The present application claims priority pursuant to 35 U.S.C. § 119(a) from Japanese patent application number 2018-26918, filed on Feb. 19, 2018, the entire disclosure of which is hereby incorporated by reference herein.
The present disclosure relates to a power supply module.
There is a power supply module which includes a snubber circuit, for example (see, for example, WO2016/076121).
A power supply module having a circuit configuration as illustrated in
A power supply module according to the present disclosure includes: a first resin substrate including a first electrode formed on one surface of a first polyimide substrate; a second resin substrate including a second electrode formed on one surface of a second polyimide substrate, the second resin substrate being arranged such that the first electrode and the second electrode oppose to each other; a first switching element provided between the first electrode and the second electrode, and coupled to the first electrode; a second switching element provided between the first electrode and the second electrode, and coupled to the second electrode; and a chip component provided between the first electrode and the second electrode, the chip component having one end coupled to the first electrode at a position different from a region where the first switching element is arranged, and another end coupled to the second electrode at a position different from a region where the second switching element is arranged.
A power supply module according to an embodiment of the present disclosure will be described with reference to the drawings as appropriate.
A power supply module 100 is a module for converting an inputted voltage or current into a desired voltage or current. As illustrated in
In such a power supply module 100, as the length of lead wiring coupling a MOSFET and a chip component becomes longer, the inductance of the lead wiring becomes larger. As the inductance of the lead wiring becomes larger, the risk of damage caused by surge voltage increases. Accordingly, the power supply module 100 needs to have a higher breakdown voltage. Conversely, the length of the lead wiring needs to be shortened in order to reduce the size of the power supply module 100. Furthermore, in a case where the chip component is a chip capacitor, the chip capacitor is a ceramic chip capacitor. In this case, if the substrate on which the chip component is mounted is made of ceramic or metal, the difference in coefficient α of thermal expansion between the chip component and the substrate causes cracking and/or the like in a coupling portion between the chip component and an electrode. Such a phenomenon a cracking occurs similarly in an epoxy resin-based printed circuit board and the like. Moreover, when the chip component is coupled to the substrate with solder or Ag paste, cracking may occur in the solder or Ag paste.
The present disclosure relates to the “power supply module.” As can be understood from the title of the disclosure, the power supply module employs a switching element which is commonly referred to as a “power element,” and heat generated by large current flowing therethrough raises the temperature of the power supply module to a considerably high temperature. In other words, repeated cycles of low and high temperatures, whose difference is large, cause cracking in the coupling portion, and furthermore in the semiconductor chip itself.
Examples of the power element include a bipolar transistor (BipTr), a power metal oxide semiconductor (MOS) transistor, and an insulated-gate bipolar transistor (IGBT). Furthermore, examples of the material of the power element include Si, GaN, GaAs, SiC, diamond, and the like, and such a switching element generates high heat.
The present disclosure focuses on a polyimide resin having heat resistance and flexibility. The power supply module according to the present disclosure has a structure in which two polyimide substrates sandwich the power element. The length of lead wiring is shortened by direct coupling of the power element to electrodes through opening parts in the polyimide substrates. Furthermore, the power supply module according to an embodiment of the present disclosure is characterized in that even though the chip component is sandwiched between the polyimide substrates, the flexibility of the polyimide substrates eases stresses of the chip component and the polyimide substrates, thereby making it possible to suppress cracking in the coupling portion.
Although will be described with reference to
Next, a method of manufacturing the power supply module will be briefly described. To begin with, as illustrated in
Subsequently, as illustrated in
Thereafter, as illustrated in
Subsequently, as illustrated in
After that, as illustrated in
Thereafter, as illustrated in
Finally, as illustrated in
As can be understood from the above explanation, the electrodes are formed directly on the top and bottom of the power element 11 and the chip component 12 instead of being coupled thereto using metal fine wires, and thus the wiring length can be reduced to a large extent. In addition, since the chip component 12 is fixed to the flexible substrates 13, 14, cracking and the like in the electrodes can be suppressed. Note that a resin may be provided between the substrates 13, 14 and sealed.
Subsequently, a power supply module 100 illustrated in
To begin with, a circuit diagram will be described. The wiring 40 is coupled to a plus power supply terminal, while the wiring 41 is coupled to a minus power supply terminal. The drain electrode of a first switching element (for example, a MOSFET) 43 is electrically coupled to the wiring 40, while the source electrode of a second switching element (for example, a MOSFET) 44 is electrically coupled to the wiring 41. Furthermore, the source electrode of the first switching element 43 and the drain electrode of the second switching element 44 are coupled to each other. A terminal 70 extends from the wiring which couples the source electrode of the first switching element 43 and the drain electrode of the second switching element 44.
Further, a first diode 45 is provided, with its cathode and anode electrodes being respectively coupled to the drain and source electrodes of the first switching element 43. A second diode 46 is provided, with its cathode and anode electrodes being respectively coupled to the drain and source electrodes of the second switching element 44. Furthermore, the gate electrodes of the first and second switching elements 43, 44 are coupled to a gate-H terminal and a gate-L terminal, respectively. Moreover, the snubber capacitor 50 is coupled between the plus power supply terminal and the minus power supply terminal.
A line 40 joining the plus power supply terminal and the first switching element corresponds to lead wiring. A line 51 joining the plus power supply terminal and the snubber capacitor 50 corresponds to lead wiring. A line 41 joining the minus power supply terminal and the second switching element corresponds to lead wiring. A line 52 joining the minus power supply terminal and the snubber capacitor 50 corresponds to lead wiring. Lines 55, 56 between the source electrode of the first switching element 43 and the drain electrode of the second switching element 44 correspond to lead wiring.
Next, a cross-sectional diagram of the power supply module 100 will be described with reference to
First, polyimide substrates 60, 61, which are features of the present disclosure, are included. The entire front surface of the first polyimide substrate 60 is covered with a first electrode 53. A heat-dissipation metal film 60a is provided on the entire back surface of the first polyimide substrate 60. The drain electrode of the first switching element 43 is electrically coupled to the left side of the first electrode 53, while the cathode electrode of the first diode 45 is electrically coupled to the right side of the first electrode 53. The drain electrode of the first switching element 43 and the cathode electrode of the first diode 45 are fixed to the left and right sides of the first electrode 53, respectively, with solder or Ag paste. Note that a substrate constituted by the first polyimide substrate 60, the first electrode 53, and the metal film 60a will be referred to as a “first resin substrate 110.”
Further, a second electrode 54 is provided on the back surface of the second polyimide substrate 61, while a heat-dissipation metal film 61a is provided on the front surface of the second polyimide substrate 61. The source electrode of the second switching element 44 is fixed to the lower left of the second electrode 54, while the anode electrode of the second diode 46 is provided on the lower right of the second electrode 54. An intermediate electrode 70 is provided between the source electrode of the first switching element 43 and the drain electrode of the second switching element 44, as well as between the anode electrode of the first diode 45 and the cathode electrode of the second diode 46. Note that a substrate constituted by the second polyimide substrate 61, the second electrode 54, and the metal film 61a will be referred to as a “second resin substrate 120.”
The right end of the first electrode 53 is a region in which an electrode 51 of the chip component 50 is provided, and this region is formed thinner than other region of the first electrode 53. The right end of the second electrode 54 is a region in which an electrode 52 of the chip component 50 is provided, and this region is similarly formed thinner than other region of the second electrode 54. The thinner regions in which the electrodes are provided are to solve the difference in the thermal expansion coefficient α. Furthermore, the flexibility is increased by reducing the thickness of the metals. This makes it possible to suppress cracking in the coupling portions of the chip component 50.
Further, the gate electrode is located in the left end of the first switching element 43, and a gate lead 80 extends outward from the gate electrode. The intermediate electrode 70 is formed thinner in a portion thereof corresponding to where the gate lead 80 extends from the gate electrode of the first switching element 43. This portion ensures that a space between the intermediate electrode 70 and the first switching element 43, particularly the gate electrode thereof, is thicker than the thickness of the lead, thereby preventing the lead from coming into contact with the intermediate electrode 70.
On the other hand, the gate electrode is located in the left end of the second switching element 44, and a gate lead 81 extends outward from the gate electrode. The second electrode 54 is formed thinner in a portion thereof corresponding to where the gate lead 81 extends from the gate electrode of the second switching element 44. This portion ensures that a space between the second electrode 54 and the second switching element 44, particularly the gate electrode thereof, is thicker than the thickness of the lead, thereby preventing the lead from coming into contact with the second electrode 54.
Finally, as described above, the chip component 50 is provided between the first electrode 53 and the second electrode 54, particularly between the portion of the first electrode 53 which is thinner in film thickness than other portion of the first electrode 53 and the portion of the second electrode 54 which is thinner in film thickness than other portion of the second electrode 54. The chip component 50 is bonded with solder, conductive paste, such as Ag paste, or the like. These bonding agents are likely to cause bad connection due to cracking and/or the like. However, by forming the electrode thin, the flexibility of each polyimide substrate inclusive of the corresponding electrode is easily secured, thereby being able to suppress bad connection in the chip component.
The first and second polyimide substrates 60, 61 may be electrically fixed to the first and second electrodes 53, 54 with Cu plating, respectively, by: providing opening parts in portions thereof corresponding to the electrodes of the switching elements 43, 44 and portions thereof corresponding to the electrodes 51, 52 of the chip component 50. Furthermore, the interstice between the first polyimide substrate 60 and the second polyimide substrate 61 may be sealed with insulating resin.
Next, the external appearance of the power supply module 100 as viewed from the above will be briefly described again with reference to
Three circular portions represent the source electrode S of the second switching element 44, while two circular portions represent the anode electrode A of the second diode 46. The source electrode S of the second switching element 44 and the anode electrode A of the second diode 46 are coupled to the second electrode 54. The intermediate electrode 70 provided thereunder extends from a lower long side S2 of the second polyimide substrate 61 toward the obliquely lower left side.
Meanwhile, reference sign G-L denotes the lead coupled to the gate electrode of the second switching element 44. The lead extends outward from a left short side S3 of the second polyimide substrate 61.
Reference numeral 60 denotes the first polyimide substrate provided thereunder. The first electrode 53 covers the front surface of the first polyimide substrate 60, where the first electrode 53 is slightly smaller than the first polyimide substrate 60. As explained with reference to
Finally, the chip component 50 will be described. The chip component 50 is formed in a rectangular parallelepiped shape. The electrode 52 is provided on the upper surface and the four side surfaces of the chip component 50, inclusive of their corner portions, while the electrode 51 is provided on the lower surface and the four side surfaces of the chip component 50, inclusive of their corner portions. Note that the electrodes 51, 52 provided on the four side surfaces are away from each other, and the electrical insulation is thus secured. Furthermore, the electrodes 51, 52 are electrically coupled to the first and second electrodes 53, 54, respectively.
Power supply modules according to other embodiments will be described hereinafter with reference to
As illustrated in
The electronic component 250 will be described more specifically. In a state where the electronic component 250 is coupled to the first electrode 112, the first lead electrode 252 is formed to extend substantially horizontally from an electrode end part 251a of the chip component 251 and be inclined downward toward the first electrode 112. Similarly, the second lead electrode 253 is formed to extend substantially horizontally from the other electrode end part 251b of the chip component 251 and be inclined upward toward the second electrode 122. Accordingly, even if thermal denaturation or the like causes minute changes to the first and second resin substrate 110, 120, the first and second lead electrodes 252, 253 bend according to the thermal denaturation, thereby being able to suppress cracking in the solder.
Furthermore, as illustrated in
As illustrated in
Such an electronic component 350 is used, for example, in a case where the chip member 351 cannot be arranged to be directly sandwiched between the first and second resin substrates 110, 120, a case where the first and second resin substrates 110, 120 are not provided with the first and second polyimide substrates 111, 121, respectively so that the chip member 351 cannot be arranged to be directly sandwiched between the first and second resin substrates 110, 120, or other case. The third lead electrode 352 is formed to extend outward from the electrode end part 351a of the chip component 351, while the fourth lead electrode 353 is formed to extend outward from the other electrode end part 351b of the chip component 351. Accordingly, even if thermal denaturation or the like causes minute changes to the first and second resin substrate 110, 120, the third and fourth lead electrodes 352, 353 bend according to the thermal denaturation, thereby being able to suppress cracking in the solder.
Although embodiments of the present disclosure have been described, the present disclosure is not limited to these embodiments. The materials, shapes and arrangements of the above-described components are merely for the embodiments for carrying out the present disclosure, and may be variously changed within the scope not departing from the gist of the disclosure.
For example, in
Number | Date | Country | Kind |
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2018-026918 | Feb 2018 | JP | national |