The present disclosure relates to a photonic chip and a photonic component integrating such a chip. They are very particularly applicable in the field of free-space communication and LiDAR (Light Detection and Ranging) or fiber optic telemetry.
The document “20×20 Focal Plane Switch Array for Optical Beam Steering” by X. Zhang et al, 2020 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, USA, 2020, proposes a two-dimensional device for steering an optical beam made up of a 20×20 array of switches integrated on a photonic chip made of silicon with microelectromechanical (MEMS) optical switches. These switches are respectively connected to surface couplers, and light radiation can selectively propagate from a light source to a selected coupler, by selecting this coupler according to its row rank and its column rank. A collimating lens is associated with the integrated device so that the surface couplers are arranged in the focal plane of the lens. Each surface coupler is configured to propagate light radiation in free space in the form of an emission light beam that, in far field, is oriented along a straight line extending from the surface coupler and passing through the center of the lens. Thus, an integrated beam-steering device allowing faster steering, with lower consumption and with a wide field of view compared with conventional mechanical solutions, is available. This device may form a component of a LiDAR system, for example.
As for the document by Ch. Poulton et al. “Coherent solid-state LiDAR with Silicon photonic optical phased arrays,” Opt. Lett. 42, 4091-4094 (2017), it proposes a frequency-modulated continuous wave (FMCW) LiDAR using integrated optical phased arrays for steering an emission light beam. This component comprises a photonic integrated circuit formed on a silicon platform and having a first edge coupler for propagating the light beam in free space through the optical phased array. It comprises a second edge coupler for receiving the reflected beam on a body of a scene illuminated by the emission beam.
A photonic component implementing a frequency-modulated continuous wave LiDAR generally exploits an optical mixer to generate a measurement signal by interferometric pulse between an emission radiation and a reflected radiation. The force of the measurement signal depends on the polarization of these signals. To maximize this force, it is necessary for the radiations to have the same polarization at the input of the mixer, the measurement signal being zero if the polarizations of the two radiations are orthogonal to each other.
Patent application WO2019161388A1 and the publication “Photonic Integrated Circuit-Based FMCW Coherent LiDAR,” JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 36, NO. 19, Oct. 1, 2018 propose other frequency-modulated continuous wave LiDAR architectures. As in the previous reference, these architectures also provide two couplers, respectively for transmitting and receiving, which reduces the compactness of the photonic circuit.
Furthermore, these architectures implement at least one fiber circulator to differentiate the forward path traveled by a transmission radiation and a return path traveled by a reflected radiation. In order to maintain the polarization of the optical fields of these radiations, the fibers must maintain their polarization, which is expensive. Finally, these architectures are not robust to changes in polarization of the reflected radiation, these changes being able to be linked to the nature of the illuminated body of the scene, or to the angle of incidence of the light beam on this body.
The present disclosure proposes a photonic chip and a photonic component for transmitting and receiving a light beam that differs from this state of the art, and seeking to provide a highly integrated solution. In some embodiments, the chip and the photonic component, while preserving their compact characters, are able to illuminate the scene using beams having two different polarizations.
In order to achieve this aim, the object of the present disclosure proposes a photonic chip including at least one emission-reception circuit comprising at least one laser source for providing a first radiation, referred to as local oscillator, to an optical mixer and for providing an emission radiation to a coupling device, the local oscillator and the emission radiation having a predetermined polarization. The coupling device is configured to propagate in free space, from a measuring surface, the emission radiation in the form of an emission light beam, to receive, in return, on the measuring surface a reflected light beam and to guide it toward the optical mixer as reflected radiation having the predetermined polarization. The optical mixer generates a measurement signal by interferometric pulse of the local oscillator and the reflected radiation.
According to other advantageous non-limiting features of the present disclosure, taken alone or according to any technically feasible combination:
According to another aspect, the present disclosure proposes a photonic component comprising at least one photonic chip as described previously and at least one Faraday rotator arranged at the measuring surface of the chip in order to intercept the emission beam and the reflected beam.
The photonic component may comprise a lens for collimating the emission beam and the reflected beam and/or a polarizer configured to allow the transmission of the emission beam and the reflected beam according to a single polarization.
Other features and advantages of the present disclosure will emerge from the following detailed description of the present disclosure with reference to the appended figures, in which:
In the present disclosure, “photonic chip” denotes an integrated circuit based on semiconductor materials formed by the standard microelectronic techniques. This chip can be formed from an assembly of independent elements based on semiconductor materials, for example, laser sources, photo detectors, waveguides, electrical or electronic processing circuits.
General description of the photonic component
With reference to
Such a component 100 comprises a photonic chip 10 having a main surface 10a. Measuring surfaces Sm of a plurality of optical coupling devices C are flush with the main surface 10a. As will become apparent in the rest of this description, each coupling device C makes it possible to propagate, at its measuring surface Sm, in free space, an electromagnetic emission radiation, generated by the chip 10 in the form of an emission light beam. This emission beam is reflected by an illuminated body of a scene arranged in the field of view of the component 100. The same measuring surface Sm of the photonic chip 10 makes it possible to receive, in return, the light beam reflected by the body. The coupling device C associated with this measuring surface Sm injects and guides this beam in the form of electromagnetic radiation reflected in the photonic chip 10. “The same measuring surface” means that the emission light beam and the reception light beam are at least partially superimposed on the main surface 10a. A single coupling device C ensures the emission of the light beam and the reception of the reflected beam at this surface. It is not necessary to provide complex fiberizing of the component 100, as is the case with certain architectures of the prior art presented in the introduction to this disclosure.
Each coupling device C is part of a transceiver circuit 1 of the chip 10, a detailed description of which is provided in subsequent sections of this disclosure. The photonic chip 10 provided with at least one transceiver circuit 1 is able to generate the emission light beam and to process the reflected light beam to generate an electrical measurement signal V representative of the distance separating the photonic component 100 from the reflection body and/or the relative speed of the component 100 and of this body.
Aside from the photonic chip 10, the photonic component 100 also comprises, arranged on the main surface 10a of the photonic chip 10, at least one collimating lens. The measuring surfaces Sm of the coupling devices C are arranged in the focal plane of the lens L. These coupling devices C are designed so that, according to their position on the main surface 10a, the emission light beams that emerge from the measuring surfaces Sm project in far fields along straight lines (depicted in dotted lines in
In the optical path of the emission and reflected light beams, an optional optical part 20 is also arranged, herein arranged on the main surface 10a of the chip 10 and sandwiched between the photonic chip 10 and the lens L. Other arrangements of this optical part 20 are possible insofar as the latter remains in the optical path of the emission and reflected light beams. It may especially be integrated into the chip 10. To make it possible to discriminate the emission radiation from the reflected radiation in the transceiver circuits 1 of the chip 10, the optical part 20 comprises a 45° polarization rotator, for example, a Faraday rotator, so that after propagation of the emission beam and the return of the reflected beam, the reflected radiation propagating from the main surface 10a of the photonic chip 10 has a polarization orthogonal to the emission radiation. The polarization rotator is not necessary when the reflected beam naturally has a polarization orthogonal to the emission beam, for example, when such a polarization rotation is carried out during the reflection of the emission beam on the illuminated body of the scene.
The optical part 20 may also comprise, in addition to the polarization rotator, a polarizer arranged downstream of the Faraday rotator in the direction of propagation of the emission beam. This polarizer is configured to allow transmission of the emission light beams and reflected according to a single polarization (the beam propagation polarization, modified by the Faraday rotator when the latter is present). This especially prevents parasitic components of the reflected light beam, having different polarizations of the propagation polarization, from coupling to the photonic chip 10 and propagating in the transceiver circuits 1 of this chip 10, in particular, toward the laser sources contained in these circuits. The use of such a polarizer is preferable when the power of the reflected radiation is greater than 1/100 of the power of the emission radiation.
In operation, the photonic component 100 can be operated to generate an emission light beam from a measuring surface Sm associated with a selected transceiver circuit 1, so as to propagate a beam in a selected direction. By processing the reflected radiation received at the same measuring surface Sm, it is possible to generate an electrical signal V representative of the distance and/or the relative speed of a body arranged in the selected direction. For this purpose, the photonic chip 10 may comprise or be electrically associated with a control circuit making it possible to select or to operate one of the transceiver circuits 1 of the chip 10.
By successively scanning or, in some cases, by simultaneously activating the coupling devices C of the photonic chip 10 oriented in a plurality of directions, it is possible to collect and process relative distance/speed information of the entire scene, for example, to depict it in the form of a point cloud as is well known per se.
In the first embodiment of
In the illustration of the first embodiment of
In the second embodiment of
In this embodiment, a transceiver circuit 1 advantageously comprises a plurality of coupling devices C aligned in a column on the main surface 10a of the chip 10. This chip 10 may comprise a plurality of transceiver circuits 1 arranged side-by-side so as to form a matrix arrangement of the measuring surfaces Sm on the main surface 10a. The matrix may be of any size, for example, comprised from a 2×2 matrix to a 100×100 matrix, square or rectangular, and arranged in rows and columns as depicted in the figures, or according to any other arrangement, for example, in polar form.
By way of illustration, each measuring surface Sm may have a size of the order of several square microns, or even one hundred to several hundred square microns and two of these surfaces Sm may be separated by a distance typically between 3 and 500 microns.
General Description of the Transceiver Circuit
Referring now to
This transceiver circuit 1 provides the emission of the light beam and the reception of the reflected light beam from the photonic component 100. It implements a Frequency Modulated Continuous Wave (FMCW) technique in order to generate the measurement signal V.
The transceiver circuit 1 comprises a laser source L, or is connected to a laser source, optically associated with a power splitter S for providing a first radiation, referred to as local oscillator LO, to a first input of an optical mixer M. The power splitter S also provides a second radiation, referred to as emission radiation Re, which is guided toward the coupling device C. It is noted that the splitter S does not form an essential element of the circuit 1, and that it is possible to provide other arrangements making it possible to provide the local oscillator LO and the emission radiation Re, for example, via two discrete and synchronized laser sources.
As already presented, this coupling device C is configured to project at a measuring surface Sm (for example, the exposed surface of an edge coupler or a surface coupler with a polarization-splitting grating) the emission radiation Re in free space in the form of an emission beam. The coupling device C is also configured to receive at the same measuring surface Sm the reflected light beam. The coupling device C injects the reflected beam into the photonic circuit 1 in the form of a reflected radiation Rr that it guides toward an optical mixer M.
The mixer M therefore receives the local oscillator LO and the reflected radiation Rr (which have a single predetermined polarization p, as is symbolized in
As already mentioned, the transceiver circuit 1 is associated with a control circuit, which may or may not be integrated into the chip 10, and which provides in all cases the electrical signals to the transceiver circuit(s) 1 (and especially to the laser source L) allowing its/their operation. The control circuit can also be connected to the transceiver circuit(s) 1 in order to receive the measurement signal or signals V and carry out the conversion processing operations making it possible to establish a distance and/or speed measurement.
The transceiver circuit 1 is, in all cases, produced according to usual photonic techniques, for example, from a silicon-on-insulator substrate. The radiation propagating in this circuit, such as the radiation emitted by the laser source L, the emission radiation Re, the reflected radiation Rr and the local oscillator LO are guided between the various elements of the circuit 1 via waveguides.
An important characteristic of the photonic chip 10 of the present disclosure is that of exploiting a single measuring surface Sm of a coupling device C to emit the emission beam and receive the reflected beam. This characteristic makes it possible to form a particularly compact chip 10 and photonic component 100, and to use the same optical part 20 and/or a single collimating lens/block of lenses L to process the emission beam and the reflected beam.
As already mentioned, this characteristic may require properly insulating, at the coupling device C, firstly the emission radiation Re intended to be guided toward the measuring surface Sm, and secondly the reflected radiation Rr that is guided toward the optical mixer M. This insulation can be implemented in several ways, depending on the level of insulation required for the system.
Thus, according to a first example depicted in
In
At the output of the chip 10, the emission light beam that is emitted in free space at the emission surface Sm of the coupler EC has a propagation polarization Pa (related to the predetermined polarization TE, but not necessarily identical) and undergoes a first rotation through 45° of its polarization by passing first through the Faraday rotator 20a of the optical part 20 so as to have a modified propagation polarization Pa+45. The reflected light beam (which is hypothesized herein as having the same polarization Pa+45 as that of the emission beam after the latter has passed through the optical part 20) undergoes a second rotation through 45° of its polarization on the return path by passing through the Faraday rotator 20a of the optical part 20 again, to adopt a polarization Pb, which is thus orthogonal to the propagation polarization, before being projected onto the measuring surface. The reflected radiation Rr guided by the coupler EC has a polarization TM orthogonal to the polarization TE of the emission radiation Re. And this reflected radiation Rr is therefore directed toward a channel of the polarization beam splitter PBS discrete from the channel receiving the emission radiation Re. The reflected radiation Rr is then guided toward the polarization rotator PR making it possible, by imposing a 90° rotation, to return the reflected radiation Rr to the original predetermined polarization TE, that is to say that of the emission radiation Re. The reflected radiation Rr therefore has the same polarization as the local oscillator LO so that they can be processed significantly by the mixer M and establish the measurement V.
It should be noted that the coupling device C of
Of course, this coupling device could be used in inverted configuration as described in relation with
The Faraday rotator 20a and the polarizer 20b in this second example play the same roles as those described previously.
As already noted, and when the coupling device C is an edge coupler EC or surface coupler GC, it is not necessary for the optical part 20 to include a Faraday rotator 20a, if the reflected beam naturally has a polarization orthogonal to the emission beam, this change of polarization possibly being caused by the reflection on the illuminated target T of the scene.
And as already noted, if the reflected beam is likely to have parasitic polarization components, especially a component orthogonal to the modified polarization Pa+45, it is possible to add to the optical part 20, downstream of the Faraday rotator 20a in the direction of propagation of the emission beam, a polarizer 20b aligned with this modified polarization Pa+45, so as to block the parasitic component at the input of the transceiver circuit 1 and thus prevent it from coupling to the laser source L. The correct stability of this source is thus preserved.
Multi-Polarization Transceiver Circuit
The photonic circuit 1 of
The power splitter S has two discrete channels making it possible to guide, in the first channel, and via two discrete waveguides, the first emission radiation Re toward the first coupling device C and the first local oscillator LO toward the first mixer M. It also makes it possible to guide, in the second channel, via two other discrete waveguides, the second emission radiation K′ toward the second coupling device C′ and the second local oscillator LO′ toward the second mixer M′. These radiations Re, Re′, LO, LO′ all have the same first polarization TE.
At the output of the first coupling device C of the chip 10, and similarly to what has been disclosed in relation with the preceding figures, the propagation polarization Pa of the first emission beam is rotated through 45° by the first Faraday rotator 20a. The polarization of the reflected beam Pa+45 is also rotated through 45° by the first Faraday rotator 20a so that it has a modified propagation polarization Pb, orthogonal to the propagation polarization Pa of the emission beam, at the output of the chip 10, when it projects onto the measuring surface Sm of the chip 10. This polarization component Pb is coupled to the chip by the first coupling device C and the reflected radiation Rr, having the same first polarization TE as the first emission radiation Re, is guided toward the first mixer M.
As for the second coupling device C′, it is configured to propagate a second emission beam having a propagation polarization Pb, at the output of the chip 10, orthogonal to the polarization Pa of the first emission beam. This polarization Pb is rotated through 45° by the second Faraday rotator 20a′. The polarization of the second reflected beam Pb+45 is rotated through 45° by the second Faraday rotator 20a′ so that it has a modified polarization Pa, orthogonal to the propagation polarization Pb of the second emission beam, when it projects onto the measuring surface Sm of the chip 10. This polarization component Pa is coupled to the chip 10 by the second coupling device C and the reflected radiation Rr′, having the same first polarization TE as the second emission radiation Re′, is guided toward the second mixer M′.
It can be seen that the transceiver circuit of
In a variant depicted in
In the variant depicted in
By switching the switches SW1′, SW2′, it is possible to propagate, according to a first configuration making it possible to emit an emission beam having a first polarization Pa (bottom part of
By switching the switches SW1′, SW2′ into a second configuration (top part of
This variant advantageously makes it possible to only have a single mixer M, and a single multiplexing coupling device C″ to form the two measurement channels, which makes it possible to reduce the size of the transceiver circuit 1 and therefore of the chip 10, while providing a chip 10 offering interrogation with polarization diversity. In this example also, the sequencing of the optical switches SW1′, SW2′ can be controlled by the control circuit of the chip 10.
In the examples of
Photonic Chip Comprising a Plurality of Transceiver Circuits
The chip 10 of
Transceiver Circuit Implementing Wavelength-Division Multiplexing
A plurality of transceiver circuits 1 in accordance with what is depicted in
The transceiver circuit 1 also comprises a unidirectional transmission bus BE, optically connected to the power splitter S, to distribute the emission radiation Re to the coupling devices C. The transceiver circuit 1 also comprises a reception bus BR for collecting the reflected radiation Rr provided by the coupling devices C and guiding it toward the mixer M. The coupling devices C are arranged between the unidirectional transmission bus BE and the reception bus BR, and respectively coupled to these buses via filters F1, F2 (
Referring to the embodiment, referred to as “wavelength-division multiplexing,” depicted in
Similarly, a plurality of reception filters F2, respectively associated with the coupling devices C, are arranged between the coupling devices C and the reception bus BR. The reception filters F2 make it possible to selectively couple the reception bus BR to a coupling device C in order to allow the propagation of the reflected radiation toward the mixer M.
The transmission filter F1 and reception filter F2 are bandpass filters, that is to say that they transmit radiation between a filter input and output when this radiation has a wavelength comprised in a range of transmission wavelengths specific to the filter. When the radiation has a wavelength outside this range, the radiation is blocked and is not transmitted between the input and the output of the filter.
To allow selective coupling of a coupling device C to the unidirectional transmission bus BE and reception bus BR, a transmission filter F1 and a reception filter F2 associated with a single coupling device C have identical ranges of transmission wavelengths. Conversely, the transmission filter F1 and reception filter F2 associated with different coupling devices C have different ranges of transmission wavelengths.
Preferably, the ranges of transmission wavelengths of the filters are distributed in the wide band of wavelengths of the radiation emitted by the laser source L and jointly cover, without overlapping, this wide band.
Depending on the wavelength of the emitted emission radiation Re, this radiation will propagate in one of the coupling devices C, the one whose transmission filter F1 has a range of transmission wavelengths covering the wavelength of the emission radiation Re. The reception filter F2 associated with this coupling device C having the same range of transmission wavelengths as the transmission filter F1 and the reflected radiation Rr having substantially the same wavelength as the emission radiation Re, this reflected radiation Rr will be transmitted by the reception filter F2 via the reception bus BR to the mixer M.
Thus, by selecting the wavelength of the emission radiation Re, it is possible to select the coupling device C that will be activated to emit the emission light beam from all the coupling devices C of the transceiver circuit 1.
The wavelength of the emission radiation Re may be selected in different ways. It is possible to provide, according to a first approach, to have a master filter in the frequency modulation block FM. The master filter FM is then configured, for example, by the control device, to filter the radiation emitted by the FM block so that the emission light radiation Re has wavelengths extending in a range that matches (or is narrower than) one of the ranges of transmission wavelengths of the filters F1, F3. By configuring the master filter FM, the coupling device C that will be activated in order to propagate the emission light beam is selected in a way from all the coupling devices C of the transceiver circuit 1.
Each output Ds of the demultiplexer D is optically linked to a power splitter S, providing a local oscillator LO(l1), LO(l2), LO(ln) and an emission radiation Re(l1), Re(l2), Re(ln). The wavelength of a local oscillator LO and an emission radiation Re coming from the same splitter S are, of course, identical. Each emission radiation Re is guided toward a first input of a coupling device C, and the reflected radiation Rr coming from this device C is guided toward a mixer M dedicated to this coupling device C. The mixer M also receives the local oscillator from the power splitter S, in order to provide a measurement signal V.
In this example, therefore, the demultiplexer D respectively distributes the wavelength components of a radiation R having a plurality of wavelengths toward the coupling devices C.
This demultiplexer is, in this variant, a multiplexer-demultiplexer DM that has a plurality of multiplexing inputs Me1, Me2, Men each connected to a laser source L1, L2, Ln continuously emitting a radiation having a particular wavelength l1, l2, ln. It has a multiplexing output Ms from which a continuous wave radiation is derived combining those presented on the multiplexing inputs Me1, Me2, Men. This radiation is guided toward the modulation block FM, which itself guides the generated radiation R(l1), R(l2), R(ln) to the demultiplexing input De of the multiplexer-demultiplexer DM.
In this example, the transceiver circuit 1 comprises a plurality of laser sources L1, L2, Ln emitting according to a plurality of different wavelengths l1, l2, ln. The transceiver circuit 1 also comprises a multiplexer, herein combined with the radiation distribution demultiplexer R, to produce the radiation R having the plurality of wavelengths.
Transceiver Circuit Implementing Time-Division Multiplexing
The end of the bidirectional transmission bus, opposite that wherein the emission radiation Re is injected by the frequency modulation block FM, is optically connected to the mixer M, in order to generate the measurement signal V, as in the preceding examples of the transceiver circuit 1.
By switching the switches SW1, SW2, it is thus possible to propagate, according to a first configuration making it possible to emit an emission beam having a first polarization Pa (top part of
By switching the switches SW1, SW2 in a second configuration (bottom part of
In other words, the two switches SW1, SW2 make it possible to selectively propagate the emission radiation Re in the bidirectional transmission bus BT in a first propagation direction or a second propagation direction, opposite to the first. According to the direction of propagation of this radiation, the coupling devices C, associated with the bidirectional transmission bus by the optical circulator switches SW, emit an emission beam having a first polarization Pa or a second polarization Pb, perpendicular to the first Pa.
Of course, the present disclosure is not limited to the embodiments described and variant embodiments can be added thereto without departing from the scope of the invention as defined by the claims.
Number | Date | Country | Kind |
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2012049 | Nov 2020 | FR | national |
This application is a national phase entry under 35 U.S.C. § 371 of International Patent Application PCT/FR2021/051991, filed Nov. 10, 2021, designating the United States of America and published as International Patent Publication WO 2022/112679 A1 on Jun. 2, 2022, which claims the benefit under Article 8 of the Patent Cooperation Treaty to French Patent Application Serial No. FR2012049, filed Nov. 24, 2020.
Filing Document | Filing Date | Country | Kind |
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PCT/FR2021/051991 | 11/10/2021 | WO |