Hereinafter, embodiments incorporating the present invention is described with an example of a liquid crystal display with a display material of liquid crystal. In the drawings and explanation hereinafter are appropriately omitted and simplified. Further, components identical are denoted by reference numerals identical to those therein with detailed description omitted as necessary.
A liquid crystal display of this embodiment is described herein after in detail. A liquid crystal display usually includes an array substrate and an opposing substrate. Furthermore, the array substrate and opposing substrate are bonded by a frame shaped seal material. Liquid crystal is filled in an area formed by the array substrate, opposing substrate and seal material. Note that in this embodiment, the array substrate is explained as a TFT array substrate having TFTs arranged in array. That is, the liquid crystal display of this embodiment is an active matrix liquid crystal display.
Several TFT array substrates and opposing substrates are obtained by cutting a pair of mother substrates in light of mass productivity. Specifically, a mother substrate having a plurality of TFT array substrates and a mother substrate having a plurality of opposing substrates are bonded. Then the bonded substrates are cut in row or column direction to form stick substrates. Furthermore, in this embodiment, a lighting test is performed to the stick substrate having a plurality of liquid crystal panels arranged in one line. Moreover, after the lighting test is performed, the stick substrate is cut into each of the liquid crystal panel.
Firstly the mother substrate having the plurality of TFT array substrates is described with reference to
Each of the element segments 101 is arranged with predetermined spacing. Furthermore, cutting lines 104 are placed between each of the element segments 101. That is, by cutting the mother substrate 1 along the cutting line 104, the mother substrate 1 is separated into each TFT array substrate 100. Note that in
Next, the configuration of the TFT array substrate 100 is described with reference to
Moreover, a plurality of source lines 25 made of metal such as Al and Cr or the like, source electrodes and drain electrodes are formed over the gate insulating film and semiconductor layer. The plurality of source lines 25 are provided to be orthogonal to the plurality of gate lines 26 with the gate insulating film interposed therebetween. The plurality of source lines 25 are formed in parallel. By this, the TFTs 27, which are switching devices, are formed near the intersections of the gate lines 26 and source lines 25. Source electrodes of the TFT 27 are connected with the source lines 25. An interlayer insulating film is formed over the source lines 25. Furthermore, pixel electrodes 24 are formed over the interlayer insulating film. Drain electrodes of the TFTs 27 are connected with the pixel electrodes 24. The pixel electrodes 24 are connected with the drain electrodes via contact holes provided to the interlayer insulating film, for example. A gate signal for turning the TFT ON/OFF is input to the gate lines 26. A source signal corresponding to a display signal voltage is input to the source lines 25.
The abovementioned pixel electrodes 24 are arranged in matrix. For the pixel electrode 24, usually transparent conductive film such as ITO is used. As for a reflective or semi-transparent liquid crystal display, a metallic material having high optical reflectance such as Al is used for the pixel electrodes 24. The areas where the pixel electrodes 24 are provided are to be pixels. The area where these pixels are formed in matrix is to be the display area. Moreover, the pixels are formed in the liquid crystal filled areas 102. Accordingly, the liquid crystal filled area 102 is placed to surround the display area. The storage capacity lines 20 are formed below the pixel electrodes 24. The gate insulating film and interlayer insulating film are formed between the pixel electrodes 24 and storage capacity lines 20. The pixel electrodes 24 and storage capacity lines 20 are placed opposite each other with the insulating films interposed therebetween. Capacitors are formed by the pixel electrodes 24 and storage capacity lines 20. The storage capacity lines 20 are connected with opposing electrodes provided to the opposing substrate via transfer electrodes. Therefore, the pixel electrodes 24 and storage capacity lines 20 form storage capacities so as to improve data retention properties. This enables to retain the display signal voltage held in the pixel electrodes even when the TFTs 27 are turned off and a driving voltage is not supplied. More specifically, even after the TFTs 27 are turned off, the display signal voltage supplied to the pixel electrodes 24 while the TFTs 27 were on can be retained.
Additionally, test lines 16 to 19 are formed over the TFT array substrate 100. The test line 17 is connected with the plurality of gate lines 26. The test line 19 is connected with a plurality of switch devices 21. The test line 18 is connected with the plurality of storage capacity lines 20. The test line 16 is connected with the plurality of source lines 25 via the switch devices 21. The test line 19 is connected with control terminals of the switch devices 21. The test lines 16 to 19 can be formed by the same process as the gate lines 26 and source lines 25. These test lines 16 to 19 are placed outside the display area.
Gate terminals 23 are formed at the end of the gate lines 26. Here, the gate terminals 23 are placed at the right end part of the TFT array substrate 100. Moreover, the gate terminals 23 corresponding to the number of gate lines 26 are arranged in a vertical line. Likewise, source terminals 22 are formed at the end of the source lines 25. Here, the source terminals 22 are placed at the upper end part of the TFT array substrate 100. Moreover, the source terminals 22 corresponding to the number of source lines 25 are arranged in a horizontal line. Test terminals 12 to 15 are formed respectively to the end of the test lines 16 to 19. Here, the test terminals 12 to 15 are formed to the upper end part of the TFT array substrate 100. Further, the test terminals 12 to 15 are placed to the left side of the source terminals 22. The same conductive layer as the pixel electrodes 24 is formed to the surface of the source terminal 22, gate terminal 23 and test terminals 12 to 15. That is, the conductive layer is exposed to the surface of the source terminals 22, gate terminals 23 and test terminals 12 to 15. This enables to input a signal from outside. The source terminals 22, gate terminals 23 and test terminals 12 to 15 are formed outside the liquid crystal filled area 102. Furthermore in
The switch devices 21 are formed to the opposite end part of the source terminals 22 for the source lines 25. The switch devices 21 are thin film transistors and can be formed by the same process as the TFTs 27. The test line 17 is connected with the gate line 26 at the opposite end part of the gate terminal 23 for the gate lines 26. The test line 18 is connected with each capacity storage line 20 at an end of the storage capacity line 20.
The source terminals 22, gate terminals 23 and test terminals 12 to 15 that are formed over the TFT array substrate 100 are input terminals for inputting a signal. Specifically, a source signal is input to the source terminals 22 from a driving circuit. Furthermore, a gate signal is input to the gate terminals 23 from the driving circuit. Therefore, a source signal is supplied to the source lines 25 via the source terminals 22, and a gate signal is supplied to the gate lines 26 via the gate terminals 23. Various test signals are input to the test terminals 12 to 15 for performing a lighting test during manufacturing process.
To be more specific, a test signal for turning the switch devices 21 on is input to the test terminal 15. This enables a test signal for lighting test that is input to the test line 19 to be supplied to the source lines 25 via the switching devices 21. Test signals are input to the gate lines 26 and storage capacity lines 20 respectively via the test terminals 13 and 14. This enables to supply the test signals to the TFTs 27 and pixel electrodes 24. Furthermore, planar light source are placed to the back of the element segments 101. Thus the lighting test can be carried out. Note that at a normal time when the lighting test is not performed, the switching devices 21 are off. That is, in order to display, a source signal is input to the source line 25 from the source terminal 22.
The configuration described above is formed inside the element segment 101. These components can be formed by a known film forming method and lithography method or the like. Moreover, over the TFT array substrate 100, the abovementioned alignment film 10 is formed to cover all the pixel electrodes 24. For the alignment film 10, a resin film such as polyimide can be used. The surface of the alignment film is rubbed in a predetermined direction.
The configuration of the mother substrate having the plurality of opposing substrates is described hereinafter with reference to
Each of the element segments 101 is arranged with predetermined spacing. Additionally, cutting lines 104 are placed between each of the element segments 101. That is, by cutting the mother substrate 2 along the cutting line 104, the mother substrate 2 is separated into each opposing substrate 200. Note that also in
Next, the pixel configuration of the opposing substrate 200 is described hereinafter with reference to
The alignment film 9 is formed over the opposing electrode 11. The alignment film 9 is formed in the liquid crystal filled area 102. Accordingly the alignment 9 is not formed in the end part of each element segment and the opposing electrodes 11 are exposed. Accordingly the opposing electrode 11 is exposed in the end part of the opposing substrates 200. For the alignment film 9 as with the TFT array substrate 100, a resin film made of polyimide or the like can be used. Furthermore, the alignment film 9 is rubbed in a predetermined direction. Note that over the opposing electrodes 11, a hydrophobic film having a predetermined contact angle to water is formed. The configuration of the hydrophobic film is described later in detail. Meantime, the hydrophobic film can be formed after forming the opposing electrodes 11 and before forming the alignment film 9. Alternatively, the hydrophobic film may be formed after forming the alignment film 9 and before bonding the TFT array substrate with opposing substrate 200.
Then, after completing the rubbing process for the alignment films 9 and 10, the mother substrate 1 is bonded with the mother substrate 2. Accordingly, firstly a seal material is formed to the mother substrate 1 or 2. The seal material is formed to each of the 12 element segments 101. Then the seal material is placed to shape a frame, surrounding the liquid crystal filled area 102. Also, a liquid crystal filling opening is formed to a part of the seal material. Next, the mother substrate 1 and 2 are aligned and placed opposite each other. Here, the alignment films 9 and 10 are placed to face each other. Then both of the substrates are pressed and the seal material is cured. This makes the mother substrates 1 and 2 to be bonded with the seal material interposed therebetween. Note that before bonding, transfer electrodes or the like are formed so that the test line 18 and opposing electrode 11 are connected. For the transfer electrodes, silver paste can be used for example. Moreover, before bonding, a spacer may be placed to keep the cell gap.
Then by cutting the bonded mother substrates 1 and 2 along the cutting lines 104 in horizontal direction shown in
The stick substrate is formed in this way. The stick substrate here indicates a pair of laminated substrates obtained by cutting and dividing the mother substrates 1 and 2 after the mother substrates 1 and 2 are bonded. In the stick substrate, the plurality of element segments 101 are arranged in one line. After a test is carried out, the stick substrates are cut. This separates into each element segment 101 and divides into each liquid crystal panel.
The configuration of the stick substrate is described hereinafter with reference to
The configuration between the element segments 101 in the stick substrate 103 is described with reference to
As shown in
As shown in
Here at the state of the stick substrate 103, the opposing substrate 11 is placed over the gate terminals 23. An area where the gate terminals 23 face the opposing substrate 11 is referred to as a terminal electrode opposing area 106 here. A hydrophobic film 8 is formed to the stick shaped opposing substrate 103b. The hydrophobic film 8 is placed to the terminal electrode opposing area 106. Specifically, the gate terminals 23 face the opposing electrode 11 with the hydrophobic film 8 interposed therebetween. The hydrophobic film 8 has a high contact angle to water. For the hydrophobic film 8, a fluorinated silicone resin may be used for example. More specifically, a commercially available photosensitive resin such as a fluorinated silicon resin or the like for forming a water-repellent film manufactured by Toshiba Silicone Co., Ltd. can be used. Thus a photosensitive resin having hydrophobicity and water-repellency is coated over the mother substrate 2, exposed and developed. This enables to easily form the hydrophobic film 8 having a desired pattern.
A test signal is input from the test terminal 13 to the gate lines 26. Thus the gate terminals 23 connected with the gate lines 26 have a potential corresponding to the test signal. A test signal is also input to the test terminal 14. Accordingly, a test signal is input to the opposing substrate 11 via the test line 18 and transfer electrodes or the like. Thus the opposing electrode 11 also has a potential corresponding to the test signal. The test signals input to the test terminals 14 and 13 are different here. Thus different voltages corresponding to the test signals are applied to the opposing substrate 11 and gate terminals 23. Therefore, a lighting test is carried out to each of the element segments 101 of the stick substrate 103.
In this embodiment as described above, in the terminal electrode opposing area 106, the hydrophobic film 8 is formed to the stick shaped opposing substrate 103b. Thus even when a voltage is applied the opposing electrode 11 and the gate terminals 23 that are exposed to the surface in a test process, corrosion in the gate terminals 23 can be prevented. This enables to prevent generating display failure. To be more specific, even when a water droplet 9 immerses in a cleansing process or by moisture condensation, the hydrophobic film 8 prevents the water droplet 29 from immersing into the terminal electrode opposing area 106. For example, even when the water droplet 29 immerses between the element segments 101, which is between the stick shaped array substrate 103a and stick shaped opposing substrate 103b, the water droplet 29 moves avoiding the hydrophobic film 8 having a high contact angle. Thus the water droplet 29 does not attach to the gate terminals 23. Even when a potential difference is generated between the opposing substrate 11 and gate terminal 23 or between the gate terminals 23, it is possible to prevent from generating an electrochemical reaction. Thus display failure can be prevented from generating. This enables to prevent from reducing display quality.
An example of the relationship between the contact angle and a rising distance of water surface due to capillary phenomenon is shown in
As described above, in the terminal electrode opposing area 106, the hydrophobic film 8 is provided to the stick shaped opposing substrate 103b. The hydrophobic film 8 is formed to all of the plurality of gate terminals 23. This enables to prevent from corrosion even when a voltage is applied in a test process. Thus it is possible to prevent from deteriorating display quality. As described above, even when a cleansing process is carried out after bonding the mother substrates 1 and 2, it is possible to prevent the water droplet 29 from immersing. For example, the stick substrate 103 can be cleansed. Furthermore, at the state of the stick substrate 103, even when the water droplet 29 immerses between both of the substrates due to capillary phenomenon, the water droplet 29 moves avoiding the hydrophobic film 8. Thus the water droplet 29 does not attach to the gate terminals 23. It is possible to prevent the water droplet 29 from immersing into the terminal electrode opposing area 106. Thus the deterioration of display quality due to electrolytic corrosion can be reduced. In addition, as only the hydrophobic film 8 needs to be formed, the corrosion caused by the electrochemical reaction can be prevented easily.
Then, after completing the test process, the stick substrate 103 is divided and separated into element segments 101. In this example, the stick shaped opposing substrate 103b is cut along the cutting lines 105 shown in
In a cutting process for cutting the stick substrate 103 after the test process, the opposing substrate 200 of the terminal electrode opposing area 106 shown in
As described above, according to this embodiment, at the state of the stick substrate 103, the hydrophobic film 8 is placed between the gate terminals 23 and opposing electrode 11. Thus in a test process at the state of the stick substrate 103, even when a potential difference is generated between the gate terminal 23 and opposing electrode 11 or between gate terminals 23, corrosion caused by an electrochemical reaction can be prevented. Further, as a test can be performed at the state of the stick substrate 103, yield can be improved. Furthermore, as a patterning process of the opposing electrodes can be omitted, a liquid crystal display with high display quality can be manufactured at low cost. Thus the productivity can be improved. Moreover, the configuration of this embodiment can be incorporated to a horizontal electric filed liquid crystal display that does not require the opposing electrode for the opposing substrate 200. In such case, corrosion in the gate terminals 23 caused by a potential difference between the gate terminals 23 can be prevented.
Note that the hydrophobic 8 may at least be formed in the terminal electrode opposing area 106. Thus the location of the hydrophobic 8 is not limited to the one shown in
As shown in
Such hydrophobic film 8 is also formed in the area facing the gate lines 26. That is, the hydrophobic film 8 is formed between the gate lines 26 and opposing electrode 11. Thus, in outside the seal material 3, even when a defect such as a pinhole 30 is created in the insulating film 7 that covers the gate line 26, corrosion caused by the water droplet 29 can be prevented. Specifically, as the hydrophobic film 8 is provided in the portion facing the pinhole 30, the water droplet 29 does not attach to the gate line 26 that is exposed from the pinhole 30. Thus an electrochemical reaction generated when applying a voltage can be prevented and the corrosion in the gate line 26 can be prevented. Note that the hydrophobic film 8 needs not to be provided to all over the element segments 101. For example, the hydrophobic film 8 may be formed in the area facing the gate lines 26. More specifically, the hydrophobic film 8 may be formed in a line formed area where the gate lines 26 are formed outside the seal material 3.
A liquid crystal display of this embodiment is described with reference to
The hydrophobic film 8 is provided to the surface of the stick shaped array substrate 103a. The area where the plurality of gate terminals 23 are formed is referred to as a terminal formed area 107. The hydrophobic film 8 is formed near the terminal formed area 107. Then the hydrophobic film 8 is formed to surround the terminal formed area 107. Accordingly, the hydrophobic film 8 is placed outside the gate terminals 23. The hydrophobic film 8 is provided over the insulating film 7 for example, and exposed to the surface. Therefore, even when the water droplet 29 immerses between the substrates, the water droplet 29 does not immerse into the terminal formed area 107. As the water droplet 29 does not attach to the gate terminals 23, corrosion of the terminals 23 caused by an electrochemical reaction can be prevented. That is, as the water droplet 29 does not immerse inside the hydrophobic film 8, the corrosion of the gate terminals 23 can be prevented even if a voltage is applied in a test process. Thus, even when the stick substrate 103 is cleansed, it is possible to prevent corrosion.
As for the hydrophobic film 8, a photosensitive fluorinated silicone resin can be used as with the first embodiment. The hydrophobic film 8 may only need to be a material having a higher contact angle than its peripheral parts. For example, the contact angle of the hydrophobic film 8 is higher than that of the surface of the insulating film 7 that covers the gate lines 26. That is, the material may be a material having a higher contact angle than a silicon oxide film or silicon nitride film to be the gate insulating film or interlayer insulating film. The hydrophobic film 8 is formed over the insulating film 7.
In this embodiment, the hydrophobic film 8 is formed to the stick shaped array substrate 103a. Thus, after separating into each element segment 101, the hydrophobic film 8 remains over the TFT array substrates 100. Specifically, in the state of liquid crystal panels, the hydrophobic film 8 is placed outside the gate terminals 23. The hydrophobic film 8 is formed to surround the terminal formed area 107 of the liquid crystal panel. This enables to prevent from corrosion caused by an electrochemical reaction. Furthermore, as a resin or the like is not formed to the surface of the gate terminals 23, a connection with the driving circuit can easily made with low electric resistance. Then, an ACF or the like is provided over the gate terminals 23 surrounded by the hydrophobic film 8 so as to connect the driving circuit. This enables to easily mount the driving circuit.
Note that the location of the hydrophobic film 8 is not limited to be formed to surround the terminal formed area 107. For example, the hydrophobic film 8 may only be formed outside the terminal formed area 107. Another configuration in which the location of the hydrophobic film 8 is changed is described hereinafter with reference to
Specifically, the hydrophobic film 8 is formed outside and both sides the terminal formed area 107. Furthermore, the hydrophobic film 8 is extended to the seal material 3. More specifically, the seal material 3 and hydrophobic film 8 surround the terminal formed area 107. This enables to prevent the water droplet 29 from attaching to the gate terminals 23 even when the water droplet 29 is immersed between the substrates. Thus it is possible to suppress from deteriorating display quality caused by electrolytic corrosion.
Here, the area where the plurality of gate lines 26 are formed is referred to as a line formed area 108. The seal material 3 and hydrophobic film 8 surround the line formed area 108 This enables to prevent the water droplet 29 from immersing over the gate lines 26. That is, the water droplet 29 immersed between the substrates moves only outside the area formed by the hydrophobic film 8 and seal material 3. The water droplet 29 does not immerse into the line formed area 108. As shown in
In order to form the hydrophobic film 8 over the TFT array substrates 100, the hydrophobic film 8 may be provided near the gate terminals 23. Moreover, the hydrophobic film 8 is placed outside the gate terminals 23, which is closer the end of the TFT array substrate 100 than the gate terminals 23. In such case, the gate terminals 23 are placed between the seal material 3 and hydrophobic film 8. This enables to prevent water from immersing externally. Furthermore, by surrounding the terminal formed area 107 by the hydrophobic film 8, it is possible to assure preventing a water droplet from attaching to the gate terminals 23. Alternatively, the terminal formed area 107 maybe surrounded by the hydrophobic film 8 and seal material 3. This assures to prevent the water droplet 29 from attaching to the gate terminals 23. In such case, the line formed area 108, which is outside the seal material 3, is surrounded by the hydrophobic film 8 and seal material 3. This enables to prevent from corrosion of the gate lines 26.
Although that in the first and second embodiment, the hydrophobic film 8 is explained for preventing corrosion of the gate terminals 23, the present invention is not limited to this. For example, the hydrophobic film 8 may be formed to the source terminals 22 or test terminals 12 to 15. Specifically, the hydrophobic film 8 may be provided to the input terminals configured to input signals from outside. Specifically, at the state of the stick substrate 103, the hydrophobic film 8 may be provided to the input terminal exposed outside the liquid crystal area 102 and facing the opposing electrode 11. This enables to prevent from generating corrosion in a test process even when a water droplet immerses between the substrates. Thus it is possible to prevent from deteriorating display quality. In addition, the first and second embodiments may be combined. Specifically, a hydrophobic film may be formed to both of the stick shaped array substrates 103a and 103b.
Also in the first and second embodiments, the active matrix liquid crystal display having TFT array substrates is explained, but the present invention is not limited to this. For example it may be a passive matrix liquid crystal display. Moreover, it may be a display apparatus using display materials other than liquid crystals such as an electronic paper. Furthermore in the above explanation, the liquid crystal filling process and test process are carried out after cutting the mother substrates 1 and 2, however it is not limited to this. For example if the element segments 101 are arranged in one line for the mother substrates 1 and 2, the liquid crystal filling process and test process can be carried out before cutting the mother substrates 1 and 2. Specifically, the test process may only need be carried out before separating into each element segment to form liquid crystal panels.
From the invention thus described, it will be obvious that the embodiments of the invention may be varied in many ways. Such variations are not to be regarded as a departure from the spirit and scope of the invention, and all such modifications as would be obvious to one skilled in the art are intended for inclusion within the scope of the following claims.
Number | Date | Country | Kind |
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2006-173242 | Jun 2006 | JP | national |