1. Field of the Invention
The present invention relates to a power converter and, more specifically, to a power converter controller IC (integrated circuit) that has an input voltage pin with multiple functions.
2. Description of the Related Art
With the explosive growth of the number of electronic devices recently, the demand for power converters used as adapters or changes for these electronic devices is also growing at a rapid rate. These power converters are typically controlled by power converter controller ICs. Especially, switching mode power converters are typically controlled by power converter controller ICs that control the on-times (TON) or off-times (TOFF) of the switch in the power converters to regulate the output voltage and power of the power converters.
The power converter industry is under significant pressure to manufacture power converter controller ICs that are highly efficient but can also be manufactured at low cost. Because the manufacturing cost of ICs is highly dependent upon the die size, the number of pins, the packaging, and testing of the IC, it is desirable to reduce the number of pins of an IC. However, it is difficult to reduce the number of pins in conventional power converter controller ICs, because in conventional power converter controller ICs each pin of the IC is associated with a single, separate parameter or function and thus the IC required as many pins as the number of parameters or functions either input to or output from the controller IC. Thus, it is difficult to reduce the number of pins in the power converter controller IC without reducing the number of parameters either input to or output from the controller IC and thereby sacrificing the performance of the power converter.
Therefore, there is a need for a technique to reduce the number of pins used in a power converter controller IC and reduce manufacturing costs of the IC without reducing the number of parameters or sacrificing the performance of the power converter.
Embodiments of the present invention include a power converter controller IC that uses the input voltage pin with a plurality of functions, including receiving an input voltage to the power converter, charging an external startup capacitor through charging circuitry coupled internally to the input voltage pin, and also for receiving a test signal used for programming a programmable resistor in input voltage scale down circuitry coupled to the input voltage pin. Use of the input voltage pin with a plurality of functions reduces the number of pins required in the controller IC, thereby reducing the cost of manufacturing the controller IC.
In one embodiment, the controller IC comprises charging circuitry coupled internally to the input voltage pin of the controller IC for charging a capacitor coupled externally to a supply voltage pin of the controller IC. The charging circuitry comprises a switch that is turned on and off in response to a power-on-reset (POR) signal, where the POR signal is in a first state to turn on the switch when the input voltage to the power converter is below a first threshold voltage and in a second state to turn off the switch when the input voltage to the power converter rises above the first threshold voltage but does not fall below a second threshold voltage. When the input voltage falls below the second threshold voltage, the POR signal transitions to the first state again to turn on the switch. The capacitor is charged while the switch is turned on, and the capacitor provides supply voltage to the controller IC during a startup mode of the power converter.
In another embodiment, the controller IC comprises scale down circuitry for scaling down the input voltage received at the input voltage pin to a voltage level compatible with the device characteristics of the controller IC. The scale down circuitry comprises a first transistor coupled to receive the input voltage, a second transistor connected in series to the first transistor, and a programmable resistor connected in series to the second transistor. The input voltage to the power converter is scaled down by the programmable resistor when both the first and second transistors are turned on. The second transistor is always on, while the first transistor is turned on and off in response to a power-on-reset (POR) signal. The POR signal is in a first state when the input voltage to the power converter rises above a first threshold voltage to turn on the first transistor and in a second state when the input voltage to the power converter falls below a second threshold voltage to turn off the first transistor.
The programmable resistor comprises a plurality of resistors connected in series and a plurality of switches each coupled to one of the resistors, where each of the switches is configured to short one of the resistors to which each of the switches is coupled when the switch is closed. The programmable resistor is programmed by a clock count signal determining how many of the switches are closed and how many of the resistors of the programmable switches are shorted by said closed switches. A test signal is input to the input voltage pin, where the test signal includes a first positive pulse indicating the start of a test mode, a plurality of negative pulses following the first positive pulse, and a second positive pulse indicating the end of the test mode. The count of the number of negative pulses is used to set the programmable resistor, in such a way that the count of the number of negative pulses in the test signal is inversely proportional to the set resistance of the programmable resistor.
The features and advantages described in the specification are not all inclusive and, in particular, many additional features and advantages will be apparent to one of ordinary skill in the art in view of the drawings, specification, and claims. Moreover, it should be noted that the language used in the specification has been principally selected for readability and instructional purposes, and may not have been selected to delineate or circumscribe the inventive subject matter.
The teachings of the embodiments of the present invention can be readily understood by considering the following detailed description in conjunction with the accompanying drawings.
The Figures (FIG.) and the following description relate to preferred embodiments of the present invention by way of illustration only. It should be noted that from the following discussion, alternative embodiments of the structures and methods disclosed herein will be readily recognized as viable alternatives that may be employed without departing from the principles of the claimed invention.
Reference will now be made in detail to several embodiments of the present invention(s), examples of which are illustrated in the accompanying figures. It is noted that wherever practicable similar or like reference numbers may be used in the figures and may indicate similar or like functionality. The figures depict embodiments of the present invention for purposes of illustration only. One skilled in the art will readily recognize from the following description that alternative embodiments of the structures and methods illustrated herein may be employed without departing from the principles of the invention described herein.
Referring to
As shown in
Referring to
Note that the Vcc charging circuitry is implemented on-chip on the power converter controller IC 100, and there is no circuitry external to the power converter controller 100 that connects the input line voltage VIN to the capacitor C7. In essence, the VIN/Startup pin is used as a charging path internal to the controller IC 100 for charging the supply voltage (Vcc) capacitor C7 connected externally to the controller IC through the power converter controller IC 100. Therefore, the entire power converter circuitry may be implemented in a simple configuration with fewer external parts.
The switch Q20 may be turned on and off according to a POR (Power On Reset) signal that is generally high while the input line voltage VIN is high.
In one embodiment, the power converter controller IC 100 is fabricated on silicon using a low voltage CMOS (Complementary Metal-Oxide Semiconductor) process, which typically cannot withstand a voltage higher than 3.6 V in the devices. This is at odds with a power converter controller that typically should be able to receive and withstand 260 V of input line voltage VIN. This is why the VIN scale down circuitry is needed.
Referring back to
When the controller IC 100 is turned on, POR becomes high and the transistor Q22 is turned on. The transistor Q24 is always turned on. The transistor Q24 has resistor-like characteristics in its MOSFET linear region, providing a certain voltage drop. Thus, the input line voltage VIN (also referred to herein as VLINE) is scaled down by a resistive divider comprised of the resistor R40 (which is typically very large, for example 6 Mohm), the two transistors Q22, Q24 in their linear regions, and the programmable resistor R20 to generate the scaled down input voltage 236. The scaled down input voltage 236 is input to an analog-to-digital converter (ADC) 210 to generate a digital representation 230 of the scaled down input voltage 236, which is used by the digital controller 104 in a variety of ways to generate the pulse 102 and determine its on-times/off-times as well as set a variety of analog parameters in the power converter (e.g., internal oscillator frequency, reference voltage, etc.).
However, when the input line voltage VIN increases beyond a certain level, the transistor Q24 becomes saturated. When Q24 is saturated, VGS (gate-source voltage drop) of the transistor Q24 is typically approximately 2 V, and thus the voltage at node 234 at the source of the transistor Q24 is clamped to approximately 4 V. The 4 V clamped voltage at node 236 can be easily scaled down further by the resistive divider comprised of the programmable resistor R20 to be under 3.6 V, which is the voltage limit that can be tolerated by semiconductor devices fabricated under the low voltage CMOS process. Thus, the devices of the power converter controller IC 100 are able to receive and process a high input line voltage VIN even with devices fabricated using the low voltage CMOS process.
The test mode signal 420 indicates a test mode during which the values of T1-Tn for setting the programmable resistor R20 are determined. The test mode signal 420 turns high at the rising edge of the first positive pulse 402 of the test signal 400, and turns low at the rising edge of the second positive pulse 410 of the test signal 400. The test mode signal 420 can be generated, for example, as the output signal of a flip flop (not shown) that is set and reset in response to rising edges of the test signal 400. However, any logic circuitry that can generate the test mode signal 420 in accordance with the test signal 400 shown in
The counter clock signal 440 indicates the number of negative pulses 404, 406, 408 in the test signal 400 while the test mode signal 400 is positive (during test mode). The counter clock signal 440 turns high at the falling edge of the negative pulses 404, 406, 408 and turns low at the rising edges of the negative pulses 404, 406, 408 of the test signal 400. The counter clock signal 440 is input to the counter 208. The counter 208 counts the number of positive pulses in the counter clock signal 440 and converts the resulting count into a programming signal T1-Tn representing the count. The programming signal T1-Tn sets the value of the programmable resistor R20, as is explained below with reference to
Referring to
Thus, for example, when the count from the counter is T1, the programmable resistor R20 is “trimmed” with a remaining trimmed resistance RTRIM=R52+R54+R56+R58, and R50 is bypassed (shorted). When the count from the counter is T2, the programmable resistor R20 is “trimmed” with a remaining trimmed resistance RTRIM=R54+R56+R58, and R50 and R52 are bypassed (shorted). When the count from the counter is T3, the programmable resistor R20 is “trimmed” with a remaining trimmed resistance RTRIM=R56+R58, and R50, R52, and R54 are bypassed (shorted). When the count from the counter is T4, the programmable resistor R20 is “trimmed” with a remaining trimmed resistance RTRIM of R58, and R50, R52, R54, and R56 are bypassed (shorted). Thus, RTRIM is inversely proportional to the count (T1-T4). The voltage at node 236 input to the ADC 210 is VLINE×RTRIM/(R40+R50+R52+R54+R56+R58). Since R40 is typically a very large resistor (e.g., 6 Mohm) and much larger than the bypassed resistor(s) in the programmable resistor R20, the voltage 236 is determined by the ratio of the RTRIM to the bypassed resistors in the programmable resistor R20 with sufficient accuracy.
Upon reading this disclosure, those of ordinary skill in the art will appreciate still additional alternative structural and functional designs for an input voltage pin for a power converter controller IC through the disclosed principles of the present invention. Thus, while particular embodiments and applications of the present invention have been illustrated and described, it is to be understood that the invention is not limited to the precise construction and components disclosed herein. Various modifications, changes and variations which will be apparent to those skilled in the art may be made in the arrangement, operation and details of the method and apparatus of the present invention disclosed herein without departing from the spirit and scope of the invention as defined in the appended claims.
This application claims priority under 35 U.S.C. §119(e) to co-pending U.S. Provisional Patent Application No. 60/735,522 entitled “Digital Off-line Low Power Supply Controller,” filed on Nov. 10, 2005, which is incorporated by reference herein in its entirety,
Number | Name | Date | Kind |
---|---|---|---|
5610503 | Fogg et al. | Mar 1997 | A |
6061257 | Spampinato et al. | May 2000 | A |
6166927 | Farrington et al. | Dec 2000 | A |
6169680 | Matsui et al. | Jan 2001 | B1 |
6532161 | Kovalevskii et al. | Mar 2003 | B2 |
6545882 | Yang | Apr 2003 | B2 |
6760203 | Usui | Jul 2004 | B2 |
6882552 | Telefus et al. | Apr 2005 | B2 |
6944034 | Shteynberg et al. | Sep 2005 | B1 |
6958920 | Mednik et al. | Oct 2005 | B2 |
7009369 | Ni et al. | Mar 2006 | B2 |
7030512 | Krein | Apr 2006 | B2 |
7061780 | Yang et al. | Jun 2006 | B2 |
7136292 | Chan et al. | Nov 2006 | B1 |
7170763 | Pai et al. | Jan 2007 | B2 |
7239117 | Lee et al. | Jul 2007 | B2 |
7250745 | Yasukouchi et al. | Jul 2007 | B2 |
7362593 | Yang et al. | Apr 2008 | B2 |
7411378 | Lathrop et al. | Aug 2008 | B2 |
7443700 | Yan et al. | Oct 2008 | B2 |
20020057080 | Telefus et al. | May 2002 | A1 |
20060043954 | Markowski | Mar 2006 | A1 |
20070206338 | Ishino | Sep 2007 | A1 |
20080067994 | Kesterson et al. | Mar 2008 | A1 |
Number | Date | Country | |
---|---|---|---|
60735522 | Nov 2005 | US |