Number | Name | Date | Kind |
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3452328 | Hsiao et al. | Jun 1969 | |
3703705 | Patel | Nov 1972 | |
3859630 | Bennett | Jan 1975 |
Entry |
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Konemann et al., Built-In Test for Complex Digital Integrated Circuits, IEEE Journal of Solid-State Circuits, vol. SC-15, No. 3, Jun. 1980, pp. 315-319. |