1. Field of the Invention
The invention is related to the field of magnetic disk drive systems and, in particular, to a perpendicular magnetic recording medium having an interlayer formed from multiple layers. More particularly, the interlayer is formed from a layer of FCC material (e.g., NiWCr), a layer of BCC material (e.g., Cr), and a layer of HCP material (e.g., Ru).
2. Statement of the Problem
One type of recording medium presently used in magnetic recording/reproducing apparatuses is a longitudinal magnetic recording medium. A longitudinal magnetic recording medium includes a magnetic recording layer having an easy axis of magnetization parallel to the substrate. The easy axis of magnetization is the crystalline axis that is aligned along the lowest energy direction for the magnetic moment. Another type of recording medium is a perpendicular magnetic recording medium. A perpendicular magnetic recording medium includes a magnetic recording layer having an easy axis of magnetization oriented substantially perpendicular to the substrate. Hexagonal-close-packed (HCP) Co-alloys are typically used as the magnetic recording layer for both longitudinal and perpendicular recording. The easy axis of magnetization for these materials lies along the c-axis or <0001> direction.
The perpendicular magnetic recording medium is generally formed with the following layers on a substrate, a soft magnetic underlayer (SUL), an interlayer, a perpendicular magnetic recording layer, and a protective layer for protecting the surface of the perpendicular magnetic recording layer. The soft magnetic underlayer (SUL) serves to concentrate a magnetic flux emitted from a main pole of a write head and to serve as a flux return path back to a return pole of the write head during recording on the magnetic recording layer. The interlayer serves to control the size of magnetic crystal grains and the orientation of the magnetic crystal grains in the magnetic recording layer. The interlayer also serves to magnetically de-couple the SUL and the magnetic recording layer.
The interlayer may be formed from a single layer of material, such as a layer of Ru that has an HCP structure. The interlayer may alternatively be formed from multiple layers. For example, a common interlayer comprises a layer of Ru formed on a seed layer, such as Ta, NiFe, NiW, etc. The seed layer is commonly formed from a face-centered-cubic (FCC) material with the layer of Ru (having the HCP structure) formed on the FCC material. One particular interlayer comprises a seed layer of NiW or another Ni-based alloy, a first layer of Ru deposited at a lower pressure, and a second layer of Ru deposited at a higher pressure.
One problem with many present interlayers for perpendicular magnetic recording media is that they include significant amounts of Ru, which is an HCP material. The thickness of Ru in a common interlayer can reach 200 Å or more. As the cost of Ru and other HCP materials increases, the cost of fabricating perpendicular magnetic recording media unfortunately also increases.
Embodiments of the invention solve the above and other related problems with an interlayer of a perpendicular magnetic recording medium that includes less Ru (or other HCP material) than present interlayers. The interlayer as provided herein is formed from multiple layers including a layer formed from a face-centered-cubic (FCC) material (e.g., NiWCr), a layer formed from a body-centered-cubic (BCC) material (e.g., Cr), and a layer formed from a hexagonal-close-packed (HCP) material (e.g., Ru). The BCC material advantageously replaces some of the HCP material in the interlayer without affecting performance. Because the BCC material has a lower cost than the HCP material, such as Ru, perpendicular magnetic recording media may be fabricated at a lower cost without degrading performance. The addition of some BCC materials, such as Cr, may also help with corrosion resistance in the media.
One embodiment comprises an interlayer of perpendicular magnetic recording media. The interlayer includes a first layer formed from a first material having a FCC structure. The interlayer also includes a second layer formed from a second material having a BCC structure. The interlayer also includes a third layer formed from a third material having a HCP structure. The BCC material in the interlayer replaces some of the HCP material without degrading performance. At the same time, the BCC material, such as Cr, is less expensive than an HCP material, such as Ru, which allows for more cost effective fabrication of perpendicular magnetic recording media.
In another embodiment, a perpendicular magnetic recording medium includes, among other layers, a soft magnetic underlayer (SUL), an interlayer, and a perpendicular magnetic recording layer. The interlayer includes a FCC layer, a BCC layer, and a HCP layer. In one particular example of the interlayer, the FCC layer is formed from a Ni-based material (e.g., NiWCr), the BCC layer is formed from a Cr-based material (e.g., Cr), and the HCP layer is formed from a Ru-based material (e.g., Ru).
The invention may include other exemplary embodiments described below, such as associated methods of fabricating perpendicular magnetic recording media.
The same reference number represents the same element or same type of element on all drawings.
When perpendicular magnetic recording medium 104 rotates, an air flow generated by the rotation of magnetic disk 104 causes an air bearing surface (ABS) of recording head 114 to ride on a cushion of air at a particular height above magnetic disk 104. The height depends on the shape of the ABS. As recording head 114 rides on the cushion of air, actuator 108 moves actuator arm 110 to position a read element (not shown) and a write element (not shown) in recording head 114 over selected tracks of perpendicular magnetic recording medium 104.
The perpendicular magnetic recording medium 104 is shown as a disk in
SUL 205 acts in conjunction with the write head to increase the perpendicular field magnitude and improve the field gradient generated by the write head passing over the perpendicular magnetic recording medium 104. SUL 205 may be formed from CoFeTaZr or another type of material. Interlayer 210 controls the orientation and grain diameter of perpendicular magnetic recording layer 215, and also acts to de-couple SUL 205 and perpendicular magnetic recording layer 215. Perpendicular magnetic recording layer 215 comprises one or more materials that have an easy axis of magnetization oriented substantially perpendicular to the substrate. Perpendicular magnetic recording layer 215 is typically formed from a Co-alloy and may contain elements such as Cr and Pt as well as oxides such as SiO2. One example of perpendicular magnetic recording layer 215 comprises CoPtCr—SiOx.
In this embodiment, interlayer 210 is formed from multiple layers of material having different crystallographic structures.
Interlayer 210 also includes a second layer 302 formed from a material having a BCC structure, such as a BCC(110) structure. The material forming the second layer 302 may be a Cr-based material having the BCC structure, examples of which are Cr, CrMo, CrV, CrTi, CrW, CrMoB, CrMoC, CrMoSe, CrTi, CrV, and MoCr. A Cr-based material means any material solely or partially formed from Cr. The second layer 302 may have a thickness of about 3-15 nanometers.
Interlayer 210 also includes a third layer 303 formed from a material having a HCP structure, such as a HCP(00.2) structure. The material forming the third layer 303 may be a Ru-based material having the HCP structure, examples of which are Ru, RuCr, and RuTi. A Ru-based material means any material solely or partially formed from Ru. The third layer 303 may have a thickness of about 3-15 nanometers. The terms “first”, “second”, and “third” are used to distinguish between layers of different material, and are not necessarily indicative of a particular order of the layers. Also, interlayer 210 may include more layers than those illustrated in
The second layer 302 of BCC material may be multi-layer itself.
The second layer 402 of BCC material may serve as a grain size control layer. As an example, the second layer 402 may comprise a layer of a Cr alloy (CrX or CrXY) having a higher concentration of a doping element. For instance, the Cr alloy (CrX) may have a doping element (X), such as Mo, Ti, V, W, Ta, Mn, or another element. The Cr alloy (CrXY) may additionally have the doping element (Y), such as B, Si, O, N, or another element. The atomic percentage of the doping element (X) in the Cr alloy may be between about 5 to 30%, and the atomic percentage of the doping element (Y) in the Cr alloy may be between about 5 to 10%. The second layer 302 may include more layers of BCC material in other embodiments.
Interlayer 210 may comprise other layers than those shown in
For the embodiments shown in
The BCC material works well in interlayer 210 as the lattice of the BCC material matches well with both of the FCC material and the HCP material. With the BCC material replacing some of the HCP material in interlayer 210, interlayer 210 still effectively controls the size of magnetic crystal grains and the orientation of the magnetic crystal grains in perpendicular magnetic recording layer 215. Interlayer 210 also effectively serves to magnetically de-couple SUL 205 and perpendicular magnetic recording layer 215. If a BCC material such as Cr is used in interlayer 210, perpendicular magnetic recording medium 104 will also exhibit a higher resistance to corrosion.
To form the perpendicular magnetic recording medium 104 illustrated in
As a reference point, graph 800 illustrates the coercivity of a typical interlayer formed from NiW(70)/Ru(90)/Ru(90) (a FCC/HCP interlayer), where the thicknesses referred to are in Angstroms. The coercivity of this reference point is about 4900 Oe. Graph 800 also illustrates data points 802 for NiW(x)/Cr(90)/Ru(110) (a FCC/BCC/HCP interlayer). As x increases above about 20 Å, the coercivity raises above 4900 Oe. At about 70 Å, the coercivity is about 5300 Oe. This indicates that the FCC/BCC/HCP interlayer provides a good crystalline orientation even better than the FCC/HCP interlayer traditionally used.
Graph 800 also illustrates data points 804 for NiW(52)/Cr(x)/Ru(110). As x increases above about 20 Å, the coercivity raises above 4900 Oe again. At about 70 Å, the coercivity is between 5200 and 5300 Oe. This again indicates that the FCC/BCC/HCP interlayer provides a good crystalline orientation even better than the FCC/HCP interlayer traditionally used.
Although specific embodiments were described herein, the scope of the invention is not limited to those specific embodiments. The scope of the invention is defined by the following claims and any equivalents thereof.
This patent application is a continuation-in-part of a co-pending patent application having the Ser. No. 11/681,693, which was filed on Mar. 2, 2007, and is incorporated by reference as if fully provided herein.
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Number | Date | Country | |
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Child | 11736428 | US |