This application claims the benefit of Korea Patent Application No. 10-2013-0141334 filed on Nov. 20, 2013, which is incorporated herein by reference for all purposes as if fully set forth herein.
1. Field of the Invention
Embodiments of the invention relate to an active matrix organic light emitting display, and more particularly, to an organic light emitting display and a method of compensating for a threshold voltage thereof.
2. Discussion of the Related Art
An active matrix organic light emitting display includes organic light emitting diodes (hereinafter, abbreviated as “OLEDs”) capable of emitting light. Such an active matrix organic light emitting display has advantages of a fast response time, a high light emitting efficiency, a high luminance, a wide viewing angle, and the like.
The OLED serving as a self-emitting element typically includes an anode electrode, a cathode electrode, and an organic compound layer formed between the anode electrode and the cathode electrode. The organic compound layer includes a hole injection layer HIL, a hole transport layer HTL, a light emitting layer EML, an electron transport layer ETL, and an electron injection layer EIL. When a driving voltage is applied to the anode electrode and the cathode electrode, holes passing through the hole transport layer HTL and electrons passing through the electron transport layer ETL move to the light emitting layer EML and form excitons. As a result, the light emitting layer EML generates visible light.
The organic light emitting display arranges pixels, each including an OLED, in a matrix form, and adjusts a luminance of the pixels depending on a gray scale of video data. Each pixel typically includes a driving thin film transistor (TFT) for controlling a driving current flowing in the OLED. It is preferable that electrical characteristics (including a threshold voltage, mobility, etc.) of the driving TFT are equally designed in all of the pixels. However, in practice, the electrical characteristics of the driving TFTs of the pixels are not uniform due to various causes. A deviation between the electrical characteristics of the driving TFTs results in a luminance deviation between the pixels.
Various compensation methods of compensating for the threshold voltage of the driving TFT are known.
More specifically, a sensing data voltage Vdata greater than the threshold voltage Vth is applied to a gate electrode of the driving TFT DT, so as to sense the threshold voltage Vth. When an initialization voltage Vref is applied to a source electrode of the driving TFT DT, the driving TFT DT is turned on because a gate-source voltage Vgs of the driving TFT DT is greater than the threshold voltage Vth. In this instance, the drain-source current Ids of the driving TFT DT depends on a difference Vgs between a gate voltage Vg (VN1) of the driving TFT DT and a source voltage Vs (VN2) of the driving TFT DT. In an initial sensing period, in which the source voltage Vs (VN2) of the driving TFT DT starts to increase, because the gate-source voltage Vgs of the driving TFT DT is large, a channel resistance of the driving TFT DT is small. As a result, the drain-source current Ids of the driving TFT DT is large. However, as the source voltage Vs (VN2) of the driving TFT DT gradually increases, the gate-source voltage Vgs of the driving TFT DT decreases. Therefore, the channel resistance of the driving TFT DT increases. As a result, the drain-source current Ids of the driving TFT DT decreases. When the drain-source current Ids of the driving TFT DT decreases, a charge amount accumulated in a sensing capacitor Cx decreases. Therefore, a time required for the gate-source voltage Vgs of the driving TFT DT to become the threshold voltage Vth increases. As the sensing time of the threshold voltage Vth increases, the amount of time available for displaying an image (e.g., the image display time) is reduced. Thus, in order to increase the image display time, the sensing time of the threshold voltage Vth needs to be reduced.
Embodiments of the invention provide an organic light emitting display and a method of compensating for a threshold voltage thereof capable of reducing a sensing time of a threshold voltage when the threshold voltage of a driving thin film transistor (TFT) is sensed in a source follower manner.
In an embodiment, there is an organic light emitting display comprising a display panel including a plurality of pixels, a gate driving circuit configured to generate a first threshold voltage sensing gate pulse and a second threshold voltage sensing gate pulse for operating the pixels using a source follower manner, a data driving circuit configured to supply a threshold voltage sensing data voltage to the pixels in response to the first threshold voltage sensing gate pulse and detect a source voltage of a driving thin film transistor (TFT) of each pixel as a sensing voltage in response to the second threshold voltage sensing gate pulse, and a timing controller configured to modulate input digital video data for the image display based on a change in the sensing voltage and generate digital compensation data, wherein a sensing period for sensing a threshold voltage of the driving TFT is divided into a first period and a second period following the first period, wherein a gate voltage of the driving TFT of each pixel is held at one or more high levels in the first period of the sensing period and is held at a reference level lower than the high level in the second period of the sensing period.
In another embodiment, there is a method of compensating for a threshold voltage of an organic light emitting display including a display panel including a plurality of pixels, the method comprising generating a first threshold voltage sensing gate pulse and a second threshold voltage sensing gate pulse for operating the pixels using a source follower manner, supplying a threshold voltage sensing data voltage to the pixels in response to the first threshold voltage sensing gate pulse and detecting a source voltage of a driving thin film transistor (TFT) of each pixel as a sensing voltage in response to the second threshold voltage sensing gate pulse, and modulating input digital video data for the image display based on a change in the sensing voltage and generating digital compensation data, wherein a sensing period for sensing a threshold voltage of the driving TFT is divided into a first period and a second period following the first period, wherein a gate voltage of the driving TFT of each pixel is held at one or more high levels in the first period of the sensing period and is held at a reference level lower than the high level in the second period of the sensing period.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of embodiments of the invention. In the drawings:
Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same or like reference numbers will be used throughout the drawings to refer to the same or like parts. Detailed description of known art may be omitted if it is determined that the art can mislead the embodiments of the invention.
Example embodiments of the invention will be described with reference to
As shown in
The display panel 10 may include a plurality of data lines 14, a plurality of gate lines 15 crossing the data lines 14, and a plurality of pixels P respectively arranged at crossings of the data lines 14 and the gate lines 15 in a matrix form.
The data lines 14 may include m data voltage supply lines 14A_1 to 14A_m and m sensing voltage readout lines 14B_1 to 14B_m, where m is a positive integer. The gate lines 15 may include n first gate lines 15A_1 to 15A_n and n second gate lines 15B_1 to 15B_n, where n is a positive integer.
Each pixel P may be connected to one of the data voltage supply lines 14A_1 to 14A_m, one of the sensing voltage readout lines 14B_1 to 14B_m, one of the first gate lines 15A_1 to 15A_n, and one of the second gate lines 15B_1 to 15B_n. Each pixel P may receive a data voltage through the data voltage supply line, may receive a first threshold voltage sensing gate pulse through the first gate line, may receive a second threshold voltage sensing gate pulse through the second gate line, and may output a sensing voltage through the sensing voltage readout line. For example, in a pixel array shown in
Each pixel P may receive a high potential driving voltage EVDD and a low potential driving voltage EVSS from a power generator (not shown). Each pixel P according to an embodiment of the invention may include an organic light emitting diode (OLED), a driving thin film transistor (TFT), first and second switch TFTs, and a storage capacitor for the external compensation. The TFTs constituting the pixel P may be implemented as a p-type or an n-type. Further, semiconductor layers of the TFTs constituting the pixel P may contain amorphous silicon, polycrystalline silicon, or oxide.
In a sensing drive for sensing a threshold voltage of the driving TFT, the data driving circuit 12 may supply the threshold voltage sensing data voltage to the pixels P in response to the first threshold voltage sensing gate pulse. Further, the data driving circuit 12 may convert the sensing voltages received from the display panel 10 through the sensing voltage readout lines 14B_1 to 14B_m into digital values and supply the digital sensing voltages to the timing controller 11. In an image display drive for the image display, the data driving circuit 12 may convert digital compensation data MDATA received from the timing controller 11 into an image display data voltage based on a data control signal DDC and supply the image display data voltage to the data voltage supply lines 14A_1 to 14A_m.
The gate driving circuit 13 may generate a gate pulse based on a gate control signal GDC. The gate pulse may include the first threshold voltage sensing gate pulse, the second threshold voltage sensing gate pulse, a first image display gate pulse, and a second image display gate pulse. In the sensing drive of the threshold voltage, the gate driving circuit 13 may supply the first threshold voltage sensing gate pulse to the first gate lines 15A_1 to 15A_n in the line sequential manner and also may supply the second threshold voltage sensing gate pulse to the second gate lines 15B_1 to 15B_n in the line sequential manner. In the image display drive, the gate driving circuit 13 may supply the first image display gate pulse to the first gate lines 15A_1 to 15A_n in the line sequential manner and also may supply the second image display gate pulse to the second gate lines 15B_1 to 15B_n in the line sequential manner. The gate driving circuit 13 may be directly formed on the display panel 10 through a gate driver-in panel (GIP) process.
The timing controller 11 may generate the data control signal DDC for controlling operation timing of the data driving circuit 12 and the gate control signal GDC for controlling operation timing of the gate driving circuit 13 based on timing signals, such as a vertical sync signal Vsync, a horizontal sync signal Hsync, a data enable signal DE, and a dot clock DCLK. Further, the timing controller 11 may modulate input digital video data DATA based on the digital sensing voltages received from the data driving circuit 12 and generate the digital compensation data MDATA for compensating for a deviation between the threshold voltages of the driving TFTs. The timing controller 11 may then supply the digital compensation data MDATA to the data driving circuit 12.
The timing controller 11 according to an embodiment of the invention may divide a sensing period for sensing the threshold voltage into a first period and a second period following the first period. The timing controller 11 may control an operation of the data driving circuit 12 and an operation of the gate driving circuit 13 in the first and second periods, thereby reducing the time required to sense the threshold voltage. For this, an embodiment of the invention may not uniformly hold a gate voltage of the driving TFT included in the pixel P at a predetermined level throughout the sensing period, in contrast to the related art. For example, an embodiment of the invention may hold the gate voltage of the driving TFT at one or more high levels in the first period of the sensing period, and may hold the gate voltage of the driving TFT at a reference level lower than the high level in the second period of the sensing period. Furthermore, the embodiment may increase a gate-source voltage of the driving TFT and reduces a channel resistance of the driving TFT in the first period of the sensing period, thereby increasing an amount of a current flowing between a drain electrode and a source electrode of the driving TFT. As the amount of the current flowing between the drain electrode and the source electrode of the driving TFT increases, the source voltage of the driving TFT may rapidly increase. Therefore, the time it takes for the gate-source voltage of the driving TFT to reach a threshold voltage of the driving TFT may be reduced.
As shown in
The OLED may include an anode electrode connected to a second node N2, a cathode electrode connected to an input terminal of a low potential driving voltage EVSS, and an organic compound layer positioned between the anode electrode and the cathode electrode.
The driving TFT DT may control a driving current Ioled flowing in the OLED depending on a gate-source voltage Vgs of the driving TFT DT. The driving TFT DT may include a gate electrode connected to a first node N1, a drain electrode connected to an input terminal of a high potential driving voltage EVDD, and a source electrode connected to the second node N2.
The storage capacitor Cst may be connected between the first node N1 and the second node N2.
In the sensing drive, the first switch TFT ST1 may apply a threshold voltage sensing data voltage Vdata charged to the data voltage supply line 14A to the first node N1 in response to a first threshold voltage sensing gate pulse SCAN. In the image display drive, the first switch TFT ST1 may apply an image display data voltage Vdata charged to the data voltage supply line 14A to the first node N1 in response to a first image display gate pulse SCAN. The first switch TFT ST1 may include a gate electrode connected to the first gate line 15A, a drain electrode connected to the data voltage supply line 14A, and a source electrode connected to the first node N1.
In the sensing drive, the second switch TFT ST2 may turn on a current flow between the second node N2 and the sensing voltage readout line 14B in response to a second threshold voltage sensing gate pulse SEN, thereby storing a source voltage of the second node N2, which is changed by following a gate voltage of the first node N1 in the source follower manner, in a sensing capacitor Cx of the sensing voltage readout line 14B. In one example, the sensing capacitor Cx may be implemented by a parasitic capacitor of the sensing voltage readout line 14B. In the image display drive, the second switch TFT ST2 may turn on a current flow between the second node N2 and the sensing voltage readout line 14B in response to a second image display gate pulse SEN, thereby resetting a source voltage of the driving TFT DT to an initialization voltage Vpre. A gate electrode of the second switch TFT ST2 may be connected to the second gate line 15B, a drain electrode of the second switch TFT ST2 may be connected to the second node N2, and a source electrode of the second switch TFT ST2 may be connected to the sensing voltage readout line 14B.
The data driving circuit 12 may be connected to the pixel P through the data voltage supply line 14A and the sensing voltage readout line 14B. The sensing capacitor Cx for storing the source voltage of the second node N2 as the sensing voltage Vsen may be formed on the sensing voltage readout line 14B. The data driving circuit 12 may include a digital-to-analog converter (DAC), an analog-to-digital converter (ADC), an initialization switch SW1, and a sampling switch SW2.
In the first and second periods of the sensing period, the DAC may generate the threshold voltage sensing data voltages Vdata at the same level or different levels under the control of the timing controller 11 and may output the threshold voltage sensing data voltages Vdata to the data voltage supply line 14A. In an image display period, the DAC may convert digital compensation data into an image display data voltage Vdata under the control of the timing controller 11 and may output the image display data voltage Vdata to the data voltage supply line 14A.
The initialization switch SW1 may turn on a current flow between an input terminal of the initialization voltage Vpre and the sensing voltage readout line 14B. The sampling switch SW2 may turn on a current flow between the sensing voltage readout line 14B and the ADC. The ADC may convert the analog sensing voltage Vsen stored in the sensing capacitor Cx into a digital value and supplies this digital sensing voltage Vsen to the timing controller 11.
A process for detecting the sensing voltage Vsen deciding a change in the threshold voltage of the driving TFT DT from each pixel P is additionally described below with reference to
When the first and second threshold voltage sensing gate pulses SCAN and SEN of an on-level Lon are applied to the pixel P for the sensing drive of the threshold voltage, the first switch TFT ST1 and the second switch TFT ST2 may be turned on. In this example, the initialization switch SW1 inside the data driving circuit 12 is turned on. When the first switch TFT ST1 is turned on, the threshold voltage sensing data voltages Vdata is supplied to the first node N1. When the initialization switch SW1 and the second switch TFT ST2 are turned on, the initialization voltage Vpre is supplied to the second node N2. In this example, because the gate-source voltage Vgs of the driving TFT DT is greater than the threshold voltage Vth of the driving TFT DT, the current Ioled (Ids) flows between the drain electrode and the source electrode of the driving TFT DT. A source voltage VN2 of the driving TFT DT charged to the second node N2 gradually increases due to the current Ioled (Ids). Hence, until the gate-source voltage Vgs of the driving TFT DT becomes the threshold voltage Vth of the driving TFT DT, the source voltage VN2 of the driving TFT DT follows a gate voltage VN1 of the driving TFT DT.
The gradually increasing source voltage VN2 of the driving TFT DT at the second node N2 may be stored in the sensing capacitor Cx formed on the sensing voltage readout line 14B as the sensing voltage Vsen via the second switch TFT ST2. The sensing voltage Vsen may be detected when the sampling switch SW2 inside the data driving circuit 12 is turned on in the sensing period, in which the second threshold voltage sensing gate pulse SEN is maintained at the on-level Lon. The detected sensing voltage Vsen may be supplied to the ADC.
In the external compensation using the source follower manner, an embodiment of the invention may hold the gate voltage of the driving TFT at one or more high levels in the first period of the sensing period, thereby reducing the sensing time of the threshold voltage. For this, an example embodiment of the invention may modulate the threshold voltage sensing data voltage Vdata as shown in
As shown in
An example embodiment of the invention may increase the gate-source voltage of the driving TFT in an initial sensing period and reduce the channel resistance of the driving TFT. Further, the example embodiment may increase the drain-source current of the driving TFT in the initial sensing period, so that the source voltage of the driving TFT rapidly follows the gate voltage of the driving TFT. Hence, the time required to sense the threshold voltage of the driving TFT may be reduced.
Example embodiments of the invention may use at least one of the methods shown in
As shown in
As shown in
According to embodiments of the invention, a threshold voltage sensing period Tx′ may be much shorter than the related art threshold voltage sensing period Tx (
As shown in
In this example, the inverter INV inverts the (N−1)th clock signal S(N−1) of a TTL level. The first AND gate AND1 performs an AND operation on the (N−1)th clock signal S(N−1) passing through the inverter INV and the Nth clock signal S(N). The second AND gate AND2 performs an AND operation on the (N−1)th clock signal S(N−1), which does not pass through the inverter INV, and the Nth clock signal S(N). The first level shifter L/S 1 level-shifts an operation result of the second AND gate AND2 having the TTL level into a first on-level VGH1 and an off-level VGL. The second level shifter L/S 2 level-shifts an operation result of the first AND gate AND1 having the TTL level into a second on-level VGH2 and the off-level VGL. In example embodiments disclosed herein, the first on-level VGH1 is higher than the second on-level VGH2. The waveform synthesizer synthesizes a signal received from the first level shifter L/S 1 and a signal received from the second level shifter L/S 2 and generates the first threshold voltage sensing gate pulse SCAN of the multi-on level having the first on-level VGH1 and the second on-level VGH2.
As shown in
On the other hand, example embodiments of the invention do not uniformly hold the gate voltage of the driving TFT at a predetermined level throughout the sensing period. For example, an example embodiment holds the gate voltage of the driving TFT at the high level (for example, 11V) in the initial period of the sensing period and holds the gate voltage of the driving TFT at the reference level (for example, 9V) lower than the high level in the remaining period of the sensing period. As a result, in the example embodiment, the time required to sense the threshold voltage Vth of the driving TFT may be 2.77 msec, which is greatly reduced as compared with the related art.
As described above, embodiments of the invention control the gate voltage of the driving TFT at the multi-level when sensing the threshold voltage of the driving TFT using the source follower manner, thereby greatly reducing time required to sense the threshold voltage of the driving TFT.
Although embodiments have been described with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the scope of the principles of this disclosure. More particularly, various variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the disclosure, the drawings and the appended claims. In addition to variations and modifications in the component parts and/or arrangements, alternative uses will also be apparent to those skilled in the art.
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