Number | Date | Country | Kind |
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95-53509 | Dec 1995 | KRX |
Number | Name | Date | Kind |
---|---|---|---|
4665345 | Shinoya et al. | May 1987 | |
4996460 | Kim et al. | Feb 1991 | |
4999541 | Kim et al. | Mar 1991 | |
5371437 | Amano | Dec 1994 |
Entry |
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"Formation of Current Leakage Paths at the Interface between Dielectrics in Intense Electric Fields in a Gas Discharge Device", S. Mikoshiba, S. Shinada, K. Kitagawa, Japanese Journal of Applied Physics, vol. 30, No. 1, Jan. 1991, pp. 146-151. |