Claims
- 1. A method of manufacture of a pin array assembly comprising the steps of:forming an initial shape of a single crystal silicon wafer to define a base and an array of pins; etching said initial shape of a single crystal silicon wafer to form a taper; dipping said pin array into a second etch solution; and polishing said array of pins.
- 2. A method of manufacture of a pin array assembly as recited in claim 1 wherein the step of forming an initial shape of a single crystal silicon wafer to define a base and an array of pins includes the step of mechanically sawing said single crystal silicon wafer to define said base and said array of pins.
- 3. A method of manufacture of a pin array assembly as recited in claim 1 further includes the step of cleaning said formed base and said array of pins.
- 4. A method of manufacture of a pin array assembly as recited in claim 3 further includes the step of attaching an Al2O3 substrate to said formed base.
- 5. A method of manufacture of a pin array assembly as recited in claim 1 wherein the step of etching said array of pins to form a taper includes the step of etching said array of pins in a 2 parts HF (49%), 38 parts HNO3 (70%), 17 parts CH3COOH (99.5%), by volume, isotropic etching solution, for a predefined period of time.
- 6. A method of manufacture of a pin array assembly as recited in claim 5 wherein said predefined period of time is about 15 minutes.
- 7. A method of manufacture of a pin array assembly as recited in claim 1 wherein the step of dipping said pin array into a second etch solution includes the step of dipping the ends of the pins into an etch solution of 1 part CH3COOH (99.5%), 4 parts HF (49%), 35 parts HNO3 (70%).
- 8. A method of manufacture of a pin array assembly as recited in claim 7 wherein the step of dipping the ends of the pins into an etch solution of 1 part CH3COOH (99.5%), 4 parts HF (49%), 35 parts HNO3 (70%) includes the step of dipping said pin array to a selected depth at a set rate for a predefined time period.
- 9. A method of manufacture of a pin array assembly as recited in claim 8 wherein said selected depth at a set rate for a predefined time period includes a depth of about 5 mm at a rate of about 40 dips/minute for about 12 minutes.
- 10. A method of manufacture of a pin array assembly as recited in claim 1 wherein the step of dipping said pin array into a second etch solution includes the step of utilizing a motor driven pin array holder for dipping said pin array to a selected depth at a set rate for a predefined time period.
- 11. A method of manufacture of a pin array assembly as recited in claim 1 wherein the step of polishing said array of pins includes the steps of potting said array of pins in wax and polishing tips of said pins.
- 12. A method of manufacture of a pin array assembly as recited in claim 11 wherein the step of polishing tips of said pins includes the step of polishing with water and detergent solution on an abrasive paper.
- 13. A method of manufacture of a pin array assembly as recited in claim 1 further includes the step of chemically treating said polished pins.
- 14. A method of manufacture of a pin array assembly as recited in claim 13 wherein the step of chemically treating said polished pins includes the step of making shafts of said pins hydrophobic.
- 15. A method of manufacture of a pin array assembly as recited in claim 14 wherein the step of making shafts of said pins hydrophobic includes the step of etching said shafts in a Buffered Oxide Etch, 10:1 NH4F:HF for a set time period to expose the silicon material.
- 16. A method of manufacture of a pin array assembly as recited in claim 13 wherein the step of chemically treating said polished pins includes the step of making a tip surface of said pins hydrophilic.
- 17. A method of manufacture of a pin array assembly as recited in claim 14 wherein the step of making said tip surface of said pins hydrophilic includes the steps of applying a drop of HNO3 (70%) to said tip surface to form a thin oxide layer; and rinsing with de-ionized water.
Government Interests
The United States Government has rights in this invention pursuant to Contract No. W-31-109-ENG-38 between the United States Government and Argonne National Laboratory.
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