Portion of a cover for an electron microscope

Information

  • Patent Grant
  • D711950
  • Patent Number
    D711,950
  • Date Filed
    Thursday, May 30, 2013
    11 years ago
  • Date Issued
    Tuesday, August 26, 2014
    9 years ago
  • US Classifications
    Field of Search
    • US
    • D16 130
    • D16 131
    • 250 310000
    • 250 311000
    • 250 440110
    • D24 216
    • D24 232
    • D10 81
    • 422 063000
    • 422 066000
    • D15 79
    • D15 81
    • D15 84- 89
    • 312 405000
    • 312 116000
    • 312 407100
    • 312 409000
    • 004 607000
    • 004 614000
    • D99 41
    • D99 43
    • CPC
    • A47B81/00
    • E05C3/06
  • International Classifications
    • 1606
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of a portion of a cover for an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof; and,



FIG. 7 is a bottom plan view thereof.


The long and short dashed lines immediately adjacent the shaded area represent the bounds of the claimed design while all other broken lines are directed to an environment and form no part of the claimed design.


Claims
  • We claim the ornamental design for a portion of a cover for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2012-029394 Nov 2012 JP national
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Non-Patent Literature Citations (3)
Entry
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
Jeol News, Introduction of New Products, High Throughput Electron Microscope, Electron Microscope, JEM-2800, Jul. 2011, vol. 46, No. 1, in English.
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