Photovoltaic element, photovoltaic module comprising photovoltaic element, and method of fabricating photovoltaic element

Information

  • Patent Application
  • 20070215196
  • Publication Number
    20070215196
  • Date Filed
    March 13, 2007
    17 years ago
  • Date Published
    September 20, 2007
    17 years ago
Abstract
A photovoltaic element capable of improving weather resistance is obtained. This photovoltaic element includes a photoelectric conversion layer, a first transparent conductive film formed on a surface of the photoelectric conversion layer closer to an incidence side and including a first indium oxide layer having (222) orientation and two X-ray diffraction peaks, and a second transparent conductive film formed on a surface of the photoelectric conversion layer opposite to the incidence side and including a second indium oxide layer having (222) orientation and one X-ray diffraction peak.
Description

BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a sectional view showing a structure of a photovoltaic module comprising photovoltaic elements according to an embodiment of the present invention;



FIG. 2 is a diagram for illustrating the relation between pressures of a gas mixture of Ar and O2 in forming first transparent conductive films closer to incidence sides respectively and X-ray diffraction spectra of the first transparent conductive films;



FIG. 3 is a diagram for illustrating the relation between pressures of a gas mixture of Ar and O2 in forming first transparent conductive films closer to incidence sides respectively and normalized cell outputs (Pmax) of photovoltaic elements;



FIG. 4 is a diagram for illustrating the relation between pressures of a gas mixture of Ar and O2 in forming first transparent conductive films closer to incidence sides respectively, the contents of WO3 in targets, and intensity ratios (P1/P2) between first peaks (P1) and second peaks (P2) of the transparent conductive films;



FIG. 5 is a diagram for illustrating the relation between intensity ratios (P1/P2) of first peaks (P1) and second peaks (P2) of first transparent conductive films closer to incidence sides respectively and normalized weather resistance of photovoltaic elements;



FIG. 6 is a diagram for illustrating the relation between pressures of a gas mixture of Ar and O2 in forming first transparent conductive films closer to incidence sides respectively, the contents of WO 3 in targets, and normalized cell outputs (Pmax) of photovoltaic elements; and



FIG. 7 is a diagram for illustrating the relation between pressures of a gas mixture of Ar and O2 in forming second transparent conductive films on opposite sides to incidence sides respectively, and normalized weather resistance of photovoltaic elements.


Claims
  • 1. A photovoltaic element comprising: a photoelectric conversion layer;a first transparent conductive film formed on a surface of said photoelectric conversion layer closer to an incidence side and including a first indium oxide layer having (222) orientation and two X-ray diffraction peaks; anda second transparent conductive film formed on a surface of said photoelectric conversion layer opposite to said incidence side and including a second indium oxide layer having (222) orientation and one X-ray diffraction peak.
  • 2. The photovoltaic element according to claim 1, wherein said X-ray diffraction peak of said second indium oxide layer has an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.6 degrees.
  • 3. The photovoltaic element according to claim 1, wherein said two X-ray diffraction peaks of said first indium oxide layer are constituted by a first peak on a low angle side having an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.1 degrees, and a second peak on a high angle side with a peak intensity level lower than said first peak, having an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.6 degrees.
  • 4. The photovoltaic element according to claim 3, wherein, the intensity ratio between said first peak and said second peak of said first indium oxide layer is at least 1.
  • 5. The photovoltaic element according to claim 4, wherein, the intensity ratio between said first peak and said second peak of said first indium oxide layer is at most 2.
  • 6. The photovoltaic element according to claim 1, wherein said first indium oxide layer and said second indium oxide layer include W.
  • 7. The photovoltaic element according to claim 1, further comprising: a first semiconductor layer formed thereon with said first transparent conductive film and consisting of at least either an amorphous semiconductor or a microcrystalline semiconductor;a first collector formed on a surface of said first transparent conductive film;a second semiconductor layer formed thereon with said second transparent conductive film and consisting of at least either an amorphous semiconductor or a microcrystalline semiconductor; anda second collector formed on a surface of said second transparent conductive film.
  • 8. The photovoltaic element according to claim 1, wherein said first indium oxide layer and said second indium oxide layer include Sn.
  • 9. A photovoltaic module comprising: a photoelectric conversion layer;a plurality of photovoltaic elements, each of which including a first transparent conductive film formed on a surface of said photoelectric conversion layer closer to an incidence side and including a first indium oxide layer having (222) orientation and two X-ray diffraction peaks, and a second transparent conductive film formed on a surface of said photoelectric conversion layer opposite to said incidence side and including a second indium oxide layer having (222) orientation and one X-ray diffraction peak;a transparent surface protector arranged on a surface of said first transparent conductive film closer to said incidence side; anda resin film arranged on a surface of said second transparent conductive film opposite to the incidence side.
  • 10. The photovoltaic module according to claim 9, wherein said X-ray diffraction peak of said second indium oxide layer has an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.6 degrees.
  • 11. The photovoltaic module according to claim 9, wherein said two X-ray diffraction peaks of said first indium oxide layer are constituted by a first peak on a low angle side having an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.1 degrees and a second peak on a high angle side with a peak intensity level lower than said first peak, having an angle 2θ (θ: X-ray diffraction angle) in the vicinity of 30.6 degrees.
  • 12. The photovoltaic module according to claim 11, wherein, the intensity ratio between said first peak and said second peak of said first indium oxide layer is at least 1.
  • 13. The photovoltaic module according to claim 12, wherein, the intensity ratio between said first peak and said second peak of said first indium oxide layer is at most 2.
  • 14. The photovoltaic module according to claim 9, wherein said first indium oxide layer and said second indium oxide layer include W.
  • 15. The photovoltaic module according to claim 9, further comprising: a first semiconductor layer formed thereon with said first transparent conductive film and consisting of at least either an amorphous semiconductor or a microcrystalline semiconductor;a first collector formed on a surface of said first transparent conductive film;a second semiconductor layer formed thereon with said second transparent conductive film and consisting of at least either an amorphous semiconductor or a microcrystalline semiconductor; anda second collector formed on a surface of said second transparent conductive film.
  • 16. The photovoltaic module according to claim 9, wherein said first indium oxide layer and said second indium oxide layer include Sn.
  • 17. A method of fabricating a photovoltaic element, comprising steps of: forming a photoelectric conversion layer;forming a first transparent conductive film including a first indium oxide layer having (222) orientation and two X-ray diffraction peaks on a surface of said photoelectric conversion layer closer to an incidence side by ion plating; andforming a second transparent conductive film including a second indium oxide layer having (222) orientation and one X-ray diffraction peak on a surface of said photoelectric conversion layer opposite to the incidence side by ion plating.
  • 18. The method of fabricating a photovoltaic element according to claim 17, wherein said step of forming said first transparent conductive film includes a step of forming said first transparent conductive film by ion plating under a condition of an ion energy of at least 10 eV and not more than 20 eV, andsaid step of forming said second transparent conductive film includes a step of forming said second transparent conductive film by ion plating under a condition of an ion energy of at least 10 eV and not more than 20 eV.
  • 19. The method of fabricating a photovoltaic element according to claim 17, wherein said step of forming said first transparent conductive film includes a step of forming said first transparent conductive film by ion plating under a condition where the content of WO3 powder in a target consisting of indium oxide (In2O3) is at least 1 percent by weight and not more than 3 percent by weight and a pressure of a gas mixture of Ar and O2 is at least 0.7 Pa and not more than 1.0 Pa.
  • 20. The method of fabricating a photovoltaic element according to claim 17, wherein said step of forming said first transparent conductive film includes a step of forming said first transparent conductive film prepared from a target consisting of indium oxide (In2O3) containing SnO2 powder by ion plating under a condition where a pressure of a gas mixture of Ar and O2 is at least 0.4 Pa and not more than 1.0 Pa.
Priority Claims (1)
Number Date Country Kind
JP2006-073858 Mar 2006 JP national