Number | Date | Country | Kind |
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199 58 442 | Dec 1999 | DE |
Filing Document | Filing Date | Country | Kind |
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PCT/DE00/04051 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO01/41300 | 6/7/2001 | WO | A |
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3898575 | Hanspector | Aug 1975 | A |
4384217 | Tsividis | May 1983 | A |
5164679 | Dittmer | Nov 1992 | A |
5623228 | Arbel | Apr 1997 | A |
5856760 | Lam et al. | Jan 1999 | A |
5929502 | Beasom | Jul 1999 | A |
6563381 | Strong | May 2003 | B1 |
Number | Date | Country |
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35 86 368 | Jan 1993 | DE |
1 328 016 | Sep 1963 | FR |
59 012 609 | Jan 1984 | JP |
Entry |
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Patent Abstract of Japan vol. 008, No. 095 (E-242), May 2, 1984, Tokyo Shibaura Denki KK. |
Meinki; Gundlach; Taschenbuch der Hochfrequenztechnik, 5, Auflage, Berlin: Springer, 1992, SF34-SF35. |
M. Rickelt und H.-M Rein “Impact-Ionization Induced Instabilities in High-Speed Bipolar Transistors and their Influence on the Maximum Usable Output Voltage”. |