Patent Application
20130242298
The present invention relates to a prism part of an analysis chip for use in a surface plasmon resonance analysis device for analyzing a specimen based on a change in the resonance angle of surface plasmon resonance (SPR), or for use in a surface plasmon resonance fluorescence analysis device for analyzing a specimen by causing the specimen or a fluorescent material labeled to the specimen to emit fluorescence with use of an evanescent wave generated by surface plasmon resonance, and by measuring the fluorescence, as well as an analysis chip including the prism part, and a method for producing the prism part of the analysis chip.
Conventionally, there have been developed various analysis methods utilizing surface plasmon resonance, as a method for quantitatively analyzing a trace amount of a specimen contained in a sample solution for use in biomeasurement for detecting proteins or DNAs. In most of these analysis methods, an analysis chip using a Kretschmann configuration, in which a gold film is formed on a prism, is used. A change in the resonance angle of surface plasmon resonance, or an enhanced electric field in the vicinity of a gold film based on surface plasmon resonance in the analysis chip is utilized, and analysis of a trace amount of a specimen contained in a sample solution is carried out with high sensitivity and with high precision (see patent literature 1).
Specifically, as shown in
Incidence of excitation light into the prism main body 112 of the analysis chip 110 causes reflection of the excitation light on the gold film 113 formed on the predetermined surface 112b. Then, an electric filed near the surface of the gold film 113 is greatly enhanced by the excitation light incident at a predetermined incident angle. This is because incidence of excitation light into the gold film 113 at a predetermined incident angle (resonance angle) generates surface plasmon resonance on the gold film 113, whereby the electric filed near the surface of the gold film 113 is greatly enhanced. This phenomenon is highly sensitive and responsive to a change in the refractive index on the surface of the gold film 113. Thus, utilizing the above phenomenon enables to detect a trace amount of a material residing in a sample solution flowing over the gold film 113.
However, due to weak adhesion of the gold film 113 to glass or to a resin and softness of the gold film 113, the gold film 113 is easily peeled off from the prism main body 112 or easily damaged. As a result, a part of the gold film 113 may be peeled off from the prism main body 112 or may be damaged in assembling into an analysis chip 110, or in washing the channel 116 of the analysis chip 110 each time a specimen is analyzed.
Specifically, peeling off or damage may be generated in the gold film 113, in the case where a portion of the prism part 111 at which the gold film 113 is formed is nipped with, e.g., a pair of tweezers for joining the prism part 111 and the channel member 117, after the gold film 113 is formed on the predetermined surface 112b of the prism main body 112. Further, in the case where the prism part 111 and the channel member 117 are temporarily detached from each other for washing, e.g., the channel 116, the gold film 113 may be peeled off from the prism main body 112 or may be damaged at a portion in contact with the channel member 117. As described above, in the case where peeling off or damage is generated in the gold film 113, detection of a specimen may not be carried out with precision in analyzing the specimen with use of the analysis chip 110 incorporated with the prism part 111.
Patent literature 1: Japanese Patent No. 4,370,383
An object of the invention is to provide a prism part of an analysis chip in which peeling off of a gold film is suppressed, an analysis chip including the prism part, and a method for producing the prism part of the analysis chip.
A prism part of an analysis chip, an analysis chip including the prism part, and a method for producing the prism part of the analysis chip of the invention have a feature that a prism main body has a mixed layer in which gold and a material constituting the prism main body coexist along a specified surface on which a gold film is formed and on an inner side of the specified surface. The invention having the above configuration provides a prism part of an analysis chip in which peeling off of a gold film is suppressed, an analysis chip including the prism part, and a method for producing the prism part of the analysis chip.
These and other objects, features and advantages of the present invention will become more apparent upon reading the following detailed description along with the accompanying drawings.
In the following, an embodiment of the invention is described referring to the accompanying drawings.
An analysis chip according to the embodiment is used in an analysis device for analyzing a specimen based on a change in the resonance angle of surface plasmon resonance, or is used in an analysis device for measuring fluorescence emitted by excitation of a specimen or a fluorescent material labeled to a specimen by an evanescent wave based on surface plasmon resonance. The analysis chip is a sensor chip using a Kretschmann configuration.
Specifically, as shown in
The prism part 20 generates surface plasmon resonance on the gold film 25 by reflecting excitation light incident into the prism part 20 on the gold film 25. Specifically, the prism part 20 includes a prism main body 21 into which excitation light for generating surface plasmon is incident, and the gold film 25 formed on a specified surface 23 of the prism main body 21.
The prism main body 21 includes, as the surfaces thereof, an incident surface 22, the reflection surface (specified surface) 23, and an exit surface 24; and is made of transparent glass or a transparent resin.
The incident surface 22 is used for incidence of excitation light to be outputted from a light source (not shown) of a surface plasmon resonance fluorescence analysis device into the prism main body 21, in the case where the analysis chip 10 is placed in the surface plasmon resonance fluorescence analysis device for analyzing a specimen. Further, the reflection surface 23 is used for reflecting excitation light incident from the incident surface 22 into the prism main body 21 on the gold film 25 formed on the specified surface 23, in the case where the analysis chip 10 is placed in the surface plasmon resonance fluorescence analysis device for analyzing a specimen. Further, the exit surface 24 is used for outputting excitation light reflected on the reflection surface 23 (specifically, on the gold film 25 formed on the reflection surface 23) to the outside of the prism main body 21, in the case where the analysis chip 10 is placed in the surface plasmon resonance fluorescence analysis device for analyzing a specimen.
The prism main body 21 in the embodiment includes only a prism. However, the invention is not limited to the above. For instance, as shown in
As also shown in
The mixed layer portion 28 is formed by ions of gold for the gold film 25 entering into the prism main body 21 from the reflection surface 23. Specifically, in the mixed layer portion 28, a material (the aforementioned glass or resin) constituting the other portion (a portion other than the mixed layer portion 28) of the prism main body 21, and gold atoms constituting the gold film 25 coexist.
The mixed layer portion 28 has a thickness of 10 nm or smaller. As far as the mixed layer portion 28 has the aforementioned thickness, it is easy to determine the thickness of the gold film 25 suitable for surface plasmon resonance in the prism part 20. Specifically, the refractive index of the mixed layer portion 28 is different from the refractive index of the other portion of the prism main body 21. Accordingly, in the case where the thickness of the mixed layer portion 28 is larger than 10 nm, it is required to consider the refractive index or the thickness of the mixed layer portion 28 in deriving the thickness of the gold film 25 suitable for surface plasmon resonance. This makes it difficult to derive the thickness of the gold film 25 suitable for surface plasmon resonance in the prism part 20. On the other hand, in the case where the thickness of the mixed layer portion 28 is not larger than 10 nm, it is possible to derive the thickness of the gold film 25 suitable for surface plasmon resonance only from the refractive index of the other portion of the prism main body 21, without considering the refractive index or the thickness of the mixed layer portion 28. In the embodiment, the thickness of the mixed layer portion 28 is a thickness of a region in which gold is present in the prism main body 21.
The prism main body 21 may have a shape other than a trapezoidal shape (see
The gold film 25 is a thin film made of gold and is formed on the reflection surface 23 of the prism main body 21. The gold film 25 forms the mixed layer portion 28 by causing a part of a large amount of gold atoms constituting the gold film 25 to enter into the prism main body 21 from the reflection surface 23. The gold film 25 amplifies an evanescent wave to be generated by reflection of excitation light on the gold film 25 in the prism part 20. Specifically, as compared with a configuration, in which an evanescent wave is generated by causing total reflection of excitation light on a reflection surface 23 without forming a gold film 25, the configuration of forming a gold film 25 on a reflection surface 23, and generating surface plasmon resonance on the gold film 25 is advantageous in enhancing an electric field to be formed near the reflection surface 23. The film thickness of the gold film 25 is 100 nm or smaller for generating surface plasmon resonance. Preferably, the gold film 25 is formed on the reflection surface 23 with a film thickness of not smaller than 30 nm but not larger than 70 nm.
Further, biologically active substances 26 for capturing a specimen (e.g. a specific antigen) contained in a sample solution are immobilized on a surface (a surface of the gold film 25 opposite to the prism main body 21) 25a of the gold film 25. The biologically active substances 26 in the embodiment are antibodies. The biologically active substances 26 are immobilized on the surface 25a of the gold film 25 by surface treatment. Specifically, the biologically active substances 26 are immobilized in a region, on the surface 25a of the gold film 25, in contact with a sample solution that flows through the channel 13, in the case where the channel member 12 forms the channel 13 in cooperation with the prism main body 21. It should be noted that the biologically active substances 26 shown in
The thus-configured gold film 25 is formed on the reflection surface 23 by a vacuum film forming process such as an electron beam heating vacuum deposition process, a resistance heating vacuum deposition process, a magnetron sputtering process, a plasma support sputtering process, an ion assist vapor deposition process, or an ion plating process.
The channel member 12 is formed on the reflection surface 23 (specifically, on the gold film 25) of the prism main body 21, and forms the channel 13 in cooperation with the prism main body 21. The channel member 12 is made of a transparent resin. The channel member 12 in the embodiment is a plate-shaped member extending in a horizontal direction.
The channel 13 has a detecting portion 13a in which antigen-antibody reaction is performed, and guiding portions 13b for guiding a sample solution from the outside of the analysis chip 10 to the detecting portion 13a or guiding a sample solution from the detecting portion 13a to the outside of the analysis chip 10. The detecting portion 13a is surrounded by a groove formed in a back surface (the lower surface in
Further, the channel member 12 has a seal member 15 in the groove of the back surface 12b constituting the channel 13. The seal member 15 surrounds the detecting portion 13a in a horizontal direction, and is adhesively attached to an inner surface of the groove in the back surface 12b of the channel member 12 and to the gold film 25 of the prism part 20, in the case where the channel member 12 is joined to the prism main body 21 from the gold film 25 side. This configuration prevents leakage of a sample solution from a joined portion between the channel member 12 and the prism part 20. The seal member 15 in the embodiment is a so-called O-ring. The seal member 15 is not limited to an O-ring. For instance, as shown in
The channel member 12 is joined to the prism part 20 by a fixing member such as a clamp or a screw so that the back surface 12b is pressingly mounted on the reflection surface 23 (specifically, on the gold film 25) of the prism part 20. The above configuration makes it easy to detach the channel member 12 and the prism part 20 from each other, and is advantageous in replacing the prism part 20 due to smear or damage of the gold film 25.
The channel member 12 may not be detachably joined to the prism part 20. Specifically, the channel member 12 may be adhesively joined to the prism part 20, or may be joined to the prism part 20 by laser welding or ultrasonic welding. Further, as far as the channel member 12 and the prism part 20 are liquid-tightly joined, the seal member 15 for surrounding the detecting portion 13a may be omitted.
The thus-configured analysis chip 10 is produced as follows.
<Production of Prism Part>
A prism main body (a prism in the embodiment) 21 of a predetermined shape is prepared (Step S1). The prism main body 21 is placed in a film forming position of, e.g., a vacuum film forming apparatus. Then, a gold film 25 is formed on a reflection surface 23 by the vacuum film forming apparatus. Specifically, the prism main body 21 is placed in a vacuum atmosphere, and gold (gold ions) in an ionized state is supplied onto the reflection surface 23. By the supply, the gold film 25 is formed substantially on the entirety of the reflection surface 23. In the embodiment, the gold film 25 is formed on the reflection surface 23 by a vacuum film forming process such as an electron beam heating vacuum deposition process, a magnetron sputtering process, a plasma support sputtering process, an ion assist vapor deposition process, or an ion plating process.
Specifically, the prism main body 21 is placed in a vacuum chamber of a vacuum film forming apparatus, and the air in the vacuum chamber is exhausted. By the exhaustion, the inside of the chamber is brought to a vacuum atmosphere. The vacuum film forming apparatus generates gold ions to be supplied onto the reflection surface 23 in the chamber of a vacuum atmosphere, and supplies the gold ions onto the reflection surface 23. In the supply, the gold to be supplied onto the reflection surface 23 may not be in a completely ionized state.
A part of a large amount of gold ions that reached the reflection surface 23 (namely, gold ions having an energy higher than a predetermined energy) enters into the prism main body 21 from the reflection surface 23, whereby a mixed layer portion 28 is formed on the prism main body 21 (Step S2). As gold ions are continued to be supplied onto the reflection surface 23, the gold is deposited on the outer side of the reflection surface 23 in such a manner as to continue from a layer of gold that has entered into the prism main body 21 (into a mixed layer). Then, when the gold is deposited up to a predetermined thickness, formation of the gold film 25 is completed (Step S3). In the thus-formed gold film 25, the gold atoms entered into the prism main body 21 from the reflection surface 23 act as an anchor. As a result, the reflection surface 23 of the prism main body 21 made of a resin or glass, and the gold film 25 are firmly adhesively attached to each other. In the adhesion, as the amount of gold ions to be supplied onto the reflection surface 23 increases, the amount of gold that enters from the reflection surface 23 per unit area increases. Further, as the energy of gold ions that have reached (collided) the reflection surface 23 increases, the distance by which the gold ions enter into the prism main body 21 from the reflection surface 23 increases. In other words, the thickness of the mixed layer portion 28 increases.
As described above, a prism part 20 provided with a prism main body 21 having a mixed layer portion 28 formed thereon, and a gold film 25 is produced.
<Production of Analysis Chip>
Biologically active substances 26 are immobilized in a predetermined region on a surface 25a of the gold film 25 by surface treatment (Step S4). The predetermined region is a portion (region) corresponding to a detecting portion 13a of a channel 13 in the case where a channel member 12 is joined to the prism part 20.
The channel member 12 of a predetermined shape is prepared (Step S5). The channel member 12 is abutted against the prism part 20 from the gold film 25 side. In this state, the channel member 12 is fixedly mounted to the prism part 20 by, e.g., screws (Step S6), whereby an analysis chip 10 is fabricated.
In the thus-configured analysis chip 10, a part of the gold film 25 is entered into the prism main body 21 (into the mixed layer portion 28). This is advantageous in enhancing adhesion of the gold film 25 to the prism main body 21. The adhesion suppresses the gold film 25 from peeling off from the prism main body 21. Specifically, a part of a large amount of gold atoms constituting the gold film 25 is entered into the prism main body 21 and forms the mixed layer portion 28 to thereby firmly join the prism main body 21 and the gold film 25. By the joining, the adhesion strength of the gold film 25 to the prism main body 21 is enhanced, as compared with a gold film which is formed on a specified surface without formation of a mixed layer portion 28 on a prism main body 21.
The prism part 20, the analysis chip 10 including the prism part 20, and the method for producing the prism part 20 of the analysis chip 10 according to the invention are not limited to the embodiment. It should be appreciated that various modifications are applicable, as far as such modifications do not depart from the scope of the present invention.
In the embodiment, in forming a gold film 25 on a reflection surface 23, a step of forming a mixed layer portion 28 by implanting gold ions into the reflection surface 23, and a step of forming a portion of the gold film 25 on the outer side of the reflection surface 23 are sequentially carried out by a vacuum film forming process. The invention is not limited to the above. For instance, a mixed layer portion 28 may be formed in advance by implanting gold ions from a reflection surface 23 by an ion implantation process, and thereafter, a portion of a gold film 25 on the outer side of the reflection surface 23 may be formed by a vacuum film forming process.
In this section, in order to evaluate the performance of suppressing peeling off of a gold film 25 from a prism part 20 of an analysis chip 10 according to the embodiment, comparison is made between a prism part 20 having a mixed layer portion 28, and a prism part having substantially the same configuration as the embodiment except that a mixed layer is not formed.
A prism part 20 as Example 1 was fabricated (produced) as follows.
A gold film 25 of 50 nm-thickness was formed on a reflection surface 23 of a prism main body 21 made of LaF71 (crown-based glass containing lanthanum) by a plasma support sputtering process.
In the following, the plasma support sputtering process is described.
Film formation by the plasma support sputtering process is performed by, e.g., an apparatus 30 as shown in
In the thus-configured apparatus 30, the prism main body 21 (or a substrate 212) is held on the holder 32 in a state that the reflection surface 23 faces the gold target G, and the air is exhausted to thereby bring the inside of the vacuum chamber 31 into a predetermined vacuum atmosphere. Then, argon gas is fed into the vacuum chamber 31, and electric discharge is generated by applying RF energy to the cathode by the first RF power source 33, whereby gold is sputtered from the gold target G by the reaction as represented by the following reaction formula.
Au+Ar+→Au++e−+Ar+
When the shutter 34 is opened, the gold ions and the gold (gold which has not been ionized) sputtered out of the gold target G are energized by high energy electrons while passing through the support coil 35 to which RF energy is applied by the second RF power source 37. Then, the gold ions having high energy collide with the reflection surface 23. By the collision, the gold ions enter into the prism main body 21 from the reflection surface 23, and a mixed layer portion 28 is formed. By continuing sputtering, the gold is deposited on the reflection surface 23, and a gold film 25 is formed. In the film formation, the high frequency electric power to be applied is 100 W on the cathode side, and 50 w on the support coil side.
A cross section of the prism main body 21 having the gold film 25 formed thereon by the aforementioned plasma support sputtering process was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that a region containing gold atoms (i.e. the mixed layer portion 28) was formed in the range of about 9 nm from the reflection surface 23, on the reflection surface 23 side of the prism main body 21.
On the other hand, as a comparative example, a gold film of 50 nm-thickness was formed on a reflection surface 23 of a prism main body 21 by a resistance heating vacuum deposition process without a step of ionizing gold. Similarly to the above, a cross section of the prism main body 21 was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that no region containing gold atoms was found near the reflection surface 23 of the prism main body 21. In other words, a mixed layer portion was not formed.
A tape peeling test (a grid tape peeling test according to JIS D0202-1988) was performed, and the adhesion strengths of the gold films were evaluated.
In the test, as shown in
The result is shown in the following table 1.
As a result of the test, it was confirmed that a prism part 20 provided with a mixed layer portion 28 is advantageous in firmly adhering a gold film 25 to a reflection surface 23.
In this example, a prism part 20 provided with a mixed layer portion 28 was produced by forming a gold film 25 of 45 nm-thickness on a reflection surface 23 of a prism main body 21 made of E48R (cycloolefin polymer resin) by an electron beam heating vacuum deposition process.
In the following, the electron beam heating vacuum deposition process is described.
Film formation by the electron beam heating vacuum deposition process is performed by, e.g., an apparatus 40 as shown in
In the thus-configured apparatus 40, the prism main body 21 (or a substrate 212) is held on the holder 42 in such a state that a reflection surface 23 faces the gold ingot G, and the air is exhausted to thereby bring the inside of the vacuum chamber 41 into a predetermined vacuum atmosphere. Then, a predetermined acceleration voltage and an emission current are applied to the electron gun 44 for discharging electrons from the filament 43, and a magnetic field formed near the electron gun 44 guides the electrons to the gold ingot G. When the discharged electrons are irradiated onto the gold ingot G (collide with the gold ingot G), the gold evaporates. Then, when the shutter 45 is opened, the evaporated gold passes through the flow of electrons that are irradiated onto the gold ingot G while being supplied onto the reflection surface 23. During this operation, collision ionization as represented by the following formula occurs, whereby the gold is ionized.
Au+e−→Au++e−+e−
By the collision of ionized gold with the reflection surface 23, the gold ions enter into the prism main body 21 from the reflection surface 23, and form a mixed layer portion 28. By continuing discharge of electrons by the electron gun 44, the gold is deposited on the reflection surface 23, and a gold film 25 is formed. In the film formation, the acceleration voltage to be applied to electron beams is 6 kV, and an emission current is 120 mA.
A cross section of the prism main body 21 having the gold film 25 formed thereon by the aforementioned electron beam heating vacuum deposition process was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that a region (i.e. the mixed layer portion 28) containing gold atoms was formed in the range of about 3 nm from the reflection surface 23, on the reflection surface 23 side of the prism main body 21.
On the other hand, as a comparative example, a gold film of 45 nm-thickness was formed on a reflection surface 23 of a prism main body 21 by a resistance heating vacuum deposition process without a step of ionizing gold. Similarly to the above, a cross section of the prism main body 21 was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that no region containing gold atoms was found near the reflection surface 23 of the prism main body 21.
A tape peeling test (a grid tape peeling test according to JIS D0202-1988) was performed with respect to the two prism parts, and the adhesion strengths of the gold films were evaluated in the same manner as Example 1.
The result is shown in the following table 2.
As a result of the test, it was confirmed that a prism part 20 provided with a mixed layer portion 28 is advantageous in firmly adhering a gold film 25 to a reflection surface 23, as well as Example 1.
In this example, a prism part 20 provided with a mixed layer portion 28 was produced by forming a gold film 25 of 40 nm-thickness on a reflection surface 23 of a prism main body 21 made of BK7 (white sheet glass) by an ion plating process.
In the following, the ion plating process is described.
Film formation by the ion plating process is performed by, e.g., an apparatus 50 as shown in
In the thus-configured apparatus 50, the prism main body 21 (or a substrate 212) is held on the holder 52 in such a state that a reflection surface 23 faces the gold ingot G, and the air is exhausted to thereby bring the inside of the vacuum chamber 51 into a predetermined vacuum atmosphere. Then, in response to application of an alternate-current voltage to the thoria tungsten filament 54 for discharging electrons, the electrons travel toward the mesh anode 55. In this state, the shutter 57 is opened, and the gold ingot G placed on the tungsten board 56 is heated to evaporate. By the above operation, the evaporated gold passes through the flow of electrons from the thoria tungsten filament 54 toward the mesh anode 55 while being supplied onto the reflection surface 23. During this operation, collision ionization as represented by the following formula occurs, whereby the gold is ionized.
Au+e−→Au++e−+e−
By the collision of ionized gold with the reflection surface 23, the gold ions enter into the prism main body 21 from the reflection surface 23, and form a mixed layer portion 28. By continuing discharge of electrons by the thoria tungsten filament 54, the gold is deposited on the reflection surface 23, and a gold film 25 is formed. In the film formation, the electric power of an evaporation source is 500 W, the voltage to be applied for ionization is 0.5 kV, and an emission current is 500 mA.
A cross section of the prism main body 21 having the gold film 25 formed thereon by the aforementioned ion plating process was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that a region (i.e. the mixed layer portion 28) containing gold atoms was formed in the range of about 6 nm from the reflection surface 23, on the reflection surface 23 side of the prism main body 21.
On the other hand, as a comparative example, a gold film of 40 nm-thickness was formed on a reflection surface 23 of a prism main body 21 by a resistance heating vacuum deposition process without a step of ionizing gold. Similarly to the above, a cross section of the prism main body 21 was observed by FIB-TEM, and element analysis was performed by EDS. As a result of the observation, it was confirmed that no region containing gold atoms was found near the reflection surface 23 of the prism main body 21.
A tape peeling test (a grid tape peeling test according to JIS D0202-1988) was performed with respect to the two prism parts, and the adhesion strengths of the gold films were evaluated in the same manner as Example 1 and Example 2.
The result is shown in the following table 3.
As a result of the test, it was confirmed that a prism part 20 provided with a mixed layer portion 28 is advantageous in firmly adhering a gold film 25 to a reflection surface 23, as well as Example 1 and Example 2.
The following is a summary of the embodiment
A prism part of an analysis chip according to an embodiment is a prism part to be included in an analysis chip for use in an analysis device for analyzing a specimen utilizing surface plasmon resonance, the analysis chip being operative to generate the surface plasmon resonance, the prism part being cooperative with a channel member to form a channel for flowing a sample solution containing the specimen. The prism part is provided with a prism main body into which excitation light for generating the surface plasmon resonance is incident, and a gold film formed on a specified surface of the prism main body. The prism main body has a mixed layer in which gold and a material constituting the prism main body coexist along the specified surface on which the gold film is formed, and on an inner side of the specified surface.
In the above configuration, forming a mixed layer in which gold constituting a gold film and a material constituting a prism main body coexist is advantageous in increasing the adhesion strength of the gold film to the prism main body, as compared with a prism part, in which a gold film is formed on a specified surface of a prism main body, without a mixed layer. In other words, the adhesion strength of a gold film to a prism main body is enhanced by interaction between the gold atoms residing in a mixed layer, and the gold atoms residing on the outer side of a specified surface.
In the prism part having the above configuration, for instance, the mixed layer may be formed by ions of gold for the gold film entering into the prism part from the specified surface in the formation of the gold film on the specified surface.
As described above, causing a part of a gold film to enter into a prism main body (into a mixed layer) is advantageous in obtaining high adhesion of the gold film to the prism main body. This suppresses peeling off of the gold film from the prism main body. Specifically, forming a mixed layer by causing a part of a large amount of gold atoms constituting a gold film to enter into a prism main body firmly joins the prism main body and the gold film. This is advantageous in enhancing the adhesion strength of the gold film to the prism main body.
In the above configuration, preferably, the mixed layer may have a thickness of 10 nm or smaller.
A mixed layer having the above thickness is advantageous in easily determining the thickness of a gold film suitable for surface plasmon resonance in the prism part. Specifically, the refractive index of a mixed layer is different from the refractive index of the other portion (a portion other than the mixed layer) of a prism main body. Accordingly, if the thickness of a mixed layer exceeds 10 nm, it is required to take into consideration of the refractive index or the thickness of a mixed layer in deriving the thickness of a gold film suitable for surface plasmon resonance. This makes it difficult to derive the thickness of a gold film suitable for surface plasmon resonance in a prism part 20. On other hand, a mixed layer having a thickness of 10 nm or smaller is advantageous in deriving the thickness of a gold film suitable for surface plasmon resonance only from the refractive index of the other portion of a prism main body, without considering the refractive index or the thickness of the mixed layer.
Forming the gold film having a thickness of not smaller than 30 nm but not larger than 70 nm in the prism part having the above configuration is advantageous in generating an enhanced electric field of an intensity sufficient for detecting a specimen in the vicinity of the gold film, in the case where surface plasmon resonance is generated in the gold film of the analysis chip incorporated with the prism part.
Further, an analysis chip according to the embodiment is an analysis chip for use in an analysis device for analyzing a specimen utilizing surface plasmon resonance, the analysis chip being operative to generate the surface plasmon resonance. The analysis chip is provided with a prism part, and a channel member which is cooperative with the prism part to form a channel for flowing a sample solution containing the specimen. The prism part has a prism main body into which excitation light for generating the surface plasmon resonance is incident, and a gold film formed on a specified surface of the prism main body. The prism main body has a mixed layer in which gold and a material constituting the prism main body coexist along the specified surface on which the gold film is formed, and on an inner side of the specified surface.
In the above configuration, forming a mixed layer in which gold constituting a gold film and a material constituting a prism main body coexist is advantageous in obtaining high adhesiveness of a gold film with respect to the prism main body. This suppresses peeling off of the gold film from the prism main body. Specifically, the adhesion strength of a gold film to a prism main body is enhanced by interaction between the gold atoms residing in a mixed layer, and the gold atoms residing on the outer side of a specified surface.
Further, a method for producing a prism part according to the embodiment is a method for producing a prism part to be included in an analysis chip for use in an analysis device for analyzing a specimen utilizing surface plasmon resonance, the analysis chip being operative to generate the surface plasmon resonance, the prism part being cooperative with a channel member to form a channel for flowing a sample solution containing the specimen. The method is provided with a film forming step of forming a gold film on a specified surface of a prism main body, the prism main body being prepared in advance for allowing incidence of excitation light for generating the surface plasmon resonance. In the film forming step, gold in an ionized state is supplied onto the specified surface in such a manner that the gold in an ionized state enters into the prism main body from the specified surface.
The above configuration is advantageous in producing a prism part in which peeling off of a gold film from a prism main body is suppressed. Specifically, in the step of forming a gold film, a part of a large amount of gold atoms constituting the gold film is entered into the prism main body to thereby obtain a prism part in which the adhesion strength between the prism main body and the gold film is large.
Specifically, in the film forming step, the gold film is formed by one of film forming processes including an electron beam heating vacuum deposition process, a magnetron sputtering process, a plasma support sputtering process, an ion assist deposition process, and an ion plating process. This configuration is advantageous in supplying gold ions onto a specified surface in forming a gold film in such a manner that gold in an ionized state enters into a prism main body.
As described above, a prism part of an analysis chip, an analysis chip including the prism part, and a method for producing the prism part of the analysis chip of the invention are useful in easily handling an analysis chip to be used in a surface plasmon resonance analysis device or a surface plasmon resonance fluorescence analysis device, and is suitable for suppressing peeling off of a gold film from a prism main body.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2010-263856 | Nov 2010 | JP | national |
This is the U.S. national stage of application No. PCT/JP2011/005126, filed on 12 Sep. 2011. Priority under 35 U.S.C. §119(a) and 35 U.S.C. §365(b) is claimed from Japanese Application No. 2010-263856, filed 26 Nov. 2010, the disclosure of which is also incorporated herein by reference.
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP2011/005126 | 9/12/2011 | WO | 00 | 5/24/2013 |
