Patent Application
20240343636
The present invention relates to a powder.
Fillers in a powder form are generally used to improve physical properties or functions of base materials such as glass materials and resin materials. For example, amorphous silica has a small thermal expansion coefficient of about 0.5×10−6/° C. and is relatively readily available, and therefore amorphous silica is used as a filler to control a thermal expansion coefficient of a base material. Fillers having thermal expansion coefficients even lower than that of amorphous silica are attracting attention in order that, when a filler is added to base materials used for bonding, sealing, encapsulation, or the like, the thermal expansion coefficients match between the filler and the base material and that thermal stress is hindered from occurring.
As a material having a thermal expansion coefficient lower than that of amorphous silica, many materials are known, such as zirconium phosphate, zirconium tungstate, and manganese nitride. However, the above materials are not commonly used in electronic components, etc. because specific gravities of these materials are large, making the resin materials, etc. to which these materials are added also heavy. Therefore, development of light materials having a low thermal expansion coefficient has been actively pursued.
For example, Patent Document 1 discloses a powder comprising three components of ZnO, Al2O3, and SiO2, wherein the respective contents of the three components are ZnO: 17 to 43 mol %, Al2O3: 9 to 20 mol %, and SiO2: 48 to 63 mol % of the total content of the three components, the powder being excellent in an effect of reducing a thermal expansion coefficient of a base material when blended in a resin base material.
Here, in the above-mentioned Patent Document 1, the thermal expansion coefficient of the resin composition to which the powder is added is evaluated, but the thermal expansion coefficient of the powder itself is not evaluated. On the other hand, with the recent size reduction of electronic components, there is a need for powders with negative thermal expansion coefficients greater in magnitude.
The purpose of the present invention is to provide a powder having a negative thermal expansion coefficient greater in magnitude.
According to one aspect of the present invention, a powder is provided. The powder comprises constituents including ZnO, Al2O3, and SiO2. In a ternary state diagram of ZnO, Al2O3, and SiO2, the powder has a composition included in a quadrangular area having, as corners, four points (ZnO (mol %), Al2O3(mol %), SiO2 (mol %))=(24,13,63), (19,18,63), (37,12,51), (32,17,51), and in an X-ray diffraction pattern, a ratio (S001/S101) of an area S001 of a peak appearing in a range of 15°≤2θ≤17° to an area S101 of a peak appearing in a range of 24°≤2θ≤27° is in a range from 0.001 to 0.07.
The present invention may be provided in each of the following aspects.
The powder comprising a β-quartz solid solution as a crystalline phase at equal to or more than 50 mass % of a total amount of the powder.
The powder wherein, each of total contents of Li, Na, and K is equal to or less than 500 mass ppm of a total amount of the powder.
The powder, wherein an average circularity is equal to or more than 0.6.
Of course, the present invention is not limited to these.
According to the present invention, it is possible to provide a powder having a negative thermal expansion coefficient of greater in magnitude.
Hereinafter, a description will be given of embodiments of the present invention. The present invention is not limited to the following embodiments, and the respective components described in the following embodiments can be combined with each other.
The powder according to the present embodiment comprises constituents including ZnO, Al2O3, and SiO2. In a ternary state diagram of ZnO, Al2O3 and SiO2, the powder has a composition included in a quadrangular area having, as corners, four points (ZnO (mol %), Al2O3(mol %), SiO2 (mol %))=(24, 13, 63), (19, 18, 63), (37, 12, 51), (32, 17, 51), and in an X-ray diffraction pattern, a ratio (S001/S101) of an area S001 of a peak appearing in a range of 15°≤2θ≤17° to an area S101 of a peak appearing in a range of 24°≤2θ≤27° is in a range from 0.001 to 0.07.
In the powder having the composition range described above, the ratio S001/S101 and the thermal expansion coefficient of the powder have relationship of a linear function with a negative slope, and when S001/S101 is in a range from 0.001 to 0.07, the thermal expansion coefficient is greater in magnitude. In other words, if the powder has the composition described above and illustrates the X-ray diffraction pattern described above, the negative thermal expansion coefficient is greater in magnitude.
Although the present invention is not limited to any particular theories or mechanisms, and the actual mechanism thereof has not been clarified, the applicant considers that the reasons are as described below why the negative thermal expansion coefficient becomes greater in magnitude when the powder has the above-mentioned composition and represent the above-mentioned X-ray diffraction pattern. Firstly, in such a range, a content of a β-quartz solid solution having a negative thermal expansion coefficient greater in magnitude increases, and thereby the powder as a whole is likely to have a negative thermal expansion coefficient greater in magnitude. Second, it is considered that the greater unevenness of existence likelihood among interstitial sites where Zn substitutes in interstitial-type β-quartz crystal structures, the larger the area S001 of the peak appearing in the range of 15°≤2θ≤17° in the X-ray diffraction pattern. In other words, the ratio S001/S101 acquired by dividing the area S001 by the area S101 of the peak appearing in the range of 24°≤2θ≤27° is in a range from 0.001 to 0.07, which means that the unevenness of the existence likelihood among the interstitial sites is constant. Such β-quartz solid solution has a negative thermal expansion coefficient greater in magnitude.
Hereinafter, the points (24, 13, 63), (19, 18, 63), (37, 12, 51), and (32, 17, 51) will be also referred to as “first point,” “second point,” “third point,” and “fourth point”, respectively.
The first point is (24,13,63) as described above but may be, for example, (25,13,62), (24,14,62), or (25,14,61).
The second point is (19, 18, 63) as described above but may be, for example, (20, 17, 63), (21, 17, 62), (22, 17, 16), (23, 17, 60), or (24, 16, 60).
The third point is (37,12,51) as described above but may be, for example, (36,13,51), (35,13,52), (34,13,53), (33,13,54), (32,13,55), (31,13,56), (30,13,57), or (29,14,57).
The fourth point is (32, 17, 51) as described above but may be, for example, (31, 17, 52), (30, 17, 53), (29, 17, 54), (28, 17, 55), (27, 17, 56), or (26, 17, 57).
In the X-ray diffraction pattern of the powder, the ratio (S001/S101) of the area S001 of the peak appearing in the range of 15°≤2θ≤17° to the area S101 of the peak appearing in the range of 24°≤2θ≤27° is not limited as long as the ratio (S001/S101) is in a range from 0.001 and 0.07, and may be, for example, equal to or less than 0.065, equal to or less than 0.06, equal to or less than 0.055, equal to or less than 0.05, equal to or less than 0.045, equal to or less than 0.04, equal to or less than 0.39, equal to or less than 0.38, equal to or less than 0.37, equal to or less than 0.36, equal to or less than 0.35, equal to or less than 0.34, equal to or less than 0.33, equal to or less than 0.32, equal to or less than 0.31, or equal to or less than 0.3. S001/S101 may be equal to or more than 0.002, equal to or more than 0.003, equal to or more than 0.004, equal to or more than 0.005, equal to or more than 0.006, equal to or more than 0.007, equal to or more than 0.008, equal to or more than 0.009, or equal to or more than 0.01. The negative thermal expansion coefficient of the powder can be made large in magnitude when S001/S101 is within the predetermined range. The area of each peak is obtained with Jade 9, a powder X-ray diffraction pattern comprehensive analysis software from Materials Data, Inc., by drawing a parabolic background line in a range of 10°≤2θ≤30° and then conducting a refinement including the background line and separating the peaks. The peak is separated in consideration of overlaps between each of the peaks in the ranges of 15°≤2θ≤17° and 24°≤2θ≤27° and a Kα1-derived diffraction line and between each peak and a Kα2-derived diffraction line. In the analysis, the pseudo-voigt function is used as a function of the diffraction peaks.
The powder may contain ionic impurities, which are unavoidable impurities, and the content thereof is not particularly limited. The total content of Li, Na, and K as ionic impurities may be, for example, equal to or less than 500 mass ppm, equal to or less than 450 mass ppm, equal to or less than 400 mass ppm, equal to or less than 350 mass ppm, equal to or less than 300 mass ppm, equal to or less than 250 mass ppm, equal to or less than 200 mass ppm, equal to or less than 150 mass ppm, equal to or less than 100 mass ppm, equal to or less than 90 mass ppm, equal to or less than 80 mass ppm, equal to or less than 70 mass ppm, equal to or less than 60 mass ppm, equal to or less than 50 mass ppm, equal to or less than 40 mass ppm, equal to or less than 30 mass ppm, equal to or less than 20 mass ppm, or equal to or less than 10 mass ppm of the total amount of the powder. When the total content of Li, Na, and K is equal to or less than the predetermined amount, it is possible to improve moisture-resistance reliability and to reduce failures of electronic apparatuses. It is to be noted that the total content of Li, Na, and K may be more than 500 mass ppm of the total amount of the powder. On the other hand, the content of Li may be equal to or more than 0 mass ppm (including an aspect where the total content of Li, Na, and K is 0 mass ppm, i.e., Li, Na, and K is not included at all) of the total amount of the powder.
The content of Li is not limited, but may be, for example, equal to or less than 500 mass ppm, equal to or less than 450 mass ppm, equal to or less than 400 mass ppm, equal to or less than 350 mass ppm, equal to or less than 300 mass ppm, equal to or less than 250 mass ppm, equal to or less than 200 mass ppm, equal to or less than 150 mass ppm, equal to or less than 100 mass ppm, equal to or less than 90 mass ppm, equal to or less than 80 mass ppm, equal to or less than 70 mass ppm, equal to or less than 60 mass ppm, equal to or less than 50 mass ppm, equal to or less than 40 mass ppm, equal to or less than 30 mass ppm, equal to or less than 20 mass ppm, or equal to or less than 10 mass ppm of the total amount of the powder. On the other hand, the content of Li may be equal to or more than 0 mass ppm (including an aspect where the content of Li is 0 mass ppm, i.e., Li is not included at all) of the total amount of the powder.
The content of Na is not limited, but for example, equal to or less than 500 mass ppm, equal to or less than 450 mass ppm, equal to or less than 400 mass ppm, equal to or less than 350 mass ppm, equal to or less than 300 mass ppm, equal to or less than 250 mass ppm, equal to or less than 200 mass ppm, equal to or less than 150 mass ppm, equal to or less than 100 mass ppm, equal to or less than 90 mass ppm, equal to or less than 80 mass ppm, equal to or less than 70 mass ppm, equal to or less than 60 mass ppm, equal to or less than 50 mass ppm, equal to or less than 40 mass ppm, equal to or less than 30 mass ppm, equal to or less than 20 mass ppm, or equal to or less than 10 mass ppm of the total amount of the powder. On the other hand, the content of Na may be equal to or more than 0 mass ppm (including an aspect where the content of Na is 0 mass ppm, i.e., Na is not included at all) of the total amount of the powder.
The content of K is not limited, but may be, for example, equal to or less than 500 mass ppm, equal to or less than 450 mass ppm, equal to or less than 400 mass ppm, equal to or less than 350 mass ppm, equal to or less than 300 mass ppm, equal to or less than 250 mass ppm, equal to or less than 200 mass ppm, equal to or less than 150 mass ppm, equal to or less than 100 mass ppm, equal to or less than 90 mass ppm, equal to or less than 80 mass ppm, equal to or less than 70 mass ppm, equal to or less than 60 mass ppm, equal to or less than 50 mass ppm, equal to or less than 40 mass ppm, equal to or less than 30 mass ppm, equal to or less than 20 mass ppm, or equal to or less than 10 mass ppm of the total amount of the powder. On the other hand, the content of K may be equal to or more than 0 mass ppm (including an aspect where the content of K is 0 mass ppm, i.e., K is not included at all) of the total amount of the powder.
The powder can further contain zirconium oxide (ZrO2), titanium oxide (TiO2), etc. as well as ZnO, Al2O3 and SiO2. The total content of ZnO, Al2O3 and SiO2 is not particularly limited, but may be, for example, equal to or more than 90 mol %, equal to or more than 91 mol %, equal to or more than 92 mol %, equal to or more than 93 mol %, equal to or more than 94 mol %, equal to or more than 95 mol %, equal to or more than 96 mol %, equal to or more than 97 mol %, equal to or more than 98 mol %, equal to or more than 99 mol %, equal to or more than 99.5 mol %, equal to or more than 99.9 mol %, equal to or more than 99.95 mol %, and equal to or more than 99.99 mol % of the total amount of the powder. The powder may consist only of ZnO, Al2O3 and SiO2 and unavoidable impurities or may consist only of ZnO, Al2O3, and SiO2. When the total content of ZnO, Al2O3, and SiO2 is equal to or more than the predetermined amount, the negative thermal expansion coefficient of the powder can be made greater in magnitude. On the other hand, the total content of ZnO, Al2O3, and SiO2 may be equal to or less than 100 mol % of the total amount of the powder.
The powder may contain a β-quartz solid solution as a crystalline phase. A content of the β-quartz solid solution is not particularly limited but may be, for example, equal to or more than 50 mass %, equal to or more than 55 mass %, equal to or more than 57 mass %, equal to or more than 60 mass %, equal to or more than 62 mass %, equal to or more than 65 mass %, equal to or more than 67 mass %, equal to or more than 70 mass %, equal to or more than 71 mass %, equal to or more than 72 mass %, equal to or more than 73 mass %, equal to or more than 74 mass %, equal to or more than 75 mass %, or equal to or more than 76 mass % of the total amount of the powder. When the content of the β-quartz solid solution is equal to or more than the predetermined amount, the negative thermal expansion coefficient of the powder can be increased in magnitude. In addition, when the content of the β-quartz solid solution is equal to or more than the predetermined amount, the amount can be increased of the powder blended (filled) in the base material, and thereby the thermal expansion coefficient of the base material can be more easily controlled. On the other hand, the content of the β-quartz solid solution may be equal to or less than 100 mass %. The structure of the β-quartz solid solution included in the powder can be expressed as xZnO-yAl2O3-zSiO2. Identification of the crystalline phase and measurement of the content can be carried out by analyzing the XRD pattern obtained by the powder X-ray diffraction method using the Rietveld method.
In addition to the β-quartz solid solution phase, the powder may contain another amorphous phase and may contain another crystalline phase. The powder may contain a willemite phase (Zn2SiO4) as the other crystalline phase. The powder may also contain a gahnite phase (ZnAl2O4), mullite phase (Al6Si2O13), and cristobalite phase (SiO2) as the other crystalline phase. The total content of the gahnite phase (ZnAl2O4), mullite phase (Al6Si2O13), and cristobalite phase (SiO2) is not limited but may be, for example, equal to or less than 10 mass %, equal to or less than 9 mass %, equal to or less than 8 mass %, equal to or less than 7 mass %, equal to or less than 6 mass %, equal to or less than 5 mass %, equal to or less than 4 mass %, equal to or less than 3 mass %, equal to or less than 2 mass %, equal to or less than 1 mass %, equal to or less than 0.5 mass %, equal to or less than 0.2 mass %, equal to or less than 0.1 mass %, equal to or less than 0.05 mass %, equal to or less than 0.02 mass %, or equal to or less than 0.01 mass % of the total amount of the powder. The gahnite phase (ZnAl2O4), mullite phase (Al6Si2O13), and cristobalite phase (SiO2) have positive thermal expansion coefficients, and thus when the content thereof is equal to or less than the predetermined amount, the negative thermal expansion coefficient of the powder can remain large in magnitude. On the other hand, the total content of gahnite phase (ZnAl2O4), mullite phase (Al6Si2O13), and cristobalite phase (SiO2) may be equal to or more than 0 mass % (including an aspect where the content of these crystalline phases is 0 mass %, i.e., these crystalline phases are not included at all) of the total amount of the powder.
The shape of the powder is not limited and can be spherical, cylindrical, prismatic, etc., but spherical shape is preferable.
Whether or not the powder is spherical can be determined by calculating an average circularity of the powder. In the present specification, the average circularity is calculated as described below. A circularity is calculated by substituting, into the following equation (1), a projected area (S) and projected perimeter (L) of a particle (powder particle) whose image is captured by using an electron microscope and is used to obtain the projected area (S) and perimeter (L).
The average circularity is then obtained by calculating an average value of circularities of 100 randomly selected particles.
Circularity=4πS/L2 (1)
The average circularity is not limited but may be, for example, equal to or more than 0.6, equal to or more than 0.65, equal to or more than 0.7, equal to or more than 0.75, equal to or more than 0.8, equal to or more than 0.85, or equal to or more than 0.9. When the average circularity is equal to or more than the predetermined amount, it is possible to reduce rolling resistance of the particles at the time of mixing those with the base material, which lowers viscosity of the base material and improves fluidity of the base material. In particular, when the average circularity is equal to or more than 0.90, the fluidity of the base material becomes even higher, allowing the powder to be highly filled into the base material and facilitating the reduction of the thermal expansion coefficient. On the other hand, the average circularity may be equal to or less than 1.
The average particle diameter is not particularly limited but may be, for example, equal to or more than 0.1 μm, equal to or more than 0.2 μm, equal to or more than 0.5 μm, equal to or more than 1 μm, or equal to or more than 2 μm. On the other hand, the average particle diameter may be equal to or less than 100 μm, equal to or less than 90 μm, equal to or less than 80 μm, equal to or less than 70 μm, equal to or less than 60 μm, or equal to or less than 50 μm. The average particle diameter of the powder can be obtained by measuring a particle size distribution using a laser diffraction particle size analyzer, multiplying the calculated particle diameter value by a relative particle amount (differential vol %), and dividing it by a total relative particle amount (100 vol %).
The thermal expansion coefficient in a 112 plane direction of the powder is not limited but may be equal to or less than 0 ppm/° C., equal to or less than −0.1 ppm/° C., equal to or less than −0.2 ppm/° C., equal to or less than −0.3 ppm/° C., equal to or less than −0.4 ppm/° C., equal to or less than −0.5 ppm/° C., equal to or less than −0.6 ppm/° C., equal to or less than −0.7 ppm/° C., equal to or less than −0.8 ppm/° C., equal to or less than −0.9 ppm/° C., equal to or less than −1 ppm/° C., equal to or less than −1.1 ppm/° C., equal to or less than −1.2 ppm/° C., equal to or less than −1.3 ppm/° C., equal to or less than −1.4 ppm/° C., or equal to or less than −1.5 ppm/° C. The larger in magnitude the negative thermal expansion coefficient of the powder, the lower the amount of powder added may be. Therefore, it is preferable that the negative thermal expansion coefficient is large in magnitude. Thus, the lower limit value of the thermal expansion coefficient in the 112 plane direction of the powder is not particularly limited. A thermal expansion coefficient in a plane direction is measured by the following method. High-temperature X-ray diffraction (high-temperature XRD) is used to analyze a thermal expansion coefficient of a main phase. Here, an angle standard sample (Si) is added to the sample and the measurement is carried out using a focusing optical system. Specifically, about 10 mass % of the angle standard sample (Si, NIST SRM 640c) is added to each sample, and then each sample is mixed in a mortar. Thereafter, the sample is placed on a sample plate and is pressed and spread by a glass plate so that the sample surface and the sample plate surface are aligned, and measurements (using a focusing optical system) are carried out at six temperature levels (25 to 300° C.). Lattice plane spacing at each temperature is calculated based on the obtained diffraction lines derived from the 112 plane and the 203 plane, and the thermal expansion coefficient of the main phase is analyzed. More detailed measurement conditions are described in the Examples.
The thermal expansion coefficient in the 203 plane direction is not limited, but may be equal to or less than 0 ppm/° C., equal to or less than −0.1 ppm/° C., equal to or less than −0.2 ppm/° C., equal to or less than −0.3 ppm/° C., equal to or less than −0.4 ppm/° C., equal to or less than −0.5 ppm/° C. or less, equal to or less than −0.6 ppm/° C., equal to or less than −0.7 ppm/° C., equal to or less than −0.8 ppm/° C., equal to or less than −0.9 ppm/° C., equal to or less than −1 ppm/° C., equal to or less than −1.1 ppm/° C., equal to or less than −1.2 ppm/° C., equal to or less than −1.3 ppm/° C., equal to or less than −1.4 ppm/° C., or equal to or less than −1.5 ppm/° C. The lower limit value of the thermal expansion coefficient of the powder in the 203 plane direction is not particularly limited.
Hereinafter, a description will be given of a method for producing the powder according to the present embodiment. The method for producing the powder according to one embodiment includes preparing a raw material powder (raw material powder preparation step), forming the raw material powder into a spherical shape (sphere formation step), and crystallizing the raw material powder (crystallization step). The method for producing the powder according to the present embodiment may include the raw material powder preparation step, the sphere formation step, and the crystallization step in this order.
In the raw material powder preparation step, raw materials are mixed to prepare the raw material powder. Although not limited, the raw materials may include zinc oxide, etc. as a Zn source, aluminum oxide, aluminum hydroxide, etc. as an Al source, and silicon oxide (α-quartz, cristobalite, amorphous silica, etc.) as a Si source.
The contents of the raw materials are not limited but may be such that, for example, the Zn source is 17 to 43 mol %, Al source is 9 to 20 mol %, and Si source is 48 to 63 mol % of the total amount of Zn, Al, and Si source materials to be used.
In addition to the raw materials mentioned above, the raw material powder preparation step may add zirconium oxide, titanium oxide, or other nucleating agents to an extent that they do not affect the thermal expansion coefficient.
The content of ionic impurities in the raw material mixture is not limited but may be equal to or less than 500 mass ppm, equal to or less than 450 mass ppm, equal to or less than 400 mass ppm, equal to or less than 350 mass ppm, equal to or less than 300 mass ppm, equal to or less than 250 mass ppm, equal to or less than 200 mass ppm, equal to or less than 150 mass ppm, equal to or less than 100 mass ppm, equal to or less than 0 mass ppm, equal to or less than 80 mass ppm, equal to or less than 70 mass ppm, equal to or less than 60 mass ppm, equal to or less than 50 mass ppm, equal to or less than 40 mass ppm, equal to or less than 30 mass ppm, equal to or less than 20 mass ppm, or equal to or less than 10 mass ppm.
The method of mixing the raw material oxides is not limited as long as the method hinders alkali metals, such as Na, Li, or K, and other metal elements, such as Fe, from mixing in. For example, mixing can be carried out using an agate mortar, ball mill, vibration mill, or other milling machine, or various mixers.
In the raw material powder preparation step, the raw material powder is then placed in a container, such as a platinum crucible or alumina crucible, and melted in an electric furnace, high-frequency furnace, image furnace, or other heating furnace or flame burner, etc., and then these melts are brought out into air or water for rapid cooling. In this way, raw material glass can be obtained. The obtained raw material glass is then pulverized to obtain the raw material powder. The method of pulverizing the raw material glass is not limited but may be, for example, a method using an agate mortar, a ball mill, a vibration mill, a jet mill, a wet jet mill, etc. Pulverizing can be carried out by any of dry and wet pulverizing methods. When pulverizing is carried out by a wet pulverizing method, a liquid such as water or alcohol for example is mixed with the raw material powder and thereby pulverizing can be carried out in a wet condition.
In the sphere formation step, the raw material powder is made to have a spherical shape by a powder melting method. The sphere formation method of the powder melting method includes feeding and melting the raw material powder in a chemical flame, thermal plasma, vertical tube furnace, or tower kiln, and making the powder to have a spherical shape by its own surface tension.
In the powder melting method, the particle size distribution after the sphere formation can be adjusted by forming, to have a desired particle size distribution, particles made by pulverizing raw material glass or made by granulating raw material powder with a spray dryer, etc. The sphere formation is carried out by feeding and melting these particles in a chemical flame, thermal plasma, vertical tube furnace, tower kiln, etc. while suppressing particle agglomeration. Alternatively, the sphere formation may be carried out by preparing a dispersion liquid of the raw material powder dispersed in a solvent or the like, spraying the liquid raw material into a chemical flame, thermal plasma, vertical tube furnace, tower kiln, etc. using a nozzle or the like, and melting the raw material powder while evaporating the dispersion medium.
In the powder melting method, “chemical flame” refers to a flame generated by combustion of a combustible gas with a burner. The combustible gas may be any gas as long as temperature can rise to equal to or more than the melting point of the low material powder, and may include, for example, natural gas, propane gas, acetylene gas, liquefied petroleum gas (LPG), hydrogen, etc. Such a combustible gas may be used together with oxidizing gases such as air, oxygen, etc. The size, temperature, and other conditions of the chemical flame can be adjusted by the size of the burner and the flow rates of the combustible and oxidizing gases.
In the crystallization step, the raw material powder is heated at high temperature to be crystallized. Any heating apparatus can be used for crystallization as long as a desired heating temperature can be provided. For example, an electric furnace, rotary kiln, pusher furnace, roller hearth kiln, etc. can be used.
The temperature in the heating crystallization (crystallization temperature) is not particularly limited but may be, for example, 750 to 900° C. When the heating temperature is equal to or more than the predetermined temperature, it is possible to shorten a crystallization time and to increase the content of the β-quartz solid solution phase due to sufficient crystallization. Thereby, it is possible to further lower the thermal expansion coefficient of the base material in which the powder is blended. On the other hand, when the crystallization temperature is equal to or less than the predetermined temperature, a crystalline phase other than the β-quartz solid solution phase, such as a gahnite phase, cristobalite phase, and willemite phase, is less likely to form, which can further lower the thermal expansion coefficient of the base material in which the powder is blended. Even with the same composition, S001/S101 can differ depending on the crystallization temperature. For example, a difference of 10° C. in heating temperature may cause a large difference in S001/S101.
The heating time (crystallization time) is not particularly limited but may be, for example, 1 to 24 hours. When the heating time is equal to or more than the predetermined time, it is possible to sufficiently carry out crystallization to the β-quartz solid solution phase and thereby further lower the thermal expansion coefficient of the base material in which the powder is blended. When the heating time is equal to or less than the predetermined time, it is possible to reduce the cost of producing the powder. Such a crystallization step can provide the powder according to the present embodiment.
The powder obtained by the crystallization step may be an agglomerate of a plurality of particles. The agglomerates themselves may be used as powder, or if necessary, the agglomerates may be crushed and used as powder. The method for crushing the agglomerates is not limited but may be, for example, a method using an agate mortar, ball mill, vibration mill, jet mill, wet jet mill, etc. The crushing may be carried out in a dried condition or in a wet condition while mixing the powder with a liquid, such as water or alcohol. In a case of wet crushing, the powder according to the present embodiment can be obtained by drying after the crushing. The drying method is not limited but may be, for example, heat drying, vacuum drying, freeze drying, supercritical carbon dioxide drying, etc.
In another embodiment, the method for producing the powder can further includes classifying the powder to obtain a desired average particle size and providing surface treatment using a coupling agent. The surface treatment can further increase the amount of the powder blended (filled) into the base material. The coupling agent for surface treatment may include silane coupling agent, titanate coupling agent, aluminate coupling agent, etc.
The powder according to the present embodiment may be mixed with a powder having compositions (e.g., silica, alumina, etc.) different from the powder according to the present embodiment.
The powder according to the present embodiment can be blended in glass or resin base materials while being as it is or being mixed with the above-described powder having the different compositions.
The glass base material may include glasses having compositions of the PbO—B2O3—ZnO system, PbO—B2O3—Bi2O3 system, PbO—V2O5—TeO2 system, SiO2—ZnO-M12O system (M12O is an alkali metal oxide), SiO2—B2O3-M12O system, SiO2—B2O3-M2O system (M2O is an alkaline earth metal oxide), and the like.
The resin base material is not limited but may be, for example, epoxy resins, silicone resins, phenolic resins, melamine resins, urea resins, unsaturated polyesters, fluororesins, polyamides (polyimides, polyamideimides, polyetherimides, etc.), polybutylene terephthalate, polyesters (polybutylene terephthalate, etc.), polyphenylene sulfide, wholly aromatic polyesters, polysulfones, liquid crystal polymers, polyethersulfones, polycarbonates, modified maleimide resins, ABS (acrylonitrile-butadiene-styrene) resin, AAS (acrylonitrile-acrylic rubber-styrene) resin, AES (acrylonitrile-ethylene-propylene-diene rubber-styrene) resin, etc., or a mixture of these resins.
The amount of powder blended (filled) in the base material is not particularly limited and may be adjusted based on a thermal expansion coefficient after the powder addition, etc., but may be, for example, 30 to 95 vol % or may 40 to 90 vol % of the total amount of the base material after the powder addition.
Since the powder according to the present embodiment has a negative thermal expansion coefficient greater in magnitude, it is possible to lower the thermal expansion coefficient of the base material, etc. in which the powder is blended.
Hereinafter, a more specific description will be given of examples of the present invention, but the present invention is not limited to the examples.
Zinc oxide, aluminum oxide, and silicon dioxide as raw materials are prepared at molar ratios represented in Table 1, and these raw materials were mixed with a vibratory mixer (Lab RAM II, low frequency resonant acoustic mixer from Resodyn Corporation). Thirty grams of this mixture was placed into a platinum crucible, heated in an electric furnace, and melt. The furnace temperature of the electric furnace during melting was set at 1600° C., and the holding time at 1600° C. was 30 minutes. After melting, the crucible was submerged and quenched in water to obtain a raw material glass. The raw material glass was collected from the platinum crucible and crushed by a stamp mill, and crushed glass having passed a nylon sieve with a mesh aperture of 77 μm (200 mesh) was obtained as a raw material powder.
The raw material powder was then pulverized and placed in an alumina crucible, and crystallized using an electric furnace under an air atmosphere, with a furnace temperature of the electric furnace during crystallization set to 800° C. and the holding time at 800° C. set to 24 hours. Thereby, powder samples of Examples 1-5 and Comparative Example 1 were obtained.
The properties of the obtained powder samples were evaluated by the following methods.
The crystalline phases in the obtained powder samples were identified by powder X-ray diffraction. Specifically, a parallel-specimen type multipurpose X-ray diffractometer (Ultima IV from Rigaku Corporation) was used under the following condition: an X-ray source of CuKα, a tube voltage of 40 kV, tube current of 40 mA, a scan speed of 10°/min, a 20 scan range of 10° to 80°, a detector of a high-speed 1D X-ray detector D/teX Ultra 2, and an optical system of focusing method.
Ratio S001/S101 of Peaks of X-Ray Diffraction
The area of each peak was determined by drawing a parabolic background line in the range of 10°≤2θ≤30° using the analysis software Jade 9, then conducting a refinement including the background line, and separating the peaks. The peak was separated in consideration of overlaps between each of the peaks in the ranges of 15°≤2θ≤17° and 24°≤2θ≤27° and a Kα1-derived diffraction line and between each peak and a Kα2-derived diffraction line. In the analysis, the pseudo-voigt function was used as a function of the diffraction peaks.
High-temperature X-ray diffraction (XRD) was used to analyze the thermal expansion coefficient of the main phase of β-quartz solid solution. Here, an angle standard sample (Si) was added to the samples and measured using a focusing optical system. Specifically, about 10 mass % of the angle standard sample (Si, NIST SRM 640c) was added to each sample and then each sample was mixed in a mortar. Thereafter, the sample was placed on a sample plate and was pressed and spread by a glass plate so that the sample surface and the sample plate surface were aligned, and measurements (using a focusing optical system) were carried out at temperatures 100° C. to 300° C. The thermal expansion coefficient of the main phase was analyzed by calculating a lattice plane spacing at each temperature based on the obtained diffraction lines (112 plane and 203 plane).
X-ray diffraction measurements were carried out using a specimen-parallel type multipurpose X-ray diffractometer (UltimaIV from Rigaku Corporation) under the following condition: an X-ray source of CuKα, a tube voltage of 40 kV, tube current of 40 mA, a scan speed of 10°/min, a 20 scan range of 10° to 140°, a detector of high-speed 1D X-ray detector D/teX Ultra 2, an optical system of focusing method, a measurement stage of high-temperature attachment, measurement atmosphere of N2 flow (30 mL/min), set temperatures of 100, 150, 200, 250, and 300° C., a temperature rise rate of 10° C./min, an interval of 5 min.
The analysis was carried out as follows. The lattice plane spacings d220_T and d400_T of Si and the lattice plane spacings d112_T and d203_T of the main phase were calculated for the measured results at each temperature T using the analysis software Jade 9.
The lattice plane spacings obtained above are considered to include errors due to sample eccentricity because they were measured with a focusing optical system while being heated. Therefore, a sample eccentricity (AZ) was estimated using the thermal expansion coefficient of Si (known) and the lattice plane spacings (measured values), and the lattice plane spacings of the main phase (ZnO—Al2O3—SiO2) were corrected by the following procedure. Using a lattice plane spacing at 100° C. as a reference, a calculated value d220_T calculated value of a lattice plane spacing at 150° C. or more was obtained from a literature value of the thermal expansion coefficient at the Si 220 plane (refer to 3.5 ppm/° C., Int. J. Thermophys, 25, 1, 221-236 (2004)). Next, d220_T calculated value was substituted into Bragg's equation to calculate a diffraction line angle 2θ220_T calculated value. Then, Δ2θ220_T was then calculated, which is the difference between 2θ220_T measured value and 2θ220_T calculated value. Next, Δ2θ220_T was substituted into the following equality of eccentricity error (Equation (1)) to calculate a sample eccentricity ΔZ. The goniometer radius R was set to 285 mm.
Δ2θ112_T was then calculated (equation (2)) by substituting the diffraction line angle θ112_T measured value derived from the main phase 112 plane and the sample eccentricity ΔZ into the eccentricity error.
2θ112_T measured value was then corrected by Δ2θ112_T described above to calculate 2θ112_T corrected value. 2θ112_T corrected value was substituted into Bragg's equation to calculate the corrected lattice plane spacing d112_T corrected value for the main phase 112 plane. In the same way, the corrected lattice plane spacing d203_T corrected value for the main phase 203 plane was calculated using the Si 400 diffraction line.
A graph was created where the lattice plane spacing d112_T corrected value obtained above was plotted to the measurement temperature T, an approximated linear line was drawn in a range from 100 to 300° C., and thereby a gradient Δd112_T/ΔT was obtained. A thermal expansion coefficient α112 of the main phase 112 plane was calculated by using the following equation (2).
In the same way, a thermal expansion coefficient α203 of the main phase 203 plane was calculated using d203_T corrected value.
Table 2 represents compositions of the raw materials (preparation compositions), the ratios S001/S101, and the thermal expansion coefficients α112 and α203 of the (112) and (203) planes. There was almost no change between the compositions of the raw materials and the compositions of the powders.
The powder samples of Examples 1-5 were found to have negative thermal expansion coefficients greater in magnitude than that of the powder sample of Comparative Example 1.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2021-135561 | Aug 2021 | JP | national |
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2022/024858 | 6/22/2022 | WO |
