1. Field of the Invention
The present invention relates to a power supply control apparatus including a control circuit chip for controlling a power supply switch circuit chip for connecting a battery to a load in a motor vehicle.
2. Description of the Related Art
A prior art power supply control apparatus is constructed by a power supply switch circuit chip for connecting a battery to a load and a control circuit chip for controlling the power supply switch circuit chip. The power supply switch circuit chip includes a power MOS transistor. On the other hand, the control circuit chip includes an internal circuit formed by a logic circuit and a charge pump circuit, a parasitic diode (an electrostatic discharge protection circuit) in parallel with the internal circuit for operating the internal circuit in a forward-connected battery state, and a polycrystalline silicon resistor connected in series with the parasitic diode for limiting a current flowing through the internal circuit in a reverse-connected battery state (see: Infineon Technologies AG, “Smart Highside Power Switch” of PROFET Data sheet BTS 6143D, page 1 of 16, Aug. 7, 2002). This will be explained later in detail.
In the above-described prior art power supply control apparatus, however, since the polycrystalline silicon resistor is manufactured by a chemical vapor deposition (CVD) process, the resistance value of the polycrystalline silicon resistor cannot be increased. As a result, a large amount of current flows through the internal circuit in a reverse-connected battery state, so that the internal circuit would be overheated and damaged.
In the case of U.S. Pat. No. 5,517,379, since the power MOS transistor is manufactured by a vertical MOS process while the internal circuit is manufactured by a CMOS process, it is difficult to integrate the power MOS transistor into the control circuit chip. Also, a circuit required for controlling the power MOS transistor is very complex, which would increase the manufacturing cost.
Also, a Schottkey barrier diode or a depletion type MOS transistor is provided to protect the load in a reverse-connected battery state (see: JP-A-8-213619). However, such a Schottkey barrier diode or a depletion type MOS transistor cannot protect the internal circuit of the control circuit chip in a reverse-connected battery state.
It is an object of the present invention to provide a power supply control apparatus capable of effectively protecting an internal circuit in a reverse-connected battery state.
Another object is to provide a control circuit chip used in such a power supply control apparatus.
According to the present invention, in a power supply control apparatus for controlling supplying of power from a battery to a load, a power supply switch circuit chip is connected to the load to turn ON and OFF connection between the battery and the load. A control circuit chip is powered by the battery to control the power supply switch circuit chip. The control circuit chip is constructed by an internal circuit for controlling the power supply switch circuit chip, a parasitic diode connected in parallel to the internal circuit, and a depletion type MOS transistor connected in series to the internal circuit. The diode characteristics of the parasitic diode and the depletion type MOS transistor are opposite to each other with respect to the battery. In a forward-connected battery state, the parasitic diode and the depletion type MOS transistor are reverse-biased and forward-biased, respectively. In a reverse-connected battery state, the parasitic diode and the depletion type MOS transistor are forward-biased and reverse-biased, respectively.
The present invention will be more clearly understood form the description set forth below, as compared with the prior art, with reference to the accompanying drawings, wherein:
Before the description of the preferred embodiments, a prior art power supply control apparatus will be explained with reference to
In
The control circuit 4 is constructed by another semiconductor chip including a logic circuit 41 powered by the battery voltage VB for receiving an input signal IN to generate a clock signal CLK, a charge pump circuit 42 powered by the battery voltage VB to receive the clock signal CLK and turn ON the power MOS transistor 21, a parasitic diode 43 serving as an electrostatic discharge diode (ESD), and a resistor 44 made of polycrystalline silicon.
In a forward-connected battery state, since the parasitic diode 43 is reverse-biased, the parasitic diode 43 can protect the logic circuit 41 and the charge pump circuit 42 from an over voltage of the battery voltage VB.
On the other hand, in a reverse-connected battery state, since the parasitic diode 43 is forward-biased, the parasitic diode 43 cannot protect the logic circuit 41 and the charge pump circuit 42 from a reversed voltage of the battery voltage VB. In this case, since the resistor 44 limits a total current flowing through the logic circuit 41, the charge pump circuit 42 and the parasitic diode 43, the resistor 44 would protect the logic circuit 41 and the charge pump circuit 42 from a reversed voltage of the battery voltage VB.
In
Also, note that the power supply switch circuit 2 is manufactured by a vertical MOS process while the control circuit 4 is manufactured by a CMOS process, (see: U.S. Pat. No. 5,517,379). Therefore, it is difficult to integrate the power supply switch circuit 2 and the control circuit 4 into one semiconductor chip.
In
In
In
In a forward-connected battery state as illustrated in
On the other hand, in a reverse-connected battery state as illustrated in
In
The structure of the control circuit 4 of
In
In the substrate 501, the P-channel MOS transistors such as Qp of the logic circuit 41 and the charge pump circuit 42 are formed. In this case, the node N1 is connected via an N+-type impurity diffusion region 504 to the substrate 501.
In the P-type well 502, the ground voltage GND (or the battery voltage VB) is supplied via a P+-type impurity diffusion region 505 to the P-type well 502, thus stably operating the N-channel MOS transistors such as Qn.
In the P-type well 503, the battery voltage VB (or the ground voltage GND) is supplied via a P+-type impurity diffusion region 506 to the P-type well 503, thus stably operating the N-channel depletion type MOS transistor 45.
In
In
In a forward-connected battery state as illustrated in
On the other hand, in a reverse-connected battery state as illustrated in
Also, in
The structure of the control circuit 4 of
In
In the substrate 901, the N-channel MOS transistors such as Qn of the logic circuit 41 and the charge pump circuit 42 are formed. In this case, the node N1′ is connected via a P+-type impurity diffusion region 904 to the substrate 901.
In the N-type well 902, the ground voltage GND (or the battery voltage VB) is supplied via an N+-type impurity diffusion region 905 to the N-type well 902, thus stably operating the P-channel MOS transistors such as Qp.
In the N-type well 903, the battery voltage VB (or the ground voltage GND) is supplied via an N+-type impurity diffusion region 906 to the N-type well 903, thus stably operating the P-channel depletion type MOS transistor 45′.
As explained hereinabove, according to the present invention, an internal circuit of a control circuit chip for controlling a power supply switch circuit chip can be protected against a reverse voltage of a reverse-connected battery state by integrating a deletion-type MOS transistor having diode characteristics into the control circuit chip.
Number | Date | Country | Kind |
---|---|---|---|
2003-179688 | Jun 2003 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
5301146 | Hama | Apr 1994 | A |
5374923 | Sakamoto | Dec 1994 | A |
5517379 | Williams et al. | May 1996 | A |
5869957 | Koike | Feb 1999 | A |
6031702 | Williams | Feb 2000 | A |
6043965 | Hazelton et al. | Mar 2000 | A |
6313610 | Korsunsky | Nov 2001 | B1 |
6380793 | Bancal et al. | Apr 2002 | B1 |
6614666 | Chen et al. | Sep 2003 | B1 |
6650520 | He | Nov 2003 | B2 |
6859020 | Baldwin et al. | Feb 2005 | B2 |
20030128569 | Chen et al. | Jul 2003 | A1 |
20040160350 | Lu | Aug 2004 | A1 |
Number | Date | Country |
---|---|---|
8-213619 | Aug 1996 | JP |
Number | Date | Country | |
---|---|---|---|
20040263132 A1 | Dec 2004 | US |