtering deposition at room temperature.
- 32. A method of using an apparatus for absorption spectroscopy, the method comprising:
loading test samples into a microfluidic system; placing the microfluidic system on a detector system; providing a light source system coupled to the microfluidic system; sensing sample signals received at the detector system; processing detector response signals; determining an absorption spectrum using at least information associated with detector response signals; wherein the method is free from providing any lens system between the microfluidic system and the detector system.
- 33. The method of claim 32, wherein the processing detector response signals comprises:
averaging detector response signals at different spatial locations, the detector response signals induced by sample signals of a same wavelength; matching each pixel of the detector system with a wavelength of its received sample signals.
- 34. The method of claim 33 further comprising
placing a top filter system between the light source system and the microfluidic system; placing a bottom filter system between the microfluidic system and the detector system.
- 35. A method of using an apparatus for fluorescence spectroscopy, the method comprising:
loading test samples into a microfluidic system; placing the microfluidic system on a bottom filter system; placing the bottom filter system on a detector system; placing a light source system coupled to the microfluidic system; sensing sample signals received at the detector system; processing detector response signals; determining an absorption spectrum using at least information associated with detector response signals; wherein the method is free from providing any lens system between the microfluidic system and the detector system.
- 36. The method of claim 35 wherein the processing detector response signals comprises:
averaging detector response signals at different spatial locations, the detector response signals induced by sample signals of a same wavelength; matching each pixel of the detector system with a wavelength of its received sample signals.
- 37. The method of claim 35 further comprising placing a top filter system between the light source system and the microfluidic system.
- 38. An apparatus comprising:
a light source configured to emit light of at least one wavelength; an photosensitive element including a pixel having a dimension; and a sample holding element located between the light source and the photosensitive element, the sample holding element comprising a material substantially transparent to light of the wavelength, the sample holding element including a microfabricated recess configured to position a sample from the pixel at a distance of fifty-times the pixel dimension or less.
- 39. The apparatus of claim 38 wherein the sample holding element comprises an elastomer layer having a microfabricated recess formed therein, the microfabricated recess having a width of at least twice the pixel dimension.
- 40. The apparatus of claim 38 wherein the sample holding element comprises a quartz layer having a recess formed therein, the recess having a width of at least twice the pixel dimension.
- 41. A method comprising:
providing a photosensitive element including a pixel having a dimension; providing a light source configured to emit light of at least one wavelength; disposing between the light source and the photosensitive element, a sample within a recess of a sample holding element, at a distance of fifty-times the pixel dimension or less, the sample holding element substantially transparent to the light of the at least one wavelength; and detecting with the photosensitive element an optical property of light from the sample.
- 42. The method of claim 41 wherein disposing the sample comprises flowing a liquid sample through a microfabricated flow channel.
- 43. The method of claim 41 wherein detecting an optical property comprises detecting an intensity of the first wavelength.
- 44. The method of claim 43 further comprising comparing the detected intensity with the intensity of the emitted light to determine an absorbance of the sample.
- 45. The method of claim 41 wherein detecting an optical property comprises detecting an intensity of a wavelength of light different than the first wavelength.
- 46. The method of claim 45 further comprising measuring a fluorescence of the sample by the intensity of the detected light of the different wavelength.
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] This application claims priority to U.S. Provisional No. 60/351,485 filed Jan. 24, 2002, which is incorporated by reference herein.
STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT
[0002] Work described herein has been supported, in part, by NSF grant BES-0119493 and DARPA grant DAAD19-00-1-0392. The United States Government may therefore have certain rights in the invention.
Provisional Applications (1)
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Number |
Date |
Country |
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60351485 |
Jan 2002 |
US |