Photonic Monitoring For Optical Signals

Abstract

This invention concerns real-time multi-impairment signal performance monitoring, [n particular it concerns an optical device, for instance a monolithic integrated photonics chip, comprising a waveguide having an input region to receive a signal for characterization, and a narrow band CW laser signal. A non-linear waveguide region to mix the two received signals. More than one output region, each equipped with bandpass filters that extract respective discrete frequency bands of the RF spectrum of the mixed signals. And, also comprising (slow) power detectors to output the extracted discrete frequency banded signals.

Description

TECHNICAL FIELD

This invention concerns photonic monitoring for optical signals, in particular for real-time multi-impairment signal performance monitoring.

BACKGROUND ART

Traditional optical transmission systems have primarily employed a conventional intensity modulation format, i.e. on-off keying (OOK), due to its simplicity at both transmitter and receiver. Recently advanced coherent modulation formats such as differential phase shift keying (DPSK), differential quadrature phase shift keying and m-array phase shift keying [1-4] have attracted increased attention. In coherent communications networks, data is encoded into the phase instead of intensity of the optical signals, providing numerous advantages over the traditional OOK format, including robustness, better tolerance to nonlinearity and crosstalk, increased receiver sensitivity and spectral efficiency [1]. Due to these advantages, many research laboratories have exploited advanced modulation formats for ultra-high bit-rate and long-haul transmission systems [5-8].

Despite the robustness of coherent optical systems, reliable optical performance monitoring (OPM) [9, 10] is still a critical part of network infrastructure. In particular, for quality of service assurance and optimal network performance. Conventionally, DPSK signals are demodulated and detected for performance monitoring by a Mach-Zehnder (MZ) delay interferometer and a high-speed balanced receiver, respectively [1], adding a significant cost and complexity to the network.

Several relatively simple OPM techniques have been reported to monitor impairments of phase modulated optical signals. These include single impairment monitoring methods for group velocity dispersion (GVD) [11] and optical signal-to-noise ratio (OSNR) monitoring [12] using the radio-frequency (RF) power spectra, and amplitude and phase Q-factor measurement using asynchronous amplitude and phase histograms [13]. Moreover, multi-impairment monitoring schemes, including GVD and OSNR monitoring using asynchronous amplitude histogram evaluation [14]. GVD and first-order polarization mode dispersion (PMD) monitoring using asynchronous amplitude histogram evaluation [15] or asynchronous delay tap sampling [16] have been established. However, these conventional electro-optic based monitoring schemes reply on high-speed detectors, thus their typical operating bandwidth is limited to about 100 GHz and costs remain relatively high.

Besides the above methods, a variety of all-optical OPM schemes that work for high speed phase-encoded optical signals have been presented. These include OSNR monitoring using two-photon-absorption in a semiconductor micro-cavity [17] and an optical delay interferometer [18]. Alternatively all-optical signal processing based on nonlinear optics is considered as a method to overcome the limitations imposed by the electronic bandwidth. Several monitoring methods, including GVD monitoring using cross-phase modulation (XPM) in a highly nonlinear fiber (HNLF) [20] have been presented. Although impressive results have been obtained, these techniques do not offer multi-impairment monitoring functionality which is essential for next generation optical communication networks.

DISCLOSURE OF THE INVENTION

The invention is an optical device, for instance a monolithic integrated photonics chip, comprising a waveguide having:

• • An input region to receive a signal for characterization, and a narrow band CW laser signal.
  • A non-linear waveguide region to mix the two received signals.
  • More than one output region, each equipped with bandpass filters that extract respective discrete frequency bands of the RF spectrum of the mixed signals.

And, also comprising (slow) power detectors to output the extracted discrete frequency banded signals.

This arrangement enables real-time impairment monitoring functionality, and it may be realized in a compact and low cost chip that integrates the input, non-linear waveguide and output regions of the device. In particular it also offers high sensitivity and multi-impairment monitoring without ambiguities for microwave and photonics applications.

A semiconductor laser may also be integrated on the chip to provide the narrow band CW laser signal.

The mixing of the two received signals produces cross-phase modulation between them.

The integrated bandpass filters may be etched onto the waveguide using lithographic techniques. The filters may be Bragg gratings, or Array Waveguide gratings (AWG).

The use of more than one output region allows for simultaneous monitoring of a number of different signal impairments. For instance two output regions may monitor both GVD and ONSR.

The waveguide may be a dispersion engineered, highly nonlinear Chalcogenide (ChG) rib waveguide, which offers THz bandwidth by exploiting its femtosecond response time of the Kerr nonlinearity in the mm scale. The monolithic integrated photonics chip may be fabricated in silicon. The waveguide may also be fabricated in silicon modified for high speed use.

The features observed on the RF spectrum may be directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio monitoring.

Based on the relationship between signal impairments and the RF spectra or autocorrelation traces, the chip may be used to monitor GVD, OSNR and timing jitter simultaneously with high measurement dynamic ranges.

The chip may be used to monitor on-off keying as well as advanced modulation formats including;

• • differential phase shift keying (DPSK)
  • differential quadrature phase shift keying (QPSK)
  • Optical time division multiplexing (OTDM)

BRIEF DESCRIPTION OF THE DRAWINGS

An example of the invention will now be described with reference to the accompanying drawings, in which:

FIG. 1 is a schematic diagram of a chip based RF spectrum analyzer, which monitors multiple impairments simultaneously.

This OPM approach is suitable to be operated after in-line EDFAs.

FIG. 2 is a transmission system diagram.

FIG. 3( a) is a diagram of the experimental setup for 40 Gbit/s NRZ-DPSK.

FIG. 3( b) is a diagram of the experimental setup for 640 Gbit/s RZ-DPSK optical signals generation.

FIG. 3( c) is a diagram of the experimental setup for monitoring GVD and in-band OSNR of the DPSK signals simultaneously.

FIG. 4( a) is a graph of the optical spectrum.

FIG. 4( b) is a graph of the RF spectra of a 40 Gbit/s NRZ-DPSK signal, captured via chip based RF spectrum analyzer under different conditions:

• • (i) no impairment,
  • (ii) ASE noise and
  • (iii) GVD.

FIG. 5 is a plot of GVD and in-band OSNR measurements of 40 Gbit/s NRZ-DPSK data.

FIG. 6( a) is a graph of the optical spectrum and

FIG. 6( b) is a graph of the RF spectra of:

• • (i) a 640 Gbit/s RZ-DPSK signal with no impairment,
  • (ii) ASE noise and
  • (iii) GVD.

FIG. 7 is a series of plots of GVD and in-band OSNR measurements of 640 Gbit/s RZ-DPSK data.

FIG. 8( a) is a graph of OSNR values measured from our method as a function of actual OSNR obtained from an OSA (in case of no GVD) for (a) 40 Gbit/s DPSK signals.

FIG. 8( b) is a graph of OSNR values measured from our method as a function of actual OSNR obtained from an OSA (in case of no GVD) for 640 Gbit/s DPSK signals

FIG. 9 is a schematic diagram of a monolithic integrated circuit waveguide with filters etched into the waveguide, and detectors.

BEST MODES OF THE INVENTION

I. Operating Principle

A. RF Spectrum Monitoring

FIG. 1 depicts a schematic of a photonic chip 2 based RF analyzer 4 which receives input signals 6 from in line Erbium Doped Filter Amplifiers (EDFA) 8 travelling from a transmitter 10 to a receiver 12. A Signal Under Test (SUT) 14 at center frequency f_s is co-propagated through the nonlinear waveguide 2 with a narrow band Continuous Wave (CW) beam 16 at frequency f_p. Cross phase modulation (XPM) [24] 18 caused by the optical Kerr effect induces a phase-modulation proportional to the instantaneous intensity of the signal onto the co-propagating CW probe field. The XPM thus maps the rapid fluctuations of the signal intensity onto the phase of the CW probe, broadening its optical spectrum as new frequencies are generated around the probe frequency 20. Note that the frequency separation between f_s and f_p has to be sufficiently large to avoid spectral interference. The probe field E_p′(t) at the output of the nonlinear waveguide thus becomes

E _p(t)=E_p(t)·exp(jφ_NL(t))  (1)

where E_p(t) is the initial electric field of the probe and φ_NL(t) is the nonlinear phase shift which is proportional to the signal intensity I(t) according to

φ_NL(t)=2γ·1(t)·L  (2)

with the nonlinear coefficient γ=(2π·n₂)/λ.A_eff) [24] and the nonlinear propagation length L. By Taylor series expansion of the term exp[j·φ_NL(t)] with the assumption of φ_NL(t)1, the electric field of a probe becomes

E _p(t)≈E_p(t)·[1+jφ_NL(t)]  (3)

The optical spectrum of the CW-probe after propagating through the waveguide is therefore proportional to the power spectrum of the signal under test (SUT) [25]

S _p(f)|F[E_p(t)]|²∝|∫l(t)exp(j2π(f−f_p)tdt|²=|F[(I(t)]|²  (4)

It is thus possible to capture the RF spectrum of a system under test by measuring the optical spectrum of the probe. The bandwidth of this technique is determined by the nonlinear response time of the medium and the group-velocity-mismatch-induced walk-off between pump 14 and probe 16. Optical Band Pass Filters (BPF) 22 and 24 and power meters 26 and 28, are employed to capture the optical spectrum and extract power signals P₁ and P₂ for impairments measurement. In this way a simple, monolithic, instantaneous measurements of P₁ and P₂ can be made. Where power P₁ is extracted from a band of low frequencies around the first fundamental clock tones, while P₂ is extracted from a band of high frequencies in the RF spectrum. It is beneficial to take the signal input after amplification by the EDFA 8 because of the high power requirements of the XPM 18.

B. Multi-impairment Performance Monitoring

FIG. 2 depicts a basic Digital Phase Shift Key (DPSK) transmission and monitoring system. The phase-encoded optical signal from transmitter 30 at the input of the standard single mode fiber (SMF) 32 is defined as [26]

$\begin{array}{cc}{E}_i\left(t\right)=\sum _ka_kp\left(t-\mathrm{kT}\right)& \left(5\right)\end{array}$

where α_k=±1, T is the bit period and p(t) is the pulse function. The transfer function of a SMF without amplified spontaneous emission (ASE) noise, PMD and Kerr nonlinearity is given by [26]

H(f)=exp(j2π²β₂Lf²)  (6)

where β₂ is GVD parameter and L is the fiber length. The optical signal at the output of the SMF is a convolution between the input signal and impulse response of the fiber

E ₀(t)=E_in(t)*h(t)=E_in(t)*{F⁻¹[H(f)]}  (7)

According to [11] the RF spectrum of an optical signal as a function of frequency f at the output of the SMF thus becomes

$\begin{array}{cc}S\left(f\right)={F\left({E_o\left(t\right)}^2\right)}^2=B\sum _{n\ne 0}{G_n\left(f\right)}^2+B.K\left(f\right)\sum _n\exp \left(j2\pi \mathrm{nTf}\right)& \left(8\right)\end{array}$

where B=1/T is the bit-rate of the optical signal, G_n(f) and K(f) are defined as [11]

$\begin{array}{cc}{G}_n\left(f\right)=F\left(E_o\left(t\right)·E_o^{*}\left(t+\mathrm{nT}\right)\right)& \left(9\right)\\ K\left(f\right)=F\left({\int }_{-\infty }^{+\infty }{E_o\left(t\right)}^2{E_o\left(t-n\tau \right)}^2t\right)& \left(10\right)\end{array}$

Note that equation (9) depends on the frequencies of the input signal and new frequencies generated by transmission impairments. If the ASE noise is included in this transmission system, the total RF spectrum at the output of a SMF fiber is [12]

S(f)=S_signal(f)+S_ASE(f)+S_signal−ASE(f)  (11)

where S_signal(f), S_ASE(f) and S_signal−ASE(f) are the RF spectra of the optical signal, ASE noise and signal-ASE beat noise, respectively.

C. Chalcogenide Planar Waveguide

An accurate measurement of multiple impairments using this OPM scheme requires sufficient bandwidth of the RF spectrum analyzer. Here we employ a highly nonlinear, dispersion-shifted Chalcogenide (ChG) planar waveguide to enhance measurement performance [27]. The ChG planar waveguide offers many advantages, including a high nonlinear response due to large ultra-fast Kerr nonlinear index coefficient n₂ (greater than 100 times of silica [28]) and a small effective core area A_eff of ˜1.2 μm² for the transverse-magnetic (TM) mode [29]. Therefore the nonlinear coefficient γ is about 9900 W⁻¹km⁻¹ and the large, normal dispersion is offset to an anomalous dispersion of ˜28.6 ps/nm/km at 1550 nm. The combination of low dispersion and short propagation length of 6.8 cm provides ultra-low walk-off, thus enabling a THz measurement bandwidth [30, 31]. This allows the characterization and performance monitoring of high-speed optical signals [22, 23].

II. Experiments and Results

A. Experimental Setup

We generate a 40 Gbit/s NRZ-DPSK signal using a CW laser source 40 at λ_s=1543 nm and a DPSK MZ modulator 42, driven by a 40 Gbit/s pseudorandom bit sequence (PRBS) of 2³¹−1 pattern length; shown in FIG. 3(a). Although optical intensity dips are observed on the eye diagram at the output of the MZ modulator due to the effects of drive waveform imperfections, the phase information of this optical signal is left intact

FIG. 3( b) depicts a 640 Gbit/s RZ-DPSK signal generation setup. A 40 GHz pulse train from a mode-locked fiber laser 50 at λ_s=1542.5 nm (with ˜550 fs pulse width after a nonlinear compression) was data encoded with the same MZ modulator 42 to produce a 40 Gbit/s RZ-DPSK data stream. An optical delay line (ΔT) 52 was used to align the data to the pulses. The 640 Gbit/s DPSK signal, whose eye diagram was captured via an optical sampling oscilloscope, was generated from the 40 Gbit/s data via four-stage optical time division multiplexing (MUX) 56.

FIG. 3( c) shows the experimental setup for the simultaneous multi-impairment monitoring of phase-encoded optical signals. The 40 Gbit/s NRZ-DPSK 60 and 640 Gbit/s RZ-DPSK signals 62 were coupled with optical impairments, e.g. GVD and ASE noise, which were produced from a Finisar WaveShaper [32] 64 and an erbium doped fiber amplifier (EDFA) 66. respectively. Note that an in-line polarizer 68 was used to ensure signal and ASE noise were co-polarized. The degraded signal (P_ave=33 mW) and a CW probe (P_ave=30 mW, λ_p=1550 nm for 40 Gbit/s NRZ-DPSK and λ_p=1570 nm for 640 Gbit/s RZ-DPSK) were aligned to the TM mode using polarization controllers (PC) 68 and co-propagated through the planar waveguide 2 via coupling lo using a pair of lensed fibers. The total insertion loss was ˜11.3 dB.

B. 40 Gbit/s NRZ-DPSK Monitoring

FIG. 4 shows the optical and RF spectra of a 40 Gbit/s NRZ-DPSK optical signal with three different conditions: no impairment, ASE noise and GVD. We define P₁ and P₂ as the RF power at lower and higher frequencies, respectively as indicated in FIG. 4(b). The bandwidths for P₁ and P₂ measurements are the same in our experiments. We observed power P₁ in the RF spectrum increases according to an increase of GVD while ASE noise raise power P₂ at further frequency. Note that the GVD effect only changes the temporal waveform of the signal and thus the RF spectrum, but not the optical spectrum.

We exploit the relationship between signal impairments of GVD and ASE noise on the. RF power spectra to determine their impact simultaneously. We calculate P₁ and P₂ by integrating the powers over a bandwidth of 10 GHz in the RF spectrum captured from a conventional optical spectrum analyzer (OSA); the same function could be performed using two sharp and narrow optical BPFs. This would simplify the implementation compared to autocorrelation approaches [21, 22] and facilitate real-time monitoring.

In FIG. 5, we map the power P₁ against the power ratio P₁/P₂. Each point on this map uniquely defines both OSNR and GVD; thus enabling their respective values to be determined simultaneously. We achieved very high GVD monitoring range of up to 510 ps/nm and the OSNR range is ˜30 dB.

C. 640 Gbit/s RZ-DPSK Monitoring

FIG. 6( a) shows the optical spectrum and FIG. 6(b) depicts the effects of GVD and ASE noise on the RF spectrum of a 640 Gbit/s RZ-DPSK optical signal.

FIG. 7 presents GVD and OSNR monitoring results of this 640 Gbit/s phase-encoded to signal based on the specific features on RF spectra. The measuring bandwidth of P₁ and P₂ is 480 GHz. Here, GVD and OSNR monitoring ranges are about 0.2 ps/nm and 40 dB, respectively.

To verify our OSNR measurement, we compare the OSNR values measured from our technique to values obtained using an OSA for both 40 Gbit/s NRZ-DPSK and 640 Gbit/s RZ-DPSK signals. FIG. 8 shows good agreement between two methods with high monitoring accuracy (error <1.2 dB for 40 Gbit/s NRZ-DPSK and error <0.5 dB for 640 Gbit/s RZ-DPSK). Note that GVD=0 ps/nm in these measurements.

III. Discussions

The multi-impairment monitoring approach is based on the measurements of power P₁ and P₂ (shown in FIGS. 4 and 7) which are the RF power at lower frequency (from the CW probe to the first RF clock tone) and at higher frequency (from the second to the third tone). Therefore sufficient measurement bandwidth is a key determinant that decides the accuracy of this monitoring approach.

TABLE I
THE PERFORMANCE OF NONLINEAR MEDIA
Nonlinear	γ*	D*	S*	L
Media	(W−1km−1)	(ps/nm/km)	(ps/nm2/km)	(m)
As2S3 planar	9900	28.6	0.62	0.068
waveguide
Silica HNLF	20	0.5	0.026	33.66
Silica DSF	3	0.5	0.08	224.4
*at 1550 nm wavelength

Three different nonlinear media, including ChG dispersion-shifted planar waveguide and two popular media, HNLF and DSF, whose key parameters are shown in Table 1, are studied in this section. Note that losses are ignored in our numerical investigation and operating powers are kept similarly in both simulation and experiment. For the purpose of comparing different waveguides, our analysis assumes an equal γ·L product of 0.6732 W⁻¹. This gives an equivalent length of HNLF and DSF of 33.66 m and 224.4 m, respectively.

The 3-dB bandwidth of this monitoring scheme is numerically characterized using a sinusoidal wave created by the interference of two CW lasers with relatively narrow wavelength separation centered at λ_s=1542.5 nm. A third CW probe at λ_p=1570 nm is coupled with this beat signal through investigated media [25, 27, 30].

FIG. 10 illustrates the power of the XPM tone generated around the probe wavelength while increasing the beat frequency, which are 3-dB bandwidths of this technique. Our numerical model used the nonlinear Schrodinger equations [24] to simulate second order β₂ and third order β₃ dispersion as well as nonlinear effects

$\begin{array}{cc}\frac{\partial A}{\partial z}+j\frac{{\beta }_2{\partial }^2A}{2\partial T^2}-\frac{{\beta }_3{\partial }^3A}{6\partial T^3}-j\gamma \left[{A}^2+j\frac{\partial \left({A}^2A\right)}{{\omega }_0\partial T}-T_RA\frac{\partial {A}^2}{\partial T}\right]& \left(12\right)\end{array}$

where A is the varying envelop and T_R is the Raman response time which is set to 3 fs. Note that propagation loss is ignored in this equation.

Finally, FIG. 9 shows the detailed architecture of the photonics chip 2 with the signal 14 input into the end of waveguide 70, and the CW probe signal 16 injected from the on chip laser 72. The waveguide 70 splits into two sub-channels 74 and 76 which are etched with bandpass filters 78 and 80 to extract P₁ and P₂ respectively. Slow detectors 82 and 84 are also integrated into the chip 2, as is a processor 86 that outputs P₁ and P₂ for multi-impairment monitoring. The inserts show the RE spectrum and the GVD and OSNR monitoring results coming from it.

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Claims

1. An optical device for real-time multi-impairment signal performance monitoring comprising: a waveguide having: an input region to receive a signal for testing, and a narrow band CW laser signal, a non-linear waveguide region to m ix the two received signals, andmore than one output region, each equipped with bandpass filters that extract respective discrete frequency bands of the RF spectrum of the mixed signals; andpower detectors to output extracted discrete frequency banded signals.

2. An optical device according to claim 1, further comprising a laser to provide the narrow band CW laser signal.

3. An optical device according to claim 1, wherein the mixing results in cross-phase modulation.

4. An optical device according to claim 1, wherein the integrated bandpass filters are etched onto the waveguide using lithographic techniques

5. An optical device according to claim 1, wherein the filters are Bragg gratings.

6. An optical device according to claim 1, wherein the filters are Array Waveguide gratings (AWG).

7. An optical device according to claim 1, wherein there are only two optical band-pass filters and slow power detectors.

8. An optical device according to claim 1, further comprising a processor to perform RF spectrum analysis of the discrete frequency banded signals.

9. An optical device according to claim 1, wherein the device is fabricated from silicon.

10. An optical device according to claim 1, wherein the waveguide is fabricated from silicon.

11. An optical device according to claim 1, wherein the waveguide is a dispersion engineered, highly nonlinear Chalcogenide (ChG) rib waveguide.

12. An optical device according to claim 1, wherein the waveguide is a nonlinear optical fiber.

13. An optical device according to claim 8, wherein the features observed on the RF spectrum are directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio monitoring.

14. An optical device according to claim 8, wherein, based on the relationship between signal impairments and the RF spectra or autocorrelation traces, the processor monitors GVD, OSNR and timing jitter simultaneously with high measurement dynamic ranges.

15. An optical device according to claim 1, wherein the power detectors are slow power detectors.

16. An optical device according to claim 1, that receives a signal for testing that is modulated according to any one of the following types of modulation: on-off keying,differential phase shift keying (DPSK),differential quadrature phase shift keying (QPSK), andoptical time division multiplexing (OTDM).

17. An optical device according to claim 1, wherein the device is a monolithic integrated photonics chip in which the input, non-linear waveguide and output regions are integrated.

18. An optical device according to claim 8, wherein a processor region is also integrated with the other regions of the device.