PHOTOELECTRIC CONVERSION FILM STACK-TYPE SOLID-STATE IMAGING DEVICE AND IMAGING APPARATUS

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of Japanese Patent Application No. 2010-061625 (filed on Mar. 17, 2010), the entire contents of which are hereby incorporated by reference.

BACKGROUND

1. Technical Field

The present invention relates to a solid-state imaging device with a stacked photoelectric conversion film and an imaging apparatus including the solid-state imaging device.

2. Related Art

In conventional, commonly used CCD and CMOS image sensors (solid-state imaging devices), a photodetecting region (effective pixel region) consisting of plural pixels (photoelectric conversion portions, photodiodes) that are arranged in two-dimensional array form is formed in a semiconductor substrate surface portion and subject image signals corresponding to a subject optical image formed on the photodetecting region are output from the respective pixels. An optical black (OB) region that is covered with a light shield film is formed around the photodetecting region, and an offset component of each of subject image signals that are output from the photodetecting region is removed using, as a reference signal, a dark signal that is output from the OB region.

Subtracting a noise component (dark current; equal to an output of the OB region) that thermally occurs even without incident light from each subject image signal (each output of the photodetecting region) makes it possible to detect, with high accuracy, faint subject image signals that are output from the photodetecting region and to thereby realize a solid-state imaging device having a large S/N ratio.

In the above-described conventional CCD and CMOS solid-state imaging devices, the photoelectric conversion portions (photodiodes) and signal reading circuits (charge transfer channels and an output amplifier in the case of the CCD type and MOS transistor circuits in the case of the CMOS type) need to be formed in the same semiconductor substrate surface portion. This raises a state that the ratio of the total area of the photoelectric conversion portions to the chip area of the solid-state imaging device cannot be set to 100%. A recent trend of a decreasing aperture ratio due to miniaturization of pixels is a factor of S/N ratio reduction.

In these circumstances, attention has come to be paid to solid-state imaging devices that are configured in such a manner that photoelectric conversion portions are not formed on a semiconductor substrate and only signal reading circuits are formed on the semiconductor substrate and that a photoelectric conversion film is formed above the semiconductor substrate.

For example, in the stack-type solid-state imaging device disclosed in JP-A-6-310699, X rays or electron beams are detected through photoelectric conversion by an amorphous silicon layer, for example, stacked over a semiconductor substrate surface. In the photoelectric conversion film stack-type solid-state imaging device disclosed in JP-A-2006-228938, a color image of a subject is taken by means of three photoelectric conversion layers having a red detection photoelectric conversion film, a green detection photoelectric conversion film, and a blue detection photoelectric conversion film, respectively.

In the solid-state imaging device of JP-A-6-310699, dark current is detected by stacking a 2-μm-thick light shield layer as the topmost layer of the solid-state imaging device around an effective pixel region (photodetecting region). In the solid-state imaging device of JP-A-2006-228938, incidence of light on signal reading circuits is merely prevented by stacking a light shield film between the semiconductor substrate surface and the photoelectric conversion film (bottommost layer). No consideration is given to the structure of an OB region.

In the stack-type solid-state imaging device of JP-A-6-310699, since the 2-μm-thick light shield layer is formed in the OB region, a step of 2 μm is formed between the OB region and the photodetecting region. Diffuse reflection of light incident on the step portion may degrade a subject image. The photoelectric conversion film stack-type solid-state imaging device of JP-A-2006-228938 cannot produce subject image signals having large S/N ratios because dark current cannot be detected in a state that no light is incident on the photoelectric conversion film (i.e., the photoelectric conversion film is shielded from light).

In stack-type solid-state imaging devices, a photoelectric conversion layer is formed over a semiconductor substrate and a light shield film (OB region) is formed over the photoelectric conversion layer. And a metal film that is high in light shield performance may be formed as the light shield film. If the metal light shield film is in an electrically floating state (due to high impedance), the film may be destroyed or a film formation defect (e.g., film thickness unevenness, crack, or pinhole) is caused by dust collection by charging that occurs in a manufacturing process, for example, resulting in a manufacture failure or an image quality degradation. One countermeasure would be supplying a voltage from a power line of a signal reading circuit or a peripheral circuit. However, in this case, it is necessary to form an additional line that leads from that power line to the light shield film, which complicates the structure.

SUMMARY OF INVENTION

According to an aspect of the invention, a photoelectric conversion film stack-type solid-state imaging device includes a semiconductor substrate, a photoelectric conversion layer, and a conductive light shield film. A signal reading portion is formed on the semiconductor substrate. The photoelectric conversion layer is stacked above the semiconductor substrate and includes a photoelectric conversion film formed between a first electrode film and a second electrode films which is divided into a plurality of regions corresponding to pixels respectively. The conductive light shield film is stacked above a light incidence side of the photoelectric conversion layer and is electrically connected to the first electrode film at an outside of an effective pixel region.

An object of the present invention is to provide a photoelectric conversion film stack-type solid-state imaging device which can produce high-quality image signals having large S/N ratios and which can increase the production yield and produce image signals stably by forming a light shield film that is free of destruction or a charging-dust-collection-induced defect caused by charging that occurs in a manufacturing process, for example, by decreasing the impedance without complicating the structure, as well as an imaging apparatus incorporating such a photoelectric conversion film stack-type solid-state imaging device.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a functional block diagram of an imaging apparatus according to an exemplary embodiment of the present invention.

FIG. 2A is a schematic view of the surface of a solid-state imaging device shown in FIG. 1.

FIG. 2B is a schematic view of the surface of a solid-state imaging device according to another exemplary embodiment.

FIG. 3 is a schematic sectional view taken along line III-III in FIG. 2A or 2B.

FIG. 4 is a schematic sectional view as a simplified version of FIG. 3.

FIG. 5 is a graph showing a relationship between the counter voltage and the output signal of the solid-state imaging device of FIG. 4.

FIG. 6 is a schematic sectional view of a solid-state imaging device according to another exemplary embodiment of the invention.

FIG. 7 is a schematic sectional view of a solid-state imaging device according to still another exemplary embodiment of the invention.

FIG. 8 is a schematic sectional view of a solid-state imaging device according to yet another exemplary embodiment of the invention.

FIG. 9 is a schematic sectional view of a solid-state imaging device according to a further exemplary embodiment of the invention.

DETAILED DESCRIPTION

Exemplary embodiments of the present invention will be hereinafter described with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of a digital camera (imaging apparatus) 20 according to an exemplary embodiment of the invention. The digital camera 20 is equipped with a solid-state imaging device 100, a shooting lens 21 which is disposed before the solid-state imaging device 100, an analog signal processing section 22 which performs analog processing such as automatic gain control (AGC) and correlated double sampling on analog image data that is output from the solid-state imaging device 100, an analog-to-digital (A/D) converting section 23 which converts analog image data that is output from the analog signal processing section 22 into digital image data, a drive control section (including a timing generator) 24 which drive-controls the shooting lens 21, the A/D-converting section 23, the analog signal processing section 22, and the solid-state imaging device 100 according to an instruction from a system control section (CPU; described later) 29, and a flash light 25 which emits light according to an instruction from the system control section 29. The drive control section 24 also controls of application of a prescribed bias voltage between an upper electrode film 104 and pixel electrode films 113 (both described later).

The digital camera 20 according to the exemplary embodiment is also equipped with a digital signal processing section 26 which captures digital image data that is output from the A/D-converting section 23 and performs interpolation processing, white balance correction, RGB/YC conversion processing, etc. on the digital image data, a compression/expansion processing section 27 which compresses image data into JPEG or like image data or expands JPEG or like image data, a display unit 28 which displays a menu etc. and also displays a through-the-lens image or a shot image, the system control section (CPU) 29 which supervises the entire digital camera 20, an internal memory 30 such as a frame memory, a medium interface (I/F) section 31 which performs interfacing with a recording medium 32 for storing JPEG or like image data, and a bus 40 which interconnects the above blocks. A manipulation unit 33 which receives a user instruction is connected to the system control section 29.

FIG. 2A is a schematic view of the surface of the solid-state imaging device 100 shown in FIG. 1. A central rectangular region 101 of the surface of the solid-state imaging device 100 is an effective pixel region (photodetecting region), and a subject optical image that is formed on the photodetecting region 101 is converted into electrical signals which are output as subject image signals.

In the exemplary embodiment of FIG. 2A, OB (optical black) regions 102 (their structure will be described later in detail) are formed adjacent to the four sidelines of the photodetecting region 101. An organic film (photoelectric conversion film; described later) occupies a rectangular region 103. An upper electrode film (counter electrode film; described later) occupies a rectangular region 104.

FIG. 2B is a schematic view of the surface of a solid-state imaging device according to another exemplary embodiment. Whereas in the exemplary embodiment of FIG. 2A the OB regions 102 are formed adjacent to the four sidelines of the photodetecting region 101, in this exemplary embodiment OB regions 102 are formed adjacent to the two (right and left) sidelines of the photodetecting region 101.

To take a difference between a dark-time reference signal detected from OB regions 102 and a pixel signal of each of the pixels in the effective pixel region 101, OB regions 102 are formed adjacent to the ends of the effective pixel region 101 in the row direction and an OB level is acquired from the pixels in the OB regions 102 in the horizontal blanking period of each horizontal scanning period. An OB level obtained in each horizontal blanking period is clamped by a correlated double sampling (CDS) circuit of the analog signal processing section 22 shown in FIG. 1 and is used for correction of subject image signals in the effective video period that immediately follows the horizontal blanking period.

FIG. 3 is a schematic sectional view of the solid-state imaging device 100 taken along line III-III in FIG. 2A or 2B. The photoelectric conversion film stack-type solid-state imaging device 100 is formed on a semiconductor substrate 110, and MOS circuits (not shown) are formed as signal reading circuits for the respective pixels in a surface portion of the semiconductor substrate 110. Alternatively, CCD signal reading circuits may be employed.

An insulating layer 111 is formed on the surface of the semiconductor substrate 110 and wiring layers 112 are buried in the insulating layer 111. The wiring layers 112 also function as shield plates for preventing leak incident light that is transmitted through the upper layers from entering the signal reading circuits etc.

Plural pixel electrode films 113 are formed on the surface of the insulating layer 111 so as to be separated from each other so as to correspond to the respective pixels and to be arranged in square lattice form when viewed from above. A vertical interconnection 114 extends from each pixel electrode film 113 to the surface of the semiconductor substrate 110, and each vertical interconnection 114 is connected to a signal charge storage portion (not shown) formed as a surface portion of the semiconductor substrate 110.

The signal reading circuit for each pixel reads out, as a subject image signal, a signal corresponding to the amount of signal charge stored in the corresponding signal charge storage portion. The pixel electrode films 113 are formed in the effective pixel region 101 and the OB regions 102 shown in FIGS. 2A and 2B.

A single organic film 103 (see FIGS. 2A and 2B) having a photoelectric conversion function is formed on the pixel electrode films 113 (arranged in square lattice form) so as to be common to the pixel electrode films 113, and a single upper electrode film (counter electrode film, common electrode film) 104 is formed on the organic film 103. In the solid-state imaging device 100 according to the exemplary embodiment, the lower electrode films 113 and the upper electrode film 104 and the organic film 103 which is sandwiched between the films 113 and 104 in the vertical direction constitute a photoelectric conversion layer.

An end portion of the upper electrode film 104 is electrically connected to a connection terminal 116 which is exposed in the surface of the insulating layer 111, and a prescribed voltage (hereinafter also referred to as “counter voltage” because the upper electrode film 104 is a counter electrode for the pixel electrode films 113) is applied to the upper electrode film 104 via a wiring layer 112a and a connection pad 112b. That is, a prescribed bias voltage is applied between the upper electrode film 104 and each pixel electrode film 113 by the drive control section 24 shown in FIG. 1.

A protective layer 117 is laid on the upper electrode film 104 and a smoothing layer 118 is laid on the protective layer 117. Color filters 120 are laid on the smoothing layer 118 in the effective pixel region 101 (see FIGS. 2A and 2B) so as to correspond to the respective pixel electrode films 113. For example, color filters of the three primary colors red (R), green (G), and blue (B) are Bayer-arranged.

In the exemplary embodiment, light shield films 121 are laid around the effective pixel region 101 in the same layer as the color filters 120. The light shield films 121 function to prevent light coming from above from shining on those portions of the organic film 103 which are formed in the OB regions 102 so that charge stored in each signal charge storage portion in the OB regions 102 produces a correct dark-time reference signal.

For example, each light shield film 121 goes down near its end so that its portion covers a peripheral portion of the protective layer 117 and is in electrical contact with the upper electrode film 104 through a hole (short-circuiting portion 115) of the protective layer 117 at the position of the connection terminal 116. Since the light shield film 121 and the upper electrode film 104 are electrically connected to each other, the impedance between the light shield film 121 and the upper electrode film 104 is low.

A planarization layer 122 is laid on the color filters 120 and the light shield films 121. To enable incidence of light on the organic film 103, the upper electrode film 104 is made of a conductive material that is transparent to incident light. The material of the upper electrode film 104 may be a transparent conducting oxide (TCO) having a high transmittance to visible light and low resistivity.

Although a metal thin film of Au (gold) or the like can be used, its resistance becomes extremely high when its thickness is reduced to attain a transmittance of 90% or more. TCO is thus preferable. Particularly preferable example TCOs are indium tin oxide (ITO), indium oxide, tin oxide, fluorine-doped tin oxide (FTO), zinc oxide, aluminum-doped zinc oxide (AZO), and titanium oxide. ITO is most preferable in terms of process executability, (low) resistivity, and transparency. Although in the exemplary embodiment the single upper electrode film 104 is formed so as to be common to all the pixel portions, divisional upper electrode films may be formed so as to correspond to the respective pixel portions.

The lower electrode films (pixel electrode films) 113, which are divisional thin films corresponding to the respective pixel portions, are made of a transparent or opaque conductive material, examples of which are metals such as Cr, In, Al, Ag, W, TiN (titanium nitride) and TCOs.

The light shield films 121 are made of an opaque metal material, examples of which are copper (Cu), aluminum (Al), titanium nitride (TiN), titanium (Ti), tungsten (W), tungsten nitride (WN), molybdenum (Mo), tantalum (Ta), platinum (Pt), alloys thereof, and silicides thereof (silicides of transition metals). In the case of using a metal material, the light shield films 121 are formed by a known method, that is, a combination of sputtering, evaporation, or the like, photolithography/etching, and a metal mask.

The protective layer 117, the smoothing layer 118, and the planarization layer 122 not only serve for smoothing and planarization in a stacking process but also prevent degradations in the characteristics of the photoelectric conversion film (organic film) 103 due to a defect (crack, pinhole, or the like) formed therein due to dust etc. occurring in a manufacturing process and aging deteriorations of the photoelectric conversion film 103 caused by water, oxygen, etc.

The protective layer 117, the smoothing layer 118, and the planarization layer 122 are made of a transparent insulative material, examples of which are silicon oxide, silicon nitride, zirconium oxide, tantalum oxide, titanium oxide, hafnium oxide, magnesium oxide, alumina (Al₂O₃), a polyparaxylene resin, an acrylic resin, and an perfluoro transparent resin (CYTOP).

The protective layer 117, the smoothing layer 118, and the planarization layer 122 are formed by a known technique such as chemical vapor deposition (CVD) such as atomic layer deposition (ALD, ALCVD). If necessary, each of the protective layer 117, the smoothing layer 118, and the planarization layer 122 may be a multilayer film of plural insulating films deposited by CVD or atomic layer deposition, or the like. The smoothing layer 118 and the planarization layer 122 are formed by smoothing and planarizing a deposited layer by removing projections by chemical mechanical polishing (CMP).

It is desirable that each of the protective layer 117, the smoothing layer 118, and the planarization layer 122 be as thin as possible while exercise its function. A preferable thickness range is 0.1 to 10 μm.

Next, an example manufacturing method will be described. An insulating layer 111 made of silicon oxide is formed on a semiconductor substrate 110 in which signal charge storage portions and signal reading circuits have been formed by a known process, while wiring layers 112 are buried in the insulating layer 111. Plugs (vertical interconnections 114) are formed by forming holes through the insulating layer 111 by photolithography and filling the holes with tungsten.

Then, a TiN film is formed on the insulating layer 111 by sputtering or the like and patterned into lower electrode films (pixel electrode films 113) by photolithography and etching.

Then, a photoelectric conversion film (organic film) 103 is formed on the lower electrode films 113 by depositing a photoelectric conversion material by sputtering, evaporation, or the like, and an upper electrode film 104 is formed on the photoelectric conversion film 103 by depositing ITO by sputtering, evaporation, or the like. Then, a protective layer 117 and a smoothing layer 118 are formed on the upper electrode film 104 by physical vapor deposition (e.g., sputtering), chemical vapor deposition (CVD), atomic layer deposition (ALD, ALCVD), or the like.

To prevent substances such as water and oxygen that will deteriorate the photoelectric conversion film 103 from being mixed into it during formation of the photoelectric conversion film 103 or the protective layer 117, it is preferable that the photoelectric conversion film 103 and the protective layer 117 be formed in vacuum or in an inert gas atmosphere consistently.

Then, where light shield films 121 should be made of a metal material, they are formed around the effective pixel region 101 by a known method, that is, a combination of sputtering, evaporation, or the like, photolithography/etching, and a metal mask.

Then, color filters of one color are formed on the portion, in the effective pixel region 101, of the smoothing layer 118 by forming a film of a color filter material and pattering it by photolithography and etching. A color filter layer 120 having a Bayer arrangement, for example, is formed by repeating this process using R, G, and B color filter materials.

Subsequently, a planarization layer 122 is formed on the color filter layer 120 by the same known technique as the protective layer 117 was formed. Microlenses may be formed on the color filter layer 120.

It is preferable that the layers that are stacked on the photoelectric conversion film 103 be formed at low film formation temperatures. That is, it is preferable that the layers which are stacked on the photoelectric conversion film 103 be made of materials that enable film formation at low temperatures that are suitable for the heat resistance of the photoelectric conversion film 103 or be made of materials that are low in heat resistance. It is preferable that the substrate temperature at the time of film formation be lower than or equal to 300° C. It is even preferable that it be lower than or equal to 200° C. And it is most preferable that it be lower than or equal to 150° C.

Likewise, it is preferable that the layer that is laid on the color filter layer 120 be made of a material that enables film formation at a low temperature that is suitable for the heat resistance of the photoelectric conversion film 103 or be made of a material that is low in heat resistance. It is preferable that the substrate temperature at the time of film formation be lower than or equal to 300° C. It is even preferable that it be lower than or equal to 200° C. And it is most preferable that it be lower than or equal to 150° C.

FIG. 4 is a schematic sectional view as a simplified version of FIG. 3. As shown in FIG. 4, in the solid-state imaging device 100 according to the exemplary embodiment, the light shield films 121 are formed over the upper electrode film 104 in the same layer as the color filter layer 120 with the protective layer 117 (which includes the smoothing layer 118 in FIG. 4) interposed in between. Therefore, the thickness of the solid-state imaging device 100 can be reduced, the entire surface of the solid-state imaging device 100 can be made flat, and color contamination between the effective pixels for image output can be prevented. Furthermore, oblique incidence of light on the OB regions 102 can be prevented and hence the accuracy of a dark-time reference signal can be increased.

In the solid-state imaging device 100 according to the exemplary embodiment, each light shield film 121 and the upper electrode film 104 are electrically connected to each other by the short-circuiting portion 115. Therefore, the impedance of the portion including each light shield film 121 is made low by the simple structure. As a result, each light shield film 121 is free of destruction or a charging-dust-collection-induced defect that is caused by charging that occurs in a manufacturing process, for example, of the solid-state imaging device 100. The production yield can be increased and image signals can be obtained stably.

In the solid-state imaging device 100 according to the exemplary embodiment, a counter voltage is applied to the upper electrode film 104 and each light shield film 121 from a power source 150. To enable high-sensitivity operation and a high-speed response of the solid-state imaging device 100, the counter voltage is usually made different from a voltage that is used in the signal reading circuits formed in the semiconductor substrate 110.

FIG. 5 is a graph showing a relationship between the counter voltage and the output signal. The output signal increases as the exposure time is increased, because the amount of signal charge generated in the photoelectric conversion film 103 increases accordingly. If the counter voltage which is applied to the upper electrode film 104 and each light shield film 121 is increased, the output signal is increased even if the exposure amount is kept the same. This is explained as follows. Excitons are generated in the photoelectric conversion film 103 on which light is incident, and are dissociated into electron-hole pairs by the bias voltage that is applied between the upper electrode film 104 and each pixel electrode film 113. The higher the bias voltage (counter voltage), the more electron-hole pairs are formed. That is, the drive control section 24 shown in FIG. 1 can adjust the sensitivity of the solid-state imaging device 100 by controlling the counter voltage.

FIGS. 6-9 are schematic sectional views of solid-state imaging devices according to other exemplary embodiments of the invention. It may be necessary to change the structure involving each light shield film 121 (i.e., the structure of FIG. 4 cannot be employed) depending on the stacking conditions such as temperatures, pressures, chemical reactions, etc. that are employed in stacking the photoelectric conversion film 103, the electrode films 104 and 113, the insulating layers, the color filter layer 120, etc.

In the exemplary embodiment of FIG. 6, a light shield film 121 is laid on the protective layer 117 which is laid on the upper electrode film 104. The light shield film 121 is formed outside the effective pixel region 101 in the same layer as a second protective layer 131 which is formed on the protective layer 117. A smoothing layer 132 is laid on the protective layer 131 and the light shield film 121. And the color filter layer 120 and the planarization layer 122 are formed on the smoothing layer 132. In this exemplary embodiment, the color filter layer 120 is formed only in the effective pixel region 101 and an insulating layer 133 is formed around it. As in the exemplary embodiment of FIG. 4, the light shield film 121 is electrically connected to the upper electrode film 104 by the short-circuiting portion 115.

Although in this exemplary embodiment the distance between the photoelectric conversion film 103 and the color filter layer 120 is longer than in the exemplary embodiment of FIG. 4, the protective layer 131 and the smoothing layer 132 may be thin.

The exemplary embodiment of FIG. 7 is different from that of FIG. 6 in that a light shield film 121b is provided in place of the insulating layer 133. This exemplary embodiment is superior in light shield performance because of the presence of the two light shield films 121a and 121b. Both of the light shield films 121a and 121b are electrically connected to the upper electrode film 104 by the short-circuiting portion 115. The total area of the light shield films 121a and 121b is larger than the area of the light shield film 121 of the exemplary embodiment of FIG. 4, whereby the impedance of the portion including the light shield films 121a and 121b is decreased accordingly.

To short-circuit the two light shield films 121a and 121b, openings are formed through the in-between insulating layers etc. (protective layer and smoothing layers) at the position of the short-circuiting portion 115 by etching and the upper light shield film 121b is laid thereon. If one of the two light shield films 121a and 121b is made of resin rather than metal, it goes without saying that the resin light shield film need not be short-circuited with the other light shield film or the upper electrode film 104.

The exemplary embodiment of FIG. 8 is different from that of FIG. 6 in that the color filter layer 120 extends so as to occupy the area of the insulating layer 133. The number of manufacturing steps can be decreased because the color filter layer 120 is formed so as to extend to occupy the area of the insulating layer 133 instead of forming the insulating layer 133 by a separate manufacturing step.

The exemplary embodiment of FIG. 9 is different from that of FIG. 8 in that a second light shield film 121b is formed on the part, outside the effective pixel region 101, of the color filter layer 120. The light shield performance is enhanced because of the two light shield films 121a and 121b. A transparent insulating layer 134 is formed in the effective pixel region 101 in the same layer as the light shield film 121b, and the planarization layer 122 is formed as a topmost layer.

Also in this exemplary embodiment, both of the light shield films 121a and 121b are electrically connected to the upper electrode film 104 by the short-circuiting portion 115.

As described above, a photoelectric conversion film stack-type solid-state imaging device according to the exemplary embodiments includes a semiconductor substrate, a photoelectric conversion layer, and a conductive light shield film. A signal reading portion is formed on the semiconductor substrate. The photoelectric conversion layer is stacked above the semiconductor substrate and includes a photoelectric conversion film formed between a first electrode film and a second electrode films which is divided into a plurality of regions corresponding to pixels respectively. The conductive light shield film is stacked above a light incidence side of the photoelectric conversion layer and is electrically connected to the first electrode film at an outside of an effective pixel region.

A second photoelectric conversion film stack-type solid-state imaging device according to the exemplary embodiments further comprises a light transmission layer that is stacked above the light incidence side of the photoelectric conversion layer and made of a material that transmits light at least partially. The conductive light shield film is formed in the same layer level as the light transmission layer and covers the effective pixel region.

The second photoelectric conversion film stack-type solid-state imaging device may be such that the light transmission layer is a color filter layer.

Each of the first and second photoelectric conversion film stack-type solid-state imaging devices may be such that the light shield film is directly laid on the first electrode film at a position that is outside the effective pixel region and is thereby electrically connected to the first electrode film.

Each of the first and second photoelectric conversion film stack-type solid-state imaging devices may be such that it further comprises a second light shield film which is laid on the light incidence side of the photoelectric conversion layer outside the effective pixel region, and that the two light shield films shield part of the photoelectric conversion layer from light.

The above photoelectric conversion film stack-type solid-state imaging device may be such that the second light shield film is made of a conductive material and is also electrically connected to the first electrode film.

An imaging apparatus according to the exemplary embodiments comprises any of the above photoelectric conversion film stack-type solid-state imaging devices.

The above imaging apparatus may further comprise an imaging device driving section for adjusting a voltage that is applied to the first electrode film.

According to the exemplary embodiments, since each light shield film which is provided outside the effective pixel region is formed in the same layer as the upper electrode film or another constituent layer, the surface of the solid-state imaging device can be made flat and hence image quality degradations due to diffuse reflection of light. Since a dark-time signal which is used as a reference signal can be detected accurately from the OB regions, high-quality subject image signals can be obtained.

Furthermore, since each light shield film is short-circuited with the upper electrode film, the impedance of the portion including each light shield film is decreased. Therefore, even if each light shield film is rendered in a floating state in a manufacturing process, it causes no problems. Each light shield film may be connected to a layer (e.g., a ground layer) to be connected to a power source or a potential that is different from the power source to which the upper electrode film is connected (the invention is not limited to this configuration).

According to the embodiment, since an OB region is provided by forming the light shield film outside the effective pixel region, high-quality shot images can be taken. A highly accurate dark-time reference signal can be obtained from the OB region, and hence high-quality image signals having large S/N ratios can be obtained.

Furthermore, according to the embodiment, since the light shield film is short-circuited with the first electrode film within the device, the impedance of the portion including the light shield film can be made low by means of a simple structure, whereby a light shield film can be formed that is free of destruction or a charging-dust-collection-induced defect caused by charging that occurs in a manufacturing process, for example. As a result, the production yield can be increased and image signals can be produced stably.

Being manufactured at a high yield and a low cost and allowing the user to take high-quality subject images, the photoelectric conversion film stack-type solid-state imaging device according to the invention can usefully be incorporated in digital still cameras, digital video cameras, cell phones with a camera, electronic apparatus with a camera, monitoring cameras, endoscopes, vehicular cameras, etc.

DESCRIPTION OF SYMBOLS

21: Shooting lens

26: Digital signal processing section

29: System control section

100: Photoelectric conversion film stack-type solid-state imaging device

101: Effective pixel region

102: OB (optical black) region

103: Photoelectric conversion film (organic film)

104: Upper electrode film (common electrode film, counter electrode film, first electrode film)

110: Semiconductor substrate

111, 133, 134: Insulating layer

112: Wiring layer

113: Lower electrode film (pixel electrode film, second electrode film)

114: Vertical interconnection (plug)

117: Protective layer

118: Smoothing layer

120: Color filter layer

121, 121a, 121b: Light shield film

122: Planarization layer

PHOTOELECTRIC CONVERSION FILM STACK-TYPE SOLID-STATE IMAGING DEVICE AND IMAGING APPARATUS

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