Patent Application
20240345060
This disclosure relates to a system and method for detecting hydrocarbon fuels blended in paraffin-based lubricants.
Fuel smuggling is a growing problem in international commerce. To avoid detection, smugglers may blend hydrocarbon fuels with lubrication oils and greases that are based on paraffinic compounds. Generally, hydrocarbon fuels contain low molecular weight aromatic compounds that can be used to detect the illicit compounds.
An embodiment described herein provides a system for detecting aromatic compounds mixed with aliphatic compounds. The system includes a lower substrate, a polymer film including a resistor mesh disposed on the polymer film, and an upper substrate disposed over the polymer film, wherein the upper substrate includes an opening exposing the resistor mesh.
Another embodiment described herein provides a method for detecting aromatic compounds mixed with aliphatic compounds. The method includes placing a sample of a test fluid on a polymer film through an opening in an upper substrate, wherein a resistor mesh is disposed on the polymer film. Data collection is started when the sample contacts the resistor mesh, wherein the data collection measures resistivity over time. The data collection is stopped, and a change in resistivity over time is used to determine a test time. The test time is used to determine if an aromatic compound is present in the test fluid.
Embodiments described herein provide a system and method for determining the presence of aromatic compounds in lubricants and greases based on paraffinic (aliphatic) compounds. The detection system, herein termed an aromatic detector, is based on the differential solubility of a polymer between aromatic compounds and aliphatic compounds.
A film is formed from a polymer, and then a resistor mesh is deposited over the polymer film. In some embodiments, the resistor mesh is a metal or semiconductor grid deposited by chemical vapor deposition, for example, using a mask. In other embodiments, the resistor mesh is deposited by inkjet printing of a conductive ink. The polymer film with the resistor mesh is mounted in a test apparatus.
To test for the presence of an aromatic compound in the aliphatic compounds, a resistivity instrument is coupled to contact points on the resistor mesh, for example, at the corners of the polymer film. A sample of the test fluid is placed on the polymer film, and if aromatic compounds are present, the polymer film will start to dissolve. The dissolution of the polymer film will result in degradation of the mesh where the test fluid has been applied. The measurement may be conducted for a preselected period of time, such as 1 minute, 2 minutes, 5 minutes, or longer. In some embodiments, the measurement is conducted until the resistivity levels undergoes an inflection point or levels off, indicating that dissolution has slowed or stopped.
For some polymers, contact with a material that is a poor solvent may result in stress cracking, or slower dissolution, leading to breaking of the polymer film under the resistor mesh. However, the dissolution or disintegration rate will be faster for solvents, such as aromatic compounds. In these embodiments, the measurement of the time to an inflection point after the application of the test fluid can be compared to the time to break the polymer film after the application of a control fluid. For example, a paraffinic fluid or paraffinic oil that does not contain aromatics may be used as the control fluid. Similarly, the slope of the increase in resistivity may be lower for a solvent that causes stress cracking. Accordingly, the slope may be used as an indicator of the presence of aromatic compounds in the aliphatic compounds.
The device, or aromatics detector, is discussed with respect to
To perform the test, a sample of a fluid is placed on the resistor mesh 104 deposited on the polymer film 102. The sample may be about 0.3 mL, about 0.5 mL, about 1 mL, or about 2 mL, or more. The amount of sample used may depend on the likely concentration of aromatics in the solution.
In various embodiments, the lower substrate 106 comprises polymethyl methacrylate, acetal copolymer, acetal homopolymer, nylon, polytetrafluoroethylene (PTFE), polyvinylidene fluoride copolymer, or glass, or any combinations thereof. In various embodiments, the upper substrate 108 comprises polymethyl methacrylate, acetal copolymer, acetal homopolymer, nylon, polytetrafluoroethylene (PTFE), polyvinylidene fluoride copolymer, or glass, or any combinations thereof. The lower substrate 106 and the upper substrate 108 may be made from different materials.
As materials, such as aromatic compounds, attack the polymer film 102, it will fail, disrupting the resistor mesh 104 and increasing the resistivity. As discussed below, the time to maximum resistivity can be used to indicate the presence of the aromatic compounds from fuels.
In various embodiments, the resistor mesh 104 is a metal or semiconductor that is deposited through a mask by chemical vapor deposition. The metal can include silver, copper, zinc, or any number of other conductive metals. In some embodiments, the resistor mesh 104 is a semi-conductor, such as indium oxide, gallium arsenide, and the like
In various embodiments, the resistor mesh 104 is a conductive substance deposited on the surface of the film by an ink jet printing process. For example, the ink may include carbon particles, metal particles, and the like. Other excipients may be included in the ink, such as polymers, surfactants, or co-solvents, among others. The excipients can be used to stabilize the ink, and improve binding of the resistor mesh 104 to the polymer film 102, among others.
In some embodiments, the resistor mesh 104 has contact pads 202 to enable the measurement of the resistivity changes. The contact pads 202 can be formed with the resistor mesh 104, or may be attached after formation of the resistor mesh 104, for example, by the attachment of metal contacts at the corners using a conductive adhesive. The use of the contact pads is discussed further with respect to
Placing a droplet of a fluid that includes an aromatic solvent on the resistor mesh 104 causes the polymer film 102 under the resistor mesh 104 to dissolve resulting in a disruption 306 of the resistor mesh 104. As the disruption 306 increases in size, the resistivity of the resistor mesh 104 increases, as indicated in this illustration by plot 308. In some embodiments, the resistivity measurement 300 is made by determining the total time between inflection points, for example, by measuring time when the resistivity starts to increase and the time when the resistivity starts to plateau, and comparing the time to that of a control sample that does not have an aromatic component. In some embodiments, the resistivity measurement 300 is made by determining the total increase in resistivity over a certain period of time, and comparing that increase in resistivity to that of a control sample that does not have an aromatic component. Other measurement techniques may also be used.
The concentration of the polymer and the rotation speed in the solvent controls the thickness of the polymer layer. At block 408, the solvent is then evaporated through a baking process that decreases the evaporation time, solidifying a polymer film on the lower substrate.
At block 410, the resistor mesh is formed on the polymer film. As described herein, this may be performed by chemical vapor deposition of a metal or semiconductor on the polymer film, for example, through a mask. Further, the resistor mesh may be made by inkjet printing of an ink containing a conducting material over the polymer film. The conductive material can include carbon black, suspended metal particles, suspended semiconductor particles, or any combination thereof, among others. At block 412, the upper substrate is place over the resistor mesh and secured, for example, by magnets, clips, and the like, as described herein.
In some embodiments, the polymer film is formed by other plastics processing techniques. For example, pellets of the polymer selected are used to form a film, for example, in a sheet extruder or a blown film extruder. The film is then cut into the final size and shape, for example, as shown with respect to
At block 508, the time for the resistivity to plateau, for example, the time between a first inflection point and a second inflection point in a resistivity versus time graph, is used to determine the presence of an aromatic contaminant in an aliphatic solvent. This may be performed by comparing the time to a control sample.
The test procedure is not limited to the specific steps shown in the blocks above. For example, if the polymer used to form the polymer film is not susceptible to dissolution by aliphatic compounds, the test may be implemented with no control fluid. In this example, a few milliliters of the test sample is placed on the polymer film through the opening of the upper substrate, and the change in resistivity indicates the presence of the aromatic compounds.
The design tested for the diesel-sensitive element of the sensor included a thin film of cyclic olefin copolymer (COC) with a conductive line, of silver or gold, sputtered on top. The COC film had a thickness of around 10-15 μm, where the thickness is inversely proportional to the dissolution rate, thus having a thin film helps achieve faster results.
The formation of a COC film was tested. The COC was purchased from TOPAS advanced polymers of Florence, KY, USA. The great selected was 5013I-10 which had 3 mm nominal granule size.
A COC solution was first made using 30% (w/w) of COC crystals dissolved in Toluene. The solution was then spin coated at a speed of 1500 rpm for 30 sec and then heated on a hot plate of 40° C. to dry the COC thin film. The film was then released from the carrier wafer.
A polyimide mask of the conductive line was designed. The mask was taped on the stage directly by covering over the COC film covered wafer without direct contact with the COC film. It was then sputtered using a silver target. In the tests herein, the conductive trace was used as a fuse for a circuit driving a light-emitting diode.
Design with Glass Substrate
Initially, the COC film was affixed to a glass substrate for support. Acrylic frame was cut to attach on top of the glass-COC-gold stack, to act as holder for the drop casted diesel.
Design with Released COC Thin Film
To achieve this, the COC thin film was released from the substrate using acetone. The film was subsequently sputtered and diced to make samples for testing. The film was placed between two acrylic frames.
An embodiment described herein provides a system for detecting aromatic compounds mixed with aliphatic compounds. The system includes a lower substrate, a polymer film including a resistor mesh disposed on the polymer film, and an upper substrate disposed over the polymer film, wherein the upper substrate includes an opening exposing the resistor mesh.
In an aspect, the lower substrate includes glass. In an aspect, the lower substrate includes acetal copolymer, acetal homopolymer, nylon, polytetrafluoroethylene (PTFE), or polyvinylidene fluoride, or any combination thereof.
In an aspect, the polymer film includes a cyclic olefin copolymer (COC). In an aspect, the polymer film includes poly(acrylonitrile butadiene styrene) (ABS). In an aspect, the polymer film includes polyphenylene oxide (PPO).
In an aspect, the resistor mesh includes metal particles printed on the polymer film. In an aspect, the resistor mesh includes a metal trace deposited on the polymer film. In an aspect, the metal trace is deposited on the polymer film by chemical vapor deposition through a mask.
In an aspect, the upper substrate includes glass. In an aspect, the upper substrate includes acetal copolymer, acetal homopolymer, nylon, polytetrafluoroethylene (PTFE), or polyvinylidene fluoride, or any combination thereof.
Another embodiment described herein provides a method for detecting aromatic compounds mixed with aliphatic compounds. The method includes placing a sample of a test fluid on a polymer film through an opening in an upper substrate, wherein a resistor mesh is disposed on the polymer film. Data collection is started when the sample contacts the resistor mesh, wherein the data collection measures resistivity over time. The data collection is stopped, and a change in resistivity over time is used to determine a test time. The test time is used to determine if an aromatic compound is present in the test fluid.
In an aspect, the method includes determining a test time based, at least in part, on the time at which the resistivity starts to plateau, as determined by a difference in time between a first inflection point in the resistivity and a second inflection point in the resistivity.
In an aspect, the method includes assembling a test apparatus with a layer of polymer film, between two substrates, wherein an upper substrate has an opening to the resistor mesh disposed on the polymer film. In an aspect, the method includes removing the polymer film from the test apparatus after a test is completed, cleaning the test apparatus, and reassembling the test apparatus with a replacement layer of the polymer film between the upper substrate and a lower substrate, wherein the resistor mesh on the layer polymer film faces the opening in the upper substrate.
In an aspect, the method includes placing a sample of control fluid on the resistor mesh disposed on the polymer film through the opening in the upper substrate, starting data collection when the sample contacts the resistor mesh, wherein the data collection measures resistivity over time, and stopping the data collection. A change in resistivity over time is used to determine a control time. In an aspect, the method includes comparing the test time to the control time to determine if an aromatic compound is present at a test fluid.
In an aspect, the method includes forming the polymer film by dissolving a polymer in an aromatic solvent to form a solution, and casting the polymer film. In an aspect, the polymer includes a cyclic olefin copolymer.
In an aspect, the method includes forming the resistor mesh by printing a conductive ink on the polymer film. In an aspect, the method includes forming the resistor mesh by chemical vapor deposition of a conductive material through a mask on the polymer film.
In an aspect, the polymer includes an acrylonitrile butadiene styrene (ABS) copolymer.
Other implementations are also within the scope of the following claims.
