This application is a National Stage Entry of PCT/JP2017/038130 filed on Oct. 23, 2017, the contents of all of which are incorporated herein by reference, in their entirety.
The present invention relates to a phase control plate controlling a phase of an electromagnetic wave.
A technology using a dielectric lens is known as a technology of controlling a phase of an electromagnetic wave.
A technology related to the present invention is disclosed in Patent Document 1. Patent Document 1 discloses a device for coupling of an electromagnetic radiation from outside to inside of a biological matter or from inside to outside of the biological matter. The device includes a first metamaterial. The first metamaterial includes a substrate having a thickness equal to or less than a first wavelength of the electromagnetic radiation and a plurality of elements supported by the substrate. Each of the plurality of elements has a first length equal to or less than the first wavelength of the electromagnetic radiation, and at least two of the plurality of elements are not the same.
[Patent Document 1] Japanese Unexamined Patent Application Publication (Translation of PCT Application) No. 2017-507722
A dielectric lens has a certain thickness and therefore hinders thinning of a device. An object of the present invention is to achieve phase control over a range from 0 to 360 degrees without using a dielectric lens.
The present invention provides a phase control plate including n layers (n≥4) of overlapping admittance sheets each of which includes a plurality of plane unit cells, in which an admittance of a first plane unit cell included in an admittance sheet in a layer a (1≤a≤n) and an admittance of a second plane unit cell being included in an admittance sheet in a layer b (1≤b≤n and b≠a) and overlapping the first plane unit cell are different from each other.
The present invention can achieve phase control over a range from 0 to 360 degrees without using a dielectric lens.
The aforementioned object, other objects, features and advantages will become more apparent by the following preferred example embodiments and accompanying drawings.
A phase control plate according to the present example embodiment is configured with n layers (n≥4) of overlapping admittance sheets each of which includes a plurality of plane unit cells. A dielectric layer exists between two layers of admittance sheets. In other words, the phase control plate has a structure including n layers of admittance sheets and (n−1) layers of dielectric layers, and the admittance sheets and the dielectric layers are alternately laminated.
Each admittance sheet has a metal pattern. A metal pattern has a structure in which a plurality of types of plane unit cells including metal are two-dimensionally arranged in accordance with a certain rule or randomly. Note that, for example, a dielectric exists in a part other than metal in an admittance sheet. A size of a plane unit cell is sufficiently small compared with a wavelength of an electromagnetic wave. Consequently, a set of plane unit cells functions as an electromagnetic continuous medium. By controlling a magnetic permeability and a dielectric constant with the structure of the metal pattern, a refractive index (phase velocity) and an impedance can be independently controlled.
An example of a structure of the phase control plate will be described.
First, referring to
A linear or plate-shaped metal is formed in the metal layer 2. Two linear or plate-shaped metals separated from each other are formed in the metal layer 1. Then, the respective two metals separated from each other in the metal layer 1 are connected to the same metal in the metal layer 2, for example, through vias. As illustrated, one metal in the metal layer 2, two metals in the metal layer 1, and two vias are connected in such a way as to form a partially opened ring-shaped metal (split ring) when observed from an x direction.
When a magnetic field Bin having a component in the x direction is applied to the structure illustrated in
Next, referring to
The admittance sheet includes a plate-shaped metal in order to control an impedance (admittance). When a magnetic field Bin having a component parallel with two plate-shaped metals is applied between the two layers of admittance sheets, current Jind flows in the respective two plate-shaped metals in directions opposite to each other. Currents induced by the magnetic field Bin always flow in directions opposed to each other and therefore can induce a magnetic field. In other words, the currents can be equivalently considered as a ring current. The current Jind can be adjusted by adjusting admittances of the two layers of admittance sheets. Then, by adjusting the current Jind, a magnetic field generated by the current can be adjusted. In other words, a magnetic permeability can be controlled. Adjustment of the admittances of the admittance sheets can be achieved by adjusting an inductance L and a capacitance C formed by patterns of the plate-shaped metals.
Next, referring to
The above description tells that a magnetic permeability is controlled by two layers of admittance sheets and a dielectric constant is controlled by a single-layer admittance sheet. An impedance and a phase constant are given by Equations (1) and (2) described below by use of a dielectric constant and a magnetic permeability. Consequently, an amount of phase shift being a delay in the phase control plate can be controlled by controlling the phase constant while matching a vacuum impedance to an impedance of the phase control plate (in other words, while keeping a reflection-free condition) by controlling the dielectric constant and the magnetic permeability.
An example of a metal pattern of an admittance sheet will be described.
Another example of a metal pattern of an admittance sheet will be described. In order to control an admittance over a wide range from a capacitance to an inductance, use of a resonance circuit is considered; and examples of a metal pattern providing a series resonance circuit are illustrated in
A metal pattern in
For example, the x-axis indicates a direction of an electric field E and the y-axis indicates a direction perpendicular to the electric field E, in
Other examples of a metal pattern of an admittance sheet will be described.
Each of the metal patterns illustrated in
For example, the x-axis indicates a direction of an electric field E, and the y-axis indicates a direction perpendicular to the electric field E in
Note that, while each of the metal patterns illustrated in
When designing a metal pattern, C can be increased by forming a capacitor part as, for example, an interdigital capacitor. Further, L can be increased by forming an inductor part as, for example, a meander inductor or a spiral inductor.
Next, examples of a lamination method of an admittance sheet having the metal pattern as described above will be described. The phase control plate according to the present example embodiment is configured by overlapping n layers (n≥4) of admittance sheets each of which has the aforementioned metal pattern.
A laminated body 20 in
A laminated body 20 in
Laminated bodies 20 in
Next,
Note that n layers (n≥4) of admittance sheets are laminated in such a way as to satisfy the following conditions,
First, an admittance of a first plane unit cell included in an admittance sheet in a layer a (1≤a≤n) out of then layers (n≥4) of admittance sheets and an admittance of a second plane unit cell being included in an admittance sheet in a layer b (1≤b≤n and b≠a) and overlapping the first plane unit cell are different from each other. In other words, plane unit cells admittances of which are different from each other exist in a three-dimensional unit cell configured with a plurality of plane unit cells overlapping one another.
Further, the phase control plate according to the present example embodiment includes a plurality of three-dimensional unit cells each of which is configured with a plurality of plane unit cells overlapping one another. A three-dimensional unit cell is configured by laminating n layers (n≥4) of plane unit cells. Then, a condition “when admittances of a plurality of plane unit cells included in the same three-dimensional unit cell are compared, the difference between an admittance of a c-th layer (1≤c≤n) and an admittance of an (n−c+1)-th layer is less than a reference value” is satisfied in at least one of the plurality of three-dimensional unit cells included in the phase control plate. In other words, admittances of a plurality of plane unit cells included in the same three-dimensional unit cell are symmetric with respect to the plane unit cell in the middle.
In this case, a metal pattern of a plane unit cell in the c-th layer (1≤c≤n) may be the same as a metal pattern of a plane unit cell in the (n−c+1)-th layer in at least one three-dimensional unit cell. The same metal pattern means that shapes, line widths, line lengths, and the like of metals are equivalent and the difference in admittance is less than the reference value.
Such a symmetric structure can simplify design while achieving desired advantageous effects.
Further, an equivalent circuit diagram of a phase control plate in which six layers of admittance sheets and five layers of dielectric layers are laminated is illustrated in
Y denotes an admittance, β denotes a phase constant in a dielectric layer, and t denotes a thickness of the dielectric layer. An ABCD matrix of each admittance sheet and each dielectric layer can be written down from the equivalent circuit diagram, and a Z matrix (Z11, Z12, Z21, Z22) of the phase control plate can also be written down from the ABCD matrices.
A scattering coefficient formula G expressed by Equation (3) is described by use of the Z matrix and normalized impedances (ZS, ZL) of the phase control plate.
ZS denotes a normalized impedance determined by an incidence angle of an electromagnetic wave with respect to the phase control plate and a space impedance of a space where the phase control plate is positioned (for example, an impedance of air). ZL denotes a normalized impedance determined by an emission angle of an electromagnetic wave with respect to the phase control plate and the aforementioned space impedance.
When an incident wave and an emitted wave are transverse electric (TE) waves, ZS and ZL are expressed as Equations (4) and (5).
Further, when an incident wave and an emitted wave are transverse magnetic (TM) waves, ZS and ZL are expressed as Equations (6) and (7).
[Math. 6]
ZS=η0 cosθ
[Math. 7]
ZL=η0 cosθ
Note that η0 is a space impedance of a space where the phase control plate is positioned. Further, θi is an incidence angle of an electromagnetic wave with respect to the phase control plate. Further, θt is an emission angle of an electromagnetic wave with respect to the phase control plate.
According to the present example embodiment, admittances of n layers of admittance sheets are given in such a way that an off-diagonal element of the aforementioned scattering coefficient formula G is equal to or greater than 0.8. A structure satisfying the condition provides a high transmissivity and achieves desired advantageous effects.
Advantageous effects of the phase control plate according to the present example embodiment will be described. The entire structure of the phase control plate configured by laminating a plurality of admittance sheets approaches a resonance state when a predetermined condition is satisfied. Consequently, inconveniences such as a narrowed bandwidth in addition to increase in flowing current and increase in a loss occur. The present inventors have discovered that when a structure including three layers of admittance sheets and two layers of dielectric layers that are alternately laminated is configured to perform phase control over a wide range from 0 to 360 degrees, the aforementioned resonance state is likely to occur in a specific phase range.
The phase control plate according to the present example embodiment resolves the problem with a structure including six layers of admittance sheets and five layers of dielectric layers that are alternately laminated. Three layers of admittance sheets and two layers of dielectric layers in the laminated structure perform phase control for 0 to 180 degrees, and the other three layers of admittance sheets and the other two layers of dielectric layers perform phase control for 180 to 360 degrees. The inconvenience being occurrence of a resonance state is avoided by narrowing a phase range covered by the structure including three layers of admittance sheets and two layers of dielectric layers. Then, phase control over a wide range from 0 to 360 degrees is achieved by laminating structures each of which includes three layers of admittance sheets and two layers of dielectric layers.
The difference in characteristics between a three-layer structure and a six-layer structure are presented by use of
A steep frequency response exists in a part indicated by a frame W in
Passing power characteristics [arg(G21) between the lower surface and the upper surface of a structure] of two three-dimensional unit cells exhibiting a steep frequency response are illustrated in
Next, in a six-layer structure illustrated in
Passing power characteristics [arg(G21) between the lower surface and the upper surface of a structure] of three-dimensional unit cells corresponding to the two three-dimensional unit cells exhibiting a steep frequency response in the three-layer structure are illustrated in
Note that, while an example of causing a three-layer structure to cover a range of 180 degrees and covering a range of 360 degrees with a six-layer structure in which two three-layer structures are laminated has been described, a range covered by a three-layer structure may be decreased and the range of 360 degrees may be covered by laminating a greater number of three-layer structures. For example, a range of 120 degrees may be covered by a three-layer structure, and the range of 360 degrees may be covered by laminating three three-layer structures. However, a greater number of laminated layers causes increase in thickness of the phase control plate and hinders thinning of a device. The six-layer structure contributes to thinning of a device while achieving a sufficient characteristic as described above.
In a case of a phase control plate in which two layers of admittance sheets with the same admittance Y0 are laminated at a sufficiently close distance, it is known that equivalent performance can be achieved even when the two layers of admittance sheets are replaced by a single-layer admittance sheet with the admittance Y0. Therefore, equivalent performance can be achieved in a structure (Y1/Y2/Y3/Y2/Y1) configured by replacing the two layers in the middle in a six-layer structure with the aforementioned symmetric structure (Y1/Y2/Y3/Y3/Y2/Y1) with a single layer.
In other words, a phase control plate including five layers of admittance sheets and four layers of dielectric layers that are alternately laminated can achieve performance equivalent to that of the aforementioned phase control plate including six layers of admittance sheets and five layers of dielectric layers that are alternately laminated. The same applies to a laminated structure including more layers.
Further, a two-layer structure in which two layers of admittance sheets and a single-layer dielectric layer are laminated may cover a range of 180 degrees, and a four-layer structure in which two two-layer structures are laminated may cover a range of 360 degrees, according to the present example embodiment. In this case, advantageous effects similar to those of the six-layer structure can also be acquired.
A phase control plate according to the present example embodiment has a distinctive arrangement of three-dimensional unit cells. Details will be described below.
In the example in
According to the present example embodiment, each of n layers (n≥4) of admittance sheets includes a representative point (for example, the center of a plane shape), and the admittance sheets are laminated in such a way that representative points overlap one another in plan view. In the illustrated examples, a point C is a representative point.
The phase control plate 1 is provided by arranging three-dimensional unit cells 11 giving different phase delays according to a distance from the representative point C. For example, the phase control plate 1 may be provided by arranging three-dimensional unit cells 11 in such a way that an amount of phase delay increases as a distance from the representative point C increases (toward the edge of the phase control plate 1). Note that the phase control plate 1 may also be provided by arranging three-dimensional unit cells 11 in such a way that an amount of phase delay decreases as a distance from the representative point C increases. An amount of phase delay refers to the difference in a phase of an electromagnetic wave between an incidence plane and an emission plane of the phase control plate 1.
For example, a reference point (for example, the center of a surface of a three-dimensional unit cell 11) is defined for each of a plurality of three-dimensional unit cells 11 arranged as illustrated in
For example, an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through a three-dimensional unit cell 11 in each group is increased as a value of N increases in such a manner as n0≤N≤n1, n1<N≤n2, n2<N≤n3, . . . , or a distance from the representative point C increases. In addition, an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through a three-dimensional unit cell 11 in each group may be decreased as a value of N increases. Note that a phase range is not limited to a range from 0 to 360 degrees.
The phase control plate according to the present example embodiment described above can achieve advantageous effects similar to those of the first example embodiment. Further, the phase control plate according to the present example embodiment has a phase control function equivalent to a convex lens and a concave lens.
A phase control plate according to the present example embodiment has a distinctive arrangement of three-dimensional unit cells. Details will be described below.
According to the present example embodiment, each of n layers (n≥4) of admittance sheets includes a representative line (for example, a straight line passing through the center of a plane shape), and the admittance sheets are laminated in such a way that representative lines overlap one another in plan view. In the illustrated examples, a line L is a representative line.
The phase control plate 1 is provided by arranging three-dimensional unit cells 11 giving different phase delays according to a distance from the representative line L. For example, the phase control plate 1 may be provided by arranging three-dimensional unit cells 11 in such a way that an amount of phase delay increases as a distance from the representative line L increases (as a distance from the representative line L increases in a direction perpendicular to the representative line L). Note that the phase control plate 1 may also be provided by arranging three-dimensional unit cells 11 in such a way that an amount of phase delay decreases as a distance from the representative line L increases. An amount of phase delay refers to the difference in a phase of an electromagnetic wave between an incidence plane and an emission plane of the phase control plate 1.
For example, a reference point (for, example, the center of a surface of a three-dimensional unit cell 11) is defined for each of a plurality of three-dimensional unit cells 11 arranged as illustrated in
For example, an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through a three-dimensional unit cell 11 in each group is increased as a value of N increases in such a manner as n0≤N≤n1, n1<N≤n2, n2<N≤n3, . . . , or a distance from the representative line L increases. In addition, an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through a three-dimensional unit cell 11 in each group may be decreased as a value of N increases. Note that a phase range is not limited to a range from 0 to 360 degrees.
The phase control plate according to the present example embodiment described above can achieve advantageous effects similar to those of the first example embodiment. Further, the phase control plate according to the present example embodiment has a beam refraction function of refracting a beam in a desired state.
Examples of reference embodiments are added below as supplementary notes.
an admittance of a first plane unit cell included in an admittance sheet in a layer a (1≤a≤n) and an admittance of a second plane unit cell being included in an admittance sheet in a layer b (1≤b≤n and b≠a) and overlapping the first plane unit cell are different from each other.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
a difference between an admittance of the plane unit cell in a c-th layer (1≤c≤n) and an admittance of the plane unit cell in an (n−c+1)-th layer is less than a reference value in at least one of the three-dimensional unit cells.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
a metal pattern of the plane unit cell in a c-th layer (1≤c≤n) and a metal pattern of the plane unit cell in an (n−c+1)-th layer are identical in at least one of the three-dimensional unit cells.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
each of the n layers of admittance sheets includes a representative point, the representative points overlapping one another, and
an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through each of a plurality of the three-dimensional unit cells increases as a distance from the representative point increases.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
each of the n layers of admittance sheets includes a representative point, the representative points overlapping one another, and
an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through each of a plurality of the three-dimensional unit cells decreases as a distance from the representative point increases.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
each of the n layers of admittance sheets includes a representative line, the representative lines overlapping one another, and
an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through each of a plurality of the three-dimensional unit cells increases as a distance from the representative line increases.
a plurality of three-dimensional unit cells each of which is configured with a plurality of the plane unit cells overlapping one another, in which
each of the n layers of admittance sheets includes a representative line, the representative lines overlapping one another, and
an amount of phase delay of an electromagnetic wave when the electromagnetic wave passes through each of a plurality of the three-dimensional unit cells decreases as a distance from the representative line increases.
admittances of the n layers of admittance sheets are given in such a way that an off-diagonal element of a scattering coefficient formula G below acquired from an equivalent circuit diagram including the n layers of admittance sheets and (n−1) layers of dielectric layers positioned between the admittance sheets is equal to or greater than 0.8
in which ZS denotes a normalized impedance determined by an incidence angle of an electromagnetic wave with respect to the phase control plate and a space impedance of a space where the phase control plate is positioned, ZL denotes a normalized impedance determined by an emission angle of an electromagnetic wave with respect to the phase control plate and the space impedance, and Z11 to Z22 denote elements of a Z matrix determined by an ABCD matrix of each of the n layers of admittance sheets and an ABCD matrix of each of the (n−1) layers of dielectric layers.
Filing Document | Filing Date | Country | Kind |
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PCT/JP2017/038130 | 10/23/2017 | WO | 00 |
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WO2019/082230 | 5/2/2019 | WO | A |
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20200343644 A1 | Oct 2020 | US |