Claims
- 1. A niobium primary powder for capacitors, having an average circular degree of 0.8 or more and an average particle size of 0.01 to 0.5 μm, the circular degree being defined by the following formula:
- 2. The niobium primary powder for capacitors as claimed in claim 1, wherein at least a part of niobium is nitrided.
- 3. A niobium primary agglomerated powder for capacitors, having an average primary particle size of 0.01 to 0.5 μm and an average particle size of 0.03 to 20 μm.
- 4. The niobium primary agglomerated powder for capacitors as claimed in claim 3, wherein the primary particles have an average circular degree of 0.8 or more, the circular degree being defined by the following formula:
- 5. The niobium primary agglomerated powder for capacitors as claimed in claim 3 or 4, wherein at least a part of niobium is nitrided.
- 6. The niobium primary agglomerated powder for capacitors as claimed in claim 3 or 4, wherein the specific surface area is from 4 to 30 m2/g.
- 7. A niobium secondary agglomerated powder for capacitors, obtained by granulating the niobium primary agglomerated powder claimed in any one of claims 3 to 6.
- 8. The niobium secondary agglomerated powder for capacitors as claimed in claim 7, wherein the specific surface area is from 3 to 20 m2/g.
- 9. The niobium secondary agglomerated powder for capacitors as claimed in claim 7 or 8, wherein the average particle size is from 50 to 150 μm.
- 10. The niobium secondary agglomerated powder for capacitors as claimed in any one of claims 7 to 9, wherein at least a part of niobium is nitrided.
- 11. A sintered body using the niobium primary agglomerated powder for capacitors claimed in any one of claims 3 to 6.
- 12. A sintered body using the niobium secondary agglomerated powder for capacitors claimed in any one of claims 7 to 10.
- 13. The sintered body as claimed in claim 11 or 12, wherein the specific surface area is from 1 to 10 m2/g.
- 14. A capacitor comprising the sintered body as claimed in claim 11 or 12 as one part electrode, a dielectric material formed on the surface of the sintered body, and another part electrode provided on the dielectric material.
- 15. The capacitor as claimed in claim 14, wherein the dielectric material mainly comprises niobium oxide.
- 16. The capacitor as claimed in claim 15, wherein the niobium oxide is formed by electrolytic oxidation.
- 17. The capacitor as claimed in any one of claims 14 to 16, wherein the another part electrode is at least one material selected from the group consisting of an electrolytic solution, an organic semiconductor and an inorganic semiconductor.
- 18. The capacitor as claimed in claim 17, wherein the another part electrode is composed of an organic semiconductor and the organic semiconductor is at least one organic semiconductor selected from the group consisting of an organic semiconductor comprising a benzopyrroline tetramer and chloranile, an organic semiconductor mainly comprising tetrathiotetracene, an organic semiconductor mainly comprising tetracyanoquinodimethane, and an organic semiconductor mainly comprising an electrically conducting polymer obtained by doping a dopant into a polymer containing two or more repeating units represented by the following formula (1) or (2):
- 19. The capacitor as claimed in claim 18, wherein the organic semiconductor is at least one member selected from polypyrrole, polythiophene polyaniline and substitution derivatives thereof.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2000-326737 |
Oct 2000 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application is an application based on the provisions of 35 U.S.C. Article 111(a), claiming the benefit from U.S. provisional application Ser. No. 60/268,914 filed on Feb. 16, 2001, under the provisions of 35 U.S.C. 111(b), pursuant to 35 U.S.C. Article 119(e) (1).
PCT Information
Filing Document |
Filing Date |
Country |
Kind |
PCT/JP01/09375 |
10/25/2001 |
WO |
|