The present application is related generally to optical filters.
Optical display, radiation detection, and imaging devices can include a stack of some of the following components: charge-coupled device (CCD) image sensor, complementary metal oxide semiconductor (CMOS) Image sensor, a liquid crystal layer, electronic components, electrodes, and optical components. For example, see patent publications U.S. Pat. Nos. 6,977,702; 8,199,282; 8,934,069; WO2012053753; WO2012053754; and WO2018190049.
These devices can be manufactured together by successively adding layers of different components in a single stack. Typical manufacturing of such devices is adapted to large volumes of a single design. A problem is that it can be expensive to vary components in the design. It would be beneficial to be able to customize by changing certain components to meet the needs of the many different applications of such devices.
Another problem of the present manufacturing process is that a defect in one component in the stack can destroy the functionality of the entire stack. Therefore, manufacturing yield can be a big concern.
It has been recognized that it would be advantageous to improve the manufacturing, and the ability to vary the design, of optical display, radiation detection, radiation measurement, and imaging devices, and other similar devices. The present invention is directed to a subassembly with at least two different optical components in a stack. Each optical component can be a wavelength filter, a polarizer, or a waveplate.
In one embodiment, each of the optical components can include separate pixels. In another embodiment, the stack can be free of radiation detection devices, liquid crystal, electronic components, or electrodes. In another embodiment, a thickness of the stack can be ≥0.1 mm and ≤3 mm.
This subassembly (i.e. stack of optical components) can be manufactured separately from other components like CCD, CMOS, liquid crystal layer, electronic components, and electrodes. Consequently, this subassembly can be manufactured relatively inexpensively and with large variety of configurations. After first manufacturing the subassembly, it can then be attached to other components (e.g. CCD, CMOS, liquid crystal layer, electronic components, electrodes, etc.) to form the completed device (e.g. optical display, radiation detection, radiation measurement, imaging, etc.).
As used herein, the term “nm” means nanometer(s), the term “μm” means micrometer(s), and the term “mm” means millimeter(s).
As used herein, the term “adjoin” means direct and immediate contact; and the term “adjacent” includes adjoin, but also includes near or next to with other solid material(s) between the adjacent items.
As used herein, the terms “equal in size” and “equal dimensions” mean exactly equal in size or dimension, equal in size or dimension within normal manufacturing tolerances, or nearly equal in size or dimension, such that any deviation from exactly equal would have negligible effect for ordinary use of the device.
As used herein, the term “pixels” means different regions of an optical device with intentionally different optical properties.
As Illustrated in
The optical devices 10, 20, 30, and 40 can consist essentially of two (
The wavelength filter can be designed to block or pass certain range(s) of the electromagnetic spectrum. The polarizer can be any type of polarizer, including an array of parallel, elongated wires, a metamaterial polarizer, a film polarizer, or combinations thereof. The waveplate can alter polarization state, such as for example by converting between linearly polarized light and circularly polarized light. Examples of thicknesses Th15 of each of the optical components 15 includes ≥50 nm or ≥300 nm and ≤1 μm, ≤3 μm, ≤500 μm, or ≤1 mm.
The stack S can be free of radiation detection devices, liquid crystal, electronic components, or electrodes. Due to absence of such additional devices, a thickness Ths of the stack can be relatively thin, such as for example ≥0.1 mm, ≥0.25 mm, or ≥0.4 mm and ≤0.8 mm, ≤1 mm, ≤2 mm, ≤3 mm, ≤5 mm, or ≤10 mm. The thickness Ths can be measured perpendicular to adjacent faces of optical components 15.
Opposite, outer sides 14 of the stack S can be exposed to air. As illustrated in
The outer solid layers 21 can be relatively thin, and a distance from each of the outer sides 14 to the optical components 15 (i.e. thickness Th21 of the outer solid layers 21) can be small. A thickness Th22 of the inner solid layers 22, and thus also distance between adjacent optical components 15, can also be small. These thicknesses Th21 and Th22 can be, for example, ≥0.1 nm, ≥1 nm, or ≥20 mm and ≤100 nm, ≤500 nm, ≤1 μm, or ≤5 μm. A choice of whether to include outer solid layers 21 and inner solid layers 22 can be made based on various factors, such as for example ease of manufacture, material cost, adhesion of the layers, protection of the optical device, and optical performance.
As Illustrated in
The pixels can be used for image formation and analysis. The polarizer can include pixels with different polarization, such as for example wire angle, wire material, coating on wires, layers of wires, wire cross-sectional shape, wire width, wire height, or combinations thereof. These differences of polarization are described in U.S. Pat. No. 8,873,144. The wavelength filter can include separate pixels, each pixel having a difference in wavelength filtration range with respect to at least one other pixel. The waveplate can include separate pixels, each pixel having a difference in polarization properties. Each pixel can have a difference with respect to ≥1, ≥2, ≥3, or ≥4 other pixels in its optical component 15.
As illustrated in
As illustrated in
The subassembly described above (i.e. stack S of optical components) can be manufactured separately from other components like CCD, CMOS, liquid crystal layer, electronic components, and electrodes. Consequently, this subassembly can be manufactured relatively inexpensively and with large variety of configurations. After first manufacturing the subassembly, it can then be attached to other components (e.g. CCD, CMOS, liquid crystal layer, electronic components, electrodes, etc.) to form the completed device (e.g. optical display, radiation detection, radiation measurement, imaging, etc.).
As illustrated in
The optical device can have properties according to any combination of the embodiments described herein. The stack S can include more than three of the optical components 15 or can include additional layers, such as for example the inner solid layer(s) 22, the outer solid layer(s) 21, or both.
This separate manufacturing, then later combining, allows for a much larger variety of final optical assemblies. It can be relatively easy to vary the design of the optical device, which can then be matched with the radiation detection device, liquid crystal, electronic component, electrode, etc. A further advantage is that yield can be improved by manufacturing these devices separately, then later combining them.
This application claims priority to U.S. Provisional Patent Application No. 62/810,506, filed on Feb. 26, 2019, which is incorporated herein by reference.
Number | Date | Country | |
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62810506 | Feb 2019 | US |