Hinsley, Non-Destructive Testing, 1959, pp. 336-339. |
Hallenback et al, Precision Four-Point Probe Resistivity Instrumentation, 1969, p. 736. |
Cohen et al, Erratic Welding in Low-Carbon Steels, 2-1981. |
Smits, Measurement of Sheet Resistivities with LHC Four-Point Probe, 10-1957, pp. 711-718. |
Swartzendruber, Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples, 4-1964, pp. 1-7. |
Halliday et al, The D.C. Electrical Potential Method for Crack Length Measurement, pp. 85-112. |
Uhlir, The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor Engineering, 8-1954, pp. 105-128. |
Kohl, Handbook of Materials and Techniques for Vacuum Devices, 1967, p. 198. |
Logan, An A.C. Bridge for Semiconductor Resistivity Measurements Using a Four-Point Probe, 9-1960, pp. 885-919. |
Rossiter, An Instrument for Measuring the Resistivity of Metals and Metallic Alloys, Journal of Physics E:Scientific Instruments, vol. 3, No. 7, Jul. 1970, pp. 530-532. |
"Electrical Resistance Probe Method for Inservice Inspection", Nuclear Power Education Seminar, Chugoku X-Ray Co., Ltd., Tsutomu Fujimura, The Headquarters of Engineering Services. |
"An Apparatus for Four-Probe Specific Resistance Measurement on Epitaxial Silicon Films", Measurement Techniques, vol. 17, No. 11, V. V. Batavin et al, 1974, pp. 1753-1754. |
Weast, Handbook of Chemistry and Physics, 51st edition, pp. E126-E128. |