Patent Application
20120089368
1. Technical Field
Embodiments of the present disclosure relate to methods and apparatuses for testing computing devices, and particularly to an apparatus and method for testing a power cycle of a computing device.
2. Description of Related Art
Computing devices, such as personal computers, notebook computers, or servers, must be tested for performance before the computing device is distributed into the consumer market. In order to control and improve the performance of the computing device, one or more power cycle tests should be performed to test the computing device. However, presently, the one or more power cycle tests must be performed individually, and a lot of manual work is required during each power cycle test. The efficiency and accuracy of each power cycle test cannot be ensured.
The present disclosure, including the accompanying drawings, is illustrated by way of examples and not by way of limitation. It should be noted that references to “an” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean at least one.
As used herein, the term “power cycle test” is defined as a cold boot test that is to repeatedly execute actions of power-on and power-off test processes in a certain time interval, to test whether the computing device boots properly. For example, if a computer is able to start the operating system (OS) when the computer is powered on, then it is considered as a normal power-on test process. Likewise, if the computer is able to exit the OS when the computer is powered off, then it is consider as a normal power-off test process.
In the embodiment, the power cycle test apparatus 10 can control a computing device 3 to perform a power cycle test by switching a power supply 2 on or off automatically. In one embodiment, the power cycle test may be an alternating current (AC) test, or a direct current (DC) test. The power supply 2 is an AC power device that supplies AC to the computing device 3 for performing the AC power cycle test, or a DC power device that supplies DC to the computing device 3 for performing the DC power cycle test. The computing device 3 includes, but is not limited to, personal computer (PC), a notebook computer, and a server.
In one embodiment, the power cycle test apparatus 10 includes a timer 11, a counter 12, a power rectifier 13, and a display unit 14. The power rectifier 13 connects to the timer 11, and is connected with the power supply 2 and the computing device 3 respectively. The display unit 14 connects to the computing device 3, and is connected with the timer 11 and the counter 12 respectively. It should be understood that
The timer 11 is operable to set a test period of the power cycle test for the computing device 3, and control the power rectifier 13 to switch the power supply 2 on or off according to the test period. In one embodiment, the test period is defined as a period that the computing device 3 performs a power-on operation and a power-off operation, and can be set to different times, such as 30 seconds or 60 seconds, according to requirements of the computing device 3. For example, the timer 11 controls the power rectifier 13 to switch the power supply 2 on at the beginning of the test period, and controls the power rectifier 13 to switch the power supply 2 off at the end of the test period (i.e., the 60th second).
The timer 11 is further operable to start to count a test time of the power cycle test when the power rectifier 13 switches the power supply 2 on, and determines whether the test time is equal to the test period. When the test time equals the test period, the timer 11 controls the power rectifier 13 to switch the power supply 2 off.
The counter 12 is operable to set a test number of the power cycle test for the computing device 3, which is denoted as a number “N,” for example, N=50. When the computing device 3 performs one power cycle, the counter 12 decreases the test number by one, i.e., N=N−1. The counter 12 is operable to determine whether the test number is equal to zero. If the test number is not equal to zero, the computing device 3 performs another power cycle.
The power rectifier 13 is operable to transform AC supplied by the power supply 2 into DC when the power supply 2 is switched on, and provides the AC to the computing device 3 to perform a power-on test process of the computing device 3. When the power supply 2 is switched off, the power rectifier 13 disconnects the power supply 2 with the computing device 3 to perform a power-off test process of the computing device 3.
The display unit 14 is operable to display the test time and the test number in real time, and display a test result of the power cycle test of the computing device 3 when the test number is equal to zero. The test result may include a normal power-on times that denotes the computing device 3 passes the power cycle test, and a normal power-off times that denotes the computing device 3 fails the power cycle test. In the embodiment, the display unit 14 may be a light-emitting diode (LED), or a seven-segment display that can display the test time and the test number in a digital number format.
In block S201, the power cycle test apparatus 10 initializes the timer 11 and the counter 12. Before testing the power cycle of the computing device 3, the timer 11 initializes a test time as zero, and the counter 12 initializes a test number as zero.
In block S202, the timer 11 sets a test period of the power cycle test for the computing device 3 when the power cycle test begins. In one embodiment, the test period is defined as a period that the computing device 3 performs a power-on operation and a power-off operation, and can be set to different times, such as 30 seconds or 60 seconds, according to requirements of the computing device 3.
In block S203, the counter 12 sets a test number of the power cycle test for the computing device 3. In one embodiment, the test number is denoted as a number “N,” and can be set different numbers according to requirements of the tester, for example, N=50.
In block S204, the timer 11 controls the power rectifier 13 to switch the power supply 2 on at the begin time of the test period, and starts to count a test time of the power cycle test when the power rectifier 13 switches the power supply 2 on.
In block S205, the power rectifier 13 transforms AC supplied by the power supply 2 into DC when the power supply 2 is switched on, and provides the AC to the computing device 3 to perform a power-on test process of the computing device 3.
In block S206, the timer 11 determines whether the test time is equal to the test period. If the test time is equal to the test period, block S207 is implemented. Otherwise, if the test time is not equal to the test period, block S205 is repeated.
In block S207, the timer 11 controls the power rectifier 13 to switch the power supply 2 off. In one embodiment, the timer 11 controls the power rectifier 13 to switch the power supply 2 off at the end time of the test period (i.e., the 60th second). When the power supply 2 is switched off, the power rectifier 13 disconnects the power supply 2 with the computing device 3 to perform a power-off test process of the computing device 3.
In block S208, the counter 12 decreases the test number by one, i.e., N=N−1. In block S209, the counter 12 determines whether the test number is equal to zero. If the test number is not equal to zero, block S210 is implemented. Otherwise, if the test number is equal to zero, block S211 is implemented.
In block S210, the timer 11 resets the test time as zero, and the flow goes to block S204. In block S211, the display unit 14 displays the test time and the test number, and displays a test result of the power cycle test of the computing device 3 when the test number is equal to zero. In the embodiment, the test result may include a normal power-on times that denotes the computing device 3 passes the power cycle test, and a normal power-off times that denotes the computing device 3 fails the power cycle test.
Although certain disclosed embodiments of the present disclosure have been specifically described, the present disclosure is not to be construed as being limited thereto. Various changes or modifications may be made to the present disclosure without departing from the scope and spirit of the present disclosure.
| Number | Date | Country | Kind |
|---|---|---|---|
| 201010503136.6 | Oct 2010 | CN | national |
