The present application claims priority from Japanese patent application JP 2007-244645 filed on Sep. 21, 2007, the content of which is hereby incorporated by reference into this application.
The present invention relates to a plasma display panel (hereinafter also referred to as a plasma panel or a PDP), and in particular to a plasma display device including a plasma panel structure capable of reducing an address discharge timelag and deterioration thereof to realize a PDP with high image quality, and a drive device thereof.
In recent years, plasma display devices have become hopeful as color display devices with large screens and low-profile. In particular, alternating-current (AC) coplanar-discharge type PDP, which generates the display discharge between electrodes disposed on the same substrate, and is driven in an alternating-current manner, is the type most advanced in practical applications because of simplicity in structure and high reliability. Hereinafter, a specific example of the ac coplanar-discharge type PDP in the related art will be explained.
The rear panel 28 is provided with address electrodes 29 (hereinafter referred to merely as “A electrodes”) disposed on its surface facing the front panel 21, so as to be spaced from and extend perpendicularly to the X electrodes (22-1, 22-2, . . . ) and Y electrodes (23-1, 23-3, . . . ) of the front panel 21, and the A electrodes are covered with a dielectric layer 30. The A-electrodes 29 are disposed so as to extend in a direction (the column direction) of an arrow D1 shown in
Further, as described in JP-A-2006-216556 and JP-A-2006-147538, regarding the electrode structure, there is proposed a structure of using a floating electrode disposed inner from the X electrodes and Y electrodes in parallel to the X electrodes and Y electrodes for the purpose of improvement in brightness, reduction of the discharge starting voltage, reduction of the manufacturing cost, and improvement in image quality. Still further, as described in JP-A-2001-216902, there is also proposed a structure of using a floating electrode in a part opposed to the partition for the purpose of effectively preventing interference in discharge between the discharge cells adjacent to each other, and thereby performing stable image display. Further, as described in JP-A-2001-6564 and JP-A-2002-343257, there is also proposed a structure of arranging the area where the sustaining discharge electrodes used as the scan electrodes are opposed to the address electrodes is larger than the area where the sustaining discharge electrode not used as the scan electrodes are opposed to the address electrodes.
In the case in which it is attempted to achieve the PDP, which is bright, has guaranteed life, can be driven stably, and is of low power consumption, high definition, and high image quality, the address discharge timelag becomes a bottleneck. If the address discharge timelag becomes large, a failure in the address discharge is caused, and the subsequent sustaining discharge fails, thus causing flickers on the screen. Further, in addition, driving the PDP for a long period of time causes the problem (deterioration with age) of increasing the address discharge timelag. Specifically, when the PDP is kept on for a long period of time, the flickers on the screen occur to cause degradation of the image quality.
As described in JP-A-2006-216556 and JP-A-2006-147538, there is proposed a structure of using the floating electrode disposed inner from the X electrodes and Y electrodes in parallel to the X electrodes and Y electrodes. However, in such a structure, since the floating electrode is disposed so as to traverse the center section of the discharge cell for the purpose of supporting the sustaining discharge, deterioration of an MgO surface on the floating electrode is caused by the sustaining discharge, thus making it quite difficult to prevent the deterioration of the address discharge timelag with age. Further, the deterioration of the address discharge timelag is not improved even by using the floating electrode to the part opposed to the partition as described in JP-A-2001-216902. Further, even if the area where the sustaining discharge electrodes used as the scan electrodes are opposed to the address electrodes is arranged to be larger than the area where the sustaining discharge electrode not used as the scan electrodes are opposed to the address electrodes as described in JP-A-2001-6564 and JP-A-2002-343257, the positive effect of the floating electrode can hardly be obtained because the floating electrode is not disposed at an appropriate place.
The present invention has been made in view of the circumstances described above, and has an object of improving the deterioration of the address discharge timelag with age, thereby providing a PDP, which is bright, has guaranteed life, can be driven stably, and is of low power consumption, high definition, and high image quality.
A summary of representative aspects of the invention disclosed in the present specification will be explained below.
According to a first aspect of the present invention, there is provided a plasma display panel, including a plurality of discharge cells each having a front substrate, a bus electrode, a pair of sustaining discharge electrodes provided to the front substrate disposed in parallel to each other in a direction perpendicular to the longitudinal direction of the bus electrode, and for forming a display line, a dielectric layer for covering the pair of sustaining discharge electrodes, a rear substrate, and an address electrode provided to the rear substrate so as to be opposed to the pair of sustaining discharge electrodes, and extending in a direction perpendicular to the longitudinal direction of the bus electrode, and a plurality of partitions for separating the plurality of discharge cells, wherein a floating electrode is disposed on the same substrate as the pair of sustaining discharge electrodes so as not to pass through a center line coplanar with the floating electrode extending in a direction perpendicular to the longitudinal direction of the bus electrode and dividing the discharge cell into two equal parts.
According to a second aspect of the present invention, in the plasma display panel according to the first aspect of the invention, a length of the floating electrode in the longitudinal direction of one bus electrode is 20% of a width of the discharge cell in the longitudinal direction excluding the partitions.
According to a third aspect of the present invention, in the plasma display panel according to the first aspect of the invention, the floating electrode is formed of one of a transparent conductive film and a metal film.
According to a fourth aspect of the present invention, in the plasma display panel according to the first aspect of the invention, the floating electrode is formed in the same layer as the pair of sustaining discharge electrodes.
According to a fifth aspect of the present invention, in the plasma display panel according to the first aspect of the invention, the floating electrode is made of the same material as the pair of sustaining discharge electrodes.
According to a sixth aspect of the present invention, in the plasma display panel according to the first aspect of the invention, the dielectric layer is mainly composed of a grass layer, and an MgO film covering the glass layer.
According to a seventh aspect of the present invention, in the plasma display panel according to any one of the first through the sixth aspects of the invention, the floating electrode is formed continuously to the contiguous discharge cell in the longitudinal direction of the bus electrode.
According to an eighth aspect of the present invention, in the plasma display panel according to any one of the first through the seventh aspects of the invention, the shortest distance between the pair of sustaining discharge electrodes and the floating electrode is substantially a half of the thickness of the dielectric layer.
According to a ninth aspect of the present invention, in the plasma display panel according to any one of the first through the eighth aspects of the invention, the thickness of the dielectric layer is equal to or smaller than 25 μm.
According to a tenth aspect of the present invention, in the plasma display panel according to any one of the first through the ninth aspects of the invention, the address electrode is formed so that projective components of the floating electrode and the address electrode in a direction perpendicular to the rear substrate overlap with each other.
According to an eleventh aspect of the present invention, there is provided a plasma display panel, including a plurality of discharge cells each having a front substrate, a bus electrode, a pair of sustaining discharge electrodes provided to the front substrate disposed in parallel to each other in a direction perpendicular to the longitudinal direction of the bus electrode, and for forming a display line, a dielectric layer for covering the pair of sustaining discharge electrodes so that the pair of sustaining discharge electrodes are opposed to each other with a predetermined gap, a rear substrate, and an address electrode provided to the rear substrate so as to be opposed to the pair of sustaining discharge electrodes, and extending in a direction perpendicular to the longitudinal direction of the bus electrode, and a plurality of partitions for separating the plurality of discharge cells, wherein the floating electrode is formed in another area than the gap.
According to a twelfth aspect of the present invention, in the plasma display panel according to the eleventh aspect of the invention, the floating electrode is formed of one of a transparent conductive film and a metal film.
According to a thirteenth aspect of the present invention, in the plasma display panel according to the eleventh aspect of the invention, the floating electrode is formed in the same layer as the pair of sustaining discharge electrodes.
According to a fourteen aspect of the present invention, in the plasma display panel according to the eleventh aspect of the invention, the floating electrode is made of the same material as the pair of sustaining discharge electrodes.
According to a fifteenth aspect of the present invention, in the plasma display panel according to the eleventh aspect of the invention, the dielectric layer is mainly composed of a grass layer, and an MgO film covering the glass layer.
According to a sixteenth aspect of the present invention, in the plasma display panel according to any one of the eleventh through the fifteenth aspects of the invention, the floating electrode is formed continuously to the contiguous discharge cell in the longitudinal direction of the bus electrode.
According to a seventeenth aspect of the present invention, in the plasma display panel according to any one of the eleventh through the sixteenth aspects of the invention, the shortest distance between the pair of sustaining discharge electrodes and the floating electrode is substantially a half of the thickness of the dielectric layer.
According to an eighteenth aspect of the present invention, in the plasma display panel according to any one of the eleventh through the seventeenth aspects of the invention, the thickness of the dielectric layer is equal to or smaller than 25 μm.
According to a nineteenth aspect of the present invention, in the plasma display panel according to any one of the eleventh through the eighteenth aspects of the invention, the address electrode is formed so that projective components of the floating electrode and the address electrode in a direction perpendicular to the rear substrate overlap with each other.
According to a twentieth aspect of the present invention, there is provided an imaging system using the plasma display panel according to any one of the first through the nineteenth aspects of the invention.
By applying the above aspects of the present invention, there can be provided a PDP, in which the deterioration in the address discharge timelag with age can be improved, which is bright, has guaranteed life, can stably be driven, is of low power consumption, high definition, and high image quality.
Hereinafter, some embodiments of the present invention will be explained in detail with reference to the accompanying drawings. It should be noted that in all of the drawings for explaining the embodiments of the invention, those having the same function are denoted with the same reference numerals, and redundant explanations therefor will be omitted.
Firstly, the address discharge timelag will be described.
[Formula 1]
t
d
=t
f
+t
s (1)
Here, the formative timelag tf is a period of time from when the seed electron to be a seed of the discharge has been generated to when the discharge occurs, and the statistical timelag ts is a period of time from when the voltage equal to or higher than the discharge starting voltage has been applied to when the seed electron is generated. Further, as shown in
Here, assuming that the number of times of measurement is N0, the formative timelag tf and the statistical timelag ts can be represented as follows.
[Formula 3]
1−N(t)/N0=exp(−(t−tf)/ts) (t≧tf) (3)
Therefore, the formative timelag tf and the statistical timelag ts can be obtained from the intercept and the gradient of a graph obtained by plotting values obtained by calculating the logarithm of 1−N(t)/N0, which is obtained by the experiment. As shown in
Further, in Formula 3, in the case in which the statistical timelag ts is sufficiently large, the statistical timelag independent of a fluctuation component of the formative timelag, namely a fluctuation component of the formative timelag caused by a variation in forming the wall charge and a variation in the seed electron generation position, can be obtained.
[Formula 4]
H(t)=1−N(t)/N0 (4)
Specifically, assuming that Formula 4 works out, the period of time with which the H(t) becomes large enough not to be influenced by the fluctuation component of the formative timelag is equal to or longer than a period of time with which the H(t) becomes 0.6, the period of time with which the H(t) becomes 0.6 is t—
Here, as shown in
Further, in the life test in which the PDP is continuously driven to be kept on, the address timelag, in particular the statistical timelag, is significantly increased. Thus, a failure in keeping the all of the discharge within the address pulse is caused resulting in the flickers in the display.
A detailed investigation has been conducted on the deterioration mechanism in the life test. As described above, the statistical timelag is the period of time from when the voltage equal to or higher than the discharge stating voltage has been applied to the electrodes to when the seed electron is generated. The seed electron to be the seed of the discharge is generated when the electron captured in the trapping level existing at a level slightly lower than the conduction band between the valence band and the conduction band of MgO jumps out to the discharge space owing to an electric field effect of the Auger process. The capturing of the electron in the trapping level is performed in the discharge prior to the address discharge by the vacuum ultraviolet irradiation on MgO, or collision of the charged particle to MgO. The longer the time elapsed from the discharge prior to the address discharge becomes, the fewer the number of the electrons captured in the trapping level becomes, and the fewer the number of seed electrons generated from the MgO surface becomes.
The number of the seed electrons can be obtained as follows. Assuming that the number of the seed electrons generated by the discharge prior to the address discharge is M0, and a time constant of generation (decrement of the captured electrons) of a single seed electron is τ, the number M(t) of the seed electrons with the elapsed time t after the previous discharge can be represented as follows.
[Formula 8]
M(t)=M0 exp(−t/τ) (8)
Here, using the M(t) and τ, the statistical timelag ts obtained by the experiment can be represented as follows.
[Formula 9]
t
s
=τ/M(t) (9)
Therefore, according to Formulas 8 and 9, the following can be obtained.
[Formula 10]
ln(1/ts)=ln(M0/τ)−t/τ (10)
Here, by measuring the statistical timelag ts while varying the elapsed time t after the discharge prior to the address discharge, and plotting the result, the M0 and the τ can be obtained from the intercept and the gradient thereof.
As a result, it proved that the number M0 of the seed electrons generated by the discharge prior to the address discharge was 1.0×106, and the time constant τ of generation of a single seed electron was 90 ms. Further, after executing continuous lighting for 1000 hours at 70 kHz, the M0 was 5.0×104, and the τ was 90 ms. In other words, it proved that the number of the seed electrons generated in the discharge prior to the address discharge became 1/20 while the frequency 1/τ of generation of a single seed electron was maintained. As described above, the seed electron is generated when the electron captured in the trapping level jumps out to the discharge space, and the capturing of the electron to the trapping level is performed in the discharge prior to the address discharge by the vacuum ultraviolet irradiation to MgO or the collision of the charged particle to MgO. Here, since there is almost no variation in the intensity of the discharge even after the continuous lighting for 1000 hours at 70 kHz is executed, it can be understood that the energy intensity of the vacuum ultraviolet irradiation or the charged particles for capturing the electrons in the trapping level is not reduced. In other words, the reduction of the number of seed electrons emitted to the discharge space is caused by reduction of the number of the trapping levels themselves. According to the above facts, it proved that the cause of the increase in the statistical timelag by the life test was the decrease in the number of seed electrons emitted from MgO caused by the decrease in the number of trapping levels in MgO.
Subsequently, investigation of a factor causing the decrease in the number of trapping levels in MgO was conducted.
As shown in
In the effective discharge area, the proportion of the area where such discharge traces were formed was 65%. In other words, it proved that the remaining 35% thereof has the clean MgO crystal shown in
Here, as described above, it proved that the seed electrons generated in the address discharge were generated mainly from MgO in the area of the discharge traces, namely on the electrode and the periphery thereof, and almost no seed electron was emitted from MgO in the part to which an electric field as intensive as the electric field on the electrode was not applied in the address discharge, judging from the fact that the number of seed electrons from the MgO surface generated in the discharge prior to the address discharge became 1/20, and the fact that the clean MgO crystal remains 35% of the effective discharge area.
Therefore, by arranging that the electric field is effectively applied to the areas other than the area where the discharge traces are formed, namely to the area where the clean MgO crystals remain, the seed electrons can effectively be generated, thus the discharge timelag can be improved.
Based on the above concept, the following experiments were conducted.
The results obtained are shown in Table 1. The address discharge timelag td, the formative timelag tf, and the statistical timelag ts were the values with the elapsed time t after the previous discharge of 16 ms. Further, the results were obtained with the life test in which the lighting period of time was 1000 hours, and the frequency was 70 kHz.
As is understood from the table, since the number M0 of the seed electrons becomes 1/20 after the 1000 hour life test in the structure of the related art, the statistical timelag ts becomes as very large as 4.45 μs, thus the flickers in the display are caused by miss addressing. In contrast, it proves that according to the electrode structure of the present embodiment of the invention, the number M0 of the seed electrons after the 1000 hour life test becomes only ¼, thus the statistical timelag ts can significantly be reduced to 0.88 μs. Therefore, by using the electrode structure of the embodiment of the invention, the sufficient address discharge is possible, thus the display performance can be assured without causing the flickers in the display. The reason why the deterioration in the address discharge timelag, in particular in the statistical timelag with age can be reduced by using the electrode structure of the embodiment of the invention as described above is as follows.
As described above, the reason why the number M0 of the seed electrons is reduced after the life test is that the crystals of MgO are broken, thus the trapping level involved in the electron emission is lowered. Further, in order for making the electrons be emitted from the part where the crystals of MgO are not broken, application of an intensive electrical field is required. Alternatively, it is required that the intensive electrical field is locally applied to the tip of a fine structure of the MgO surface. According to the electrode structure of the embodiment of the present invention, although the MgO crystals on the X electrode and the Y electrode are broken by sputtering with the sustaining discharge, the MgO crystals on the floating electrodes are not sputtered with the sustaining discharge, and remain as clean crystals after the life test because the MgO crystals on the floating electrodes are insulated from the circuit. Further, in the address discharge, since an intensive electrical field (including an intensive local electrical field) is induced on the MgO surface by electrostatic induction to promote generation of the seed electrons, the seed electrons are effectively generated, and this state is maintained after the life test.
Although the floating electrodes 65 are made of the same material as the material of the X electrode 22-1 and the Y electrode 23-1, the same material as the material of the X bus electrode 24-1 and the Y bus electrode 25-1 can also be used. Further, any materials can be used providing the materials cause the electrostatic induction. Further, although the floating electrodes 65 are formed in the same layer as the layer of the X electrode 22-1 and the Y electrode 23-1, the floating electrodes 65 can also be formed in the same layer as the layer of the X bus electrode 24-1 and the Y bus electrode 25-1. Alternatively, the floating electrodes 65 can also be formed between the dielectric layer 26 and the protective film 27.
As is understood from the drawings, in the case with the h1 of 32 μm, it can be appreciated that the discharge traces 62 run off the electrodes. On the other hand, in the case with the h1 of 15 μm, it can be appreciated that the discharge traces 62 substantially overlap the electrodes. The reason why the shapes of the discharge traces vary in accordance with the h1 even if the shapes of the electrodes are the same is as follows.
When a voltage is applied to the X electrode and the Y electrode, electrical potential is formed in the discharge space via the dielectric layer 26 and the protective layer 27.
Here, it is preferable to prevent the sputtering of MgO on the floating electrodes 65 caused by the ion impact. Therefor, the number MO of the seed electrons after the life test was measured while varying the h1. The length of the dn is 16 μm. The results obtained are shown in
Here, the minimum value of the dn is assumed to be dnmin. The optimum range of the dnmin when the h1 is varied was considered. As described above, in the case in which the thickness of the dielectric layer 26 is large, the potential distribution in the discharge space (or the surface of the protective layer 27) is spatially dampened, thus the ions in the plasma collide against the MgO surface on the electrodes and the periphery thereof, and consequently, the discharge traces 62 run off the electrodes. The relationship between the length of the running off and the h1 was investigated. As a result, it proved that the length of the running off was roughly a half of the h1. Therefore, the dnmin is preferably longer than a half of the h1, and if the dnmin is shorter than a half of the h1, the influence of the sputtering by the ion impact becomes significant. According to this fact, the optimum relationship between the dnmin and h1 became clear. Specifically, the relationship can be represented by the following formula. Further,
As shown in
The h1 is 25 μm, and the dnmin is 13 μm. As shown in the drawings, the broken line P-P′ is drawn in parallel to the partition 31 (perpendicular to the X bus electrode 24-1 and the Y bus electrode 25-1) so as to pass through the center point of the discharge cell, and the broken line Q-Q′ is drawn in parallel to the X bus electrode 24-1 and the Y bus electrode 25-1 so as to pass through the center point of the discharge cell.
As a result, in the PDP shown in
On the other hand, in the PDP shown in
The lengths of the floating electrodes 65 in the Q-Q′ direction (the lengths from the partitions 31 towards the center of the discharge cell along the Q-Q′ line) are preferably 20% of the length of the effective discharge area in the Q-Q′ direction (the length between the partitions 31 in the effective discharge area) from the respective sides. If the lengths exceed the desired values, the influence of the discharge sputtering in the sustaining discharge is exerted. Further, also in the structure shown in
Further, although in the present embodiment, the shape of the floating electrode 65 is rectangular, it is obvious that the same advantages can be obtained by the floating electrode of any shapes such as shown in
Further, it is obvious that by arranging the address electrode so that the overlapping of the Y electrode 23-1 and the floating electrodes with the address electrode becomes large as shown in
Number | Date | Country | Kind |
---|---|---|---|
2007-244645 | Sep 2007 | JP | national |