The present invention relates to a photoelectric conversion device and a method for producing the same.
As power generation systems using sunlight, photoelectric conversion devices in which semiconductor thin films of such as amorphous and microcrystal are stacked have been used.
A structure has been suggested in which in order to improve bonding between the first power collecting electrodes 18 and the photoelectric conversion cell 102, the photoelectric conversion layer 14 and the back electrode 16 under the first power collecting electrodes 18 are removed to expose the transparent electrode layer 12 formed on the glass substrate 10 and connecting the first power collecting electrodes 18 to the exposed transparent electrode layer 12 by ultrasonic soldering, conductive tape, or the like (refer to Patent Document 1, 2, and the others).
With the structure shown in
One aspect of the present invention provides a photoelectric conversion device comprising a glass substrate; a plurality of photoelectric conversion cells formed by stacking a first electrode layer, a photoelectric conversion layer and a second electrode layer on the glass substrate; and power collecting electrode that connects the photoelectric conversion cells in parallel and collects electric power output from the photoelectric conversion cells, wherein at least part of the power collecting electrode is welded to the glass substrate.
Another aspect of the present invention provides a manufacturing method of a photoelectric conversion device, wherein the method comprises a process of welding power collecting electrode to a glass substrate such that the power collecting electrode connects photoelectric conversion cells in parallel via a contact hole formed in photoelectric conversion cells formed by stacking a first electrode layer, a photoelectric conversion layer, and a second electrode layer on the glass substrate.
According to the present invention, it is possible to improve adhesiveness of power collecting electrode and improve reliability of a photoelectric conversion device.
As shown in
The glass substrate 30 is a member to mechanically support a photoelectric conversion panel of the photoelectric conversion device 200. Formed on the glass substrate 30 is the transparent electrode layer 32. The transparent electrode layer 32 is preferably formed from at least one or a combination of transparent conductive oxide materials (TCO) in which tin (Sn), antimony (Sb), fluorine (F), aluminum (Al) or the like is doped to tin dioxide (SnO2), zinc oxide (ZnO), indium tin oxide (ITO), or the like. In particular, zinc oxide (ZnO) is preferable because zinc oxide (ZnO) has high translucency, low resistivity, and good plasma resistance. The transparent electrode layer 32 can be formed by a sputtering method or a CVD method.
When applying a structure to connect the photoelectric conversion layers 34 in series, the transparent electrode layer 32 is divided into rectangular patterns. In this embodiment, first slits S1 are formed in and divide the transparent electrode layer 32 along a vertical direction in
Formed on the transparent electrode layer 32 is the photoelectric conversion layer 34 in which a silicon thin film of a p-type layer, i-type layer, and n-type layer are stacked in this order. The photoelectric conversion layer 34 may be a thin film type photoelectric conversion layer such as an amorphous silicon thin film photoelectric conversion layer or a microcrystal silicon thin film photoelectric conversion layer. Furthermore, these photoelectric conversion layers may be stacked as a tandem-type or triple-type photoelectric conversion layer. When the tandem-type or triple-type photoelectric conversion layers are used, it is further possible to apply a structure in which a intermediate layer is sandwiched. The intermediate layer is preferably a transparent conductive oxide material (TCO), for example, a material which is obtained by doping magnesium (Mg) as impurity to zinc oxide (ZnO).
The amorphous silicon thin film photoelectric conversion layer and microcrystal silicon thin film photoelectric conversion layer can be formed by a plasma chemical vapor deposition (CVD) method in which a film is produced by applying plasma processing to mixed gas, in which the following gas may be mixed: silicon containing gas such as silane (SiH4), disilane (Si2H6), dichloro-silane (SiH2Cl2); carbon containing gas such as methane (CH4); p-type dopant containing gas such as diborane (B2H6); n-type dopant containing gas such as phosphine (PH3); and diluent gas such as hydrogen (H2). As the plasma chemical vapor deposition (CVD) method, it is preferable to apply, for example, a parallel flat plate type RF plasma CVD method of 13.56 MHz.
When two or more cells are connected in series, the photoelectric conversion layer 34 is divided into rectangular patterns. For example, the photoelectric conversion layer 34 may be divided into rectangular patterns by forming a third slit S3 by radiating a YAG laser at a position 50 μm horizontally apart from the first slit dividing the transparent electrode layer 32. It is preferable to use a YAG laser which has, for example, an energy density of 0.7 J/cm2 and pulse frequency of 3 kHz.
Formed on the photoelectric conversion layer 34 is the back electrode 36. The back electrode 36 is preferably configured by stacking a transparent conductive oxide material (TCO) and reflective metal in this order. As the transparent conductive oxide material (TCO), the following materials may be used: a transparent conductive oxide material such as tin dioxide (SnO2) zinc oxide (ZnO), and indium tin oxide (ITO); or a material in which impurity is doped to these transparent conductive oxide materials (TCOs). For example, the transparent conductive oxide material (TCO) may be a material in which aluminum (Al) is doped as impurity to zinc oxide (ZnO). As the reflective metal, silver (Ag), aluminum (Al), or the like may be used. The transparent conductive oxide material (TCO) and the reflective metal can be formed by, for example, a sputtering method or a CVD method. It is preferable to provide concaves and convexes on at least one of the transparent conductive oxide material (TCO) and the reflective metal in order to enhance an optical confinement effect.
When applying a structure to connect two or more photoelectric conversion layers 34 in series, the back electrode 36 is divided into rectangular patterns. The back electrode 36 is divided into rectangular patterns by forming a fourth slit S4 by radiating a YAG laser at a position 50 μm horizontally apart from the third slit dividing the photoelectric conversion layer 34 into patterns. On the other hand, when applying a structure to divide the photoelectric conversion layer 34 in parallel, a fifth slit S5 which divides the photoelectric conversion layer 34 and the back electrode 36 is formed inside the second slit S2 dividing the transparent electrode layer 32. It is preferable to use a YAG laser which has an energy density of 0.7 J/cm2 and pulse frequency of 4 kHz.
As described above, the photoelectric conversion cell 202 is formed by stacking the transparent electrode layer 32, the photoelectric conversion layer 34, and the back electrode 36 on the glass substrate 30. Subsequently, the first power collecting electrode 38 and the second power collecting electrode 42 are formed for retrieving electric power generated by the photoelectric conversion cell 202. The first power collecting electrode 38 is used to collect electric power from the photoelectric conversion cell 202 which is divided in parallel, while the second power collecting electrode 42 is used to connect between the first power collecting electrode 38 and the terminal box 52.
First, the first power collecting electrode 38 is provided to extend on the back electrode 36 of the photoelectric conversion cell 202. The first power collecting electrode 38 is formed around an edge of the photoelectric conversion device 200 to connect between positive electrodes or between negative electrodes of the photoelectric conversion layer 34 which is divided in parallel. Therefore, the first power collecting electrode 38 is provided to extend in a direction perpendicular to the parallel dividing direction of the photoelectric conversion layer 34. In other words, as shown in
In the above embodiments according to the present invention, as shown in
Specifically, the back electrode 36 and the photoelectric conversion layer 34 which are formed in the removal area X are removed by using a YAG laser (wavelength of 532 nm). It is preferable to use a YAG laser with an energy density of 0.7 J/cm2 and pulse frequency of 4 kHz. Next, the transparent electrode layer 32 formed in the removal area X is removed by using a YAG laser (wavelength of 1,064 nm). It is preferable to use a YAG laser with an energy density of 13 J/cm2 and pulse frequency of 3 kHz.
The first power collecting electrode 38 is provided to extend over the removal areas X formed in the above manner. The first power collecting electrode 38 may be a conductive tape or sheet. Specifically, the first power collecting electrode 38 is preferably a tape or sheet made up of a metal material including 50% or more aluminum. After positioning the first power collecting electrode 38, the first power collecting electrode 38 and the glass substrate 30 are welded in the removal areas X by ultrasonic processing with an energy density of about 0.5 J/mm2. In the ultrasonic processing, welding is performed by applying ultrasonic waves while a head of an ultrasonic processor is pressed against the first power collecting electrode 38 over the removal areas X. This ultrasonic processing corresponds to an ultrasonic welding method. In this way, positive electrodes or negative electrodes of the photoelectric conversion cell 202 connected in series are connected in parallel with each other. It should be noted that the first power collecting electrode 38 is preferably positioned to cover the whole of the removal areas X. Further, the first power collecting electrode 38 is preferably made up of 99.999% or more aluminum electrode with a width of 4 to 6 mm and a thickness of 110 μm.
As shown above, by directly welding the glass substrate 30 and the first power collecting electrode 38, it becomes possible to improve reliability of the photoelectric conversion device 200 with an advantage such as a reduced likelihood of delamination of the first power collecting electrode 38.
Next, a first insulating coating material 40 is deposited to form electrical insulation between the second power collecting electrode 42 and the back electrode 36. As shown in
As shown in
Next, the second insulating coating material 44 is deposited so as to cover at least portions of the transparent electrode layer 32, the photoelectric conversion layer 34, the back electrode 36, and the first power collecting electrode 38 located near to an end portion sealing resin 50 described below. In particular, it is preferable to place the second insulating coating material 44 so as to cover at least portions of those elements opposing to the end portion sealing resin 50 (end surfaces of the transparent electrode layer 32, the photoelectric conversion layer 34, the back electrode 36, and the first power collecting electrode 38).
In the above embodiments according to the present invention, as shown in
The second insulating coating material 44 is preferably formed from an insulating material with a resistivity of 1016 Ωcm or more. Preferable materials are, for example, polyester (PE), polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polyimide, and polyvinyl fluoride. Further, it is preferable to use the second insulating coating material 44 which is coated with adhesive material in the form of sticker on the back side. In this way, it becomes possible to reduce the workload for depositing the second insulating coating material 44.
Next, the end portion sealing resin 50 is deposited. The end portion sealing resin 50 is deposited in the area (7 mm to 15 mm in width) where the photoelectric conversion cell 202 is not formed around an edge portion of the photoelectric conversion device 200. In order to provide an area where the photoelectric conversion cell 202 is not formed around an edge portion of the photoelectric conversion device 200, the edge of the glass substrate 30 may be masked by using a frame material to prevent the formation of the transparent electrode layer 32, the photoelectric conversion layer 34, and the back electrode 36 when forming the photoelectric conversion cell 202 in the film forming process. Alternatively, the photoelectric conversion cell 202 around the edge portion of the photoelectric conversion device 200 may be removed by a laser, sandblasting, or etching after the photoelectric conversion cell 202 is formed. The end portion sealing resin 50 may be deposited by applying it to the area where the photoelectric conversion cell 202 is not formed around an edge portion of the photoelectric conversion device 200 provided in such a manner.
As the end portion sealing resin 50, an insulation material having a resistivity of 1010 Ωcm or more may be used. Further, the end portion sealing resin 50 is preferably formed from a material with low water permeability in order to prevent ingress of water from an edge portion of the photoelectric conversion device 200. In particular, the end portion sealing resin 50 is preferably formed from a material with permeability with respect to water lower than the filling material 48. The end portion sealing resin 50 is further preferably elastic in order to lessen stress applied to the photoelectric conversion device 200 when mechanical force is applied to the edge portion of the photoelectric conversion device 200. Preferable materials for the end portion sealing resin 50 are, for example, epoxy-based resin and butyl-based resin. More specifically, the use of hot melt butyl is preferable because of easy application and adhesion at high temperature. It should be noted that the end portion sealing resin 50 may be about 6 mm to 10 mm in width and about 0.05 mm to 0.2 mm thicker than the filling material 48.
The back side of the photoelectric conversion device 200 is sealed by using the back surface protective material 46. With the end of the first insulating coating material 40 raised upright, a seal-type filling material 48 is placed over the photoelectric conversion cell 202, the first power collecting electrode 38, the second power collecting electrode 42, or the like. The filling material 48 may be an insulating material. More specifically, the filling material 48 is preferably formed from an insulating material with a resistivity about 1014 Ωcm. Preferable materials are, for example, ethylene-vinyl acetate copolymer resin (EVA) and polyvinyl butyral (PVB). Further, when the back side of the photoelectric conversion device 200 is covered by the back surface protective material 46, the back surface protective material 46 is positioned while the end portion of the second power collecting electrode 42 is pulled out through the opening portion provided with the back surface protective material 46. The back surface protective material 46 is preferably formed from a material which is electrically insulative, low in water permeability, and high in corrosion resistance. The back surface protective material 46 is preferably, for example, a glass plate.
In such a state, a vacuum laminate process is performed while the back surface protective material 46 is pressed to the photoelectric conversion cell 202 side and heated. The heating process may be performed at, for example, about 150° C. In this way, the back side of the photoelectric conversion device 200 is sealed by the back surface protective material 46. Further, when ethylene-vinyl acetate copolymer resin (EVA) is used as the filling material 48, a curing process may be performed by heating the photoelectric conversion device 200 in a curing furnace. The heating process in the curing process may be performed at, for example, 150° C. for about 30 minutes.
As described above, by sealing the back side of the photoelectric conversion device 200 with the back surface protective material 46, ingress of water or corrosive substances into the photoelectric conversion layer 34 from the back side can be prevented. Accordingly, the environmental resistance of the photoelectric conversion device 200 can be improved.
Lastly, as shown in
It should be noted that although the first power collecting electrode 38 is described to be welded only to the glass substrate 30 alone in the present embodiment, the first power collecting electrode 38 may be welded to the transparent electrode layer 32 also. In other words, as shown in the plan view in
Further, as shown in the plan view in
The removal area Y may be formed by removing the back electrode 36 and the photoelectric conversion layer 34 formed in the removal area X by using a YAG laser (wavelength of 532 nm). Further, in the removal area Y, the first power collecting electrode 38 and the transparent electrode layer 32 may be welded by ultrasonic processing.
Furthermore, the process of forming the removal areas X and Y is not limited to a laser processing and other processes such as sandblasting may be applied.
10 glass substrate, 12 transparent electrode layer, 14 photoelectric conversion layer, 16 back electrode, 18 first power collecting electrode, 20 second power collecting electrode, 22 insulating coating material, 24 back glass, 26 filling material, 30 substrate, 32 transparent electrode layer, 34 photoelectric conversion layer, 36 back electrode, 38 first power collecting electrode, 40 first insulating coating material, 42 second power collecting electrode, 44 second insulating coating material, 46 back surface protective material, 48 filling material, 50 end portion sealing resin, 52 terminal box, 100 photoelectric conversion device, 102 photoelectric conversion cell, 200 photoelectric conversion device, 202 photoelectric conversion cell.
Number | Date | Country | Kind |
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2010-194548 | Aug 2010 | JP | national |
The present application is a continuation application of International Application No. PCT/JP2011/069296, filed Aug. 26, 2011, the entire contents of which are incorporated herein by reference and priority to which is hereby claimed. The PCT/JP2011/069296 application claimed the benefit of the date of the earlier filed Japanese Patent Application No. 2010-194548 filed Aug. 31, 2010, the entire content of which is incorporated herein by reference, and priority to which is hereby claimed.
Number | Date | Country | |
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Parent | PCT/JP2011/069296 | Aug 2011 | US |
Child | 13752865 | US |