The present invention relates to measurement of very small separations between bodies, in particular, to the measurement of very small separations between a rotating disk and a disk read/write head.
Hard disk drives contain recording heads that read and write magnetic data to a rotating disk. The recording heads contain aerodynamic features that create an air bearing which controls the separation between the heads and disk. The thickness of the air bearing, or spacing between the head and disk is commonly referred to as “flying height.” The flying height greatly impacts the performance of a head. As flying height is reduced, data density on the disk can be increased significantly. However, the head must not contact the disk excessively or wear may occur, possibly leading to read/write failure. In order to verify head design and monitor production processes, the flying height of hard drive magnetic heads is frequently measured on a flying height tester.
Flying height testers commonly use a rotating transparent replica of the magnetic disk together with an actual magnetic recording head. In general, a measurement beam (1 or more) from a light source is projected through the disk onto the air bearing surface of the recording head and the reflected beam is analyzed to derive the flying height.
The current industry standard, DFHT IV (Dynamic Flying Height Tester-IV) distributed by the KLA-Tencor Corporation (U.S. Pat. No. 5,280,340 to Lacey) uses 1 multi-wavelength light source at normal incidence to the disk to produce interference at the head/disk interface. Three wavelengths are filtered from the reflected light and the intensities are analyzed to derive the flying height. This technique requires calibration of the light source intensity and the reflectance of the disk and air bearing surfaces. The calibration process involves mechanically separating the head from the disk. It is desirable for the head to remain parallel to the disk during the calibration, and not translate during the separation process. Unfortunately, considerable error may be introduced by the calibration. As the flying height decreases, the calibration error causes a greater error in flying height measurement. This condition has made many users aware that the accuracy of the DFHT IV flying height tester is not sufficient for many current and future head designs. While the DFHT IV flying height tester has been a great commercial success over the past 10 years, its commercial viability is becoming questionable for the ever-decreasing flying heights that are becoming common in the industry.
U.S. Pat. No. 5,557,399 to De Groot discloses a flying height tester that was distributed by the Zygo Corporation under the name Pegasus. The Pegasus flying height tester used polarization interferometry to measure flying height. The technique involves directing a laser at an oblique angle through the disk onto the head. The polarization state of the beam is known before it enters the disk. The beam reflected from the head is analyzed for polarization and phase changes and flying height is derived from that data. This technique has two significant difficulties. (1) The stress in the spinning glass disk causes birefringence that affects the data and is difficult to compensate for in calculations. (2) The oblique angle of incident light makes it difficult to locate the measurement spot with the required precision. Perhaps because of these reasons, the Pegasus flying height tester had little commercial success.
U.S. Pat. No. 5,638,178 to Lacey, et al, discloses an FHT using an imaging polarimeter. This technique was also adversely affected by stress-induced birefringence in the disk. While this technique theoretically provided advantages over the DFHT IV flying height tester distributed by the KLA-Tencor corporation, its performance was sub-par and it was not accepted in the industry.
U.S. Pat. No. 5,715,060 to Sides (the 060 patent) discloses a method for measuring flying height by sensing scattered light from frustrated total internal reflection. A light beam is directed through the edge of the disk onto the head air bearing surface. The incident angle of the beam striking the head is selected to produce total internal reflection. As described in “Calibration of Fly Height Measured by Scattered Total Internal Reflection” by Strunk, Low and Sides (IEEE Transactions on Magnetic Vol 36, No 5, September, 2000), the total internal reflection produces an evanescent wave on the far side of the transparent disk, where the head flies. Any material very close to the disk may interact with the evanescent wave, frustrating the total internal reflection. In particular, a typical magnetic recording head will frustrate the total internal reflection and furthermore, scatter some of the light which would have otherwise been totally internally reflected. In the 060 patent, Sides teaches that the scattered light intensity can be measured by a photo detector. The intensity of the scattered light changes as the spacing between the disk and magnetic head changes, thus this effect can be used to measure flying height. The practical difficulty in applying this technique occurs when calibrating the scattered light. Several methods are suggested in the 060 patent but they all have significant disadvantages. One method requires contacting the head and disk which can be destructive. Another method is flying the head at a known height, which requires a separate flying height measurement the method of which is unknown, or using a calibration standard that potentially does not have sufficient resolution. Even if the calibration issue was addressed, it is not clear that this technique would provide a significant improvement compared to the commercially available DFHT IV flying height tester's performance at today's very low flying heights.
U.S. Pat. No. 5,932,887 to Guzik teaches a method for measuring flying height by sensing frustrated total internally reflected light. A light beam is directed through the edge of the disk onto the head air bearing surface. The incident angle of the beam striking the head is selected to produce total internal reflection. The head material frustrates the total internal reflection. The amount of reflected light is measured and flying height is calculated. This technique has several difficulties; it is not easy to capture the internally-reflected light. The requirements for the light entry into and exit from the disk place restrictions on the disk hub design and the positions where the head may fly on the disk. Furthermore, the signals produced by the system are difficult to translate into a very accurate flying height, especially at the very low flying heights of today's head designs.
U.S. Pat. No. 6,184,993 to Duran teaches the use of a Savart plate to split an interferometric image of the head/disk interface into polarized ordinary and extraordinary beams. These beams were then retarded with respect to each other by shifting optical components in the apparatus. After shifting, the beams are superimposed and their interference is detected. The interferometric intensity is detected at a variety of phase shifts, then the phase at a giving system configuration is calculated from the data. This phase is compared to the phase measured with no head present and the flying height is calculated from the resultant phase measurements. As disclosed, this method has limitations on the possible measurement locations on the head, as the superimposed images must meet in a specific way to make the measurement. It also may be difficult to control system drift as the phase would be significantly affected by very small optical path variations caused by thermal expansion and other factors. This system has not been commercially viable.
Hence, what is needed in the art is a method or apparatus for measuring the distance between two surfaces, that overcomes one or more of the aforementioned shortcomings of the prior art.
Methods and apparatuses for measuring the distance between two surfaces are disclosed herein. For example, according to a preferred embodiment, an apparatus for measuring the spacing between a first body and a second body includes at least one source of light. The at least one source of flight produces two simultaneously coexisting light beams, including a measurement light beam and a reference light beam. At least one beam splitter may separate the measurement light beam into a first measurement portion and a second measurement portion, and may separate the reference light beam into a first reference portion and a second reference portion.
A measurement optical path directs the first measurement portion to shine upon the first and second bodies, and directs the second measurement portion to shine upon a third body. A reference optical path directs the first reference portion to shine upon the first body but not the second body, and directs the second reference portion to shine upon the third body.
A first light detector is disposed to receive light that is reflected from the first, second, and third bodies via the measurement optical path, and produces a first output signal. A second light detector is disposed to receive light that is reflected from the first and third bodies via the reference optical path, and produces a second output signal. A movable mount can hold the second body in the measurement optical path during a first period, and can hold the second body away from the measurement optical path during a second period.
A phase difference comparator is coupled to the first and second light detectors, and is capable of comparing a phase difference between the first and second output signals during the first period with a phase difference between the first and second output signals during the second period.
The preferred embodiment described above may provide several advantages. For example, the spacing-varying calibration that is required by contemporary methods may be avoided. Moreover, the preferred embodiment described above does not require the use of polarized light (which can be adversely affected by stress-induced birefringence in a spinning glass disk, for example). It may also enable measurements to be made at substantially normal incidence, which may allow improved precision of measurement spot location compared to devices with optical configurations requiring non-normal incidence. It also has the desirable trait that its sensitivity improves as the spacing or flying height decreases below 10 nm. By contrast, according to contemporary methods the sensitivity decreases as the spacing decreases below 10 nm.
Certain embodiments disclosed herein illustrate exemplary methods and apparatuses as applied in the field of hard-disk magnetic recording (e.g. for performing head/disk spacing or “flying height” measurements with improved accuracy at very low flying heights compared to contemporary methods).
a shows the Measurement Spot and Reference Spot with the Head present according to the embodiment of
b shows the Measurement Spot and Reference Spot with the Head not present (out of the field of view) according to the embodiment of
According to certain embodiments of the present invention, spacing between a transparent (or semi-transparent) medium and a reflecting object may be measured as follows. Without limiting the scope of the transparent (or semi-transparent) medium and the reflecting object, they may be referred to as the Disk and Head, respectively, in contemplation of a group of embodiments called “Flying Height Testers” (for application in the magnetic hard disk industry). In such embodiments, we can define a Measurement Spot as a relatively small spot where the spacing between the Disk and Head is substantially constant. The phase of light reflecting from the Measurement Spot on the Disk with the Head in position at a relatively small spacing from the Disk may be compared to the phase of light reflected from Measurement Spot on the Disk alone. Using the measured phase difference and the optical properties of the Head, Disk and medium between them, the spacing can be calculated.
Since the spacing is very small compared to dimensional variations caused by thermal expansion and other factors, the phase may be referenced to a secondary reflection (Reference Spot) on the Disk. The secondary reflection can be distinguished from the primary reflection in a number of ways. It can be located some distance away from the Measurement Spot. It can be located on the back-surface of the Disk. There are also many other methods to distinguish two light beams which are known to one with ordinary skill in the art. The reflection at the Reference Spot does not have a significant inherent phase change that is caused by removing the Head.
The phase at both the Measurement Spot and the Reference Spot may be measured using an interferometric technique. Light may be split and directed at two different areas. One area contains the Measurement Spot and the Reference Spot on the Disk. The other area is a Frequency Shifter. The Frequency Shifter can be composed of an optical component or mechanism that causes a relatively small shift in the frequency of the light. Examples of such a frequency shifting device would be an acusto-optic modulator or a moving reflecting object. The light reflecting from the Measurement Spot and the Reference Spot is combined with the light from the Frequency Shifter, and if properly aligned, dynamic interference fringes will result from the combination.
The intensity of the interference fringes corresponding to the Measurement Spot are measured and compared to the intensity of the fringes corresponding to the Reference Spot. Since the fringes are dynamic, they are changing in time and an analysis can yield the phase difference between the Measurement Spot fringes and the Reference Spot fringes.
However, it is not the phase difference between the Measurement Spot fringes and the Reference Spot fringes that is of primary interest. The primary interest is the difference between the phase of the light reflected from the Measurement Spot with the Head present (loaded) and the Measurement Spot with the Head not present (unloaded). However, it is not possible to directly compare the phase of these measurements, as they are not taken at the same time. Therefore, in each case (with the Head present and with the Head not present), the phase of the Measurement Spot fringes is found with respect to the Reference Spot fringes. The difference between these two Measurement Spot fringe phases with respect to the Reference Spot fringe phases yields the parameter of primary importance, the phase change caused by the presence of the Head near the Disk.
The phase difference between the Measurement Spot fringes and Reference Spot fringes is affected by a large number of factors including the difference in length between the two optical paths. The phase difference between the reference and measurement spot consists of K, a substantially constant value cause by optical path length differences and other factors, and in the case where the Head is present, the phase shift caused by the additional reflection at the surface of the Head.
In the case where the Head is not present, the phase difference between Measurement Spot and Reference Spot is the substantial constant K. When the head is present, the phase difference between the Measurement Spot and the Reference Spot is K+D, where D is the phase shift caused by the additional reflection from the Head. Taking the difference between the two differences, that is the difference of the Measurement Spot and Reference Spot with the Head loaded, minus the difference of the Measurement Spot and Reference Spot with the head unloaded, yields (K)−(K−D), or D itself. This D is the phase change caused by the presence of the Head near the Disk.
With the phase change due to introduction of the Head known as well as the optical properties of the Disk, the Head, and the medium between them, the spacing or flying height can be calculated by comparing the measured phase with the theoretical phase versus spacing relationship. The phase and associated spacing or flying height can be measured many times at high speed and parameters such as average spacing, minimum spacing, maximum spacing and others can be calculated.
Now referring to
In a similar fashion, light from second laser 10 is directed through focus optics 11 toward beamsplitter 3. Beamsplitter 3 directs a portion of the light to the interface between the head 6 and the disk 5, and a portion of the light toward the back surface of the vibrating reflecting component 8. These beams reflect and the two reflections are recombined at the beam splitter 3 and directed toward a second photo-diode detector 12. The interferometric intensity recorded at detector 12 is referred to as the Measurement. As shown in
In a preferred embodiment, the vibrating reflecting component 8 is substantially the same material and thickness as disk 5. The optics 4 and 7 are also substantially identical, such that the beamsplitter 3 and optics 4 and 7 combine to produce a “Linnik interferometer” with a vibrating reference mirror to produce dynamic interference fringes.
The signals from detectors 9 and 12 are carried by signal wires 13 and 14 respectively to system controller 15 which includes an analog-to-digital converter, digital memory, and a microprocessor-based signal combiner to record and analyze the output from detectors 9 and 12.
The disk 5 may be rotated by spindle motor 16 which is controlled by system controller 15 using control wires 17. The head 6 is mechanically attached to head actuator 18. In the preferred embodiment, head actuator 18 is a linear stage driven by a lead screw rotated by an electric motor. Head actuator 18 is controlled by system controller 15 using control wires 19. In a preferred embodiment, the vibrating reflecting component 8 may be mechanically attached to a voice-coil actuator 20. The voice coil actuator 20 is controlled by system controller 15 using control wires 21.
The motion of the vibrating reflecting component 8 is substantially synchronized with the rotation of the disk 5, because axial runout of the disk 5 and thickness variation of the disk 5 produces a similar type of dynamic interference fringe activity as the motion of the vibrating reflecting component 8. By synchronizing the motion of the vibrating reflecting component 8 and the rotating disk 5 using system controller 15, control wires 19 and 21, head actuator 18 and voice-coil actuator 20, the signals detected by detector 9 and detector 12 are substantially repeatable from revolution to revolution of the disk 5 allowing a simplified analysis of the data. In a preferred embodiment, the motion of the vibrating reflecting component 8 is synchronized by using a microprocessor-based controller 15 that receives an index pulse from the spindle motor 16 that spins the disk 5. The index pulse occurs once per revolution of the disk.
The system controller 15 may be programmed to actuate the voice coil actuator 20 with a sinusoidal current that produces one cycle of current per revolution of the disk 5, thereby causing the vibrating reflecting component 8 to move through one cycle of motion synchronously with one revolution of the disk 5. The system controller 15 can be programmed for different rotational speeds of the disk 5 and it can be programmed to change the phase of the motion of the vibrating reflecting component 8 with respect to the disk 5.
While a preferred embodiment uses two lasers 1, 10 and a vibrating optical component 8, this method may also be applied with variations of hardware. For example, a single light source could illuminate the Measurement Spot and Reference Spot in lieu of the first laser 1 and second laser 10. Also, an acusto-optic modulator could be used in lieu of the vibrating reflecting component 8. Furthermore, it is possible to implement this method using a stationary reflecting component in place of the vibrating reflecting component 8. In this case the axial runout of the disk 5 acts to shift the frequency of the light relative to the reflection from the stationary reflecting component.
To make a measurement, the fringe intensity at both the measurement detector 12 and the reference detector 9 may be recorded by the system controller 15 for a period of time with the head 6 in close proximity to the disk 5 in the field of view of the optical system. The fringe intensity at both detector 9 and detector 12 may also be recorded for a period of time with the head 6 displaced from the field of view of the optical system. The head 6 can be displaced by head actuator 18 under control of the system controller 15.
a illustrates a configuration with the head 6 in the field of view. The measurement spot 22 is located at the interface between the head 6 and disk 5. The reference spot 23 is on the disk 5 but is not affected by the head 6. An alternate reference spot 24 is also shown on the bottom surface of the disk 5.
Data set 50 and data set 51 illustrate simulated fringe intensity corresponding to measurement photo detector 12 and reference photo detector 9 respectively with the head 5 in the field of vision. Data set 52 and data set 53 illustrate fringe intensity corresponding to the same detectors with the head 5 displaced from the field of vision. These data sets are representative of one revolution of the disk 5.
The signal recorded corresponding to the measurement spot 22 with the head in the field of vision (exemplified by data set 50) may be denoted as Sa. The signal recorded simultaneously corresponding to the reference spot 23 (exemplified by data set 51) can be denoted Sb. A subsequent measurement with the head 6 out of the field of vision yields, Sc, the data corresponding to the measurement spot 22 (exemplified by data set 52), and Sd the data corresponding to the reference spot 23 (exemplified by data set 53). While shown in the figure displaced vertically for clarity, all four sets of data are normalized to a maximum of +1.0 and a minimum of −1.0.
Now referring to
Px=arcCosine(Sx) if the slope of Sx is positive
Px=2PI−arcCosine(Sx) if the slope of Sx is negative Eq. 1
In Equation 1, the subscript x is taken to be used as each of the subscripts a, b, c and d independently. The slope can be determined by examining neighboring points in each data set.
Now referring to
Now referring to
Now referring additionally to
Note that there is an ambiguity in the selection of the sign of this result depending on the sign of the shift in frequency caused by the vibrating reflecting component 8. Specifically, for one direction of motion of the vibrating reflecting component 8, the correct phase caused by the introduction of the head 6 is the data set 58 minus the data set 59. When the vibrating reflecting component 8 is moving in the opposite direction, the correct phase is data set 59 minus the data set 58.
The change in direction of the vibrating reflecting component 8 is clearly indicated by the discontinuities at disk rotational positions of 90 degrees and 270 degrees in these sets of data. From the theoretical phase versus spacing relationship, we know that the phase caused by introducing a low flying head (less than 50 nm) into the field of view is between 0 and 180 degrees. By analyzing data with a known low flying head (less than 50 nm) we determine that on data set 60, the data in the range of 0 to 90 degrees and the data in the range of 270 through 360 degrees is of the incorrect sign.
Now referring additionally to
In the preferred embodiment, the look up table is generated for each one-tenth nm. One-tenth nm is one Angstrom.
Now referring additionally to
It should be noted that the use of an acusto-optic modulator type of frequency shifter would be an advantage in that there would be no errors in the data as there can be when the vibrating reflecting component 8 shifts direction. In the preferred embodiment, the ease of integrating the vibrating reflecting component 8 was judged to be more important than the difficulty introduced by the variation in frequency shifting caused by its direction reversal.
Now referring to
Modifications and substitutions made by one of ordinary skill in the art are within the scope of the present invention which is not to be limited, except by the claims that follow.
This application is a continuation of pending U.S. patent application Ser. No. 11/011,295 (Atty. Docket No. MP-1), filed Dec. 13, 2004, incorporated herein by reference in its entirety.
Number | Date | Country | |
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Parent | 11011295 | Dec 2004 | US |
Child | 12690569 | US |