BRIEF DESCRIPTION OF THE DRAWINGS
These and other aspects of the invention will now be further described, by way of example only, with reference to the accompanying figures in which:
FIG. 1 shows a schematic cross-sectional view of an embodiment of semiconductor devices according to the invention;
FIG. 2 shows I-V characteristics of a thyristor device according to an embodiment of the invention;
FIG. 3 shows an enlargement of FIG. 2;
FIG. 4 shows I-V curves of thyristor devices with the same cathode width and carrier lifetime but different gate width;
FIG. 5 shows the relationship between the gate width and the current density at the crosspoint;
FIG. 6 shows I-V curves of thyristor devices with substantially the same structures but different carrier lifetime;
FIG. 7 shows the relationship between the carrier lifetime and the current density at the crosspoint;
FIG. 8 shows successful turn-on transients of two paralleled wide-gate thyristor devices according to an embodiment of the invention (Va: 20V/div, Vgg: 5V/div, Ia1, Ia2: 10 A/div, t: 2 μs/div);
FIG. 9 shows successful turn-off transients of the two paralleled devices of FIG. 5 (Va: 250V/div, Ia1, Ia2: 50 A/div, T: 2 μs/div);
FIG. 10 shows turn-on failure of two conventional thyristor devices connected in parallel (Va: 40V/div, Vg: 10/div, Ia1, Ia2: 2 A/div, t: 2 μs/div);
FIG. 11 shows an example of a drive circuit for a MOS-gated thyristor according to an embodiment of the invention;
FIG. 12 shows a circuit model of an embodiment of a MOS-gated thyristor according to an embodiment of the invention.