BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a side view partly cutaway showing an optical probe in accordance with a first embodiment of the present invention,
FIG. 2 is a perspective view of an optical tomographic system to which the optical probe of FIG. 1 is applied,
FIG. 3 is a side view partly cutaway showing an optical probe in accordance with a second embodiment of the present invention,
FIGS. 4A to 4C are side views partly cutaway showing an optical probes in accordance with a third embodiment of the present invention and modification thereof,
FIG. 5 is a side view partly cutaway showing an optical probe in accordance with a fourth embodiment of the present invention,
FIG. 6 is a side view partly cutaway showing an optical probe in accordance with a fifth embodiment of the present invention,
FIG. 7 is a schematic view showing an example of the optical tomography system by the SD-OCT measurement to which the optical probe of the present invention is applied,
FIG. 8 is a schematic view showing an example of the optical tomography system by the SS-OCT measurement to which the optical probe of the present invention is applied, and
FIG. 9 is a schematic view showing an example of the optical tomography system by the TD-OCT measurement to which the optical probe of the present invention is applied.